WO2003015282A3 - Ensemble de circuits electroniques comportant des moyens de decontamination de parties contaminees par des erreurs - Google Patents

Ensemble de circuits electroniques comportant des moyens de decontamination de parties contaminees par des erreurs Download PDF

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Publication number
WO2003015282A3
WO2003015282A3 PCT/FR2002/002788 FR0202788W WO03015282A3 WO 2003015282 A3 WO2003015282 A3 WO 2003015282A3 FR 0202788 W FR0202788 W FR 0202788W WO 03015282 A3 WO03015282 A3 WO 03015282A3
Authority
WO
WIPO (PCT)
Prior art keywords
buffer register
multiplexer
input
output
error
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/FR2002/002788
Other languages
English (en)
Other versions
WO2003015282A2 (fr
Inventor
Michel Nicolaidis
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Iroc Technologies SA
Original Assignee
Iroc Technologies SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Iroc Technologies SA filed Critical Iroc Technologies SA
Priority to DE60219324T priority Critical patent/DE60219324D1/de
Priority to EP02794621A priority patent/EP1417582B1/fr
Priority to AU2002355589A priority patent/AU2002355589A1/en
Priority to US10/485,700 priority patent/US7380165B2/en
Publication of WO2003015282A2 publication Critical patent/WO2003015282A2/fr
Anticipated expiration legal-status Critical
Publication of WO2003015282A3 publication Critical patent/WO2003015282A3/fr
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00Arrangements for program control, e.g. control units
    • G06F9/06Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/30Arrangements for executing machine instructions, e.g. instruction decode
    • G06F9/38Concurrent instruction execution, e.g. pipeline or look ahead
    • G06F9/3867Concurrent instruction execution, e.g. pipeline or look ahead using instruction pipelines
    • G06F9/3869Implementation aspects, e.g. pipeline latches; pipeline synchronisation and clocking
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/14Error detection or correction of the data by redundancy in operations
    • G06F11/1402Saving, restoring, recovering or retrying
    • G06F11/1405Saving, restoring, recovering or retrying at machine instruction level
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00Arrangements for program control, e.g. control units
    • G06F9/06Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/30Arrangements for executing machine instructions, e.g. instruction decode
    • G06F9/38Concurrent instruction execution, e.g. pipeline or look ahead
    • G06F9/3861Recovery, e.g. branch miss-prediction, exception handling

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Software Systems (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Hardware Redundancy (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Treatments For Attaching Organic Compounds To Fibrous Goods (AREA)
  • Telephone Function (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Containers And Plastic Fillers For Packaging (AREA)
  • Structure Of Printed Boards (AREA)
  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Abstract

l'ensemble comporte un circuit (3) de détection d'erreur dans les données fournies par au moins un des blocs de I'ensemble. Lorsqu'une erreur a été détectée, I'ensemble est décontaminé grâce à au moins un circuit de sauvegarde et de reconstitution des états passés d'une bascule associée à un bloc. le circuit de sauvegarde et de reconstitution comporte un multiplexeur (6) et un registre tampon (5), du type premier entre, premier sorti. Le multiplexeur comporte première entrée connectée directement à la sortie de la bascule (2a) et une seconde entrée connectée à cette sortie par I'intermédiaire du registre tampon. Un circuit de commande (4) contrôle le registre tampon et le multiplexeur de manière à activer en écriture le registre tampon et connecter la sortie du multiplexeur à sa première entrée à chaque cycle, pendant une phase de fonctionnement normal, et à activer en lecture le registre tampon et connecter la sortie du multiplexeur à sa seconde entrée pendant des cycles prédéterminés d'une phase de décontamination.
PCT/FR2002/002788 2001-08-10 2002-08-02 Ensemble de circuits electroniques comportant des moyens de decontamination de parties contaminees par des erreurs Ceased WO2003015282A2 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DE60219324T DE60219324D1 (de) 2001-08-10 2002-08-02 Schaltkreiskomplex mit dekontaminierungsmitteln für mit fehlern kontaminierte teile
EP02794621A EP1417582B1 (fr) 2001-08-10 2002-08-02 Ensemble de circuits electroniques comportant des moyens de decontamination de parties contaminees par des erreurs
AU2002355589A AU2002355589A1 (en) 2001-08-10 2002-08-02 Electronic circuit assembly comprising means for decontaminating error-contaminated parts
US10/485,700 US7380165B2 (en) 2001-08-10 2002-08-02 Assembly of electronic circuits comprising means for decontaminating error-contaminated parts

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0110734A FR2828601B1 (fr) 2001-08-10 2001-08-10 Ensemble de circuits electroniques comportant des moyens de decontamination de parties contaminees par des erreurs
FR01/10734 2001-08-10

Publications (2)

Publication Number Publication Date
WO2003015282A2 WO2003015282A2 (fr) 2003-02-20
WO2003015282A3 true WO2003015282A3 (fr) 2004-02-19

Family

ID=8866475

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FR2002/002788 Ceased WO2003015282A2 (fr) 2001-08-10 2002-08-02 Ensemble de circuits electroniques comportant des moyens de decontamination de parties contaminees par des erreurs

Country Status (7)

Country Link
US (1) US7380165B2 (fr)
EP (1) EP1417582B1 (fr)
AT (1) ATE358847T1 (fr)
AU (1) AU2002355589A1 (fr)
DE (1) DE60219324D1 (fr)
FR (1) FR2828601B1 (fr)
WO (1) WO2003015282A2 (fr)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NZ592039A (en) 2003-08-27 2013-03-28 Ophthotech Corp Combination therapy for the treatment of ocular neovascular disorders
WO2010099139A2 (fr) 2009-02-25 2010-09-02 Osi Pharmaceuticals, Inc. Thérapie anti-cancer combinée
WO2010099364A2 (fr) 2009-02-27 2010-09-02 Osi Pharmaceuticals, Inc. Méthodes d'identification d'agents qui inhibent les cellules cancéreuses mésenchymateuses ou leur formation
WO2010099138A2 (fr) 2009-02-27 2010-09-02 Osi Pharmaceuticals, Inc. Procédés pour l'identification d'agents qui inhibent les cellules tumorales de type mésenchymateuses ou leur formation
WO2010099363A1 (fr) 2009-02-27 2010-09-02 Osi Pharmaceuticals, Inc. Méthodes d'identification d'agents qui inhibent les cellules cancéreuses mésenchymateuses ou leur formation
US8440498B2 (en) 2009-10-28 2013-05-14 Nanosolar, Inc. Thin-film devices formed from solid particles
WO2012149014A1 (fr) 2011-04-25 2012-11-01 OSI Pharmaceuticals, LLC Utilisation de signatures de gènes de tem dans la découverte de médicaments contre le cancer, diagnostics et traitement du cancer
WO2013152252A1 (fr) 2012-04-06 2013-10-10 OSI Pharmaceuticals, LLC Polythérapie antinéoplasique
US20170184664A1 (en) * 2015-12-28 2017-06-29 Michel Nicolaidis Highly efficient double-sampling architectures
FR3065601B1 (fr) * 2017-04-20 2019-05-03 Thales Circuit integre numerique protege contre les erreurs transitoires

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5875346A (en) * 1996-09-13 1999-02-23 International Business Machines Corporation System for restoring register data in a pipelined data processing system using latch feedback assemblies

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1509193A (en) * 1974-04-17 1978-05-04 Nat Res Dev Computer systems
US4562538A (en) * 1983-05-16 1985-12-31 At&T Bell Laboratories Microprocessor having decision pointer to process restore position
JPS63156236A (ja) * 1986-12-19 1988-06-29 Toshiba Corp レジスタ装置
US5119483A (en) * 1988-07-20 1992-06-02 Digital Equipment Corporation Application of state silos for recovery from memory management exceptions
EP1359485B1 (fr) * 2002-05-03 2015-04-29 Infineon Technologies AG Système de commande et surveillance

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5875346A (en) * 1996-09-13 1999-02-23 International Business Machines Corporation System for restoring register data in a pipelined data processing system using latch feedback assemblies

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
ROBERTS M W: "A FAULT-TOLERANT SCHEME THAT COPES WITH INTERMITTENT AND TRANSIENT FAULTS IN SEQUENTIAL CIRCUITS", PROCEEDINGS OF THE MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS. CHAMPAIGN, AUG. 14 - 16, 1989, NEW YORK, IEEE, US, vol. 1 SYMP. 32, 14 August 1989 (1989-08-14), pages 36 - 39, XP000139611 *

Also Published As

Publication number Publication date
US20040219739A1 (en) 2004-11-04
AU2002355589A1 (en) 2003-02-24
EP1417582B1 (fr) 2007-04-04
WO2003015282A2 (fr) 2003-02-20
DE60219324D1 (de) 2007-05-16
FR2828601A1 (fr) 2003-02-14
ATE358847T1 (de) 2007-04-15
US7380165B2 (en) 2008-05-27
EP1417582A2 (fr) 2004-05-12
FR2828601B1 (fr) 2003-11-07

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