SE9302985D0 - Thin film thickness monitoring - Google Patents
Thin film thickness monitoringInfo
- Publication number
- SE9302985D0 SE9302985D0 SE9302985A SE9302985A SE9302985D0 SE 9302985 D0 SE9302985 D0 SE 9302985D0 SE 9302985 A SE9302985 A SE 9302985A SE 9302985 A SE9302985 A SE 9302985A SE 9302985 D0 SE9302985 D0 SE 9302985D0
- Authority
- SE
- Sweden
- Prior art keywords
- coating
- lies
- monitoring
- range
- discrete
- Prior art date
Links
- 238000012544 monitoring process Methods 0.000 title abstract 7
- 239000010409 thin film Substances 0.000 title 1
- 238000000576 coating method Methods 0.000 abstract 5
- 239000011248 coating agent Substances 0.000 abstract 4
- 238000000034 method Methods 0.000 abstract 2
- 238000005259 measurement Methods 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Surface Treatment Of Glass (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB929219450A GB9219450D0 (en) | 1992-09-15 | 1992-09-15 | Thin film thickness monitoring and control |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| SE9302985D0 true SE9302985D0 (sv) | 1993-09-14 |
| SE9302985L SE9302985L (sv) | 1994-03-16 |
| SE515115C2 SE515115C2 (sv) | 2001-06-11 |
Family
ID=10721896
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE9302985A SE515115C2 (sv) | 1992-09-15 | 1993-09-14 | Metod och anordning att anbringa och övervaka tunna filmer och deras tjocklek på ett skivformat substrat |
Country Status (17)
| Country | Link |
|---|---|
| US (1) | US5396080A (sv) |
| JP (1) | JPH06201333A (sv) |
| CN (1) | CN1049045C (sv) |
| AU (1) | AU664474B2 (sv) |
| BE (1) | BE1006795A3 (sv) |
| CA (1) | CA2105635A1 (sv) |
| CZ (1) | CZ289962B6 (sv) |
| DE (1) | DE4331355A1 (sv) |
| ES (1) | ES2078864B1 (sv) |
| FI (1) | FI933971A7 (sv) |
| FR (1) | FR2695721B1 (sv) |
| GB (2) | GB9219450D0 (sv) |
| IT (1) | IT1261253B (sv) |
| LU (1) | LU88402A1 (sv) |
| NL (1) | NL194246C (sv) |
| PT (1) | PT101364B (sv) |
| SE (1) | SE515115C2 (sv) |
Families Citing this family (79)
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| DE4413745A1 (de) * | 1994-04-20 | 1995-10-26 | Gramm Gmbh & Co Kg | Verfahren und Vorrichtung zur Kontrolle der Oberfläche von Gegenständen |
| JP2648098B2 (ja) * | 1994-07-29 | 1997-08-27 | 日本電気株式会社 | 薄膜形成装置 |
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| DE19509345A1 (de) * | 1995-03-15 | 1996-09-19 | Ver Glaswerke Gmbh | Verfahren zum Erkennen und Bewerten von Fehlern in teilreflektierenden Oberflächenschichten |
| US5619330A (en) * | 1995-12-22 | 1997-04-08 | Thomson Consumer Electronics, Inc. | Method and apparatus for determining thickness of an OPC layer on a CRT faceplate panel |
| DE19735246C2 (de) * | 1997-08-14 | 1999-07-15 | Bayern Freistaat | Verfahren zur Bestimmung eines Volumens |
| DE19821401C2 (de) * | 1998-05-13 | 2000-05-18 | Storz Endoskop Gmbh Schaffhaus | Endoskop zur Inspektion eines Beobachtungsraumes |
| US6392756B1 (en) | 1999-06-18 | 2002-05-21 | N&K Technology, Inc. | Method and apparatus for optically determining physical parameters of thin films deposited on a complex substrate |
| EP1069401A1 (en) * | 1999-07-13 | 2001-01-17 | ODME International B.V. | Optical film thickness measuring device |
| US6091485A (en) * | 1999-12-15 | 2000-07-18 | N & K Technology, Inc. | Method and apparatus for optically determining physical parameters of underlayers |
| US6472238B1 (en) * | 2000-02-09 | 2002-10-29 | Therma-Wave, Inc. | Evaluation of etching processes in semiconductors |
| US6570650B1 (en) * | 2001-06-21 | 2003-05-27 | Kla-Tenor Corporation | Apparatus and methods for reducing thin film color variation in optical inspection of semiconductor devices and other surfaces |
| US6825933B2 (en) | 2002-06-07 | 2004-11-30 | N&K Technology, Inc. | Computer-implemented reflectance system and method for non-destructive low dose ion implantation monitoring |
| KR101188356B1 (ko) | 2003-12-02 | 2012-10-08 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 레이저 조사장치, 레이저 조사방법 및 반도체장치의제조방법 |
| EP1553643A3 (en) | 2003-12-26 | 2009-01-21 | Sel Semiconductor Energy Laboratory Co., Ltd. | Laser irradiation method and method for manufacturing crystalline semiconductor film |
| ATE386144T1 (de) * | 2004-06-01 | 2008-03-15 | Applied Materials Gmbh & Co Kg | Messvorrichtung für die messung des transmissionsgrads einer beschichtung |
| DE102004034693B4 (de) * | 2004-07-17 | 2006-05-18 | Schott Ag | Verfahren und Vorrichtung zur berührungslosen optischen Messung der Dicke von heißen Glaskörpern mittels der chromatischen Aberration |
| DE102004037555B4 (de) * | 2004-08-03 | 2012-09-06 | Erlus Aktiengesellschaft | Verfahren zur berührungslosen und/oder zerstörungsfreien Prüfung einer photokatalytischen Oberflächenbeschichtung |
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| JP4930748B2 (ja) * | 2005-01-28 | 2012-05-16 | 大日本印刷株式会社 | 被膜検査装置および方法 |
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| EP2257970A4 (en) | 2008-03-05 | 2015-09-02 | Hanergy Hi Tech Power Hk Ltd | BUFFER LAYER DEPOSITION FOR THIN FILM SOLAR CELLS |
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| EP2251455B1 (en) | 2009-05-13 | 2017-09-06 | SiO2 Medical Products, Inc. | PECVD coating using an organosilicon precursor |
| US7985188B2 (en) * | 2009-05-13 | 2011-07-26 | Cv Holdings Llc | Vessel, coating, inspection and processing apparatus |
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| US11624115B2 (en) | 2010-05-12 | 2023-04-11 | Sio2 Medical Products, Inc. | Syringe with PECVD lubrication |
| US9066072B2 (en) * | 2010-07-20 | 2015-06-23 | Semiconductor Components Industries, Llc | Systems and methods for calibrating image sensors |
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| US9878101B2 (en) | 2010-11-12 | 2018-01-30 | Sio2 Medical Products, Inc. | Cyclic olefin polymer vessels and vessel coating methods |
| US9272095B2 (en) | 2011-04-01 | 2016-03-01 | Sio2 Medical Products, Inc. | Vessels, contact surfaces, and coating and inspection apparatus and methods |
| US8982362B2 (en) * | 2011-10-04 | 2015-03-17 | First Solar, Inc. | System and method for measuring layer thickness and depositing semiconductor layers |
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| US11116695B2 (en) | 2011-11-11 | 2021-09-14 | Sio2 Medical Products, Inc. | Blood sample collection tube |
| US8666202B2 (en) | 2012-02-20 | 2014-03-04 | Cardinal Ig Company | System and method for measuring properties of a thin film coated glass |
| US8855450B2 (en) | 2012-02-20 | 2014-10-07 | Cardinal Cg Company | System and method for measuring properties of a thin film coated glass |
| CA2887352A1 (en) | 2012-05-09 | 2013-11-14 | Sio2 Medical Products, Inc. | Saccharide protective coating for pharmaceutical package |
| US20150297800A1 (en) | 2012-07-03 | 2015-10-22 | Sio2 Medical Products, Inc. | SiOx BARRIER FOR PHARMACEUTICAL PACKAGE AND COATING PROCESS |
| KR101897835B1 (ko) * | 2012-07-24 | 2018-09-12 | 삼성에스디아이 주식회사 | 극판 두께 측정 장치 및 방법 |
| JP6509734B2 (ja) | 2012-11-01 | 2019-05-08 | エスアイオーツー・メディカル・プロダクツ・インコーポレイテッド | 皮膜検査方法 |
| US9903782B2 (en) | 2012-11-16 | 2018-02-27 | Sio2 Medical Products, Inc. | Method and apparatus for detecting rapid barrier coating integrity characteristics |
| WO2014085348A2 (en) | 2012-11-30 | 2014-06-05 | Sio2 Medical Products, Inc. | Controlling the uniformity of pecvd deposition on medical syringes, cartridges, and the like |
| US9764093B2 (en) | 2012-11-30 | 2017-09-19 | Sio2 Medical Products, Inc. | Controlling the uniformity of PECVD deposition |
| EP2961858B1 (en) | 2013-03-01 | 2022-09-07 | Si02 Medical Products, Inc. | Coated syringe. |
| CN105392916B (zh) | 2013-03-11 | 2019-03-08 | Sio2医药产品公司 | 涂布包装材料 |
| US9937099B2 (en) | 2013-03-11 | 2018-04-10 | Sio2 Medical Products, Inc. | Trilayer coated pharmaceutical packaging with low oxygen transmission rate |
| EP2971227B1 (en) | 2013-03-15 | 2017-11-15 | Si02 Medical Products, Inc. | Coating method. |
| DE102014100594A1 (de) * | 2014-01-20 | 2015-07-23 | Isra Surface Vision Gmbh | Vorrichtung zur Inspektion eines mit einer beschichteten Oberfläche versehenen Materials und entsprechendes Verfahren |
| US9996765B2 (en) | 2014-03-12 | 2018-06-12 | The Sherwin-Williams Company | Digital imaging for determining mix ratio of a coating |
| SG11201607524QA (en) * | 2014-03-12 | 2016-10-28 | Sherwin Williams Co | Real-time digitally enhanced imaging for the prediction, application, and inspection of coatings |
| US11066745B2 (en) | 2014-03-28 | 2021-07-20 | Sio2 Medical Products, Inc. | Antistatic coatings for plastic vessels |
| WO2015165503A1 (en) * | 2014-04-29 | 2015-11-05 | Hewlett-Packard Indigo B.V. | Transparent layer thickness measurement |
| PL3218317T3 (pl) | 2014-11-13 | 2019-03-29 | Gerresheimer Glas Gmbh | Filtr cząstek urządzenia do wytwarzania szkła, jednostka tłoka, głowica dmuchu, wspornik głowicy dmuchu i urządzenie do wytwarzania szkła, przystosowane lub zawierające filtr |
| CN105115430B (zh) * | 2015-05-26 | 2016-08-31 | 山东建筑大学 | 一种点栅透射式化学药液涂抹均匀性检测方法及装置 |
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| JP2017013408A (ja) | 2015-07-02 | 2017-01-19 | 株式会社リコー | 被処理物改質装置、被処理物改質システム、画像形成システムおよび画像形成方法 |
| US11077233B2 (en) | 2015-08-18 | 2021-08-03 | Sio2 Medical Products, Inc. | Pharmaceutical and other packaging with low oxygen transmission rate |
| EP3400430A4 (en) * | 2016-01-07 | 2019-11-06 | Arkema, Inc. | OBJECT-POSITION-INDEPENDENT METHOD FOR MEASURING THE THICKNESS OF COATINGS THAT ON CURED OBJECTS MOVING AT HIGH SPEEDS |
| EP3400431B1 (en) * | 2016-01-07 | 2022-03-23 | Arkema, Inc. | Optical method to measure the thickness of coatings deposited on substrates |
| US11125549B2 (en) | 2016-01-07 | 2021-09-21 | Arkema Inc. | Optical intensity method to measure the thickness of coatings deposited on substrates |
| CN107179055B (zh) * | 2017-05-28 | 2019-11-01 | 中国计量大学 | 用于bopp薄膜生产的薄膜厚度监测方法 |
| CN107782280B (zh) * | 2017-10-20 | 2020-09-01 | 维沃移动通信有限公司 | 一种贴膜厚度的检测方法和移动终端 |
| WO2019099415A1 (en) * | 2017-11-14 | 2019-05-23 | Kateeva, Inc. | Systems and methods for profiling material layers on a substrate |
| US10138539B1 (en) * | 2018-04-03 | 2018-11-27 | Shiping Cheng | Method of managing coating uniformity with an optical thickness monitoring system |
| DE102018110931C5 (de) | 2018-05-07 | 2023-06-29 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren und System zum Erfassen der Oberflächenbelegung einer Beschichtung auf einer Oberfläche eines bandförmigen Prüflings |
| US12265327B2 (en) * | 2018-07-30 | 2025-04-01 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor manufacturing apparatus and method thereof |
| DE102019112238A1 (de) * | 2019-05-10 | 2020-11-12 | HELLA GmbH & Co. KGaA | Verfahren zur Kontrolle der Beschichtung eines elektronischen Bauteils |
| DE102019114242A1 (de) * | 2019-05-28 | 2020-12-03 | Infineon Technologies Ag | Verfahren zum bereitstellen von beschichteten leadframes oder zum messen einer adhäsionskraft eines verkapselungsmittels auf einem leadframe |
| JP7400617B2 (ja) * | 2020-05-08 | 2023-12-19 | コニカミノルタ株式会社 | 被覆率検出装置、画像形成装置、被覆率検出方法、および被覆率検出プログラム |
| FR3116118B1 (fr) * | 2020-11-12 | 2024-07-12 | Exelsius | Dispositif de caractérisation de l’état de réticulation d’un matériau d’un objet. |
| CN114292032B (zh) * | 2021-12-30 | 2023-07-25 | 凯盛信息显示材料(洛阳)有限公司 | 一种导电玻璃的在线镀膜方法及在线镀膜装置 |
| JPWO2023210153A1 (sv) * | 2022-04-27 | 2023-11-02 | ||
| CN115046588A (zh) * | 2022-06-19 | 2022-09-13 | 上海市建筑科学研究院有限公司 | 钢构件防火防腐涂层厚度和缺陷的检测方法 |
| CN115807219B (zh) * | 2023-02-13 | 2023-05-30 | 南昌大学 | 一种光电薄膜材料制备控制系统及方法 |
| CN116603716B (zh) * | 2023-04-28 | 2024-03-29 | 宁波市融嘉轻合金科技有限公司 | 一种压铸件表面处理方法、系统、智能终端及存储介质 |
| CN117865447A (zh) * | 2023-12-29 | 2024-04-12 | 威海中玻新材料技术研发有限公司 | 浮法在线镀膜热端实时质量检测装置 |
| CN118051069B (zh) * | 2024-03-29 | 2024-07-16 | 广州泽亨实业有限公司 | 一种涂层厚度自动控制方法和系统 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2229323A5 (sv) * | 1973-01-11 | 1974-12-06 | Saint Gobain | |
| US3892490A (en) * | 1974-03-06 | 1975-07-01 | Minolta Camera Kk | Monitoring system for coating a substrate |
| GB2016678B (en) * | 1978-03-10 | 1982-09-15 | Asahi Dow Ltd | Infrared multilayer film thickness measuring method and apparatus |
| US4355903A (en) * | 1980-02-08 | 1982-10-26 | Rca Corporation | Thin film thickness monitor |
| JPS5830605A (ja) * | 1981-08-18 | 1983-02-23 | Kawasaki Steel Corp | 表面被膜厚さ測定方法 |
| JPS5840973A (ja) * | 1981-09-03 | 1983-03-10 | Toshiba Corp | 光学式情報読取装置 |
| JPS617445A (ja) * | 1984-06-21 | 1986-01-14 | Toshiba Corp | 銅酸化被膜の酸化度判別装置 |
| GB8528448D0 (en) * | 1985-11-19 | 1985-12-24 | Infrared Eng Ltd | Absorption gauge |
| US4785336A (en) * | 1986-12-04 | 1988-11-15 | Libbey-Owens-Ford Co. | Device for monitoring characteristics of a film on a substrate |
| US4748329A (en) * | 1987-02-17 | 1988-05-31 | Canadian Patents And Development Ltd. | Method for on-line thickness monitoring of a transparent film |
| ES2007965A6 (es) * | 1988-07-15 | 1989-07-01 | Serrano Juan Jose Monzon | Procedimiento y aparato para medir simultaneamente el indice de refraccion, el coeficiente de absorcion y el espesor de laminas planoparalelas. |
| US4977330A (en) * | 1989-02-13 | 1990-12-11 | Batchelder Tom W | In-line photoresist thickness monitor |
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| DE4017440C2 (de) * | 1990-05-30 | 1994-02-10 | Fraunhofer Ges Forschung | Verfahren zur Messung der Schichtdicke und des Brechungsindex einer dünnen Schicht auf einem Substrat und Vorrichtung zur Durchführung des Verfahrens |
| IL96483A (en) * | 1990-11-27 | 1995-07-31 | Orbotech Ltd | Optical inspection method and apparatus |
-
1992
- 1992-09-15 GB GB929219450A patent/GB9219450D0/en active Pending
-
1993
- 1993-08-24 AU AU44873/93A patent/AU664474B2/en not_active Ceased
- 1993-09-07 BE BE9300919A patent/BE1006795A3/fr not_active IP Right Cessation
- 1993-09-07 CA CA002105635A patent/CA2105635A1/en not_active Abandoned
- 1993-09-08 FR FR9310761A patent/FR2695721B1/fr not_active Expired - Fee Related
- 1993-09-08 LU LU88402A patent/LU88402A1/fr unknown
- 1993-09-08 IT ITTO930654A patent/IT1261253B/it active IP Right Grant
- 1993-09-09 JP JP5249866A patent/JPH06201333A/ja active Pending
- 1993-09-10 GB GB9318814A patent/GB2270561B/en not_active Expired - Fee Related
- 1993-09-10 FI FI933971A patent/FI933971A7/fi unknown
- 1993-09-13 NL NL9301577A patent/NL194246C/nl active Search and Examination
- 1993-09-13 PT PT101364A patent/PT101364B/pt active IP Right Grant
- 1993-09-14 ES ES09301955A patent/ES2078864B1/es not_active Expired - Lifetime
- 1993-09-14 US US08/120,359 patent/US5396080A/en not_active Expired - Fee Related
- 1993-09-14 CN CN93117694A patent/CN1049045C/zh not_active Expired - Fee Related
- 1993-09-14 SE SE9302985A patent/SE515115C2/sv not_active IP Right Cessation
- 1993-09-15 CZ CZ19931924A patent/CZ289962B6/cs not_active IP Right Cessation
- 1993-09-15 DE DE4331355A patent/DE4331355A1/de not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| ITTO930654A1 (it) | 1995-03-08 |
| CN1085655A (zh) | 1994-04-20 |
| DE4331355A1 (de) | 1994-03-17 |
| LU88402A1 (fr) | 1995-04-05 |
| GB9219450D0 (en) | 1992-10-28 |
| JPH06201333A (ja) | 1994-07-19 |
| SE9302985L (sv) | 1994-03-16 |
| FR2695721B1 (fr) | 1995-02-24 |
| AU4487393A (en) | 1994-03-24 |
| PT101364A (pt) | 1994-12-30 |
| CZ289962B6 (cs) | 2002-05-15 |
| CZ9301924A3 (cs) | 2001-12-12 |
| BE1006795A3 (fr) | 1994-12-13 |
| NL194246C (nl) | 2001-10-02 |
| GB2270561A (en) | 1994-03-16 |
| GB2270561B (en) | 1996-07-17 |
| AU664474B2 (en) | 1995-11-16 |
| NL194246B (nl) | 2001-06-01 |
| ES2078864R (sv) | 1996-12-16 |
| NL9301577A (nl) | 1994-04-05 |
| FI933971A7 (fi) | 1994-03-16 |
| PT101364B (pt) | 1999-11-30 |
| ES2078864A2 (es) | 1995-12-16 |
| CA2105635A1 (en) | 1994-03-16 |
| IT1261253B (it) | 1996-05-09 |
| FI933971A0 (fi) | 1993-09-10 |
| US5396080A (en) | 1995-03-07 |
| GB9318814D0 (en) | 1993-10-27 |
| SE515115C2 (sv) | 2001-06-11 |
| ITTO930654A0 (it) | 1993-09-08 |
| FR2695721A1 (fr) | 1994-03-18 |
| CN1049045C (zh) | 2000-02-02 |
| ES2078864B1 (es) | 1997-05-16 |
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