WO2009148253A3 - 반도체 발광소자 제조용 지지기판 및 상기 지지기판을 이용한 반도체 발광소자 - Google Patents
반도체 발광소자 제조용 지지기판 및 상기 지지기판을 이용한 반도체 발광소자 Download PDFInfo
- Publication number
- WO2009148253A3 WO2009148253A3 PCT/KR2009/002938 KR2009002938W WO2009148253A3 WO 2009148253 A3 WO2009148253 A3 WO 2009148253A3 KR 2009002938 W KR2009002938 W KR 2009002938W WO 2009148253 A3 WO2009148253 A3 WO 2009148253A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- light emitting
- wafer
- emitting device
- semiconductor light
- supporting substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
- H10H20/0137—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials the light-emitting regions comprising nitride materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
- H10H20/0133—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials
- H10H20/01335—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials the light-emitting regions comprising nitride materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/018—Bonding of wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/83—Electrodes
- H10H20/832—Electrodes characterised by their material
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/83—Electrodes
- H10H20/832—Electrodes characterised by their material
- H10H20/833—Transparent materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/855—Optical field-shaping means, e.g. lenses
- H10H20/856—Reflecting means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/858—Means for heat extraction or cooling
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/84—Coatings, e.g. passivation layers or antireflective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/858—Means for heat extraction or cooling
- H10H20/8581—Means for heat extraction or cooling characterised by their material
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/858—Means for heat extraction or cooling
- H10H20/8582—Means for heat extraction or cooling characterised by their shape
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7412—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support the auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
Landscapes
- Led Devices (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
Abstract
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP09758506.1A EP2302705B1 (en) | 2008-06-02 | 2009-06-02 | Supporting substrate for fabrication of semiconductor light emitting device and semiconductor light emitting device using the same |
| CN200980130052.8A CN102106006B (zh) | 2008-06-02 | 2009-06-02 | 用于制备半导体发光装置的支撑衬底和使用支撑衬底的半导体发光装置 |
| US12/995,998 US20110127567A1 (en) | 2008-06-02 | 2009-06-02 | Supporting substrate for preparing semiconductor light-emitting device and semiconductor light-emitting device using supporting substrates |
| JP2011512377A JP5189681B2 (ja) | 2008-06-02 | 2009-06-02 | 半導体発光素子製造用支持基板及びこの支持基板を用いた半導体発光素子 |
| US14/024,129 US8877530B2 (en) | 2008-06-02 | 2013-09-11 | Supporting substrate for preparing semiconductor light-emitting device and semiconductor light-emitting device using supporting substrates |
| US14/481,993 US9224910B2 (en) | 2008-06-02 | 2014-09-10 | Supporting substrate for preparing semiconductor light-emitting device and semiconductor light-emitting device using supporting substrates |
Applications Claiming Priority (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR20080051397 | 2008-06-02 | ||
| KR10-2008-0051397 | 2008-06-02 | ||
| KR10-2008-0051396 | 2008-06-02 | ||
| KR20080051396 | 2008-06-02 | ||
| KR20080068521A KR101171855B1 (ko) | 2008-06-02 | 2008-07-15 | 반도체 발광소자용 지지기판 및 상기 지지기판을 이용한고성능 수직구조의 반도체 발광소자 |
| KR10-2008-0068521 | 2008-07-15 | ||
| KR1020080068525A KR101231118B1 (ko) | 2008-06-02 | 2008-07-15 | 반도체 발광소자용 지지기판 및 상기 지지기판을 이용한고성능 수직구조의 반도체 발광소자 |
| KR10-2008-0068525 | 2008-07-15 |
Related Child Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US12/995,998 A-371-Of-International US20110127567A1 (en) | 2008-06-02 | 2009-06-02 | Supporting substrate for preparing semiconductor light-emitting device and semiconductor light-emitting device using supporting substrates |
| US14/024,129 Division US8877530B2 (en) | 2008-06-02 | 2013-09-11 | Supporting substrate for preparing semiconductor light-emitting device and semiconductor light-emitting device using supporting substrates |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2009148253A2 WO2009148253A2 (ko) | 2009-12-10 |
| WO2009148253A3 true WO2009148253A3 (ko) | 2010-03-18 |
Family
ID=43608423
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/KR2009/002938 Ceased WO2009148253A2 (ko) | 2008-06-02 | 2009-06-02 | 반도체 발광소자 제조용 지지기판 및 상기 지지기판을 이용한 반도체 발광소자 |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US20110127567A1 (ko) |
| EP (1) | EP2302705B1 (ko) |
| JP (2) | JP5189681B2 (ko) |
| CN (2) | CN102106006B (ko) |
| WO (1) | WO2009148253A2 (ko) |
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| US7057256B2 (en) | 2001-05-25 | 2006-06-06 | President & Fellows Of Harvard College | Silicon-based visible and near-infrared optoelectric devices |
| DE102005022017B3 (de) * | 2005-05-12 | 2006-10-26 | Infineon Technologies Ag | Verfahren zur Herstellung von Chip-Stapeln sowie zugehörige Chip-Stapel |
| KR20100008123A (ko) | 2008-07-15 | 2010-01-25 | 고려대학교 산학협력단 | 이중 히트 씽크층으로 구성된 지지대를 갖춘 고성능수직구조의 반도체 발광소자 |
| US9293656B2 (en) * | 2012-11-02 | 2016-03-22 | Epistar Corporation | Light emitting device |
| US8716723B2 (en) * | 2008-08-18 | 2014-05-06 | Tsmc Solid State Lighting Ltd. | Reflective layer between light-emitting diodes |
| US8580593B2 (en) * | 2009-09-10 | 2013-11-12 | Micron Technology, Inc. | Epitaxial formation structures and associated methods of manufacturing solid state lighting devices |
| US9911781B2 (en) | 2009-09-17 | 2018-03-06 | Sionyx, Llc | Photosensitive imaging devices and associated methods |
| US9673243B2 (en) | 2009-09-17 | 2017-06-06 | Sionyx, Llc | Photosensitive imaging devices and associated methods |
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| US8692198B2 (en) | 2010-04-21 | 2014-04-08 | Sionyx, Inc. | Photosensitive imaging devices and associated methods |
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- 2009-06-02 CN CN201410682299.3A patent/CN104538507B/zh active Active
- 2009-06-02 EP EP09758506.1A patent/EP2302705B1/en not_active Not-in-force
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Also Published As
| Publication number | Publication date |
|---|---|
| US8877530B2 (en) | 2014-11-04 |
| JP2013070111A (ja) | 2013-04-18 |
| EP2302705A2 (en) | 2011-03-30 |
| CN102106006B (zh) | 2014-12-10 |
| US9224910B2 (en) | 2015-12-29 |
| WO2009148253A2 (ko) | 2009-12-10 |
| CN104538507A (zh) | 2015-04-22 |
| JP2011522436A (ja) | 2011-07-28 |
| CN102106006A (zh) | 2011-06-22 |
| US20140377895A1 (en) | 2014-12-25 |
| EP2302705A4 (en) | 2014-10-08 |
| JP5189681B2 (ja) | 2013-04-24 |
| CN104538507B (zh) | 2017-08-15 |
| US20140065746A1 (en) | 2014-03-06 |
| EP2302705B1 (en) | 2018-03-14 |
| US20110127567A1 (en) | 2011-06-02 |
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