Fleischer et al.
1965
Effects of temperature, pressure, and ionization of the formation and stability of fission tracks in minerals and glasses
JPS523486A
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1977-01-11
Detecting method of the surface flaw of metal material
Schultz et al.
1983
Observation of defects associated with the Cu/W (110) interface as studied with variable-energy positrons
GB1309772A
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1973-03-14
Method of and device for inspecting and or controlling electron beam welded joints
SU426333A1
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1974-04-30
JPS57131027A
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1982-08-13
Black body furnace
Pronko et al.
1995
Laser induced avalanche ionization and electron-lattice heating of silicon with intense near IR femtosecond pulses
JPS57149927A
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1982-09-16
Measuring method for temperature distribution
US2884345A
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1959-04-28
Infra-red devices and methods
Haneman et al.
1989
Measurement of conversion temperatures for Si (111) 2× 1
US3327124A
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1967-06-20
Method for facilitating the identification of icbm nose cones and for discriminating against decoys by spectral analysis
Van Voorhis
1927
Heats of Condensation of Electrons and Positive Ions on Molybdenum in Gas Discharges
RU1789947C
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1993-01-23
Способ изготовлени сцинтилл ционного детектора
Farnsworth et al.
1930
Distinction between Contact-Potential Effects and True Reflection Coefficients for Low-Velocity Electrons
KOLOT et al.
1972
Processes determining the composition of a two-dimensional oxide film on a molybdenum surface
JPS5540921A
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1980-03-22
Method and unit for hydrogen analysis in metal
Rantsevich
1978
Thermal detection of cracks in fatigue testing of parts
SU372478A1
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1973-03-01
;?^союзидя
Meclewski
1970
Measurement of the Surface Diffusion Activation Energy of Potassium on Tungsten
GB993985A
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1965-06-02
Method and apparatus for detecting defects on surfaces
ROSKOSHNYI
1973
A device for measuring the temperature of high-temperature gas-discharge heating sources
JPS57191524A
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1982-11-25
Measuring method for temperature error of thermocouple
GB1273191A
(en )
1972-05-03
Method of cleaning and optionally annealing coiled metal foil
JPS5517465A
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1980-02-06
Measuring method of high temperature performance of semiconductor device
SU415533A1
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1974-02-15