WO2020133255A1 - Appareil d'analyse d'échantillon, système de maintenance et procédé associé - Google Patents

Appareil d'analyse d'échantillon, système de maintenance et procédé associé Download PDF

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Publication number
WO2020133255A1
WO2020133255A1 PCT/CN2018/125001 CN2018125001W WO2020133255A1 WO 2020133255 A1 WO2020133255 A1 WO 2020133255A1 CN 2018125001 W CN2018125001 W CN 2018125001W WO 2020133255 A1 WO2020133255 A1 WO 2020133255A1
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WO
WIPO (PCT)
Prior art keywords
maintenance
sample analysis
analysis device
items
determined
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2018/125001
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English (en)
Chinese (zh)
Inventor
范才彬
冷知见
戴海欣
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Mindray Bio Medical Electronics Co Ltd
Original Assignee
Shenzhen Mindray Bio Medical Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Mindray Bio Medical Electronics Co Ltd filed Critical Shenzhen Mindray Bio Medical Electronics Co Ltd
Priority to CN201880099527.0A priority Critical patent/CN113015907B/zh
Priority to PCT/CN2018/125001 priority patent/WO2020133255A1/fr
Publication of WO2020133255A1 publication Critical patent/WO2020133255A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor

Definitions

  • the maintenance result is displayed on the current maintenance interface.
  • an embodiment provides a sample analysis device, including:
  • the sample analysis device further includes a display; and the controller determines that a plurality of maintenance items that need to be performed currently include:
  • the multiple maintenance items selected by the user are determined as the current maintenance items that need to be performed.
  • the test condition information includes reagent information, quality control information, and/or calibration information.
  • FIG. 1 is a schematic flow chart of an embodiment for performing maintenance on a sample analysis device
  • FIG. 3 is two schematic diagrams of the project maintenance interface in an embodiment
  • FIG. 5 is a flowchart of a maintenance method according to an embodiment
  • FIG. 6 is a flowchart of a maintenance method according to another embodiment
  • the controller 40 controls the sample analysis device to execute the plurality of maintenance projects
  • the project maintenance interface is exited from the current operation interface and placed in the background execution list.
  • the background execution is completed, the execution result is notified to the current operation interface again.
  • Background maintenance achieves a good separation of front-end and back-end services, so that users can also use information from other functional interfaces during background maintenance.

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)

Abstract

L'invention concerne un appareil d'analyse d'échantillon (60), ainsi qu'un système de maintenance et un procédé associé, qui améliorent le processus de maintenance de l'appareil d'analyse d'échantillon (60) de telle sorte que le processus de maintenance soit pratique et à haut rendement, ce qui permet de réduire l'interaction de l'utilisateur, d'augmenter l'efficacité de maintenance et de réduire le temps de préparation par un utilisateur avant le test.
PCT/CN2018/125001 2018-12-28 2018-12-28 Appareil d'analyse d'échantillon, système de maintenance et procédé associé Ceased WO2020133255A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN201880099527.0A CN113015907B (zh) 2018-12-28 2018-12-28 一种样本分析装置及其维护系统和方法
PCT/CN2018/125001 WO2020133255A1 (fr) 2018-12-28 2018-12-28 Appareil d'analyse d'échantillon, système de maintenance et procédé associé

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2018/125001 WO2020133255A1 (fr) 2018-12-28 2018-12-28 Appareil d'analyse d'échantillon, système de maintenance et procédé associé

Publications (1)

Publication Number Publication Date
WO2020133255A1 true WO2020133255A1 (fr) 2020-07-02

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2018/125001 Ceased WO2020133255A1 (fr) 2018-12-28 2018-12-28 Appareil d'analyse d'échantillon, système de maintenance et procédé associé

Country Status (2)

Country Link
CN (1) CN113015907B (fr)
WO (1) WO2020133255A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115575650A (zh) * 2021-07-05 2023-01-06 深圳迈瑞生物医疗电子股份有限公司 样本分析仪及样本分析仪的维护方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101131386A (zh) * 2006-08-22 2008-02-27 希森美康株式会社 标本分析仪
US20090117620A1 (en) * 2007-11-05 2009-05-07 Abbott Laboratories Automated analyzer for clinical laboratory
CN103364539A (zh) * 2012-03-28 2013-10-23 希森美康株式会社 样本分析装置、样本分析系统及其的管理方法
CN104769438A (zh) * 2012-11-12 2015-07-08 株式会社日立高新技术 自动分析装置
CN107179737A (zh) * 2016-03-09 2017-09-19 横河电机株式会社 仪器维护装置、仪器维护系统、仪器维护方法、仪器维护程序以及记录介质

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5658501B2 (ja) * 2010-07-27 2015-01-28 シスメックス株式会社 検体分析システム、検体分析装置、管理装置、及び検体分析装置の管理方法
JP5371905B2 (ja) * 2010-07-30 2013-12-18 シスメックス株式会社 検体処理装置の管理システム、検体処理装置及び管理装置ならびに管理方法
JP5877058B2 (ja) * 2011-12-22 2016-03-02 シスメックス株式会社 検体処理装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101131386A (zh) * 2006-08-22 2008-02-27 希森美康株式会社 标本分析仪
US20090117620A1 (en) * 2007-11-05 2009-05-07 Abbott Laboratories Automated analyzer for clinical laboratory
CN103364539A (zh) * 2012-03-28 2013-10-23 希森美康株式会社 样本分析装置、样本分析系统及其的管理方法
CN104769438A (zh) * 2012-11-12 2015-07-08 株式会社日立高新技术 自动分析装置
CN107179737A (zh) * 2016-03-09 2017-09-19 横河电机株式会社 仪器维护装置、仪器维护系统、仪器维护方法、仪器维护程序以及记录介质

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115575650A (zh) * 2021-07-05 2023-01-06 深圳迈瑞生物医疗电子股份有限公司 样本分析仪及样本分析仪的维护方法

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Publication number Publication date
CN113015907A (zh) 2021-06-22
CN113015907B (zh) 2023-12-05

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