KR100972758B1 - 프로브 조립체 제조방법 - Google Patents
프로브 조립체 제조방법 Download PDFInfo
- Publication number
- KR100972758B1 KR100972758B1 KR1020090048178A KR20090048178A KR100972758B1 KR 100972758 B1 KR100972758 B1 KR 100972758B1 KR 1020090048178 A KR1020090048178 A KR 1020090048178A KR 20090048178 A KR20090048178 A KR 20090048178A KR 100972758 B1 KR100972758 B1 KR 100972758B1
- Authority
- KR
- South Korea
- Prior art keywords
- forming
- tip portion
- photoresist
- sacrificial substrate
- probe assembly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
Claims (6)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020090048178A KR100972758B1 (ko) | 2009-06-01 | 2009-06-01 | 프로브 조립체 제조방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020090048178A KR100972758B1 (ko) | 2009-06-01 | 2009-06-01 | 프로브 조립체 제조방법 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR100972758B1 true KR100972758B1 (ko) | 2010-07-29 |
Family
ID=42646093
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020090048178A Expired - Fee Related KR100972758B1 (ko) | 2009-06-01 | 2009-06-01 | 프로브 조립체 제조방법 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR100972758B1 (ko) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20020037276A (ko) * | 2000-11-13 | 2002-05-18 | 에사시마사요시 | 접촉기, 접촉기의 제조 방법 및 접촉기를 사용한 프로브카드 |
| KR20020080950A (ko) * | 2001-04-18 | 2002-10-26 | 주식회사 아이씨멤즈 | 반도체 소자 테스트용 프로브 구조물 및 그 제조방법 |
| KR20040044808A (ko) * | 2002-11-22 | 2004-05-31 | 주식회사 파이컴 | 평판표시소자 검사용 프로브 시트 , 이의 제조방법, 이를구비한 프로브 조립체 |
-
2009
- 2009-06-01 KR KR1020090048178A patent/KR100972758B1/ko not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20020037276A (ko) * | 2000-11-13 | 2002-05-18 | 에사시마사요시 | 접촉기, 접촉기의 제조 방법 및 접촉기를 사용한 프로브카드 |
| KR20020080950A (ko) * | 2001-04-18 | 2002-10-26 | 주식회사 아이씨멤즈 | 반도체 소자 테스트용 프로브 구조물 및 그 제조방법 |
| KR20040044808A (ko) * | 2002-11-22 | 2004-05-31 | 주식회사 파이컴 | 평판표시소자 검사용 프로브 시트 , 이의 제조방법, 이를구비한 프로브 조립체 |
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