JPS649638A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS649638A JPS649638A JP62164428A JP16442887A JPS649638A JP S649638 A JPS649638 A JP S649638A JP 62164428 A JP62164428 A JP 62164428A JP 16442887 A JP16442887 A JP 16442887A JP S649638 A JPS649638 A JP S649638A
- Authority
- JP
- Japan
- Prior art keywords
- film
- interelement
- isolating
- dielectric
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Local Oxidation Of Silicon (AREA)
- Element Separation (AREA)
- Semiconductor Memories (AREA)
Abstract
PURPOSE:To secure a broad active region and to isolate elements sufficiently without complicated steps, by adopting the steps, by which element isolating insulation films are formed on a semiconductor substrate, and thereafter etching and removing the upper parts of the films. CONSTITUTION:The upper surface parts of a silicon oxide film 3 and an interelement dielectric isolation film 9 on the entire surface of a memory array part are removed by etching. Thus, a thin element isolating film 9a is obtained. In this way, the thickness of the element isolating insulation film 9a at the memory array part (b) becomes thinner than the thickness of the interelement dielectric isolating films 9, which remain in a peripheral circuit part (a). When the thickness of the film is decreased, the tip part of each bird's beak B is removed. Therefore, an initial isolating length lB between the elements at the interelement dielectric isolation film 9 is shortened to an isolation length lbetween the elements at the interelement dielectric isolating film 9a after the etching. an active region C at the memory array part is expanded.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62164428A JPH0821615B2 (en) | 1987-07-01 | 1987-07-01 | Method for manufacturing semiconductor memory device |
| US07/213,497 US5061654A (en) | 1987-07-01 | 1988-06-30 | Semiconductor integrated circuit having oxide regions with different thickness |
| US08/296,940 US5466623A (en) | 1987-07-01 | 1994-08-29 | Method of making semiconductor integrated circuit having isolation oxide regions with different thickness |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62164428A JPH0821615B2 (en) | 1987-07-01 | 1987-07-01 | Method for manufacturing semiconductor memory device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS649638A true JPS649638A (en) | 1989-01-12 |
| JPH0821615B2 JPH0821615B2 (en) | 1996-03-04 |
Family
ID=15792965
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62164428A Expired - Fee Related JPH0821615B2 (en) | 1987-07-01 | 1987-07-01 | Method for manufacturing semiconductor memory device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0821615B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03187224A (en) * | 1989-12-15 | 1991-08-15 | Mitsubishi Electric Corp | Semiconductor device |
| US5478759A (en) * | 1992-11-26 | 1995-12-26 | Mitsubishi Denki Kabushiki Kaisha | Method of manufacturing semiconductor device with retrograde wells |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5984436A (en) * | 1982-11-04 | 1984-05-16 | Sanyo Electric Co Ltd | Manufacture of semiconductor device |
-
1987
- 1987-07-01 JP JP62164428A patent/JPH0821615B2/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5984436A (en) * | 1982-11-04 | 1984-05-16 | Sanyo Electric Co Ltd | Manufacture of semiconductor device |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03187224A (en) * | 1989-12-15 | 1991-08-15 | Mitsubishi Electric Corp | Semiconductor device |
| US5478759A (en) * | 1992-11-26 | 1995-12-26 | Mitsubishi Denki Kabushiki Kaisha | Method of manufacturing semiconductor device with retrograde wells |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0821615B2 (en) | 1996-03-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313111 |
|
| R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
| LAPS | Cancellation because of no payment of annual fees |