ATE371250T1 - Programmierung mit verstärktem substrat/tub für flash-speicher - Google Patents

Programmierung mit verstärktem substrat/tub für flash-speicher

Info

Publication number
ATE371250T1
ATE371250T1 AT04784015T AT04784015T ATE371250T1 AT E371250 T1 ATE371250 T1 AT E371250T1 AT 04784015 T AT04784015 T AT 04784015T AT 04784015 T AT04784015 T AT 04784015T AT E371250 T1 ATE371250 T1 AT E371250T1
Authority
AT
Austria
Prior art keywords
tub
substrate
floating gate
programming
gate memory
Prior art date
Application number
AT04784015T
Other languages
English (en)
Inventor
Hagop Nazarian
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Application granted granted Critical
Publication of ATE371250T1 publication Critical patent/ATE371250T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/12—Programming voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Read Only Memory (AREA)
  • Non-Volatile Memory (AREA)
  • Semiconductor Memories (AREA)
  • Saccharide Compounds (AREA)
AT04784015T 2003-09-16 2004-09-14 Programmierung mit verstärktem substrat/tub für flash-speicher ATE371250T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/663,277 US6977842B2 (en) 2003-09-16 2003-09-16 Boosted substrate/tub programming for flash memories

Publications (1)

Publication Number Publication Date
ATE371250T1 true ATE371250T1 (de) 2007-09-15

Family

ID=34274335

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04784015T ATE371250T1 (de) 2003-09-16 2004-09-14 Programmierung mit verstärktem substrat/tub für flash-speicher

Country Status (9)

Country Link
US (2) US6977842B2 (de)
EP (1) EP1665281B1 (de)
JP (1) JP4417383B2 (de)
KR (1) KR100769795B1 (de)
CN (1) CN100479063C (de)
AT (1) ATE371250T1 (de)
DE (1) DE602004008490T2 (de)
SG (1) SG146620A1 (de)
WO (1) WO2005029501A1 (de)

Families Citing this family (101)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7505321B2 (en) * 2002-12-31 2009-03-17 Sandisk 3D Llc Programmable memory array structure incorporating series-connected transistor strings and methods for fabrication and operation of same
US7233522B2 (en) * 2002-12-31 2007-06-19 Sandisk 3D Llc NAND memory array incorporating capacitance boosting of channel regions in unselected memory cells and method for operation of same
US6982905B2 (en) * 2003-10-09 2006-01-03 Micron Technology, Inc. Method and apparatus for reading NAND flash memory array
US7221588B2 (en) * 2003-12-05 2007-05-22 Sandisk 3D Llc Memory array incorporating memory cells arranged in NAND strings
US7023739B2 (en) * 2003-12-05 2006-04-04 Matrix Semiconductor, Inc. NAND memory array incorporating multiple write pulse programming of individual memory cells and method for operation of same
US20050128807A1 (en) * 2003-12-05 2005-06-16 En-Hsing Chen Nand memory array incorporating multiple series selection devices and method for operation of same
US7161833B2 (en) * 2004-02-06 2007-01-09 Sandisk Corporation Self-boosting system for flash memory cells
US7170793B2 (en) * 2004-04-13 2007-01-30 Sandisk Corporation Programming inhibit for non-volatile memory
US7644239B2 (en) 2004-05-03 2010-01-05 Microsoft Corporation Non-volatile memory cache performance improvement
US7045368B2 (en) * 2004-05-19 2006-05-16 Headway Technologies, Inc. MRAM cell structure and method of fabrication
WO2006001058A1 (ja) * 2004-06-25 2006-01-05 Spansion Llc 半導体装置及びソース電圧制御方法
US7457156B2 (en) * 2004-09-02 2008-11-25 Micron Technology, Inc. NAND flash depletion cell structure
US7490197B2 (en) 2004-10-21 2009-02-10 Microsoft Corporation Using external memory devices to improve system performance
JP4284300B2 (ja) * 2005-05-02 2009-06-24 株式会社東芝 半導体記憶装置
US7443009B2 (en) * 2005-05-11 2008-10-28 Micron Technology, Inc. N well implants to separate blocks in a flash memory device
KR100735929B1 (ko) * 2005-06-11 2007-07-06 삼성전자주식회사 낸드형 플래시 메모리 어레이 및 그 동작 방법
US7239557B2 (en) * 2005-06-17 2007-07-03 Micron Technology, Inc. Program method with optimized voltage level for flash memory
JP4761872B2 (ja) * 2005-08-01 2011-08-31 株式会社東芝 不揮発性半導体記憶装置
US7212447B2 (en) * 2005-08-04 2007-05-01 Micron Technology, Inc. NAND flash memory cell programming
US7751242B2 (en) * 2005-08-30 2010-07-06 Micron Technology, Inc. NAND memory device and programming methods
US7388789B2 (en) * 2005-08-31 2008-06-17 Micron Technology NAND memory device and programming methods
US7286406B2 (en) * 2005-10-14 2007-10-23 Sandisk Corporation Method for controlled programming of non-volatile memory exhibiting bit line coupling
US7206235B1 (en) * 2005-10-14 2007-04-17 Sandisk Corporation Apparatus for controlled programming of non-volatile memory exhibiting bit line coupling
KR100780985B1 (ko) * 2005-10-17 2007-11-30 가부시끼가이샤 도시바 반도체 기억 장치 및 그 제조 방법
US8914557B2 (en) 2005-12-16 2014-12-16 Microsoft Corporation Optimizing write and wear performance for a memory
US7447094B2 (en) * 2005-12-29 2008-11-04 Sandisk Corporation Method for power-saving multi-pass sensing in non-volatile memory
WO2007076503A2 (en) * 2005-12-29 2007-07-05 Sandisk Corporation Non-volatile memory operated on. the basis of a two-step bit-line precharge operation and a two-pass sensing operation
US7733704B2 (en) 2005-12-29 2010-06-08 Sandisk Corporation Non-volatile memory with power-saving multi-pass sensing
US7400532B2 (en) * 2006-02-16 2008-07-15 Micron Technology, Inc. Programming method to reduce gate coupling interference for non-volatile memory
US7408810B2 (en) * 2006-02-22 2008-08-05 Micron Technology, Inc. Minimizing effects of program disturb in a memory device
US7561469B2 (en) * 2006-03-28 2009-07-14 Micron Technology, Inc. Programming method to reduce word line to word line breakdown for NAND flash
US7511995B2 (en) * 2006-03-30 2009-03-31 Sandisk Corporation Self-boosting system with suppression of high lateral electric fields
US7440321B2 (en) * 2006-04-12 2008-10-21 Micron Technology, Inc. Multiple select gate architecture with select gates of different lengths
US7512029B2 (en) 2006-06-09 2009-03-31 Micron Technology, Inc. Method and apparatus for managing behavior of memory devices
US7525841B2 (en) * 2006-06-14 2009-04-28 Micron Technology, Inc. Programming method for NAND flash
US7518914B2 (en) * 2006-08-07 2009-04-14 Micron Technology, Inc. Non-volatile memory device with both single and multiple level cells
US7471565B2 (en) 2006-08-22 2008-12-30 Micron Technology, Inc. Reducing effects of program disturb in a memory device
US7440326B2 (en) * 2006-09-06 2008-10-21 Sandisk Corporation Programming non-volatile memory with improved boosting
KR100770754B1 (ko) * 2006-10-12 2007-10-29 삼성전자주식회사 비휘발성 반도체 메모리 장치 및 그것의 프로그램 방법
WO2008047416A1 (fr) * 2006-10-18 2008-04-24 Spansion Llc Circuit de détection de tension
US7596031B2 (en) * 2006-10-30 2009-09-29 Sandisk Corporation Faster programming of highest multi-level state for non-volatile memory
US7696035B2 (en) * 2006-11-13 2010-04-13 Sandisk Corporation Method for fabricating non-volatile memory with boost structures
KR100811278B1 (ko) * 2006-12-29 2008-03-07 주식회사 하이닉스반도체 셀프 부스팅을 이용한 낸드 플래시 메모리소자의 읽기 방법
US7525843B2 (en) * 2006-12-30 2009-04-28 Sandisk Corporation Non-volatile storage with adaptive body bias
US7554853B2 (en) * 2006-12-30 2009-06-30 Sandisk Corporation Non-volatile storage with bias based on selective word line
US7468920B2 (en) 2006-12-30 2008-12-23 Sandisk Corporation Applying adaptive body bias to non-volatile storage
US7468919B2 (en) * 2006-12-30 2008-12-23 Sandisk Corporation Biasing non-volatile storage based on selected word line
US7583535B2 (en) * 2006-12-30 2009-09-01 Sandisk Corporation Biasing non-volatile storage to compensate for temperature variations
US7583539B2 (en) * 2006-12-30 2009-09-01 Sandisk Corporation Non-volatile storage with bias for temperature compensation
JP4939971B2 (ja) * 2007-02-20 2012-05-30 株式会社東芝 不揮発性半導体メモリ
US7738291B2 (en) * 2007-03-12 2010-06-15 Micron Technology, Inc. Memory page boosting method, device and system
US7606072B2 (en) * 2007-04-24 2009-10-20 Sandisk Corporation Non-volatile storage with compensation for source voltage drop
US7606071B2 (en) * 2007-04-24 2009-10-20 Sandisk Corporation Compensating source voltage drop in non-volatile storage
US8654592B2 (en) 2007-06-12 2014-02-18 Micron Technology, Inc. Memory devices with isolation structures
JP4504405B2 (ja) 2007-09-12 2010-07-14 株式会社東芝 半導体記憶装置
US7978520B2 (en) 2007-09-27 2011-07-12 Sandisk Corporation Compensation of non-volatile memory chip non-idealities by program pulse adjustment
ITRM20070621A1 (it) * 2007-11-28 2009-05-29 Micron Technology Inc Compensazione dell'effetto della configurazione a ritroso in un dispositivo di memorizzazione.
US8631203B2 (en) 2007-12-10 2014-01-14 Microsoft Corporation Management of external memory functioning as virtual cache
US7733705B2 (en) * 2008-03-13 2010-06-08 Micron Technology, Inc. Reduction of punch-through disturb during programming of a memory device
KR20090120205A (ko) * 2008-05-19 2009-11-24 삼성전자주식회사 플래시 메모리 장치 및 그것의 동작 방법
US7719902B2 (en) * 2008-05-23 2010-05-18 Sandisk Corporation Enhanced bit-line pre-charge scheme for increasing channel boosting in non-volatile storage
JP5331405B2 (ja) * 2008-08-01 2013-10-30 株式会社東芝 不揮発性半導体記憶装置および不揮発性半導体記憶システム
US8032707B2 (en) 2008-09-15 2011-10-04 Microsoft Corporation Managing cache data and metadata
US9032151B2 (en) 2008-09-15 2015-05-12 Microsoft Technology Licensing, Llc Method and system for ensuring reliability of cache data and metadata subsequent to a reboot
US7953774B2 (en) 2008-09-19 2011-05-31 Microsoft Corporation Aggregation of write traffic to a data store
JP5193815B2 (ja) * 2008-11-12 2013-05-08 株式会社東芝 半導体記憶装置
US8692310B2 (en) 2009-02-09 2014-04-08 Spansion Llc Gate fringing effect based channel formation for semiconductor device
JP2010198685A (ja) * 2009-02-25 2010-09-09 Toshiba Corp 不揮発性半導体メモリ
US8233320B2 (en) * 2009-07-10 2012-07-31 Aplus Flash Technology, Inc. High speed high density NAND-based 2T-NOR flash memory design
US20110128766A1 (en) * 2009-11-30 2011-06-02 Ward Parkinson Programmable Resistance Memory
US8102712B2 (en) * 2009-12-22 2012-01-24 Intel Corporation NAND programming technique
US9324440B2 (en) 2010-02-09 2016-04-26 Samsung Electronics Co., Ltd. Nonvolatile memory devices, operating methods thereof and memory systems including the same
KR101658479B1 (ko) 2010-02-09 2016-09-21 삼성전자주식회사 불휘발성 메모리 장치, 그것의 동작 방법, 그리고 그것을 포함하는 메모리 시스템
KR101691092B1 (ko) 2010-08-26 2016-12-30 삼성전자주식회사 불휘발성 메모리 장치, 그것의 동작 방법, 그리고 그것을 포함하는 메모리 시스템
US9378831B2 (en) 2010-02-09 2016-06-28 Samsung Electronics Co., Ltd. Nonvolatile memory devices, operating methods thereof and memory systems including the same
KR101691088B1 (ko) 2010-02-17 2016-12-29 삼성전자주식회사 불휘발성 메모리 장치, 그것의 동작 방법, 그리고 그것을 포함하는 메모리 시스템
JP5788183B2 (ja) 2010-02-17 2015-09-30 三星電子株式会社Samsung Electronics Co.,Ltd. 不揮発性メモリ装置、それの動作方法、そしてそれを含むメモリシステム
US8923060B2 (en) 2010-02-17 2014-12-30 Samsung Electronics Co., Ltd. Nonvolatile memory devices and operating methods thereof
US8908431B2 (en) 2010-02-17 2014-12-09 Samsung Electronics Co., Ltd. Control method of nonvolatile memory device
US8792282B2 (en) * 2010-03-04 2014-07-29 Samsung Electronics Co., Ltd. Nonvolatile memory devices, memory systems and computing systems
US8331127B2 (en) 2010-05-24 2012-12-11 Macronix International Co., Ltd. Nonvolatile memory device having a transistor connected in parallel with a resistance switching device
US8537618B2 (en) 2010-08-26 2013-09-17 Steven Jeffrey Grossman RAM memory device with NAND type interface
KR101762828B1 (ko) 2011-04-05 2017-07-31 삼성전자주식회사 불휘발성 메모리 장치 및 불휘발성 메모리 장치의 동작 방법
US8630125B2 (en) 2011-06-02 2014-01-14 Micron Technology, Inc. Memory cell sensing using a boost voltage
US8988947B2 (en) 2013-03-25 2015-03-24 Sandisk Technologies Inc. Back bias during program verify of non-volatile storage
KR102242022B1 (ko) 2013-09-16 2021-04-21 삼성전자주식회사 불휘발성 메모리 및 그것의 프로그램 방법
JP2017162526A (ja) * 2016-03-07 2017-09-14 東芝メモリ株式会社 記憶装置
JP2018125052A (ja) 2017-01-31 2018-08-09 東芝メモリ株式会社 半導体記憶装置
CN107507646A (zh) * 2017-08-31 2017-12-22 长江存储科技有限责任公司 一种降低编程干扰的控制方法及装置
WO2019113921A1 (zh) * 2017-12-15 2019-06-20 成都锐成芯微科技股份有限公司 快闪存储器的编程电路、编程方法及快闪存储器
CN110718258B (zh) * 2018-07-13 2021-10-08 西安格易安创集成电路有限公司 一种非易失存储器处理电路及方法
CN110838318A (zh) * 2018-08-17 2020-02-25 北京兆易创新科技股份有限公司 提高存储器数据可靠性的方法和系统
CN109378028B (zh) * 2018-08-22 2020-11-17 长江存储科技有限责任公司 一种降低编程干扰的控制方法及装置
KR102728054B1 (ko) * 2019-12-05 2024-11-11 에스케이하이닉스 주식회사 메모리 장치 및 그 동작 방법
US11393535B2 (en) * 2020-02-26 2022-07-19 Silicon Storage Technology, Inc. Ultra-precise tuning of analog neural memory cells in a deep learning artificial neural network
JP7446879B2 (ja) * 2020-03-18 2024-03-11 キオクシア株式会社 半導体記憶装置
CN111445938B (zh) * 2020-03-26 2022-03-18 北京大学 编码型闪存结构及数据处理方法
CN112201295B (zh) * 2020-09-11 2021-09-17 中天弘宇集成电路有限责任公司 Nand闪存编程方法
CN112365913B (zh) * 2020-09-29 2021-09-03 中天弘宇集成电路有限责任公司 3d nand闪存编程方法
CN116437669B (zh) * 2023-04-19 2024-12-06 宁波领开半导体技术有限公司 Nor闪存阵列及其操作方法
CN116156890B (zh) * 2023-04-19 2023-07-18 杭州领开半导体技术有限公司 Nor闪存阵列的制作方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5257225A (en) 1992-03-12 1993-10-26 Micron Technology, Inc. Method for programming programmable devices by utilizing single or multiple pulses varying in pulse width and amplitude
US5357463A (en) 1992-11-17 1994-10-18 Micron Semiconductor, Inc. Method for reverse programming of a flash EEPROM
JP3462894B2 (ja) * 1993-08-27 2003-11-05 株式会社東芝 不揮発性半導体メモリ及びそのデータプログラム方法
KR100217910B1 (ko) * 1995-08-17 1999-09-01 김영환 플래쉬 메모리셀의 리페어 회로 및 리페어 방법
KR0172441B1 (ko) 1995-09-19 1999-03-30 김광호 불휘발성 반도체 메모리의 프로그램 방법
KR0172403B1 (ko) * 1995-11-15 1999-03-30 김광호 불휘발성 반도체 메모리의 데이타 리드회로
JPH10223866A (ja) * 1997-02-03 1998-08-21 Toshiba Corp 半導体記憶装置
KR100316706B1 (ko) * 1999-02-01 2001-12-12 윤종용 벌크 바이어스를 사용하는 낸드형 플래쉬 메모리소자의 프로그램 방법
US6515889B1 (en) 2000-08-31 2003-02-04 Micron Technology, Inc. Junction-isolated depletion mode ferroelectric memory

Also Published As

Publication number Publication date
KR100769795B1 (ko) 2007-10-25
EP1665281A1 (de) 2006-06-07
DE602004008490D1 (de) 2007-10-04
US7149124B2 (en) 2006-12-12
US6977842B2 (en) 2005-12-20
DE602004008490T2 (de) 2008-05-15
EP1665281B1 (de) 2007-08-22
CN100479063C (zh) 2009-04-15
WO2005029501A1 (en) 2005-03-31
KR20060053000A (ko) 2006-05-19
US20050057966A1 (en) 2005-03-17
JP2007506207A (ja) 2007-03-15
US20050111260A1 (en) 2005-05-26
CN1849670A (zh) 2006-10-18
JP4417383B2 (ja) 2010-02-17
SG146620A1 (en) 2008-10-30

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