ATE156958T1 - Ausrichtsystem und -verfahren für eine prüfhalterung - Google Patents

Ausrichtsystem und -verfahren für eine prüfhalterung

Info

Publication number
ATE156958T1
ATE156958T1 AT91911016T AT91911016T ATE156958T1 AT E156958 T1 ATE156958 T1 AT E156958T1 AT 91911016 T AT91911016 T AT 91911016T AT 91911016 T AT91911016 T AT 91911016T AT E156958 T1 ATE156958 T1 AT E156958T1
Authority
AT
Austria
Prior art keywords
board
fixture
test
probes
tooling pin
Prior art date
Application number
AT91911016T
Other languages
English (en)
Inventor
Mark A Swart
Charles J Johnston
Loan David R Van
Original Assignee
Everett Charles Contact Prod
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=24107925&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE156958(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from US07/648,453 external-priority patent/US5321351A/en
Application filed by Everett Charles Contact Prod filed Critical Everett Charles Contact Prod
Application granted granted Critical
Publication of ATE156958T1 publication Critical patent/ATE156958T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Waveguide Connection Structure (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Measuring Leads Or Probes (AREA)
AT91911016T 1990-05-25 1991-05-24 Ausrichtsystem und -verfahren für eine prüfhalterung ATE156958T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US52895790A 1990-05-25 1990-05-25
US07/648,453 US5321351A (en) 1990-05-25 1991-01-31 Test fixture alignment system

Publications (1)

Publication Number Publication Date
ATE156958T1 true ATE156958T1 (de) 1997-08-15

Family

ID=24107925

Family Applications (1)

Application Number Title Priority Date Filing Date
AT91911016T ATE156958T1 (de) 1990-05-25 1991-05-24 Ausrichtsystem und -verfahren für eine prüfhalterung

Country Status (5)

Country Link
EP (1) EP0531428B1 (de)
JP (1) JPH0833434B2 (de)
AT (1) ATE156958T1 (de)
DE (1) DE69127283T2 (de)
WO (1) WO1991019392A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5408189A (en) * 1990-05-25 1995-04-18 Everett Charles Technologies, Inc. Test fixture alignment system for printed circuit boards
FR2692048B1 (fr) * 1992-06-09 1996-09-06 Everett Charles Tech Montage d'essai.
US5416428A (en) * 1993-02-09 1995-05-16 Everett Charles Technologies, Inc. Marker probe
US5442299A (en) * 1994-01-06 1995-08-15 International Business Machines Corporation Printed circuit board test fixture and method
DE4406538A1 (de) 1994-02-28 1995-08-31 Mania Gmbh Leiterplatten-Prüfeinrichtung mit Prüfadapter und Verfahren zum Einstellen desselben
US9523735B2 (en) * 2014-10-08 2016-12-20 Eastman Kodak Company Electrical test system with vision-guided alignment
CN112649628B (zh) * 2020-12-14 2024-07-23 华虹半导体(无锡)有限公司 探针卡的维护校正方法
CN118483457A (zh) * 2024-04-11 2024-08-13 徐州领测半导体科技有限公司 一种具有位置校正功能的集成电路测试夹具

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4668982A (en) * 1985-06-17 1987-05-26 The Perkin-Elmer Corporation Misregistration/distortion correction scheme
US4943767A (en) * 1986-08-21 1990-07-24 Tokyo Electron Limited Automatic wafer position aligning method for wafer prober
GB8700754D0 (en) * 1987-01-14 1987-02-18 Int Computers Ltd Test apparatus for printed circuit boards
JP2622573B2 (ja) * 1988-01-27 1997-06-18 キヤノン株式会社 マーク検知装置及び方法
CA1314085C (en) * 1988-05-25 1993-03-02 Andras G. Fule Linear interpolation for a component placement robot

Also Published As

Publication number Publication date
DE69127283D1 (de) 1997-09-18
DE69127283T2 (de) 1998-01-02
JPH0833434B2 (ja) 1996-03-29
EP0531428A4 (en) 1993-05-12
JPH05506719A (ja) 1993-09-30
EP0531428A1 (de) 1993-03-17
EP0531428B1 (de) 1997-08-13
WO1991019392A1 (en) 1991-12-12

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties