ATE118896T1 - Testzelle für das kontaktlosen testen von elektrischen schaltungen auf unterbrechungen oder kurzschlüssen. - Google Patents

Testzelle für das kontaktlosen testen von elektrischen schaltungen auf unterbrechungen oder kurzschlüssen.

Info

Publication number
ATE118896T1
ATE118896T1 AT90306197T AT90306197T ATE118896T1 AT E118896 T1 ATE118896 T1 AT E118896T1 AT 90306197 T AT90306197 T AT 90306197T AT 90306197 T AT90306197 T AT 90306197T AT E118896 T1 ATE118896 T1 AT E118896T1
Authority
AT
Austria
Prior art keywords
container
imaging plane
electrodes
circuit board
test cell
Prior art date
Application number
AT90306197T
Other languages
English (en)
Inventor
Andrew J Lepage
Diethelm G Ringleb
Original Assignee
Digital Equipment Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Digital Equipment Corp filed Critical Digital Equipment Corp
Application granted granted Critical
Publication of ATE118896T1 publication Critical patent/ATE118896T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Examining Or Testing Airtightness (AREA)
  • Secondary Cells (AREA)
  • Battery Electrode And Active Subsutance (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
AT90306197T 1989-06-26 1990-06-07 Testzelle für das kontaktlosen testen von elektrischen schaltungen auf unterbrechungen oder kurzschlüssen. ATE118896T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/371,704 US5032788A (en) 1989-06-26 1989-06-26 Test cell for non-contact opens/shorts testing of electrical circuits

Publications (1)

Publication Number Publication Date
ATE118896T1 true ATE118896T1 (de) 1995-03-15

Family

ID=23465079

Family Applications (1)

Application Number Title Priority Date Filing Date
AT90306197T ATE118896T1 (de) 1989-06-26 1990-06-07 Testzelle für das kontaktlosen testen von elektrischen schaltungen auf unterbrechungen oder kurzschlüssen.

Country Status (6)

Country Link
US (1) US5032788A (de)
EP (1) EP0409398B1 (de)
JP (1) JPH065245B2 (de)
AT (1) ATE118896T1 (de)
CA (1) CA2018725A1 (de)
DE (1) DE69017109T2 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3927842A1 (de) * 1989-08-23 1991-02-28 Siemens Ag Vorrichtung fuer die elektrische funktionspruefung von verdrahtungsfeldern, insbesondere von leiterplatten
US5179279A (en) * 1991-01-25 1993-01-12 Rensselaer Polytechnic Institute Non-contact electrical pathway
EP0508062B1 (de) * 1991-04-10 1995-07-19 atg test systems GmbH Verfahren und Vorrichtung zur Prüfung einer elektrischen Leiteranordnung
JP2577140B2 (ja) * 1991-05-27 1997-01-29 日立テクノエンジニアリング株式会社 基板の位置合わせ装置
DE4200404B4 (de) * 1992-01-10 2006-04-06 Atg Test Systems Gmbh & Co.Kg Vorrichtung zur elektrischen Prüfung und Verfahren
US5469064A (en) * 1992-01-14 1995-11-21 Hewlett-Packard Company Electrical assembly testing using robotic positioning of probes
US5202623A (en) * 1992-02-26 1993-04-13 Digital Equipment Corporation Laser-activated plasma chamber for non-contact testing
ES2073992B1 (es) * 1993-04-27 1997-08-16 Univ Cadiz Camara de ensayos para sistemas estaticos de deteccion de gases toxicos.
JPH07140209A (ja) * 1993-09-20 1995-06-02 Fujitsu Ltd 回路配線基板の検査装置およびその検査方法
US5744752A (en) * 1995-06-05 1998-04-28 International Business Machines Corporation Hermetic thin film metallized sealband for SCM and MCM-D modules
US5587664A (en) * 1995-07-12 1996-12-24 Exsight Ltd. Laser-induced metallic plasma for non-contact inspection
US5818239A (en) * 1997-03-05 1998-10-06 International Business Machines Corporation Simplified contactless test of MCM thin film I/O nets using a plasma
JP3340659B2 (ja) * 1997-10-31 2002-11-05 日本碍子株式会社 電子部品の外観検査装置及び電子部品の外観検査方法
US6268719B1 (en) * 1998-09-23 2001-07-31 Delaware Capital Formation, Inc. Printed circuit board test apparatus
US6472889B1 (en) 2000-06-15 2002-10-29 University Of Connecticut Apparatus and method for producing an ion channel microprobe
DE10038313A1 (de) 2000-08-05 2002-02-21 Tsk Pruefsysteme Fuer Elek Sch Verfahren und Vorrichtung zur Prüfung von Leiterplatten auf Funktionsfähigkeit
US20050263492A1 (en) * 2004-05-28 2005-12-01 Siemens Energy & Automation, Inc. Molded arc chute
WO2013012616A2 (en) * 2011-07-15 2013-01-24 Orbotech Ltd. Electrical inspection of electronic devices using electron-beam induced plasma probes
TWI519050B (zh) * 2015-01-20 2016-01-21 宇帷國際股份有限公司 電子裝置及其電路模組
TWI522784B (zh) * 2015-01-20 2016-02-21 宇帷國際股份有限公司 電子裝置
US10473712B2 (en) * 2016-12-27 2019-11-12 Infineon Technologies Ag Integrated circuit device testing in an inert gas
CN114114079B (zh) * 2021-10-25 2025-02-25 厦门优迅芯片股份有限公司 一种激光器驱动开路检测电路
CN114264977B (zh) * 2022-01-13 2024-01-26 中山市飞鸿电器有限公司 一种单面印刷电路板开路和短路测试装置
CN116699246B (zh) * 2023-08-04 2023-10-03 滨州高新高端装备制造产业园有限公司 机电设备制造的电器件阻值测量装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3436651A (en) * 1966-12-23 1969-04-01 Texas Instruments Inc Electronic method and apparatus utilizing photoemissive means for testing circuit board continuity
US3710251A (en) * 1971-04-07 1973-01-09 Collins Radio Co Microelectric heat exchanger pedestal
GB2108775B (en) * 1981-10-21 1985-01-03 Marconi Instruments Ltd Electrical interface arrangements
US4507605A (en) * 1982-05-17 1985-03-26 Testamatic, Incorporated Method and apparatus for electrical and optical inspection and testing of unpopulated printed circuit boards and other like items
US4527119A (en) * 1982-05-17 1985-07-02 Testamatic, Incorporated High speed, low mass, movable probe and/or instrument positioner, tool and like items suitable for use in a controlled environment chamber
US4520312A (en) * 1982-11-03 1985-05-28 Rca Corporation Method for determining the integrity of passivant coverage over rectifying junctions in semiconductor devices
DE3671106D1 (de) * 1985-09-04 1990-06-13 Siemens Ag Vorrichtung fuer die elektrische funktionspruefung von verdrahtungsfeldern, insbesondere von leiterplatten.
FR2599544B1 (fr) * 1986-05-27 1993-09-10 Commissariat Energie Atomique Appareil d'irradiation pour circuits electroniques
EP0314678A1 (de) * 1986-06-09 1989-05-10 SIM, Nigel Louis Gasbeheiztes werkzeug mit regelventil und wiederfüllbarem behälter
US4721910A (en) * 1986-09-12 1988-01-26 American Telephone And Telegraph Company, At&T Bell Laboratories High speed circuit measurements using photoemission sampling
US4771230A (en) * 1986-10-02 1988-09-13 Testamatic Corporation Electro-luminescent method and testing system for unpopulated printed circuit boards, ceramic substrates, and the like having both electrical and electro-optical read-out

Also Published As

Publication number Publication date
US5032788A (en) 1991-07-16
JPH0337578A (ja) 1991-02-18
DE69017109T2 (de) 1995-10-26
EP0409398B1 (de) 1995-02-22
EP0409398A2 (de) 1991-01-23
DE69017109D1 (de) 1995-03-30
JPH065245B2 (ja) 1994-01-19
CA2018725A1 (en) 1990-12-26
EP0409398A3 (en) 1992-02-26

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