TWI570226B - 化學機械研磨用漿液及使用該漿液的基板研磨方法 - Google Patents

化學機械研磨用漿液及使用該漿液的基板研磨方法 Download PDF

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Publication number
TWI570226B
TWI570226B TW099138787A TW99138787A TWI570226B TW I570226 B TWI570226 B TW I570226B TW 099138787 A TW099138787 A TW 099138787A TW 99138787 A TW99138787 A TW 99138787A TW I570226 B TWI570226 B TW I570226B
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TW
Taiwan
Prior art keywords
slurry
polishing
water
compound
mass
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TW099138787A
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English (en)
Chinese (zh)
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TW201124515A (en
Inventor
竹越穰
加藤充
岡本知大
加藤晉哉
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可樂麗股份有限公司
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Publication of TW201124515A publication Critical patent/TW201124515A/zh
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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H10P95/06—Planarisation of inorganic insulating materials
    • H10P95/062—Planarisation of inorganic insulating materials involving a dielectric removal step
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09G—POLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00—Polishing compositions
    • C09G1/02—Polishing compositions containing abrasives or grinding agents
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00—Materials not provided for elsewhere
    • C09K3/14—Anti-slip materials; Abrasives
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00—Materials not provided for elsewhere
    • C09K3/14—Anti-slip materials; Abrasives
    • C09K3/1454—Abrasive powders, suspensions and pastes for polishing
    • C09K3/1463—Aqueous liquid suspensions
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
    • H10W10/01—Manufacture or treatment
    • H10W10/011—Manufacture or treatment of isolation regions comprising dielectric materials
    • H10W10/014—Manufacture or treatment of isolation regions comprising dielectric materials using trench refilling with dielectric materials, e.g. shallow trench isolations
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
    • H10W10/10—Isolation regions comprising dielectric materials
    • H10W10/17—Isolation regions comprising dielectric materials formed using trench refilling with dielectric materials, e.g. shallow trench isolations

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
TW099138787A 2009-11-11 2010-11-11 化學機械研磨用漿液及使用該漿液的基板研磨方法 TWI570226B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009258444 2009-11-11

Publications (2)

Publication Number Publication Date
TW201124515A TW201124515A (en) 2011-07-16
TWI570226B true TWI570226B (zh) 2017-02-11

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
TW099138787A TWI570226B (zh) 2009-11-11 2010-11-11 化學機械研磨用漿液及使用該漿液的基板研磨方法

Country Status (8)

Country Link
US (1) US9536752B2 (fr)
EP (1) EP2500929B1 (fr)
JP (1) JP5878020B2 (fr)
KR (1) KR101359092B1 (fr)
CN (1) CN102666760B (fr)
IL (1) IL219703A (fr)
TW (1) TWI570226B (fr)
WO (1) WO2011058952A1 (fr)

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Also Published As

Publication number Publication date
KR20120080253A (ko) 2012-07-16
JP5878020B2 (ja) 2016-03-08
CN102666760A (zh) 2012-09-12
EP2500929B1 (fr) 2018-06-20
TW201124515A (en) 2011-07-16
KR101359092B1 (ko) 2014-02-05
CN102666760B (zh) 2015-11-25
WO2011058952A1 (fr) 2011-05-19
IL219703A0 (en) 2012-07-31
US20120270400A1 (en) 2012-10-25
EP2500929A4 (fr) 2013-08-14
US9536752B2 (en) 2017-01-03
EP2500929A1 (fr) 2012-09-19
JPWO2011058952A1 (ja) 2013-04-04
IL219703A (en) 2015-09-24

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