TW200736820A - Method and system for enhanced lithographic patterning - Google Patents

Method and system for enhanced lithographic patterning

Info

Publication number
TW200736820A
TW200736820A TW096106697A TW96106697A TW200736820A TW 200736820 A TW200736820 A TW 200736820A TW 096106697 A TW096106697 A TW 096106697A TW 96106697 A TW96106697 A TW 96106697A TW 200736820 A TW200736820 A TW 200736820A
Authority
TW
Taiwan
Prior art keywords
hard mask
lithographic patterning
double patterning
enhanced lithographic
patterning system
Prior art date
Application number
TW096106697A
Other languages
English (en)
Inventor
Sanjaysingh Lalbahadoersing
Sami Musa
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of TW200736820A publication Critical patent/TW200736820A/zh

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
    • G03F7/70466—Multiple exposures, e.g. combination of fine and coarse exposures, double patterning or multiple exposures for printing a single feature
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70008—Production of exposure light, i.e. light sources
    • G03F7/70025—Production of exposure light, i.e. light sources by lasers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
TW096106697A 2006-03-07 2007-02-27 Method and system for enhanced lithographic patterning TW200736820A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/369,222 US20070212649A1 (en) 2006-03-07 2006-03-07 Method and system for enhanced lithographic patterning

Publications (1)

Publication Number Publication Date
TW200736820A true TW200736820A (en) 2007-10-01

Family

ID=38479348

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096106697A TW200736820A (en) 2006-03-07 2007-02-27 Method and system for enhanced lithographic patterning

Country Status (5)

Country Link
US (2) US20070212649A1 (zh)
JP (1) JP4602367B2 (zh)
KR (1) KR20070092130A (zh)
CN (1) CN101034254B (zh)
TW (1) TW200736820A (zh)

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US8519540B2 (en) 2009-06-16 2013-08-27 International Business Machines Corporation Self-aligned dual damascene BEOL structures with patternable low- K material and methods of forming same
US8659115B2 (en) * 2009-06-17 2014-02-25 International Business Machines Corporation Airgap-containing interconnect structure with improved patternable low-K material and method of fabricating
JP2011009250A (ja) * 2009-06-23 2011-01-13 Toshiba Corp 基板処理方法、半導体装置の製造方法及びインプリント装置
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US8202783B2 (en) 2009-09-29 2012-06-19 International Business Machines Corporation Patternable low-k dielectric interconnect structure with a graded cap layer and method of fabrication
US8637395B2 (en) 2009-11-16 2014-01-28 International Business Machines Corporation Methods for photo-patternable low-k (PPLK) integration with curing after pattern transfer
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US8367540B2 (en) * 2009-11-19 2013-02-05 International Business Machines Corporation Interconnect structure including a modified photoresist as a permanent interconnect dielectric and method of fabricating same
US8642252B2 (en) 2010-03-10 2014-02-04 International Business Machines Corporation Methods for fabrication of an air gap-containing interconnect structure
US8896120B2 (en) 2010-04-27 2014-11-25 International Business Machines Corporation Structures and methods for air gap integration
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US8468470B2 (en) * 2011-09-21 2013-06-18 Taiwan Semiconductor Manufacturing Co., Ltd. Multi-patterning method
US8962484B2 (en) * 2011-12-16 2015-02-24 Taiwan Semiconductor Manufacturing Company, Ltd. Method of forming pattern for semiconductor device
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CN104821274B (zh) * 2014-01-31 2018-09-11 台湾积体电路制造股份有限公司 无需光刻胶的带电粒子束图案化
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KR102477091B1 (ko) * 2015-07-24 2022-12-13 삼성전자주식회사 2차원 물질 하드마스크와 그 제조방법 및 하드 마스크를 이용한 물질층 패턴 형성방법
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Also Published As

Publication number Publication date
US20070212648A1 (en) 2007-09-13
KR20070092130A (ko) 2007-09-12
CN101034254A (zh) 2007-09-12
CN101034254B (zh) 2011-12-07
JP2007266594A (ja) 2007-10-11
JP4602367B2 (ja) 2010-12-22
US20070212649A1 (en) 2007-09-13

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