KR970054399A - 모스트랜지스터 제조 방법 - Google Patents
모스트랜지스터 제조 방법 Download PDFInfo
- Publication number
- KR970054399A KR970054399A KR1019950064437A KR19950064437A KR970054399A KR 970054399 A KR970054399 A KR 970054399A KR 1019950064437 A KR1019950064437 A KR 1019950064437A KR 19950064437 A KR19950064437 A KR 19950064437A KR 970054399 A KR970054399 A KR 970054399A
- Authority
- KR
- South Korea
- Prior art keywords
- impurity
- insulating film
- semiconductor substrate
- insulating layer
- mos transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/01—Manufacture or treatment
- H10D64/021—Manufacture or treatment using multiple gate spacer layers, e.g. bilayered sidewall spacers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6921—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
- H10P14/6922—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
- H10P14/6923—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC the material being boron or phosphorus doped silicon oxides, e.g. BPSG, BSG or PSG
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P30/00—Ion implantation into wafers, substrates or parts of devices
- H10P30/20—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/90—Thermal treatments, e.g. annealing or sintering
Landscapes
- Insulated Gate Type Field-Effect Transistor (AREA)
Abstract
Description
Claims (3)
- 모스트랜지스터 제조 방법에 있어서, 반도체 기판 상에 게이트 절연막과 게이트 전극을 패터닝하는 단계; 상기 게이트 전극 측벽에 불순물이 도핑된 절연막을 사용하여 스페이서를 형성하는 단계; 고농도 불순물 이온주입을 실시하는 단계; 열처리 공정을 통해 상기 불순물이 도핑된 절연막의 불순물을 상기 불순물이 도핑된 절연막과 접하고 있는 반도체 기판에 확산시키는 단계를 포함하는 것을 특징으로 하는 모스트랜지스터 제조 방법.
- 제1항에 있어서, 상기 열처리 공정은 금속열처리(RTA)로 1050℃에서 10초간 실시하는 것을 특징으로 하는 모스트랜지스터 제조 방법.
- 제1항에 있어서, 상기 불순물이 도핑된 절연막은 BSG막인 것을 특징으로 하는 모스트랜지스터 제조 방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950064437A KR970054399A (ko) | 1995-12-29 | 1995-12-29 | 모스트랜지스터 제조 방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950064437A KR970054399A (ko) | 1995-12-29 | 1995-12-29 | 모스트랜지스터 제조 방법 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR970054399A true KR970054399A (ko) | 1997-07-31 |
Family
ID=66623422
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019950064437A Abandoned KR970054399A (ko) | 1995-12-29 | 1995-12-29 | 모스트랜지스터 제조 방법 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR970054399A (ko) |
-
1995
- 1995-12-29 KR KR1019950064437A patent/KR970054399A/ko not_active Abandoned
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| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
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| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
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| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
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| PG1501 | Laying open of application |
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| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
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| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
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| PC1902 | Submission of document of abandonment before decision of registration |
St.27 status event code: N-1-6-B10-B11-nap-PC1902 |
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St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
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| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
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