ATE225961T1 - Halbleiterspeicheranordnung mit fehlerdetektion und -korrektur - Google Patents

Halbleiterspeicheranordnung mit fehlerdetektion und -korrektur

Info

Publication number
ATE225961T1
ATE225961T1 AT97934742T AT97934742T ATE225961T1 AT E225961 T1 ATE225961 T1 AT E225961T1 AT 97934742 T AT97934742 T AT 97934742T AT 97934742 T AT97934742 T AT 97934742T AT E225961 T1 ATE225961 T1 AT E225961T1
Authority
AT
Austria
Prior art keywords
block
semiconductor memory
pct
correction
error detection
Prior art date
Application number
AT97934742T
Other languages
English (en)
Inventor
Shuichi Kikuchi
Original Assignee
Tokyo Electron Device Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Device Ltd filed Critical Tokyo Electron Device Ltd
Application granted granted Critical
Publication of ATE225961T1 publication Critical patent/ATE225961T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16—Error detection or correction of the data by redundancy in hardware
    • G06F11/20—Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/76—Masking faults in memories by using spares or by reconfiguring using address translation or modifications
    • G11C29/765—Masking faults in memories by using spares or by reconfiguring using address translation or modifications in solid state disks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G06F2201/88—Monitoring involving counting

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Read Only Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Hardware Redundancy (AREA)
AT97934742T 1996-08-16 1997-08-08 Halbleiterspeicheranordnung mit fehlerdetektion und -korrektur ATE225961T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP23468296 1996-08-16
PCT/JP1997/002779 WO1998008166A1 (en) 1996-08-16 1997-08-08 Semiconductor memory device having error detection and correction

Publications (1)

Publication Number Publication Date
ATE225961T1 true ATE225961T1 (de) 2002-10-15

Family

ID=16974802

Family Applications (1)

Application Number Title Priority Date Filing Date
AT97934742T ATE225961T1 (de) 1996-08-16 1997-08-08 Halbleiterspeicheranordnung mit fehlerdetektion und -korrektur

Country Status (8)

Country Link
US (1) US6058047A (de)
EP (1) EP0862762B1 (de)
JP (1) JP2001501000A (de)
KR (1) KR100383404B1 (de)
AT (1) ATE225961T1 (de)
DE (1) DE69716233T2 (de)
TW (1) TW368659B (de)
WO (1) WO1998008166A1 (de)

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Also Published As

Publication number Publication date
US6058047A (en) 2000-05-02
KR20000064279A (ko) 2000-11-06
WO1998008166A1 (en) 1998-02-26
TW368659B (en) 1999-09-01
JP2001501000A (ja) 2001-01-23
DE69716233D1 (de) 2002-11-14
DE69716233T2 (de) 2003-02-20
EP0862762B1 (de) 2002-10-09
KR100383404B1 (ko) 2003-07-16
EP0862762A1 (de) 1998-09-09

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