KR890702017A - 투광판재의 식별형 결점 검출장치 - Google Patents

투광판재의 식별형 결점 검출장치

Info

Publication number
KR890702017A
KR890702017A KR1019890700126A KR890700126A KR890702017A KR 890702017 A KR890702017 A KR 890702017A KR 1019890700126 A KR1019890700126 A KR 1019890700126A KR 890700126 A KR890700126 A KR 890700126A KR 890702017 A KR890702017 A KR 890702017A
Authority
KR
South Korea
Prior art keywords
light
detection device
defect detection
transmitting plate
identification defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
KR1019890700126A
Other languages
English (en)
Other versions
KR960012330B1 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP12808987A external-priority patent/JPH087159B2/ja
Priority claimed from JP62128090A external-priority patent/JPS63293449A/ja
Priority claimed from JP12963987A external-priority patent/JPH087160B2/ja
Priority claimed from JP12964487A external-priority patent/JPH087161B2/ja
Priority claimed from JP12964187A external-priority patent/JPH0778473B2/ja
Priority claimed from JP1987079978U external-priority patent/JPS63188549U/ja
Priority claimed from JP13152487A external-priority patent/JPH087162B2/ja
Application filed filed Critical
Publication of KR890702017A publication Critical patent/KR890702017A/ko
Publication of KR960012330B1 publication Critical patent/KR960012330B1/ko
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N2021/558—Measuring reflectivity and transmission

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1019890700126A 1987-05-27 1988-05-25 투광판재의 식별형 결점 검출 장치 Expired - Fee Related KR960012330B1 (ko)

Applications Claiming Priority (15)

Application Number Priority Date Filing Date Title
JP128,090 1987-05-27
JP12808987A JPH087159B2 (ja) 1987-05-27 1987-05-27 透光板材の識別型欠点検出装置
JP128,089 1987-05-27
JP62128090A JPS63293449A (ja) 1987-05-27 1987-05-27 ガラス板のドリップ検出装置
JP12964487A JPH087161B2 (ja) 1987-05-28 1987-05-28 識別型欠点検出装置の板厚補正装置
JP129,641 1987-05-28
JP12964187A JPH0778473B2 (ja) 1987-05-28 1987-05-28 識別型欠点検出装置の透過散乱光用ａｇｃ装置
JP129,639 1987-05-28
JP79,978 1987-05-28
JP129,644 1987-05-28
JP1987079978U JPS63188549U (ko) 1987-05-28 1987-05-28
JP12963987A JPH087160B2 (ja) 1987-05-28 1987-05-28 欠点デ−タ取込み回路
JP13152487A JPH087162B2 (ja) 1987-05-29 1987-05-29 欠点デ−タ取込み回路
JP131,524 1987-05-29
PCT/JP1988/000502 WO1988009497A1 (fr) 1987-05-27 1988-05-25 Detecteur discriminateur de defauts pour materiaux translucides en feuilles

Publications (2)

Publication Number Publication Date
KR890702017A true KR890702017A (ko) 1989-12-22
KR960012330B1 KR960012330B1 (ko) 1996-09-18

Family

ID=27565311

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890700126A Expired - Fee Related KR960012330B1 (ko) 1987-05-27 1988-05-25 투광판재의 식별형 결점 검출 장치

Country Status (5)

Country Link
US (1) US4914309A (ko)
EP (1) EP0315697B1 (ko)
KR (1) KR960012330B1 (ko)
DE (1) DE3882905T2 (ko)
WO (1) WO1988009497A1 (ko)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1988009310A1 (fr) * 1987-05-29 1988-12-01 Nippon Sheet Glass Co., Ltd. Systeme de prelevement de feuilles de verre
US5068523A (en) * 1990-03-02 1991-11-26 Intec Corp. Scanner detector array and light diffuser
JP2671241B2 (ja) * 1990-12-27 1997-10-29 日立電子エンジニアリング株式会社 ガラス板の異物検出装置
NL9100248A (nl) * 1991-02-13 1992-09-01 Philips & Du Pont Optical Inrichting voor het meten van de reflectie en/of transmissie van een voorwerp.
US5172421A (en) * 1991-03-27 1992-12-15 Hughes Aircraft Company Automated method of classifying optical fiber flaws
US5164603A (en) * 1991-07-16 1992-11-17 Reynolds Metals Company Modular surface inspection method and apparatus using optical fibers
JPH05249052A (ja) * 1992-03-06 1993-09-28 Nippon Sheet Glass Co Ltd 透光板材の欠点検出装置
EP0563897A1 (en) * 1992-03-30 1993-10-06 Fuji Photo Film Co., Ltd. Defect inspection system
FR2697086B1 (fr) * 1992-10-20 1994-12-09 Thomson Csf Procédé et dispositif d'inspection de matériau transparent.
CA2108940A1 (en) * 1992-11-13 1994-05-14 James W. Oram Material fault detector
JPH06207910A (ja) * 1993-01-11 1994-07-26 Fuji Photo Film Co Ltd 表面検査装置
AT402861B (de) * 1994-03-28 1997-09-25 Oesterr Forsch Seibersdorf Verfahren und anordnung zum erkennen bzw. zur kontrolle von flächenstrukturen bzw. der oberflächenbeschaffenheit
US5684707A (en) * 1994-10-03 1997-11-04 Westvaco Corporation Apparatus and method for analyzing paper surface topography
AUPQ262299A0 (en) * 1999-09-02 1999-09-23 Resolve Engineering Pty Ltd Detection of inclusions in glass
AU2000274686A1 (en) * 2000-08-09 2002-02-18 Turkiye Sise Ve Cam Fabrikalari A.S. Method and apparatus for imaging inhomogeneity in a transparent solid medium
US7342654B2 (en) * 2003-12-19 2008-03-11 International Business Machines Corporation Detection of impurities in cylindrically shaped transparent media
AT7890U1 (de) * 2004-08-05 2005-10-17 Binder Co Ag Verfahren zum detektieren und entfernen von fremdkörpern
KR101332786B1 (ko) * 2005-02-18 2013-11-25 쇼오트 아게 결함 검출 및/또는 분류 방법 및 장치
EP1857773A1 (en) * 2005-03-07 2007-11-21 Nippon Sheet Glass Company Limited Perspective distortion inspecting equipment and method of translucent panel
WO2007144777A2 (en) * 2006-03-30 2007-12-21 Orbotech, Ltd. Inspection system employing illumination that is selectable over a continuous range angles
US7929142B2 (en) * 2007-09-25 2011-04-19 Microsoft Corporation Photodiode-based bi-directional reflectance distribution function (BRDF) measurement
DE102008025870A1 (de) * 2008-05-31 2009-12-03 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
US8742385B2 (en) * 2011-01-26 2014-06-03 Honeywell Asca Inc. Beam distortion control system using fluid channels
US8553228B2 (en) * 2011-09-30 2013-10-08 3M Innovative Properties Company Web inspection calibration system and related methods
JP2014238534A (ja) 2013-06-10 2014-12-18 シャープ株式会社 光制御フィルムの検査装置および光制御フィルムの製造装置
JP6324114B2 (ja) 2014-02-28 2018-05-16 キヤノン株式会社 光学系および光沢計
JP6324113B2 (ja) * 2014-02-28 2018-05-16 キヤノン株式会社 光学系および光沢計
JP2016070782A (ja) * 2014-09-30 2016-05-09 株式会社Ｊｖｃケンウッド 分析装置及び分析方法
JP6146717B2 (ja) * 2014-12-24 2017-06-14 レーザーテック株式会社 検査装置、及び検査方法
US11774368B2 (en) 2022-01-03 2023-10-03 Rick Ross Light table apparatus and methods for inspecting heat exchanger plates for defects using light

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1401957A (en) * 1971-08-12 1975-08-06 Paint Research Ass Colourimeters
US3843890A (en) * 1973-07-27 1974-10-22 Du Pont Optical-electrical web inspection system
US3910701A (en) * 1973-07-30 1975-10-07 George R Henderson Method and apparatus for measuring light reflectance absorption and or transmission
US4033698A (en) * 1975-10-10 1977-07-05 International Business Machines Corporation Apparatus for textile color analysis
US3999864A (en) * 1975-11-17 1976-12-28 International Business Machines Corporation Gloss measuring instrument
GB1592449A (en) * 1976-12-01 1981-07-08 Ferranti Ltd Optical inspection apparatus
GB2004061B (en) * 1977-09-09 1982-03-10 Rank Organisation Ltd Optical sensing instrument
JPS54106289A (en) * 1978-02-07 1979-08-21 Nippon Sheet Glass Co Ltd Defect detector for glass sheet
US4247204A (en) * 1979-02-26 1981-01-27 Intec Corporation Method and apparatus for a web edge tracking flaw detection system
DE2910240A1 (de) * 1979-03-15 1980-09-25 Rolf Dr Bartke Vorrichtung zur ermittelung des reflexionsvermoegens der oberflaeche eines messobjektes
DE3006071C2 (de) * 1980-02-19 1987-05-27 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Lichtsammelanordnung in einer Vorrichtung zur Abtastung einer Fläche wie z.B. einer Materialbahn längs einer Geraden mittels eines Lichtstrahls
DE3043849A1 (de) * 1980-11-21 1982-07-08 Koninklijke Textielfabrieken Nijverdal-Ten Gate N.V., Almelo Verfahren zum beschauen einer reflektierenden und/oder transparenten, sich bewegenden bahn und beschaumaschine zur durchfuehrung des verfahrens
DE3226370A1 (de) * 1982-07-14 1984-01-19 Compur-Electronic GmbH, 8000 München Remissionsmesskopf
US4570074A (en) * 1982-09-29 1986-02-11 Q-Val Incorporated Flying spot scanner system
DE3334357C2 (de) * 1983-09-22 1986-04-10 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optisches Fehlersuchgerät für Bahnen
JP2946252B2 (ja) * 1991-07-12 1999-09-06 本田技研工業株式会社 摺動部材

Also Published As

Publication number Publication date
DE3882905T2 (de) 1994-03-10
EP0315697B1 (en) 1993-08-04
DE3882905D1 (de) 1993-09-09
KR960012330B1 (ko) 1996-09-18
US4914309A (en) 1990-04-03
EP0315697A4 (en) 1990-10-03
WO1988009497A1 (fr) 1988-12-01
EP0315697A1 (en) 1989-05-17

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