ZA832368B - Time measurement method and apparatus for its performance - Google Patents
Time measurement method and apparatus for its performanceInfo
- Publication number
- ZA832368B ZA832368B ZA832368A ZA832368A ZA832368B ZA 832368 B ZA832368 B ZA 832368B ZA 832368 A ZA832368 A ZA 832368A ZA 832368 A ZA832368 A ZA 832368A ZA 832368 B ZA832368 B ZA 832368B
- Authority
- ZA
- South Africa
- Prior art keywords
- performance
- measurement method
- time measurement
- time
- measurement
- Prior art date
Links
- 238000000691 measurement method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
-
- G—PHYSICS
- G04—HOROLOGY
- G04F—TIME-INTERVAL MEASURING
- G04F10/00—Apparatus for measuring unknown time intervals by electric means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Unknown Time Intervals (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE3215847A DE3215847C2 (de) | 1982-04-28 | 1982-04-28 | Zeitmeßverfahren und Vorrichtung zu seiner Durchführung |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ZA832368B true ZA832368B (en) | 1983-12-28 |
Family
ID=6162173
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ZA832368A ZA832368B (en) | 1982-04-28 | 1983-03-31 | Time measurement method and apparatus for its performance |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4569599A (fr) |
| EP (1) | EP0092676B1 (fr) |
| JP (1) | JPS593289A (fr) |
| DE (1) | DE3215847C2 (fr) |
| ZA (1) | ZA832368B (fr) |
Families Citing this family (42)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3215847C2 (de) * | 1982-04-28 | 1985-10-31 | MTC, Meßtechnik und Optoelektronik AG, Neuenburg/Neuchâtel | Zeitmeßverfahren und Vorrichtung zu seiner Durchführung |
| FR2564613B1 (fr) * | 1984-05-17 | 1987-04-30 | Commissariat Energie Atomique | Systeme de chronometrie electronique de haute resolution |
| SE456538B (sv) * | 1984-06-01 | 1988-10-10 | Saab Marine Electronics | Sett och anordning for nivametning med mikrovagor |
| US4988981B1 (en) * | 1987-03-17 | 1999-05-18 | Vpl Newco Inc | Computer data entry and manipulation apparatus and method |
| US5986643A (en) * | 1987-03-24 | 1999-11-16 | Sun Microsystems, Inc. | Tactile feedback mechanism for a data processing system |
| US6885361B1 (en) | 1987-03-24 | 2005-04-26 | Sun Microsystems, Inc. | Tactile feedback mechanism for a data processing system |
| US5058087A (en) * | 1987-05-29 | 1991-10-15 | Siemens Aktiengesellschaft | Process for determining the electrical duration of signal paths |
| US5359404A (en) * | 1989-03-27 | 1994-10-25 | Laser Technology, Inc. | Laser-based speed measuring device |
| US5291262A (en) * | 1989-03-27 | 1994-03-01 | Dunne Jeremy G | Laser surveying instrument |
| US5521696A (en) * | 1989-03-27 | 1996-05-28 | Laser Technology, Inc. | Laser-based speed measuring device |
| US5588139A (en) * | 1990-06-07 | 1996-12-24 | Vpl Research, Inc. | Method and system for generating objects for a multi-person virtual world using data flow networks |
| US5007035A (en) * | 1990-06-29 | 1991-04-09 | Chrysler Corporation | Distance pulse averaging unit |
| US5243553A (en) * | 1991-07-02 | 1993-09-07 | Loral Vought Systems Corporation | Gate array pulse capture device |
| US5357331A (en) * | 1991-07-02 | 1994-10-18 | Flockencier Stuart W | System for processing reflected energy signals |
| US5263012A (en) * | 1992-01-08 | 1993-11-16 | Hughes Aircraft Company | Sub-nanosecond time difference measurement |
| US5262837A (en) * | 1992-10-21 | 1993-11-16 | Norm Pacific Automation Corp. | Laser range finder |
| US5321490A (en) * | 1992-11-23 | 1994-06-14 | Schwartz Electro-Optics, Inc. | Active near-field object sensor and method employing object classification techniques |
| US5987346A (en) | 1993-02-26 | 1999-11-16 | Benaron; David A. | Device and method for classification of tissue |
| US5406842A (en) * | 1993-10-07 | 1995-04-18 | Motorola, Inc. | Method and apparatus for material level measurement using stepped frequency microwave signals |
| KR950019772A (ko) * | 1993-12-29 | 1995-07-24 | 김주용 | 위상 변화를 이용한 광학식 거리 측정 장치 및 그 방법 |
| US5440310A (en) * | 1994-02-14 | 1995-08-08 | Motorola, Inc. | Bandwidth synthesized radar level measurement method and apparatus |
| JPH10503837A (ja) * | 1994-05-09 | 1998-04-07 | ハインズ,ロビン,エイチ. | 手持形距離測定装置およびシステム |
| KR100278806B1 (ko) * | 1995-01-19 | 2001-02-01 | 데이비드 윌리엄 | 레이저범위탐지기 |
| US5652651A (en) * | 1995-01-19 | 1997-07-29 | Laser Technology, Inc. | Laser range finder having selectable target acquisition characteristics and range measuring precision |
| US5574552A (en) * | 1995-01-19 | 1996-11-12 | Laser Technology, Inc. | Self-calibrating precision timing circuit and method for a laser range finder |
| US5612779A (en) * | 1995-01-19 | 1997-03-18 | Laser Technology, Inc. | Automatic noise threshold determining circuit and method for a laser range finder |
| US5623335A (en) * | 1995-05-04 | 1997-04-22 | Bushnell Corporation | Laser range finder with target quality display |
| US6023322A (en) * | 1995-05-04 | 2000-02-08 | Bushnell Corporation | Laser range finder with target quality display and scan mode |
| DE19607345A1 (de) * | 1996-02-27 | 1997-08-28 | Sick Ag | Laserabstandsermittlungsvorrichtung |
| US5818735A (en) * | 1996-06-20 | 1998-10-06 | Peek Measurement, Inc. | Method and system for high resolution time-of-flight measurements |
| US5898484A (en) * | 1997-05-30 | 1999-04-27 | Harris; Steven E. | Hand-held distance-measurement device with an enhanced viewfinder |
| US6717656B2 (en) * | 2000-01-20 | 2004-04-06 | Asian Optical Co. Ltd. | Method and apparatus of a laser range detector |
| ATE263380T1 (de) * | 2000-01-26 | 2004-04-15 | Instro Prec Ltd | Optische distanzmessung |
| TW442652B (en) | 2000-09-11 | 2001-06-23 | Asia Optical Co Inc | Optical receiver circuit of laser range-finder |
| US6522983B1 (en) * | 2001-03-05 | 2003-02-18 | Tektronix, Inc. | Timebase calibration method for an equivalent time sampling digitizing instrument |
| US7451049B2 (en) * | 2004-02-27 | 2008-11-11 | National Instruments Corporation | Automatic delays for alignment of signals |
| DE102004031024C5 (de) * | 2004-06-26 | 2011-04-28 | Leuze Lumiflex Gmbh + Co. Kg | Optischer Sensor |
| US7684017B2 (en) * | 2006-10-26 | 2010-03-23 | Callaway Golf Company | Laser range finder for use on a golf course |
| FR3024907A1 (fr) | 2014-08-18 | 2016-02-19 | St Microelectronics Grenoble 2 | Procede de mesure de temps de vol a l'aide de diodes spad |
| US10886930B1 (en) * | 2019-07-30 | 2021-01-05 | Infineon Technologies Ag | Voltage controlled oscillator based analog-to-digital converter including a maximum length sequence generator |
| WO2024200631A1 (fr) * | 2023-03-31 | 2024-10-03 | Sony Semiconductor Solutions Corporation | Pixel de capteur d'image, capteur d'image et procédé de fonctionnement d'un pixel de capteur d'image |
| CN117761449B (zh) * | 2023-11-16 | 2025-04-18 | 北京四方继保工程技术有限公司 | 一种用于行波测距的对时与同步采样方法及系统 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3728025A (en) * | 1971-03-08 | 1973-04-17 | Cubic Corp | Optical distance measuring equipment |
| US4181431A (en) * | 1976-07-31 | 1980-01-01 | Mitec-Moderne Industrietechnik Gmbh | Laser distance measuring apparatus |
| DE2634627C2 (de) * | 1976-07-31 | 1982-08-19 | MITEC Moderne Industrietechnik GmbH, 8012 Ottobrunn | Laserentfernungsmeßgerät |
| DE2855819C3 (de) * | 1977-12-26 | 1981-05-21 | Takeda Riken Kogyo K.K., Tokyo | Zeitintervall-Meßeinrichtung |
| DE2842450C2 (de) * | 1978-09-29 | 1982-08-19 | MITEC Moderne Industrietechnik GmbH, 8012 Ottobrunn | Verfahren zur Messung der zeitlichen Abstände von jeweils zwei elektrischen Signalen |
| DE3012186C2 (de) * | 1980-03-28 | 1982-09-23 | MITEC Moderne Industrietechnik GmbH, 8012 Ottobrunn | Zeitmeßverfahren und Vorrichtung zu seiner Durchführung |
| DE3215847C2 (de) * | 1982-04-28 | 1985-10-31 | MTC, Meßtechnik und Optoelektronik AG, Neuenburg/Neuchâtel | Zeitmeßverfahren und Vorrichtung zu seiner Durchführung |
| DE3216313C2 (de) * | 1982-05-03 | 1994-11-03 | Hipp Johann F | Regelungselektronische Einrichtung für elektrooptische Entfernungsmesser mit Lichtpulslaufzeit-Meßverfahren |
-
1982
- 1982-04-28 DE DE3215847A patent/DE3215847C2/de not_active Expired
-
1983
- 1983-03-21 EP EP83102782A patent/EP0092676B1/fr not_active Expired
- 1983-03-31 ZA ZA832368A patent/ZA832368B/xx unknown
- 1983-04-26 US US06/488,779 patent/US4569599A/en not_active Expired - Fee Related
- 1983-04-28 JP JP58074222A patent/JPS593289A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP0092676A3 (en) | 1984-03-28 |
| JPS593289A (ja) | 1984-01-09 |
| DE3215847A1 (de) | 1983-11-03 |
| DE3215847C2 (de) | 1985-10-31 |
| EP0092676B1 (fr) | 1987-01-21 |
| US4569599A (en) | 1986-02-11 |
| EP0092676A2 (fr) | 1983-11-02 |
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