MD3984G2 - Memorie operativă cu autotestare compactă - Google Patents

Memorie operativă cu autotestare compactă Download PDF

Info

Publication number
MD3984G2
MD3984G2 MDA20080195A MD20080195A MD3984G2 MD 3984 G2 MD3984 G2 MD 3984G2 MD A20080195 A MDA20080195 A MD A20080195A MD 20080195 A MD20080195 A MD 20080195A MD 3984 G2 MD3984 G2 MD 3984G2
Authority
MD
Moldova
Prior art keywords
line memory
group
testing
compact self
input
Prior art date
Application number
MDA20080195A
Other languages
English (en)
Russian (ru)
Other versions
MD3984F1 (ro
Inventor
Генадие БОДЯН
Original Assignee
Генадие БОДЯН
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Генадие БОДЯН filed Critical Генадие БОДЯН
Priority to MDA20080195A priority Critical patent/MD3984G2/ro
Publication of MD3984F1 publication Critical patent/MD3984F1/ro
Publication of MD3984G2 publication Critical patent/MD3984G2/ro

Links

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

Invenţia se referă la tehnica de calcul şi microelectronică şi poate fi aplicată la producerea şi exploatarea microcircuitelor cu mijloace compacte încorporate de testare şi diagnosticare.Dispozitivul conţine un registru de sincronizare (1), un contor (2), memorie operativă (3), un grup de bistabili (4.1 şi 4.2), un sumator XOR (5), o intrare de resetare (6), o intrare de sincronizare (7), o ieşire de indicare (8), un grup de multiplexoare (9.1 şi 9.2), o poartă logică OR (10), un grup de porţi logice XOR (11.1 şi 11.2), un multiplexor suplimentar (12), o intrare de selectare (13) şi o pereche de intrări de negaţie (14).
MDA20080195A 2008-07-14 2008-07-14 Memorie operativă cu autotestare compactă MD3984G2 (ro)

Priority Applications (1)

Application Number Priority Date Filing Date Title
MDA20080195A MD3984G2 (ro) 2008-07-14 2008-07-14 Memorie operativă cu autotestare compactă

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MDA20080195A MD3984G2 (ro) 2008-07-14 2008-07-14 Memorie operativă cu autotestare compactă

Publications (2)

Publication Number Publication Date
MD3984F1 MD3984F1 (ro) 2009-11-30
MD3984G2 true MD3984G2 (ro) 2010-06-30

Family

ID=43568832

Family Applications (1)

Application Number Title Priority Date Filing Date
MDA20080195A MD3984G2 (ro) 2008-07-14 2008-07-14 Memorie operativă cu autotestare compactă

Country Status (1)

Country Link
MD (1) MD3984G2 (ro)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RO102023A2 (ro) * 1988-05-30 1991-11-25 Institutul De Cercetare Stiintifica Si Inginerie Tehnologica Pentru Electrotehnica, Bucuresti, Ro Metoda si circuit electronic pentru controlul memoriilor semiconductoare, dinamice
SU1695394A1 (ru) * 1988-12-27 1991-11-30 Предприятие П/Я Р-6082 Запоминающее устройство с тестовым самоконтролем
MD1240G2 (ro) * 1998-07-22 1999-10-31 Генадие БОДЯН Metodă de testare a dispozitivului de memorie operativă
MD2088G2 (ro) * 2001-04-20 2003-08-31 Генадие БОДЯН Dispozitiv de diagnosticare pseudoinelară a memoriei operative
MD2292G2 (ro) * 2002-12-31 2004-05-31 Генадие БОДЯН Memorie operativă biport cu autotestare
MD3870F1 (ro) * 2007-03-06 2009-03-31 Ghenadie Bodean Memorie operativa cu autotestare si analiza de semnaturi

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RO102023A2 (ro) * 1988-05-30 1991-11-25 Institutul De Cercetare Stiintifica Si Inginerie Tehnologica Pentru Electrotehnica, Bucuresti, Ro Metoda si circuit electronic pentru controlul memoriilor semiconductoare, dinamice
SU1695394A1 (ru) * 1988-12-27 1991-11-30 Предприятие П/Я Р-6082 Запоминающее устройство с тестовым самоконтролем
MD1240G2 (ro) * 1998-07-22 1999-10-31 Генадие БОДЯН Metodă de testare a dispozitivului de memorie operativă
MD2088G2 (ro) * 2001-04-20 2003-08-31 Генадие БОДЯН Dispozitiv de diagnosticare pseudoinelară a memoriei operative
MD2292G2 (ro) * 2002-12-31 2004-05-31 Генадие БОДЯН Memorie operativă biport cu autotestare
MD3870F1 (ro) * 2007-03-06 2009-03-31 Ghenadie Bodean Memorie operativa cu autotestare si analiza de semnaturi

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
I. Klistorin, Gh. Bodean, O. Didenco. Defectările multiple RAM şi implementarea metodei de testare pseudoinelară. Chişinău, Acta Academia, 1997, p. 264 *
Klistorin I., Bodean Gh., Didenco O. Defectările multiple RAM şi implementarea metodei de testare pseudoinelară. Chişinău, Acta Academia, 1997, p. 264 *

Also Published As

Publication number Publication date
MD3984F1 (ro) 2009-11-30

Similar Documents

Publication Publication Date Title
Armstrong et al. American College of Sports Medicine position stand. Exertional heat illness during training and competition.
JP2010531002A5 (ro)
Moore et al. Balanced self-checking asynchronous logic for smart card applications
TWI373621B (en) Device for jitter measurement and method thereof
JP2010531000A5 (ro)
US8612815B2 (en) Asynchronous circuit with an at-speed built-in self-test (BIST) architecture
ATE465453T1 (de) Dma-übertragung von datensätzen und ein exklusives oder (xor) der datensätze
Deutsch et al. Massive signal tracing using on-chip DRAM for in-system silicon debug
TW200513655A (en) Self-heating burn-in
ATE436137T1 (de) Erkennung eines gleichzeitigen auftretens eines ereignisses an mehreren einrichtungen
TW200737739A (en) Concurrent code checker and hardware efficient high-speed I/O having built-in self-test and debug features
MD3984G2 (ro) Memorie operativă cu autotestare compactă
MD3870G2 (ro) Memorie operativă cu autotestare şi analiză de semnături
Knichel et al. The risk of outsourcing: Hidden SCA trojans in third-party IP-cores threaten cryptographic ICs
Liu et al. A low-overhead and high-reliability physical unclonable function (PUF) for cryptography
MD2292G2 (ro) Memorie operativă biport cu autotestare
Crouch et al. Fpga-based embedded tester with a p1687 command, control, and observe-system
DE602005012266D1 (de) Schaltungsanordnung und verfahren zum prüfen einerdungsschaltung
Voyiatzis et al. On the generation of SIC pairs in optimal time
Tsai et al. A chip architecture for compressive sensing based detection of IC trojans
Dadgour et al. A built-in aging detection and compensation technique for improving reliability of nanoscale CMOS designs
TW201334420A (zh) 決定延遲線結構之量測初始化的量測初始化路徑，以及於延遲線結構執行量測初始化的方法
MD2088F1 (ro) Dispozitiv de diagnosticare pseudoinelara a memoriei operative
MD1995G2 (ro) Memorie operativă cu autotestare
JP2007305126A (ja) 状態回復を有する回路エミュレーション

Legal Events

Date Code Title Description
FG4A Patent for invention issued
KA4A Patent for invention lapsed due to non-payment of fees (with right of restoration)
MM4A Patent for invention definitely lapsed due to non-payment of fees