NL8901602A - Geintegreerde halfgeleider-schakeling voor thermische metingen. - Google Patents

Geintegreerde halfgeleider-schakeling voor thermische metingen. Download PDF

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Publication number
NL8901602A
NL8901602A NL8901602A NL8901602A NL8901602A NL 8901602 A NL8901602 A NL 8901602A NL 8901602 A NL8901602 A NL 8901602A NL 8901602 A NL8901602 A NL 8901602A NL 8901602 A NL8901602 A NL 8901602A
Authority
NL
Netherlands
Prior art keywords
signal
comparator
integrated semiconductor
temperature
semiconductor circuit
Prior art date
Application number
NL8901602A
Other languages
English (en)
Dutch (nl)
Original Assignee
Bronkhorst High Tech Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bronkhorst High Tech Bv filed Critical Bronkhorst High Tech Bv
Priority to NL8901602A priority Critical patent/NL8901602A/nl
Priority to DE90201455T priority patent/DE69002409T2/de
Priority to EP90201455A priority patent/EP0404218B1/de
Priority to ES90201455T priority patent/ES2043252T3/es
Priority to DK90201455.4T priority patent/DK0404218T3/da
Priority to AT90201455T priority patent/ATE92182T1/de
Priority to JP2161506A priority patent/JP2999227B2/ja
Priority to US07/542,177 priority patent/US5064296A/en
Publication of NL8901602A publication Critical patent/NL8901602A/nl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
    • G01F1/68—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using thermal effects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
    • G01F1/68—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using thermal effects
    • G01F1/696—Circuits therefor, e.g. constant-current flow meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K17/00—Measuring quantity of heat
    • G01K17/04—Calorimeters using compensation methods, i.e. where the absorbed or released quantity of heat to be measured is compensated by a measured quantity of heating or cooling

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Fluid Mechanics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Combustion & Propulsion (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Measuring Volume Flow (AREA)
  • Measuring Fluid Pressure (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
NL8901602A 1989-06-23 1989-06-23 Geintegreerde halfgeleider-schakeling voor thermische metingen. NL8901602A (nl)

Priority Applications (8)

Application Number Priority Date Filing Date Title
NL8901602A NL8901602A (nl) 1989-06-23 1989-06-23 Geintegreerde halfgeleider-schakeling voor thermische metingen.
DE90201455T DE69002409T2 (de) 1989-06-23 1990-06-07 Integrierte Halbleiterschaltung für thermische Messungen.
EP90201455A EP0404218B1 (de) 1989-06-23 1990-06-07 Integrierte Halbleiterschaltung für thermische Messungen
ES90201455T ES2043252T3 (es) 1989-06-23 1990-06-07 Circuito semiconductor integrado para medidas termicas.
DK90201455.4T DK0404218T3 (da) 1989-06-23 1990-06-07 Integreret halvlederkreds til termiske målinger
AT90201455T ATE92182T1 (de) 1989-06-23 1990-06-07 Integrierte halbleiterschaltung fuer thermische messungen.
JP2161506A JP2999227B2 (ja) 1989-06-23 1990-06-21 熱測定用集積半導体回路
US07/542,177 US5064296A (en) 1989-06-23 1990-06-22 Integrated semiconductor circuit for thermal measurements

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL8901602A NL8901602A (nl) 1989-06-23 1989-06-23 Geintegreerde halfgeleider-schakeling voor thermische metingen.
NL8901602 1989-06-23

Publications (1)

Publication Number Publication Date
NL8901602A true NL8901602A (nl) 1991-01-16

Family

ID=19854900

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8901602A NL8901602A (nl) 1989-06-23 1989-06-23 Geintegreerde halfgeleider-schakeling voor thermische metingen.

Country Status (8)

Country Link
US (1) US5064296A (de)
EP (1) EP0404218B1 (de)
JP (1) JP2999227B2 (de)
AT (1) ATE92182T1 (de)
DE (1) DE69002409T2 (de)
DK (1) DK0404218T3 (de)
ES (1) ES2043252T3 (de)
NL (1) NL8901602A (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5295746A (en) * 1992-02-05 1994-03-22 The United States Of America As Represented By The Secretary Of The Department Of Health And Human Services High resolution digital thermometer
US7216064B1 (en) * 1993-09-21 2007-05-08 Intel Corporation Method and apparatus for programmable thermal sensor for an integrated circuit
US5654507A (en) * 1996-07-03 1997-08-05 Board Of Trustees Operating Michigan State University Pulse width modulated constant temperature anemometer
US6055489A (en) * 1997-04-15 2000-04-25 Intel Corporation Temperature measurement and compensation scheme
US6363490B1 (en) 1999-03-30 2002-03-26 Intel Corporation Method and apparatus for monitoring the temperature of a processor
US6789037B2 (en) * 1999-03-30 2004-09-07 Intel Corporation Methods and apparatus for thermal management of an integrated circuit die
US6393374B1 (en) 1999-03-30 2002-05-21 Intel Corporation Programmable thermal management of an integrated circuit die
US7263567B1 (en) 2000-09-25 2007-08-28 Intel Corporation Method and apparatus for lowering the die temperature of a microprocessor and maintaining the temperature below the die burn out
RU2206878C1 (ru) * 2001-10-01 2003-06-20 ОАО Казанский вертолетный завод Способ измерения пространственного распределения температуры и устройство для его осуществления
US6749335B2 (en) * 2002-05-17 2004-06-15 Sun Microsystems, Inc. Adjustment and calibration system for post-fabrication treatment of on-chip temperature sensor
US6966693B2 (en) * 2003-01-14 2005-11-22 Hewlett-Packard Development Company, L.P. Thermal characterization chip
JP4790405B2 (ja) 2005-12-16 2011-10-12 三菱電機株式会社 熱式流量センサ
JP4796414B2 (ja) * 2006-03-14 2011-10-19 日本電波工業株式会社 水晶発振器
US7418878B2 (en) * 2006-09-19 2008-09-02 Los Robles Advertising, Inc. Universal sensor controller for a thermal anemometer
JP5633682B2 (ja) * 2010-06-03 2014-12-03 日産自動車株式会社 電力変換機の制御装置
JP5152538B2 (ja) * 2010-10-21 2013-02-27 横河電機株式会社 コリオリ質量流量計
US20130151319A1 (en) * 2011-12-07 2013-06-13 Yang Pan Predictable Method for Reducing Power Consumption during Peak Demand
WO2013170109A1 (en) * 2012-05-11 2013-11-14 Verto Medical Solutions, LLC Earphones and earbuds with physiologic sensors
US10022004B2 (en) * 2015-03-26 2018-07-17 Tini Topper Brands, LLC Drink lid

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4008617A (en) * 1975-01-09 1977-02-22 Filac Corporation Electronic thermometer and method
US4186384A (en) * 1975-06-24 1980-01-29 Honeywell Inc. Signal bias remover apparatus
US4045658A (en) * 1976-01-12 1977-08-30 Alnor Instrument Co. Digitized linearizing correction apparatus with frequency modulation
SU851117A1 (ru) * 1979-07-03 1981-07-30 Тернопольский Финансово-Экономи-Ческий Институт Устройство дл измерени темпера-ТуРы
NL177629C (nl) * 1979-07-09 1985-10-16 Brooks Instr Bv Richtingsgevoelige stroomsnelheidsmeter.
SU898266A1 (ru) * 1980-05-16 1982-01-15 Московский институт электронной техники Устройство дл измерени температурных полей
US4439756A (en) * 1982-01-20 1984-03-27 International Telephone And Telegraph Corporation Delta-Sigma modulator with switch capacitor implementation
US4651564A (en) * 1982-09-30 1987-03-24 Honeywell Inc. Semiconductor device
JPS601525A (ja) * 1983-06-20 1985-01-07 Nippon Soken Inc 半導体式流量検出装置
FR2567642B1 (fr) * 1984-07-10 1989-08-04 Renault Capteur de debit de fluide a point de transition thermique
JPH0813004B2 (ja) * 1984-09-07 1996-02-07 株式会社日立製作所 Ａ／ｄ変換器
SU1364911A1 (ru) * 1986-07-14 1988-01-07 Институт Электродинамики Ан Усср Способ определени температуры
US4866442A (en) * 1987-06-01 1989-09-12 Steim Joseph M Analog to digital converter employing delta-sigma modulation
US4782708A (en) * 1987-08-27 1988-11-08 General Motors Corporation Thermocouple sensors
NL8702229A (nl) * 1987-09-18 1989-04-17 Bronkhorst High Tech Bv Richtingsgevoelige stroomsnelheidsmeter.

Also Published As

Publication number Publication date
ATE92182T1 (de) 1993-08-15
JPH0342534A (ja) 1991-02-22
EP0404218B1 (de) 1993-07-28
DE69002409D1 (de) 1993-09-02
US5064296A (en) 1991-11-12
JP2999227B2 (ja) 2000-01-17
DE69002409T2 (de) 1993-12-02
ES2043252T3 (es) 1993-12-16
EP0404218A1 (de) 1990-12-27
DK0404218T3 (da) 1993-11-15

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