SG96682A1 - Detection of clock signal period abnormalities - Google Patents

Detection of clock signal period abnormalities

Info

Publication number
SG96682A1
SG96682A1 SG200200729A SG200200729A SG96682A1 SG 96682 A1 SG96682 A1 SG 96682A1 SG 200200729 A SG200200729 A SG 200200729A SG 200200729 A SG200200729 A SG 200200729A SG 96682 A1 SG96682 A1 SG 96682A1
Authority
SG
Singapore
Prior art keywords
detection
clock signal
signal period
period abnormalities
abnormalities
Prior art date
Application number
SG200200729A
Other languages
English (en)
Inventor
Senba Hisanori
Original Assignee
Nec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nec Corp filed Critical Nec Corp
Publication of SG96682A1 publication Critical patent/SG96682A1/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
    • G06F1/14—Time supervision arrangements, e.g. real time clock
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/159—Applications of delay lines not covered by the preceding subgroups
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/19—Monitoring patterns of pulse trains

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Manipulation Of Pulses (AREA)
  • Pulse Circuits (AREA)
SG200200729A 2001-02-23 2002-02-06 Detection of clock signal period abnormalities SG96682A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001048354A JP2002251227A (ja) 2001-02-23 2001-02-23 クロック監視回路、データ処理装置、データ処理システム

Publications (1)

Publication Number Publication Date
SG96682A1 true SG96682A1 (en) 2003-06-16

Family

ID=18909635

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200200729A SG96682A1 (en) 2001-02-23 2002-02-06 Detection of clock signal period abnormalities

Country Status (7)

Country Link
US (1) US6545508B2 (fr)
EP (1) EP1237282B1 (fr)
JP (1) JP2002251227A (fr)
KR (1) KR20020069143A (fr)
DE (1) DE60200050T2 (fr)
HK (1) HK1047356A1 (fr)
SG (1) SG96682A1 (fr)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3476448B2 (ja) * 2001-12-12 2003-12-10 沖電気工業株式会社 信号同期回路
JP3848152B2 (ja) * 2001-12-20 2006-11-22 株式会社東芝 多機能ｉｃカード
FR2875311A1 (fr) * 2004-09-14 2006-03-17 St Microelectronics Sa Procede de detection du positionnement relatif de deux signaux et dispositif correspondant
US20060193417A1 (en) * 2005-02-25 2006-08-31 Tellabs Operations, Inc. Systems and methods for switching between redundant clock signals
US7622961B2 (en) * 2005-09-23 2009-11-24 Intel Corporation Method and apparatus for late timing transition detection
JP2007121114A (ja) * 2005-10-28 2007-05-17 Elpida Memory Inc デューティ検知回路、これらを備えたｄｌｌ回路及び半導体装置
DE102005060394B4 (de) * 2005-12-16 2012-10-11 Infineon Technologies Ag Schaltungsanordnung und Verfahren zum Betreiben einer Schaltungsanordnung
US7480838B1 (en) * 2006-03-23 2009-01-20 Intel Corporation Method, system and apparatus for detecting and recovering from timing errors
US7679404B2 (en) * 2006-06-23 2010-03-16 Intel Corporation Missing clock pulse detector
US7498848B2 (en) * 2006-10-03 2009-03-03 Freescale Semiconductor, Inc. System and method for monitoring clock signal in an integrated circuit
DE602008003051D1 (de) * 2007-05-18 2010-12-02 St Microelectronics Rousset Erkennung einer Zustandsstörung eines bistabilen Kippschalters eines elektronischen Schaltkreises
JP2009248502A (ja) * 2008-04-09 2009-10-29 Seiko Epson Corp パルス信号生成装置、搬送装置、画像形成装置及びパルス生成方法
US7710161B1 (en) * 2009-01-13 2010-05-04 Atmel Corporation Digital low frequency detector
JP2013077921A (ja) * 2011-09-29 2013-04-25 Toshiba Corp クロック診断回路
CN107872208B (zh) * 2016-09-28 2020-04-03 深圳市中兴微电子技术有限公司 一种时钟信号丢失检测的装置
US11635465B2 (en) * 2020-10-29 2023-04-25 Stmicroelectronics International N.V. Device and method for monitoring data and timing signals in integrated circuits
CN114070767B (zh) * 2021-11-15 2024-03-19 国网黑龙江省电力有限公司信息通信公司 一种信息通信设备的智能检修方法
US12413233B1 (en) 2025-06-03 2025-09-09 Kuwait University 4-bit synchronous counter IC with ripple carry-out, loading capability, and integrated MOD-10 reset functionality

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU817717A1 (ru) 1979-05-07 1981-03-30 Dzhagarov Yulius A Устройство дл контрол после-дОВАТЕльНОСТи иМпульСОВ
US4864574A (en) * 1988-02-04 1989-09-05 Rockwell International Corporation Injection lock clock detection apparatus
JPH0469720A (ja) * 1990-07-10 1992-03-04 Nec Corp クロック異常検出装置
JPH04160918A (ja) * 1990-10-25 1992-06-04 Nec Commun Syst Ltd クロック障害検出回路
JPH06101243A (ja) * 1992-09-16 1994-04-12 Tsutsunaka Plast Ind Co Ltd 土留め擁壁における水抜き方法
JPH06218618A (ja) * 1993-01-21 1994-08-09 Mitsubishi Materials Corp スローアウェイチップ
US5463655A (en) * 1993-02-17 1995-10-31 National Semiconductor Corporation Single-ended pulse gating circuit
US5619155A (en) 1995-06-02 1997-04-08 United Microelectronics Corporation IC-chip operation inhibitor
US5761446A (en) * 1995-06-14 1998-06-02 Unisys Corp Livelock avoidance
RU2105411C1 (ru) 1995-08-16 1998-02-20 Российский Федеральный Ядерный Центр - Всероссийский Научно-Исследовательский Институт Экспериментальной Физики Кольцевой счетчик
KR100208292B1 (ko) * 1996-12-31 1999-07-15 유기범 Ipc의 이중화 버스 클럭 감시 회로
CA2201695C (fr) * 1997-04-03 2004-08-10 Gennum Corporation Detecteur de phase permettant d'extraire rapidement les signaux d'horloge incorpores a des signaux binaires aleatoires
US6324652B1 (en) * 1999-01-15 2001-11-27 3Com Corporation Asynchronous switching circuit for multiple indeterminate bursting clocks
US6469549B2 (en) * 2000-11-30 2002-10-22 Infineon Technologies Ag Apparatus and method for odd integer signal division

Also Published As

Publication number Publication date
US6545508B2 (en) 2003-04-08
KR20020069143A (ko) 2002-08-29
DE60200050T2 (de) 2004-09-16
HK1047356A1 (en) 2003-02-14
DE60200050D1 (de) 2003-11-13
JP2002251227A (ja) 2002-09-06
EP1237282A1 (fr) 2002-09-04
US20020118046A1 (en) 2002-08-29
EP1237282B1 (fr) 2003-10-08

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