ATE185018T1 - Schaltung zur isolierten bitleitungsmodulation eines srams während prüfmodus - Google Patents

Schaltung zur isolierten bitleitungsmodulation eines srams während prüfmodus

Info

Publication number
ATE185018T1
ATE185018T1 AT96911291T AT96911291T ATE185018T1 AT E185018 T1 ATE185018 T1 AT E185018T1 AT 96911291 T AT96911291 T AT 96911291T AT 96911291 T AT96911291 T AT 96911291T AT E185018 T1 ATE185018 T1 AT E185018T1
Authority
AT
Austria
Prior art keywords
fet
test mode
sram
bitline
voltage levels
Prior art date
Application number
AT96911291T
Other languages
English (en)
Inventor
Kenneth W Marr
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Application granted granted Critical
Publication of ATE185018T1 publication Critical patent/ATE185018T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/46—Test trigger logic
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C2029/5004—Voltage

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Compression, Expansion, Code Conversion, And Decoders (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
AT96911291T 1995-04-12 1996-03-12 Schaltung zur isolierten bitleitungsmodulation eines srams während prüfmodus ATE185018T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/421,506 US5568435A (en) 1995-04-12 1995-04-12 Circuit for SRAM test mode isolated bitline modulation

Publications (1)

Publication Number Publication Date
ATE185018T1 true ATE185018T1 (de) 1999-10-15

Family

ID=23670810

Family Applications (1)

Application Number Title Priority Date Filing Date
AT96911291T ATE185018T1 (de) 1995-04-12 1996-03-12 Schaltung zur isolierten bitleitungsmodulation eines srams während prüfmodus

Country Status (8)

Country Link
US (3) US5568435A (de)
EP (1) EP0820631B1 (de)
JP (1) JP2912022B2 (de)
KR (1) KR100273186B1 (de)
AT (1) ATE185018T1 (de)
DE (1) DE69604389T2 (de)
TW (1) TW358994B (de)
WO (1) WO1996032728A1 (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5894434A (en) * 1995-12-22 1999-04-13 Texas Instruments Incorporated MOS static memory array
US6750107B1 (en) * 1996-01-31 2004-06-15 Micron Technology, Inc. Method and apparatus for isolating a SRAM cell
US6103579A (en) * 1996-01-31 2000-08-15 Micron Technology, Inc. Method of isolating a SRAM cell
US5818750A (en) 1996-07-31 1998-10-06 Micron Technology, Inc. Static memory cell
JP3223817B2 (ja) * 1996-11-08 2001-10-29 日本電気株式会社 半導体メモリ装置及びその駆動方法
US5996106A (en) 1997-02-04 1999-11-30 Micron Technology, Inc. Multi bank test mode for memory devices
US5913928A (en) * 1997-05-09 1999-06-22 Micron Technology, Inc. Data compression test mode independent of redundancy
US6174764B1 (en) 1997-05-12 2001-01-16 Micron Technology, Inc. Process for manufacturing integrated circuit SRAM
FR2772970B1 (fr) * 1997-12-24 2003-09-26 Sgs Thomson Microelectronics Procede de test d'une memoire dynamique
US5999466A (en) * 1998-01-13 1999-12-07 Micron Technology, Inc. Method, apparatus and system for voltage screening of integrated circuits
TW442886B (en) * 1998-01-15 2001-06-23 Winbond Electronics Corp Method for testing sub-threshold leakage of pull-down transistor in SRAM
US5959913A (en) * 1998-02-19 1999-09-28 Micron Technology, Inc. Device and method for stress testing a semiconductor memory
US5995423A (en) * 1998-02-27 1999-11-30 Micron Technology, Inc. Method and apparatus for limiting bitline current
KR100295055B1 (ko) * 1998-09-25 2001-07-12 윤종용 전압조정이가능한내부전원회로를갖는반도체메모리장치
JP2000322900A (ja) * 1999-05-12 2000-11-24 Mitsubishi Electric Corp 半導体記録装置
US6198670B1 (en) * 1999-06-22 2001-03-06 Micron Technology, Inc. Bias generator for a four transistor load less memory cell
US6172901B1 (en) * 1999-12-30 2001-01-09 Stmicroelectronics, S.R.L. Low power static random access memory and method for writing to same
DE10064478B4 (de) * 2000-12-22 2005-02-24 Atmel Germany Gmbh Verfahren zur Prüfung einer integrierten Schaltung und Schaltungsanordnung
US6950355B2 (en) * 2001-08-17 2005-09-27 Broadcom Corporation System and method to screen defect related reliability failures in CMOS SRAMS
US6707707B2 (en) * 2001-12-21 2004-03-16 Micron Technology, Inc. SRAM power-up system and method
KR100471168B1 (ko) * 2002-05-27 2005-03-08 삼성전자주식회사 반도체 메모리 장치의 불량 셀을 스크린하는 회로, 그스크린 방법 및 그 스크린을 위한 배치 방법
US6781907B2 (en) * 2002-06-06 2004-08-24 Micron Technology, Inc. Temperature compensated T-RAM memory device and method
JP2004199763A (ja) * 2002-12-18 2004-07-15 Renesas Technology Corp 半導体集積回路装置
KR100505430B1 (ko) * 2003-11-21 2005-08-04 주식회사 하이닉스반도체 에스램의 불량분석 방법
US7519877B2 (en) * 2004-08-10 2009-04-14 Micron Technology, Inc. Memory with test mode output
US7495979B2 (en) * 2005-03-25 2009-02-24 Taiwan Semiconductor Manufacturing Co., Ltd. Method and system for in-situ parametric SRAM diagnosis
US7385864B2 (en) * 2006-09-12 2008-06-10 Texas Instruments Incorporated SRAM static noise margin test structure suitable for on chip parametric measurements
US11295995B2 (en) 2019-09-17 2022-04-05 International Business Machines Corporation Testing SRAM structures

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4502140A (en) * 1983-07-25 1985-02-26 Mostek Corporation GO/NO GO margin test circuit for semiconductor memory
JPH01166391A (ja) * 1987-12-23 1989-06-30 Toshiba Corp スタティック型ランダムアクセスメモリ
JPH01166399A (ja) * 1987-12-23 1989-06-30 Toshiba Corp スタティック型ランダムアクセスメモリ
JP3050326B2 (ja) * 1990-11-30 2000-06-12 日本電気株式会社 半導体集積回路
US5222066A (en) * 1990-12-26 1993-06-22 Motorola, Inc. Modular self-test for embedded SRAMS
US5166608A (en) * 1991-11-07 1992-11-24 Advanced Micro Devices, Inc. Arrangement for high speed testing of field-effect transistors and memory cells employing the same
US5255230A (en) * 1991-12-31 1993-10-19 Intel Corporation Method and apparatus for testing the continuity of static random access memory cells
US5212442A (en) * 1992-03-20 1993-05-18 Micron Technology, Inc. Forced substrate test mode for packaged integrated circuits
KR950014099B1 (ko) * 1992-06-12 1995-11-21 가부시기가이샤 도시바 반도체 기억장치
JPH0612878A (ja) * 1992-06-25 1994-01-21 Mitsubishi Electric Corp 半導体メモリ装置
US5424988A (en) * 1992-09-30 1995-06-13 Sgs-Thomson Microelectronics, Inc. Stress test for memory arrays in integrated circuits
KR950004870B1 (ko) * 1992-11-24 1995-05-15 삼성전자 주식회사 번인 모드에서 분리게이트의 신뢰성 개선회로
JPH06233000A (ja) * 1993-02-08 1994-08-19 Matsushita Electric Ind Co Ltd ファクシミリ装置

Also Published As

Publication number Publication date
WO1996032728A1 (en) 1996-10-17
DE69604389T2 (de) 2000-02-17
JP2912022B2 (ja) 1999-06-28
US6081464A (en) 2000-06-27
JPH10506218A (ja) 1998-06-16
KR100273186B1 (ko) 2001-01-15
EP0820631A1 (de) 1998-01-28
KR19980703823A (ko) 1998-12-05
US5568435A (en) 1996-10-22
DE69604389D1 (de) 1999-10-28
US5745415A (en) 1998-04-28
EP0820631B1 (de) 1999-09-22
TW358994B (en) 1999-05-21

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