SE0600946L - Förfarande vid spektrometri för undersökning av prover, där provet innehåller åtminstone två grundämnen - Google Patents

Förfarande vid spektrometri för undersökning av prover, där provet innehåller åtminstone två grundämnen

Info

Publication number
SE0600946L
SE0600946L SE0600946A SE0600946A SE0600946L SE 0600946 L SE0600946 L SE 0600946L SE 0600946 A SE0600946 A SE 0600946A SE 0600946 A SE0600946 A SE 0600946A SE 0600946 L SE0600946 L SE 0600946L
Authority
SE
Sweden
Prior art keywords
stage
basic
calculated
basic bodies
intensity
Prior art date
Application number
SE0600946A
Other languages
English (en)
Other versions
SE529264C2 (sv
Inventor
Johan Malmqvist
Lars Kumbrandt
Original Assignee
Xrf Analytical Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xrf Analytical Ab filed Critical Xrf Analytical Ab
Priority to SE0600946A priority Critical patent/SE0600946L/sv
Priority to PCT/SE2007/050240 priority patent/WO2007126371A1/en
Priority to EP07748401A priority patent/EP2013610A4/en
Priority to JP2009507641A priority patent/JP2009535619A/ja
Priority to US12/298,685 priority patent/US8119415B2/en
Publication of SE529264C2 publication Critical patent/SE529264C2/sv
Publication of SE0600946L publication Critical patent/SE0600946L/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
SE0600946A 2006-04-28 2006-04-28 Förfarande vid spektrometri för undersökning av prover, där provet innehåller åtminstone två grundämnen SE0600946L (sv)

Priority Applications (5)

Application Number Priority Date Filing Date Title
SE0600946A SE0600946L (sv) 2006-04-28 2006-04-28 Förfarande vid spektrometri för undersökning av prover, där provet innehåller åtminstone två grundämnen
PCT/SE2007/050240 WO2007126371A1 (en) 2006-04-28 2007-04-12 Method at spectrometry for investigation of samples, where the sample contains at least two elements
EP07748401A EP2013610A4 (en) 2006-04-28 2007-04-12 SPECTROMETRY METHOD FOR EXAMINING SAMPLES WHERE THE SAMPLE CONTAINS AT LEAST TWO ELEMENTS
JP2009507641A JP2009535619A (ja) 2006-04-28 2007-04-12 少なくとも２つの元素を含む試料の調査のための分光法における方法
US12/298,685 US8119415B2 (en) 2006-04-28 2007-04-17 X-ray fluorescence method for a composition analysis of a sample containing at least two elements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0600946A SE0600946L (sv) 2006-04-28 2006-04-28 Förfarande vid spektrometri för undersökning av prover, där provet innehåller åtminstone två grundämnen

Publications (2)

Publication Number Publication Date
SE529264C2 SE529264C2 (sv) 2007-06-12
SE0600946L true SE0600946L (sv) 2007-06-12

Family

ID=38116182

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0600946A SE0600946L (sv) 2006-04-28 2006-04-28 Förfarande vid spektrometri för undersökning av prover, där provet innehåller åtminstone två grundämnen

Country Status (5)

Country Link
US (1) US8119415B2 (sv)
EP (1) EP2013610A4 (sv)
JP (1) JP2009535619A (sv)
SE (1) SE0600946L (sv)
WO (1) WO2007126371A1 (sv)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE533452C2 (sv) * 2009-01-19 2010-10-05 Xrf Analytical Ab Förfarande vid spektrometri för undersökning av prover innehållande åtminstone två grundämnen
RU2594638C1 (ru) * 2015-02-04 2016-08-20 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Иркутский государственный университет" Способ рентгенофлуоресцентного анализа проб с неопределяемыми компонентами наполнителя
SE539014C2 (sv) * 2015-07-28 2017-03-21 Multiscat Ab Method for calibrating an X-ray fluorescence spectrometer

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2853261B2 (ja) * 1989-05-16 1999-02-03 三菱マテリアル株式会社 金属分析方法および分析装置
JP2513094B2 (ja) * 1991-06-19 1996-07-03 株式会社島津製作所 蛍光ｘ線分析法における蛍光ｘ線強度補正方法
JPH1090204A (ja) * 1996-09-18 1998-04-10 Fujitsu Ltd 全反射蛍光ｘ線分析に用いる標準試料及びその作成方法
JP2000074858A (ja) * 1998-09-01 2000-03-14 Fuji Electric Co Ltd パラジウム触媒中のパラジウムの定量方法
JP3612245B2 (ja) * 1999-08-26 2005-01-19 株式会社東芝 基板の不純物濃度分析方法
JP2002116160A (ja) * 2000-10-06 2002-04-19 Matsushita Battery Industrial Co Ltd テルル化カドミウム粉末の不純物濃度の測定方法、およびテルル化カドミウム膜の製造方法
JP2003107020A (ja) * 2001-10-02 2003-04-09 Shimadzu Corp 薄膜の蛍光ｘ線分析方法

Also Published As

Publication number Publication date
EP2013610A1 (en) 2009-01-14
SE529264C2 (sv) 2007-06-12
US20090177411A1 (en) 2009-07-09
WO2007126371A1 (en) 2007-11-08
US8119415B2 (en) 2012-02-21
EP2013610A4 (en) 2011-10-05
JP2009535619A (ja) 2009-10-01

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