MY132879A - Processor with bist function - Google Patents

Processor with bist function

Info

Publication number
MY132879A
MY132879A MYPI20001397A MYPI20001397A MY132879A MY 132879 A MY132879 A MY 132879A MY PI20001397 A MYPI20001397 A MY PI20001397A MY PI20001397 A MYPI20001397 A MY PI20001397A MY 132879 A MY132879 A MY 132879A
Authority
MY
Malaysia
Prior art keywords
random
processor
bist function
generates
testing
Prior art date
Application number
MYPI20001397A
Other languages
English (en)
Inventor
Hikone Kazunori
Nakao Michinobu
Hatayama Kazumi
Hotta Takashi
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of MY132879A publication Critical patent/MY132879A/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
  • Tests Of Electronic Circuits (AREA)
MYPI20001397A 1999-04-05 2000-04-04 Processor with bist function MY132879A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11097281A JP2000293394A (ja) 1999-04-05 1999-04-05 Ｂｉｓｔ機能付きプロセッサ

Publications (1)

Publication Number Publication Date
MY132879A true MY132879A (en) 2007-10-31

Family

ID=14188141

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI20001397A MY132879A (en) 1999-04-05 2000-04-04 Processor with bist function

Country Status (6)

Country Link
JP (1) JP2000293394A (ja)
KR (1) KR20010006956A (ja)
CN (1) CN1118024C (ja)
MY (1) MY132879A (ja)
SG (1) SG86385A1 (ja)
TW (1) TW472189B (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104461798B (zh) * 2014-11-12 2017-08-18 中国航天科技集团公司第九研究院第七七一研究所 一种用于处理器算术逻辑单元指令的随机数验证方法
CN105045696B (zh) * 2015-09-02 2018-08-07 中国航空工业集团公司航空动力控制系统研究所 一种cpu检测方法
JP6625381B2 (ja) * 2015-09-11 2019-12-25 ローム株式会社 半導体集積回路およびタイミングコントローラ
CN112416665B (zh) * 2019-08-20 2024-05-03 北京地平线机器人技术研发有限公司 检测处理器运行状态的装置和方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8507613D0 (en) * 1985-03-23 1985-05-01 Int Computers Ltd Testing digital integrated circuits
US4903266A (en) * 1988-04-29 1990-02-20 International Business Machines Corporation Memory self-test
JP2806210B2 (ja) * 1993-06-15 1998-09-30 富士通株式会社 マイクロプロセッサ
DE19911939C2 (de) * 1999-03-17 2001-03-22 Siemens Ag Verfahren für den eingebauten Selbsttest einer elektronischen Schaltung

Also Published As

Publication number Publication date
SG86385A1 (en) 2002-02-19
TW472189B (en) 2002-01-11
KR20010006956A (ko) 2001-01-26
CN1269546A (zh) 2000-10-11
CN1118024C (zh) 2003-08-13
JP2000293394A (ja) 2000-10-20

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