MX2012011702A - Dispositivo de rayo plasmatico no termico como fuente de ionizacion espacial para espectrometria de masa ambiental y metodo para su aplicacion. - Google Patents

Dispositivo de rayo plasmatico no termico como fuente de ionizacion espacial para espectrometria de masa ambiental y metodo para su aplicacion.

Info

Publication number
MX2012011702A
MX2012011702A MX2012011702A MX2012011702A MX2012011702A MX 2012011702 A MX2012011702 A MX 2012011702A MX 2012011702 A MX2012011702 A MX 2012011702A MX 2012011702 A MX2012011702 A MX 2012011702A MX 2012011702 A MX2012011702 A MX 2012011702A
Authority
MX
Mexico
Prior art keywords
thermal plasma
plasma beam
plasma
discharge
allows
Prior art date
Application number
MX2012011702A
Other languages
English (en)
Inventor
Sandra Martínes Jarquín
Robert Winkler
Original Assignee
Ct De Investigación Y De Estudios Avanzados Del I P N
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ct De Investigación Y De Estudios Avanzados Del I P N filed Critical Ct De Investigación Y De Estudios Avanzados Del I P N
Priority to MX2012011702A priority Critical patent/MX2012011702A/es
Priority to EP13814219.5A priority patent/EP2904629B1/en
Priority to PCT/IB2013/059162 priority patent/WO2014057409A2/en
Priority to US14/433,008 priority patent/US9362100B2/en
Publication of MX2012011702A publication Critical patent/MX2012011702A/es

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00—Generating plasma; Handling plasma
    • H05H1/24—Generating plasma
    • H05H1/2406—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00—Generating plasma; Handling plasma
    • H05H1/24—Generating plasma
    • H05H1/2406—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
    • H05H1/2437—Multilayer systems
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00—Generating plasma; Handling plasma
    • H05H1/24—Generating plasma
    • H05H1/2406—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
    • H05H1/2443—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes the plasma fluid flowing through a dielectric tube

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Fluid Mechanics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

La presente invención se refiere a un dispositivo de rayo plasmático no térmico como fuente de ionización espacial para espectrometría de masas ambiental, de los del tipo que permiten el libre ajuste de la geometría del haz plasmático, en donde el dispositivo se comprende de una sonda de doble barrera dieléctrica de plasma no térmico o sonda NTP a partir de la cual se genera un rayo de plasma no térmico, un circuito transformador de alto voltaje y alta frecuencia al que se conecta un electrodo externo a través del cual es posible realizar una descarga para la ionización de un gas que produce plasma, estando dicho circuito generador de plasma a su vez conectado a una fuente de poder de corriente alterna, un electrodo interno que está conectado a tierra y permite llevar a cabo la descarga para la producción de plasma, un tanque de almacenamiento de un gas que sirve como gas de descarga, una muestra en estudio sobre la cual se aplica el rayo de plasma no térmico y un adaptador de transferencia de iones para dirigir los iones producidos por el dispositivo a partir de la muestra sin pérdida de vacío, hacia un analizador de masas. El dispositivo descrito permite analizar directamente muestras vivas (plantas, por ejemplo) sin causar daño en las mismas.
MX2012011702A 2012-10-08 2012-10-08 Dispositivo de rayo plasmatico no termico como fuente de ionizacion espacial para espectrometria de masa ambiental y metodo para su aplicacion. MX2012011702A (es)

Priority Applications (4)

Application Number Priority Date Filing Date Title
MX2012011702A MX2012011702A (es) 2012-10-08 2012-10-08 Dispositivo de rayo plasmatico no termico como fuente de ionizacion espacial para espectrometria de masa ambiental y metodo para su aplicacion.
EP13814219.5A EP2904629B1 (en) 2012-10-08 2013-10-07 Non-thermal plasma jet device as source of spatial ionization for ambient mass spectrometry and method of application
PCT/IB2013/059162 WO2014057409A2 (en) 2012-10-08 2013-10-07 Non-thermal plasma jet device as source of spatial ionization for ambient mass spectrometry and method of application
US14/433,008 US9362100B2 (en) 2012-10-08 2013-10-07 Non-thermal plasma jet device as source of spatial ionization for ambient mass spectrometry and method of application

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MX2012011702A MX2012011702A (es) 2012-10-08 2012-10-08 Dispositivo de rayo plasmatico no termico como fuente de ionizacion espacial para espectrometria de masa ambiental y metodo para su aplicacion.

Publications (1)

Publication Number Publication Date
MX2012011702A true MX2012011702A (es) 2014-04-24

Family

ID=49883150

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2012011702A MX2012011702A (es) 2012-10-08 2012-10-08 Dispositivo de rayo plasmatico no termico como fuente de ionizacion espacial para espectrometria de masa ambiental y metodo para su aplicacion.

Country Status (4)

Country Link
US (1) US9362100B2 (es)
EP (1) EP2904629B1 (es)
MX (1) MX2012011702A (es)
WO (1) WO2014057409A2 (es)

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AU2015218336B2 (en) * 2014-02-14 2019-08-15 Perkinelmer U.S. Llc Systems and methods for automated optimization of a multi-mode inductively coupled plasma mass spectrometer
GB2532195B (en) * 2014-11-04 2016-12-28 Fourth State Medicine Ltd Plasma generation
US9875884B2 (en) * 2015-02-28 2018-01-23 Agilent Technologies, Inc. Ambient desorption, ionization, and excitation for spectrometry
CN109414517A (zh) * 2016-06-30 2019-03-01 3M创新有限公司 等离子体灭菌系统和方法
EP3316278A1 (de) * 2016-10-26 2018-05-02 NovionX UG (haftungsbeschränkt) Verfahren zur spektrometrie
CN106998618B (zh) * 2017-05-27 2019-01-25 河北大学 一种产生波浪形等离子体的装置及方法
US20210391161A1 (en) * 2019-01-15 2021-12-16 Fluidigm Canada Inc. Direct ionization in imaging mass spectrometry operation
US11122790B2 (en) * 2019-12-30 2021-09-21 Nbs Tek Llc Cold plasma method and apparatus for eradication of the taxonomic class insecta
RU202393U1 (ru) * 2020-03-12 2021-02-16 Федеральное государственное автономное образовательное учреждение высшего образования "Балтийский федеральный университет имени Иммануила Канта" (БФУ им. И. Канта) Устройство для генерации потока нетермальной плазмы
WO2025003926A2 (en) * 2023-06-26 2025-01-02 Zolezzi Garreton Alfredo Plasma spectral analyzer
FR3164340A1 (fr) * 2024-07-04 2026-01-09 Ecole Polytechnique Dispositif à jet de plasma

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Publication number Priority date Publication date Assignee Title
GB8917570D0 (en) 1989-08-01 1989-09-13 Vg Instr Group Plasma source mass spectrometry
JP3240857B2 (ja) 1994-10-11 2001-12-25 株式会社日立製作所 プラズマイオン質量分析装置及びプラズマイオン質量分析方法
US5909086A (en) * 1996-09-24 1999-06-01 Jump Technologies Limited Plasma generator for generating unipolar plasma
JPH10241625A (ja) 1997-02-24 1998-09-11 Hitachi Ltd プラズマイオン源質量分析装置及び方法
US6265717B1 (en) 1998-07-15 2001-07-24 Agilent Technologies Inductively coupled plasma mass spectrometer and method
US6902646B2 (en) * 2003-08-14 2005-06-07 Advanced Energy Industries, Inc. Sensor array for measuring plasma characteristics in plasma processing environments
WO2009023361A2 (en) * 2007-06-01 2009-02-19 Purdue Research Foundation Discontinuous atmospheric pressure interface
US8519354B2 (en) * 2008-02-12 2013-08-27 Purdue Research Foundation Low temperature plasma probe and methods of use thereof
JP5098079B2 (ja) * 2008-06-27 2012-12-12 国立大学法人山梨大学 イオン化分析方法および装置
WO2010037238A1 (en) * 2008-10-03 2010-04-08 National Research Council Of Canada Plasma-based direct sampling of molecules for mass spectrometric analysis
US8330119B2 (en) * 2009-04-10 2012-12-11 Ohio University On-line and off-line coupling of EC with DESI-MS
WO2011106656A1 (en) * 2010-02-26 2011-09-01 Purdue Research Foundation (Prf) Systems and methods for sample analysis
EP3667697B1 (en) * 2011-01-20 2025-12-10 Purdue Research Foundation (Prf) Ion formation from an emitter by inductive voltage
JP5771458B2 (ja) * 2011-06-27 2015-09-02 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法
WO2013184320A1 (en) * 2012-06-06 2013-12-12 Purdue Research Foundation Ion focusing

Also Published As

Publication number Publication date
EP2904629A2 (en) 2015-08-12
WO2014057409A2 (en) 2014-04-17
US20150262804A1 (en) 2015-09-17
US9362100B2 (en) 2016-06-07
WO2014057409A3 (en) 2014-07-31
EP2904629B1 (en) 2018-12-12

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