SG34092G - High throughput circuit tester and test technique avoiding overdriving damage - Google Patents

High throughput circuit tester and test technique avoiding overdriving damage

Info

Publication number
SG34092G
SG34092G SG340/92A SG34092A SG34092G SG 34092 G SG34092 G SG 34092G SG 340/92 A SG340/92 A SG 340/92A SG 34092 A SG34092 A SG 34092A SG 34092 G SG34092 G SG 34092G
Authority
SG
Singapore
Prior art keywords
damage
high throughput
circuit tester
test technique
throughput circuit
Prior art date
Application number
SG340/92A
Other languages
English (en)
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of SG34092G publication Critical patent/SG34092G/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31915—In-circuit Testers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
SG340/92A 1983-06-13 1992-03-19 High throughput circuit tester and test technique avoiding overdriving damage SG34092G (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/503,465 US4588945A (en) 1983-06-13 1983-06-13 High throughput circuit tester and test technique avoiding overdriving damage

Publications (1)

Publication Number Publication Date
SG34092G true SG34092G (en) 1992-06-12

Family

ID=24002208

Family Applications (1)

Application Number Title Priority Date Filing Date
SG340/92A SG34092G (en) 1983-06-13 1992-03-19 High throughput circuit tester and test technique avoiding overdriving damage

Country Status (6)

Country Link
US (1) US4588945A (de)
EP (1) EP0128774B1 (de)
JP (2) JPS6013267A (de)
DE (1) DE3485280D1 (de)
HK (1) HK46292A (de)
SG (1) SG34092G (de)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3543699A1 (de) * 1985-12-11 1987-06-19 Rohde & Schwarz Verfahren zum pruefen der einzelnen bauelemente einer leiterplatte (in-circuit-test)
GB2186701B (en) * 1986-02-14 1990-03-28 Membrain Ltd Circuit testers
SE461939B (sv) * 1988-09-12 1990-04-09 Kjell Moum Instrument foer kontroll av ic-kretsar
US4947113A (en) * 1989-03-31 1990-08-07 Hewlett-Packard Company Driver circuit for providing pulses having clean edges
US5027064A (en) * 1989-04-19 1991-06-25 Celeritek, Inc. Method and means for measuring operating temperature of semiconductor devices by monitoring RF characteristics
US4998026A (en) * 1989-04-19 1991-03-05 Hewlett-Packard Company Driver circuit for in-circuit overdrive/functional tester
US5005008A (en) * 1989-04-20 1991-04-02 Hewlett Packard Company Method and apparatus for providing thermodynamic protection of a driver circuit used in an in-circuit tester
JP2584673B2 (ja) * 1989-06-09 1997-02-26 株式会社日立製作所 テストデータ変更回路を有する論理回路テスト装置
US5032789A (en) * 1989-06-19 1991-07-16 Hewlett-Packard Company Modular/concurrent board tester
US5127009A (en) * 1989-08-29 1992-06-30 Genrad, Inc. Method and apparatus for circuit board testing with controlled backdrive stress
US5111137A (en) * 1990-10-29 1992-05-05 Hewlett-Packard Company Method and apparatus for the detection of leakage current
US5321701A (en) * 1990-12-06 1994-06-14 Teradyne, Inc. Method and apparatus for a minimal memory in-circuit digital tester
US5144229A (en) * 1991-08-30 1992-09-01 Hewlett-Packard Company Method for selectively conditioning integrated circuit outputs for in-circuit test
US5184029A (en) * 1991-10-15 1993-02-02 Hewlett-Packard Company Driver circuit for circuit tester
US5448166A (en) * 1992-01-03 1995-09-05 Hewlett-Packard Company Powered testing of mixed conventional/boundary-scan logic
US5260649A (en) * 1992-01-03 1993-11-09 Hewlett-Packard Company Powered testing of mixed conventional/boundary-scan logic
US5761214A (en) * 1992-10-16 1998-06-02 International Business Machines Corporation Method for testing integrated circuit devices
US5808919A (en) * 1993-11-23 1998-09-15 Hewlett-Packard Company Diagnostic system
US5502390A (en) * 1994-03-15 1996-03-26 International Business Machines Corporation Adiabatic conductor analyzer method and system
US5682337A (en) * 1995-04-13 1997-10-28 Synopsys, Inc. High speed three-state sampling
WO1999023700A1 (en) 1997-11-05 1999-05-14 Martin Robert A Chip housing, methods of making same and methods for mounting chips therein
US6175230B1 (en) 1999-01-14 2001-01-16 Genrad, Inc. Circuit-board tester with backdrive-based burst timing
US7078924B2 (en) * 2002-09-20 2006-07-18 Lsi Logic Corporation Methodology to accurately test clock to signal valid and slew rates of PCI signals
US8227929B2 (en) 2009-09-25 2012-07-24 General Electric Company Multi-use energy storage for renewable sources
WO2014019860A2 (en) * 2012-08-03 2014-02-06 Abb Technology Ag Overload limitation in peak power operation
JP6633949B2 (ja) * 2016-03-14 2020-01-22 ヤマハファインテック株式会社 基板検査装置及び基板検査方法
US10972192B2 (en) * 2018-05-11 2021-04-06 Teradyne, Inc. Handler change kit for a test system
JP7089440B2 (ja) * 2018-08-28 2022-06-22 ルネサスエレクトロニクス株式会社 半導体装置及びその自己診断の制御方法
CN109765479B (zh) * 2019-01-28 2021-10-01 合肥京东方视讯科技有限公司 一种电路板缺件检测装置和方法
CN115698735A (zh) * 2020-08-04 2023-02-03 爱德万测试公司 使用附加信令测试被测试器件的自动测试设备、分选机和方法
US12066483B2 (en) * 2022-11-11 2024-08-20 Texas Instruments Incorporated Method for testing an integrated circuit (IC) device at a testing temperature

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3870953A (en) * 1972-08-01 1975-03-11 Roger Boatman & Associates Inc In circuit electronic component tester
JPS57113377A (en) * 1981-01-07 1982-07-14 Hitachi Ltd Semiconductor testing device
US4507576A (en) * 1982-10-28 1985-03-26 Tektronix, Inc. Method and apparatus for synthesizing a drive signal for active IC testing including slew rate adjustment
JPS59221679A (ja) * 1983-05-31 1984-12-13 Advantest Corp 論理回路試験装置

Also Published As

Publication number Publication date
EP0128774A2 (de) 1984-12-19
JPH05188110A (ja) 1993-07-30
HK46292A (en) 1992-07-03
DE3485280D1 (de) 1992-01-02
EP0128774A3 (en) 1987-08-05
JP2723382B2 (ja) 1998-03-09
EP0128774B1 (de) 1991-11-21
US4588945A (en) 1986-05-13
JPS6013267A (ja) 1985-01-23

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