Classifications

• • G—PHYSICS
  • G06—COMPUTING OR CALCULATING; COUNTING
  • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
  • G06T7/00—Image analysis
  • G06T7/0002—Inspection of images, e.g. flaw detection
  • G06T7/0004—Industrial image inspection
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
  • G01B11/00—Measuring arrangements characterised by the use of optical techniques
  • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
  • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/84—Systems specially adapted for particular applications
  • G01N21/88—Investigating the presence of flaws or contamination
  • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
  • G01N21/9036—Investigating the presence of flaws or contamination in a container or its contents using arrays of emitters or receivers
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/84—Systems specially adapted for particular applications
  • G01N21/88—Investigating the presence of flaws or contamination
  • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
  • G01N21/9081—Inspection especially designed for plastic containers, e.g. preforms
• • G—PHYSICS
  • G06—COMPUTING OR CALCULATING; COUNTING
  • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
  • G06T7/00—Image analysis
  • G06T7/40—Analysis of texture
  • G06T7/41—Analysis of texture based on statistical description of texture
  • G06T7/42—Analysis of texture based on statistical description of texture using transform domain methods
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/84—Systems specially adapted for particular applications
  • G01N21/88—Investigating the presence of flaws or contamination
  • G01N21/8806—Specially adapted optical and illumination features
  • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
  • G01N2021/8832—Structured background, e.g. for transparent objects
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/84—Systems specially adapted for particular applications
  • G01N21/88—Investigating the presence of flaws or contamination
  • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
  • G01N2021/8896—Circuits specially adapted for system specific signal conditioning
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/84—Systems specially adapted for particular applications
  • G01N21/88—Investigating the presence of flaws or contamination
  • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges

Landscapes

• Engineering & Computer Science (AREA)
• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Computer Vision & Pattern Recognition (AREA)
• Chemical & Material Sciences (AREA)
• Pathology (AREA)
• Health & Medical Sciences (AREA)
• Life Sciences & Earth Sciences (AREA)
• Theoretical Computer Science (AREA)
• Analytical Chemistry (AREA)
• Biochemistry (AREA)
• General Health & Medical Sciences (AREA)
• Immunology (AREA)
• Quality & Reliability (AREA)
• Probability & Statistics with Applications (AREA)
• Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
• Length Measuring Devices By Optical Means (AREA)
• Instruments For Viewing The Inside Of Hollow Bodies (AREA)
• Testing Of Optical Devices Or Fibers (AREA)

Applications Claiming Priority (1)

Publications (1)

Family

ID=36190736

Family Applications (1)

Country Status (7)

Families Citing this family (33)

Family Cites Families (14)

• 2005
  • 2005-09-09 EP EP05783093A patent/EP1931973B1/en not_active Expired - Lifetime
  • 2005-09-09 WO PCT/IB2005/002664 patent/WO2007029048A1/en not_active Ceased
  • 2005-09-09 DE DE602005012163T patent/DE602005012163D1/de not_active Expired - Lifetime
  • 2005-09-09 CN CN200580051960XA patent/CN101297192B/zh not_active Expired - Lifetime
  • 2005-09-09 AT AT05783093T patent/ATE419519T1/de not_active IP Right Cessation
  • 2005-09-09 US US11/991,716 patent/US8254659B2/en active Active
• 2006
  • 2006-09-05 TW TW095132685A patent/TW200728712A/zh unknown

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