ATE419519T1 - Verfahren und vorrichtung zur optischen inspektion eines gegenstands - Google Patents

Verfahren und vorrichtung zur optischen inspektion eines gegenstands

Info

Publication number
ATE419519T1
ATE419519T1 AT05783093T AT05783093T ATE419519T1 AT E419519 T1 ATE419519 T1 AT E419519T1 AT 05783093 T AT05783093 T AT 05783093T AT 05783093 T AT05783093 T AT 05783093T AT E419519 T1 ATE419519 T1 AT E419519T1
Authority
AT
Austria
Prior art keywords
light
image
shade pattern
detected image
detecting
Prior art date
Application number
AT05783093T
Other languages
English (en)
Inventor
Sanzio Caroli
Donato Laico
Original Assignee
Sacmi
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sacmi filed Critical Sacmi
Application granted granted Critical
Publication of ATE419519T1 publication Critical patent/ATE419519T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9036—Investigating the presence of flaws or contamination in a container or its contents using arrays of emitters or receivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9081—Inspection especially designed for plastic containers, e.g. preforms
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/40—Analysis of texture
    • G06T7/41—Analysis of texture based on statistical description of texture
    • G06T7/42—Analysis of texture based on statistical description of texture using transform domain methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
    • G01N2021/8832—Structured background, e.g. for transparent objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8896—Circuits specially adapted for system specific signal conditioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Quality & Reliability (AREA)
  • Probability & Statistics with Applications (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Viewing The Inside Of Hollow Bodies (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
AT05783093T 2005-09-09 2005-09-09 Verfahren und vorrichtung zur optischen inspektion eines gegenstands ATE419519T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/IB2005/002664 WO2007029048A1 (en) 2005-09-09 2005-09-09 Method and apparatus for visually inspecting an object

Publications (1)

Publication Number Publication Date
ATE419519T1 true ATE419519T1 (de) 2009-01-15

Family

ID=36190736

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05783093T ATE419519T1 (de) 2005-09-09 2005-09-09 Verfahren und vorrichtung zur optischen inspektion eines gegenstands

Country Status (7)

Country Link
US (1) US8254659B2 (de)
EP (1) EP1931973B1 (de)
CN (1) CN101297192B (de)
AT (1) ATE419519T1 (de)
DE (1) DE602005012163D1 (de)
TW (1) TW200728712A (de)
WO (1) WO2007029048A1 (de)

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CA2546758C (en) * 2006-05-12 2009-07-07 Alberta Research Council Inc. A system and a method for detecting a damaged or missing machine part
DE102009020919A1 (de) * 2009-05-12 2010-11-18 Krones Ag Vorrichtung zum Erkennen von Erhebungen und/oder Vertiefungen auf Flaschen, insbesondere in einer Etikettiermaschine
DE102009020920A1 (de) * 2009-05-12 2010-11-18 Krones Ag Inspektionsvorrichtung zur Erkennung von Embossings und/oder Etiketten auf transparenten Gefäßen, insbesondere Getränkeflaschen
IT1394886B1 (it) * 2009-07-17 2012-07-20 Sacmi Sistema di ispezione e pesatura di oggetti, in particolare preforme.
FR2958751B1 (fr) * 2010-04-13 2012-05-25 Iris Inspection Machines Procede de detection de defauts dans des articles verriers et installation pour la mise en oeuvre dudit procede
WO2011145351A1 (ja) * 2010-05-20 2011-11-24 パナソニック株式会社 薬液判定装置及び薬液判定方法
GB2482473A (en) * 2010-06-29 2012-02-08 Constar Internat Uk Ltd Inspection of articles
US20120098959A1 (en) * 2010-10-20 2012-04-26 Glasstech, Inc. Method and apparatus for measuring transmitted optical distortion in glass sheets
CN102519979B (zh) * 2011-12-10 2013-12-04 山东明佳包装检测科技有限公司 Pet瓶检测定位中消除水珠影响的方法
US20140286563A1 (en) * 2013-03-19 2014-09-25 Industrial Video Solutions, Inc. Accurate detection of low-contrast defects in transparent material
CH707559A2 (de) * 2013-03-22 2014-09-30 Finatec Holding Ag Verfahren und System zur Prüfung der Farbbeschaffenheit von Preforms.
CN105444683B (zh) * 2014-08-26 2018-07-03 达观科技有限公司 透光膜的检测系统及其检测方法
US20160178535A1 (en) * 2014-12-17 2016-06-23 Xerox Corporation Inspection Device And Method
FI20155171L (fi) * 2015-03-13 2016-09-14 Conexbird Oy Kontin tarkastusjärjestely, -menetelmä, -laitteisto ja -ohjelmisto
CH711104A2 (de) * 2015-05-18 2016-11-30 Finatec Holding Ag Prüfverfahren und Prüfsystem zur Prüfung von Werkstücken.
US9952037B2 (en) 2015-06-26 2018-04-24 Glasstech, Inc. System and method for developing three-dimensional surface information corresponding to a contoured sheet
US9470641B1 (en) 2015-06-26 2016-10-18 Glasstech, Inc. System and method for measuring reflected optical distortion in contoured glass sheets
US9841276B2 (en) 2015-06-26 2017-12-12 Glasstech, Inc. System and method for developing three-dimensional surface information corresponding to a contoured glass sheet
US9851200B2 (en) 2015-06-26 2017-12-26 Glasstech, Inc. Non-contact gaging system and method for contoured panels having specular surfaces
US9952039B2 (en) 2015-06-26 2018-04-24 Glasstech, Inc. System and method for measuring reflected optical distortion in contoured panels having specular surfaces
US9933251B2 (en) 2015-06-26 2018-04-03 Glasstech, Inc. Non-contact gaging system and method for contoured glass sheets
JP7046819B2 (ja) * 2016-02-24 2022-04-04 ベクトン ディキンソン フランス 透明シリンダを検査するためのシステムおよび方法
US10422755B2 (en) * 2016-12-07 2019-09-24 Applied Vision Corporation Identifying defects in transparent containers
US20190238796A1 (en) 2017-05-11 2019-08-01 Jacob Nathaniel Allen Object Inspection System And Method For Inspecting An Object
DE102019208299A1 (de) 2019-06-06 2020-12-10 Krones Ag Verfahren und Vorrichtung zur optischen Inspektion von Behältern
DE102019208295A1 (de) 2019-06-06 2020-12-10 Krones Ag Verfahren und Vorrichtung zur optischen Inspektion von Behältern
CN110243831B (zh) * 2019-06-06 2022-02-15 锐捷网络股份有限公司 表面缺陷采集系统、表面缺陷检测方法、装置及存储介质
DE102019208296A1 (de) 2019-06-06 2020-12-10 Krones Ag Verfahren und Vorrichtung zur optischen Inspektion von Behältern
CN111107257A (zh) * 2020-01-20 2020-05-05 成都德图福思科技有限公司 针对透明介质表面刻蚀或浮雕图案进行高对比度成像的方法
KR20230024390A (ko) 2020-06-17 2023-02-20 이노비전 소프트웨어 솔루션즈, 인크. 결함 복원을 위한 시스템 및 방법
CN112955844A (zh) * 2020-06-30 2021-06-11 深圳市大疆创新科技有限公司 目标跟踪方法、设备、系统及存储介质
US12293506B2 (en) 2021-07-20 2025-05-06 Inovision Software Solutions, Inc. Method to locate defects in e-coat
DE102022104990A1 (de) 2022-03-03 2023-09-07 Emhart Glass Sa VORRICHTUNG UND VERFAHREN ZUM INSPIZIEREN VON GEFÄßEN

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US6100990A (en) * 1999-06-14 2000-08-08 Ford Motor Company Method and apparatus for determining reflective optical quality using gray-scale patterns
US6633831B2 (en) * 2000-09-20 2003-10-14 Kla Tencor Technologies Methods and systems for determining a critical dimension and a thin film characteristic of a specimen
US6424414B1 (en) * 2000-10-16 2002-07-23 Agr International, Inc. Method and apparatus for detecting refractive defects in transparent containers
JP2004146782A (ja) * 2002-08-29 2004-05-20 Advanced Lcd Technologies Development Center Co Ltd 結晶化状態のｉｎ−ｓｉｔｕモニタリング方法
JP2006510105A (ja) * 2002-12-16 2006-03-23 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 筋状構造を有する画像のフィルタリング方法
ES2290422T5 (es) 2003-05-22 2011-04-08 M. & G. POLYMERS U.S.A. LLC Aparato y método para controlar la calidad de preformas que tienen cada una un cuerpo de material plástico.
CN1272734C (zh) * 2004-05-20 2006-08-30 上海交通大学 基于非负矩阵分解的相关反馈图像检索方法
US7251033B1 (en) * 2004-06-02 2007-07-31 Advanced Micro Devices, Inc. In-situ reticle contamination detection system at exposure wavelength
US7463367B2 (en) * 2004-07-13 2008-12-09 Micron Technology, Inc. Estimating overlay error and optical aberrations

Also Published As

Publication number Publication date
CN101297192A (zh) 2008-10-29
EP1931973B1 (de) 2008-12-31
TW200728712A (en) 2007-08-01
US20080310701A1 (en) 2008-12-18
EP1931973A1 (de) 2008-06-18
CN101297192B (zh) 2012-05-30
US8254659B2 (en) 2012-08-28
DE602005012163D1 (de) 2009-02-12
WO2007029048A1 (en) 2007-03-15

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