PT101364A - Metodo e aparelho proprios para a monitoragem da espessura de peliculas finas, e metodo de aplicacao de um revestimento transparente num substrato em forma de folha - Google Patents

Metodo e aparelho proprios para a monitoragem da espessura de peliculas finas, e metodo de aplicacao de um revestimento transparente num substrato em forma de folha

Info

Publication number
PT101364A
PT101364A PT101364A PT10136493A PT101364A PT 101364 A PT101364 A PT 101364A PT 101364 A PT101364 A PT 101364A PT 10136493 A PT10136493 A PT 10136493A PT 101364 A PT101364 A PT 101364A
Authority
PT
Portugal
Prior art keywords
monitoring
applying
thin film
film thickness
sheet form
Prior art date
Application number
PT101364A
Other languages
English (en)
Other versions
PT101364B (pt
Inventor
Guy Renard
Michel Hannotiau
Bobert Terneu
Original Assignee
Glaverbel
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Glaverbel filed Critical Glaverbel
Publication of PT101364A publication Critical patent/PT101364A/pt
Publication of PT101364B publication Critical patent/PT101364B/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Surface Treatment Of Glass (AREA)
  • Physical Vapour Deposition (AREA)
PT101364A 1992-09-15 1993-09-13 Metodo e aparelho proprios para a monitoragem da espessura de peliculas finas, e metodo de aplicacao de um revestimento transparente num substrato em forma de folha PT101364B (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB929219450A GB9219450D0 (en) 1992-09-15 1992-09-15 Thin film thickness monitoring and control

Publications (2)

Publication Number Publication Date
PT101364A true PT101364A (pt) 1994-12-30
PT101364B PT101364B (pt) 1999-11-30

Family

ID=10721896

Family Applications (1)

Application Number Title Priority Date Filing Date
PT101364A PT101364B (pt) 1992-09-15 1993-09-13 Metodo e aparelho proprios para a monitoragem da espessura de peliculas finas, e metodo de aplicacao de um revestimento transparente num substrato em forma de folha

Country Status (17)

Country Link
US (1) US5396080A (pt)
JP (1) JPH06201333A (pt)
CN (1) CN1049045C (pt)
AU (1) AU664474B2 (pt)
BE (1) BE1006795A3 (pt)
CA (1) CA2105635A1 (pt)
CZ (1) CZ289962B6 (pt)
DE (1) DE4331355A1 (pt)
ES (1) ES2078864B1 (pt)
FI (1) FI933971A7 (pt)
FR (1) FR2695721B1 (pt)
GB (2) GB9219450D0 (pt)
IT (1) IT1261253B (pt)
LU (1) LU88402A1 (pt)
NL (1) NL194246C (pt)
PT (1) PT101364B (pt)
SE (1) SE515115C2 (pt)

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CN114292032B (zh) * 2021-12-30 2023-07-25 凯盛信息显示材料(洛阳)有限公司 一种导电玻璃的在线镀膜方法及在线镀膜装置
JPWO2023210153A1 (pt) * 2022-04-27 2023-11-02
CN115046588A (zh) * 2022-06-19 2022-09-13 上海市建筑科学研究院有限公司 钢构件防火防腐涂层厚度和缺陷的检测方法
CN115807219B (zh) * 2023-02-13 2023-05-30 南昌大学 一种光电薄膜材料制备控制系统及方法
CN116603716B (zh) * 2023-04-28 2024-03-29 宁波市融嘉轻合金科技有限公司 一种压铸件表面处理方法、系统、智能终端及存储介质
CN117865447A (zh) * 2023-12-29 2024-04-12 威海中玻新材料技术研发有限公司 浮法在线镀膜热端实时质量检测装置
CN118051069B (zh) * 2024-03-29 2024-07-16 广州泽亨实业有限公司 一种涂层厚度自动控制方法和系统

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Also Published As

Publication number Publication date
ITTO930654A1 (it) 1995-03-08
CN1085655A (zh) 1994-04-20
DE4331355A1 (de) 1994-03-17
LU88402A1 (fr) 1995-04-05
GB9219450D0 (en) 1992-10-28
JPH06201333A (ja) 1994-07-19
SE9302985L (sv) 1994-03-16
FR2695721B1 (fr) 1995-02-24
AU4487393A (en) 1994-03-24
CZ289962B6 (cs) 2002-05-15
CZ9301924A3 (cs) 2001-12-12
BE1006795A3 (fr) 1994-12-13
NL194246C (nl) 2001-10-02
GB2270561A (en) 1994-03-16
GB2270561B (en) 1996-07-17
AU664474B2 (en) 1995-11-16
NL194246B (nl) 2001-06-01
ES2078864R (pt) 1996-12-16
NL9301577A (nl) 1994-04-05
FI933971A7 (fi) 1994-03-16
PT101364B (pt) 1999-11-30
ES2078864A2 (es) 1995-12-16
CA2105635A1 (en) 1994-03-16
IT1261253B (it) 1996-05-09
FI933971A0 (fi) 1993-09-10
US5396080A (en) 1995-03-07
GB9318814D0 (en) 1993-10-27
SE515115C2 (sv) 2001-06-11
SE9302985D0 (sv) 1993-09-14
ITTO930654A0 (it) 1993-09-08
FR2695721A1 (fr) 1994-03-18
CN1049045C (zh) 2000-02-02
ES2078864B1 (es) 1997-05-16

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