TW472189B - Processor with best function - Google Patents

Processor with best function Download PDF

Info

Publication number
TW472189B
TW472189B TW089106118A TW89106118A TW472189B TW 472189 B TW472189 B TW 472189B TW 089106118 A TW089106118 A TW 089106118A TW 89106118 A TW89106118 A TW 89106118A TW 472189 B TW472189 B TW 472189B
Authority
TW
Taiwan
Prior art keywords
instruction
data
random number
register
instructions
Prior art date
Application number
TW089106118A
Other languages
English (en)
Chinese (zh)
Inventor
Kazufumi Hikone
Norinobu Nakao
Kazumi Hatakeyama
Takashi Hotta
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of TW472189B publication Critical patent/TW472189B/zh

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Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
  • Tests Of Electronic Circuits (AREA)
TW089106118A 1999-04-05 2000-03-31 Processor with best function TW472189B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11097281A JP2000293394A (ja) 1999-04-05 1999-04-05 Ｂｉｓｔ機能付きプロセッサ

Publications (1)

Publication Number Publication Date
TW472189B true TW472189B (en) 2002-01-11

Family

ID=14188141

Family Applications (1)

Application Number Title Priority Date Filing Date
TW089106118A TW472189B (en) 1999-04-05 2000-03-31 Processor with best function

Country Status (6)

Country Link
JP (1) JP2000293394A (ja)
KR (1) KR20010006956A (ja)
CN (1) CN1118024C (ja)
MY (1) MY132879A (ja)
SG (1) SG86385A1 (ja)
TW (1) TW472189B (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104461798B (zh) * 2014-11-12 2017-08-18 中国航天科技集团公司第九研究院第七七一研究所 一种用于处理器算术逻辑单元指令的随机数验证方法
CN105045696B (zh) * 2015-09-02 2018-08-07 中国航空工业集团公司航空动力控制系统研究所 一种cpu检测方法
JP6625381B2 (ja) * 2015-09-11 2019-12-25 ローム株式会社 半導体集積回路およびタイミングコントローラ
CN112416665B (zh) * 2019-08-20 2024-05-03 北京地平线机器人技术研发有限公司 检测处理器运行状态的装置和方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8507613D0 (en) * 1985-03-23 1985-05-01 Int Computers Ltd Testing digital integrated circuits
US4903266A (en) * 1988-04-29 1990-02-20 International Business Machines Corporation Memory self-test
JP2806210B2 (ja) * 1993-06-15 1998-09-30 富士通株式会社 マイクロプロセッサ
DE19911939C2 (de) * 1999-03-17 2001-03-22 Siemens Ag Verfahren für den eingebauten Selbsttest einer elektronischen Schaltung

Also Published As

Publication number Publication date
MY132879A (en) 2007-10-31
SG86385A1 (en) 2002-02-19
KR20010006956A (ko) 2001-01-26
CN1269546A (zh) 2000-10-11
CN1118024C (zh) 2003-08-13
JP2000293394A (ja) 2000-10-20

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GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees