ATE508460T1 - Selbst-boost-system für flash-speicherzellen - Google Patents
Selbst-boost-system für flash-speicherzellenInfo
- Publication number
- ATE508460T1 ATE508460T1 AT05711788T AT05711788T ATE508460T1 AT E508460 T1 ATE508460 T1 AT E508460T1 AT 05711788 T AT05711788 T AT 05711788T AT 05711788 T AT05711788 T AT 05711788T AT E508460 T1 ATE508460 T1 AT E508460T1
- Authority
- AT
- Austria
- Prior art keywords
- word line
- self boosting
- band
- reduce
- word lines
- Prior art date
Links
- 238000002955 isolation Methods 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/30—Power supply circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/774,014 US7161833B2 (en) | 2004-02-06 | 2004-02-06 | Self-boosting system for flash memory cells |
| PCT/US2005/001962 WO2005078733A2 (en) | 2004-02-06 | 2005-01-20 | Self-boosting system for flash memory cells |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE508460T1 true ATE508460T1 (de) | 2011-05-15 |
Family
ID=34826888
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT05711788T ATE508460T1 (de) | 2004-02-06 | 2005-01-20 | Selbst-boost-system für flash-speicherzellen |
Country Status (9)
| Country | Link |
|---|---|
| US (3) | US7161833B2 (de) |
| EP (2) | EP1714291B1 (de) |
| JP (2) | JP4819702B2 (de) |
| KR (1) | KR101161152B1 (de) |
| CN (1) | CN100555453C (de) |
| AT (1) | ATE508460T1 (de) |
| DE (1) | DE602005027810D1 (de) |
| TW (1) | TWI328228B (de) |
| WO (1) | WO2005078733A2 (de) |
Families Citing this family (115)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7466590B2 (en) * | 2004-02-06 | 2008-12-16 | Sandisk Corporation | Self-boosting method for flash memory cells |
| US7161833B2 (en) * | 2004-02-06 | 2007-01-09 | Sandisk Corporation | Self-boosting system for flash memory cells |
| JP4398750B2 (ja) * | 2004-02-17 | 2010-01-13 | 株式会社東芝 | Nand型フラッシュメモリ |
| US7170793B2 (en) * | 2004-04-13 | 2007-01-30 | Sandisk Corporation | Programming inhibit for non-volatile memory |
| US7294882B2 (en) * | 2004-09-28 | 2007-11-13 | Sandisk Corporation | Non-volatile memory with asymmetrical doping profile |
| US7895617B2 (en) * | 2004-12-15 | 2011-02-22 | Sony Corporation | Content substitution editor |
| KR100680462B1 (ko) * | 2005-04-11 | 2007-02-08 | 주식회사 하이닉스반도체 | 비휘발성 메모리 장치 및 그것의 핫 일렉트론 프로그램디스터브 방지방법 |
| US7196930B2 (en) * | 2005-04-27 | 2007-03-27 | Micron Technology, Inc. | Flash memory programming to reduce program disturb |
| KR100697284B1 (ko) * | 2005-05-02 | 2007-03-20 | 삼성전자주식회사 | 플래시 메모리 장치 및 그것의 프로그램 방법 |
| KR100621634B1 (ko) * | 2005-05-06 | 2006-09-07 | 삼성전자주식회사 | 플래시 메모리 장치 및 그것의 프로그램 방법 |
| US7345918B2 (en) | 2005-08-31 | 2008-03-18 | Micron Technology, Inc. | Selective threshold voltage verification and compaction |
| US7355888B2 (en) * | 2005-12-19 | 2008-04-08 | Sandisk Corporation | Apparatus for programming non-volatile memory with reduced program disturb using modified pass voltages |
| EP1964127B1 (de) * | 2005-12-19 | 2009-11-25 | SanDisk Corporation | Verfahren zur programmierung eines nicht flüchtigen speichers mit verminderter programmstörung über modizifierte durchgangsspannungen |
| US7355889B2 (en) * | 2005-12-19 | 2008-04-08 | Sandisk Corporation | Method for programming non-volatile memory with reduced program disturb using modified pass voltages |
| KR101016783B1 (ko) | 2005-12-27 | 2011-02-25 | 팡 하오 | 부스터 플레이트를 구비한 플래시 메모리 장치 |
| US7362615B2 (en) * | 2005-12-27 | 2008-04-22 | Sandisk Corporation | Methods for active boosting to minimize capacitive coupling effect between adjacent gates of flash memory devices |
| US7436703B2 (en) * | 2005-12-27 | 2008-10-14 | Sandisk Corporation | Active boosting to minimize capacitive coupling effect between adjacent gates of flash memory devices |
| US7443726B2 (en) | 2005-12-29 | 2008-10-28 | Sandisk Corporation | Systems for alternate row-based reading and writing for non-volatile memory |
| US7616489B2 (en) * | 2006-02-08 | 2009-11-10 | Micron Technology, Inc. | Memory array segmentation and methods |
| US7408810B2 (en) * | 2006-02-22 | 2008-08-05 | Micron Technology, Inc. | Minimizing effects of program disturb in a memory device |
| US7436733B2 (en) * | 2006-03-03 | 2008-10-14 | Sandisk Corporation | System for performing read operation on non-volatile storage with compensation for coupling |
| US7499319B2 (en) | 2006-03-03 | 2009-03-03 | Sandisk Corporation | Read operation for non-volatile storage with compensation for coupling |
| US7561469B2 (en) * | 2006-03-28 | 2009-07-14 | Micron Technology, Inc. | Programming method to reduce word line to word line breakdown for NAND flash |
| US7511995B2 (en) * | 2006-03-30 | 2009-03-31 | Sandisk Corporation | Self-boosting system with suppression of high lateral electric fields |
| WO2007117869A2 (en) * | 2006-03-30 | 2007-10-18 | Sandisk Corporation | Self-boosting system with suppression of high lateral electric fields |
| US7428165B2 (en) * | 2006-03-30 | 2008-09-23 | Sandisk Corporation | Self-boosting method with suppression of high lateral electric fields |
| US7440321B2 (en) * | 2006-04-12 | 2008-10-21 | Micron Technology, Inc. | Multiple select gate architecture with select gates of different lengths |
| US7286408B1 (en) | 2006-05-05 | 2007-10-23 | Sandisk Corporation | Boosting methods for NAND flash memory |
| US7436709B2 (en) * | 2006-05-05 | 2008-10-14 | Sandisk Corporation | NAND flash memory with boosting |
| US7310272B1 (en) * | 2006-06-02 | 2007-12-18 | Sandisk Corporation | System for performing data pattern sensitivity compensation using different voltage |
| US7450421B2 (en) * | 2006-06-02 | 2008-11-11 | Sandisk Corporation | Data pattern sensitivity compensation using different voltage |
| US7525841B2 (en) * | 2006-06-14 | 2009-04-28 | Micron Technology, Inc. | Programming method for NAND flash |
| US7492633B2 (en) | 2006-06-19 | 2009-02-17 | Sandisk Corporation | System for increasing programming speed for non-volatile memory by applying counter-transitioning waveforms to word lines |
| US7349261B2 (en) * | 2006-06-19 | 2008-03-25 | Sandisk Corporation | Method for increasing programming speed for non-volatile memory by applying counter-transitioning waveforms to word lines |
| KR100800479B1 (ko) | 2006-07-25 | 2008-02-04 | 삼성전자주식회사 | 하이브리드 로컬 부스팅 방식을 이용한 불휘발성 메모리장치의 프로그램 방법 |
| KR100761470B1 (ko) | 2006-07-31 | 2007-09-27 | 삼성전자주식회사 | 프로그램 디스터브를 방지할 수 있는 플래시 메모리 장치및 그것의 프로그램 방법 |
| US20100231977A1 (en) * | 2006-08-08 | 2010-09-16 | Kimoto Co., Ltd | Screening apparatus and screening method |
| KR100764053B1 (ko) * | 2006-08-10 | 2007-10-08 | 삼성전자주식회사 | 플래시 메모리 장치 및 그것의 프로그램 방법 |
| US7471565B2 (en) | 2006-08-22 | 2008-12-30 | Micron Technology, Inc. | Reducing effects of program disturb in a memory device |
| JP2008052808A (ja) * | 2006-08-24 | 2008-03-06 | Toshiba Corp | 不揮発性半導体記憶装置及びそのデータの読出方法並びにメモリカード |
| US7440326B2 (en) | 2006-09-06 | 2008-10-21 | Sandisk Corporation | Programming non-volatile memory with improved boosting |
| TWI349286B (en) * | 2006-09-06 | 2011-09-21 | Sandisk Corp | System and method for programming non-volatile memory with improved boosting |
| US8184478B2 (en) * | 2006-09-27 | 2012-05-22 | Sandisk Technologies Inc. | Apparatus with reduced program disturb in non-volatile storage |
| WO2008039667A2 (en) * | 2006-09-27 | 2008-04-03 | Sandisk Corporation | Reducing program disturb in non-volatile storage |
| US8189378B2 (en) * | 2006-09-27 | 2012-05-29 | Sandisk Technologies Inc. | Reducing program disturb in non-volatile storage |
| US7977186B2 (en) * | 2006-09-28 | 2011-07-12 | Sandisk Corporation | Providing local boosting control implant for non-volatile memory |
| US7705387B2 (en) * | 2006-09-28 | 2010-04-27 | Sandisk Corporation | Non-volatile memory with local boosting control implant |
| KR100763093B1 (ko) * | 2006-09-29 | 2007-10-04 | 주식회사 하이닉스반도체 | 플래쉬 메모리 장치의 프로그램 방법 |
| US7596031B2 (en) | 2006-10-30 | 2009-09-29 | Sandisk Corporation | Faster programming of highest multi-level state for non-volatile memory |
| US7505326B2 (en) | 2006-10-31 | 2009-03-17 | Atmel Corporation | Programming pulse generator |
| US7417904B2 (en) | 2006-10-31 | 2008-08-26 | Atmel Corporation | Adaptive gate voltage regulation |
| US7440323B2 (en) * | 2006-11-02 | 2008-10-21 | Sandisk Corporation | Reducing program disturb in non-volatile memory using multiple boosting modes |
| US7468911B2 (en) * | 2006-11-02 | 2008-12-23 | Sandisk Corporation | Non-volatile memory using multiple boosting modes for reduced program disturb |
| US7511996B2 (en) | 2006-11-30 | 2009-03-31 | Mosaid Technologies Incorporated | Flash memory program inhibit scheme |
| US7623386B2 (en) * | 2006-12-12 | 2009-11-24 | Sandisk Corporation | Reducing program disturb in non-volatile storage using early source-side boosting |
| US7623387B2 (en) * | 2006-12-12 | 2009-11-24 | Sandisk Corporation | Non-volatile storage with early source-side boosting for reducing program disturb |
| CN100576356C (zh) * | 2006-12-21 | 2009-12-30 | 中芯国际集成电路制造(上海)有限公司 | 减小存储单元写入扰乱的方法 |
| US7440324B2 (en) * | 2006-12-29 | 2008-10-21 | Sandisk Corporation | Apparatus with alternating read mode |
| US7433241B2 (en) * | 2006-12-29 | 2008-10-07 | Sandisk Corporation | Programming non-volatile memory with reduced program disturb by removing pre-charge dependency on word line data |
| US7468918B2 (en) * | 2006-12-29 | 2008-12-23 | Sandisk Corporation | Systems for programming non-volatile memory with reduced program disturb by removing pre-charge dependency on word line data |
| US7450430B2 (en) * | 2006-12-29 | 2008-11-11 | Sandisk Corporation | Programming non-volatile memory with reduced program disturb by using different pre-charge enable voltages |
| US7495962B2 (en) * | 2006-12-29 | 2009-02-24 | Sandisk Corporation | Alternating read mode |
| US7463531B2 (en) * | 2006-12-29 | 2008-12-09 | Sandisk Corporation | Systems for programming non-volatile memory with reduced program disturb by using different pre-charge enable voltages |
| ITRM20070107A1 (it) * | 2007-02-27 | 2008-08-28 | Micron Technology Inc | Sistema di inibizione di autoboost locale con linea di parole schermata |
| JP2008270343A (ja) * | 2007-04-17 | 2008-11-06 | Renesas Technology Corp | 不揮発性半導体記憶装置 |
| KR101263823B1 (ko) | 2007-04-19 | 2013-05-13 | 삼성전자주식회사 | 비휘발성 메모리 소자 및 그 동작 방법 |
| KR100889780B1 (ko) * | 2007-04-24 | 2009-03-20 | 삼성전자주식회사 | 패스 전압 윈도우를 향상시킬 수 있는 플래시 메모리 장치및 그것의 프로그램 방법 |
| US7606079B2 (en) * | 2007-04-25 | 2009-10-20 | Sandisk Corporation | Reducing power consumption during read operations in non-volatile storage |
| US7440327B1 (en) | 2007-04-25 | 2008-10-21 | Sandisk Corporation | Non-volatile storage with reduced power consumption during read operations |
| WO2008136826A1 (en) | 2007-05-04 | 2008-11-13 | Micron Technology, Inc. | Word line voltage boost system and method for non-volatile memory devices and memory devices and processor-based system using same |
| US7577026B2 (en) * | 2007-05-07 | 2009-08-18 | Sandisk Corporation | Source and drain side early boosting using local self boosting for non-volatile storage |
| CN101715596B (zh) * | 2007-05-07 | 2013-08-21 | 桑迪士克科技股份有限公司 | 使用沟道隔离切换的非易失性存储器的升压 |
| US7460404B1 (en) * | 2007-05-07 | 2008-12-02 | Sandisk Corporation | Boosting for non-volatile storage using channel isolation switching |
| US7463522B2 (en) * | 2007-05-07 | 2008-12-09 | Sandisk Corporation | Non-volatile storage with boosting using channel isolation switching |
| JP2008300019A (ja) * | 2007-06-04 | 2008-12-11 | Toshiba Corp | 不揮発性半導体記憶装置 |
| US7986553B2 (en) * | 2007-06-15 | 2011-07-26 | Micron Technology, Inc. | Programming of a solid state memory utilizing analog communication of bit patterns |
| KR100882205B1 (ko) * | 2007-06-27 | 2009-02-06 | 삼성전자주식회사 | 글로벌 워드라인 디코더의 레이아웃 면적을 줄이는비휘발성 메모리 장치 및 그 동작 방법 |
| JP4504405B2 (ja) | 2007-09-12 | 2010-07-14 | 株式会社東芝 | 半導体記憶装置 |
| US7978520B2 (en) | 2007-09-27 | 2011-07-12 | Sandisk Corporation | Compensation of non-volatile memory chip non-idealities by program pulse adjustment |
| US7894263B2 (en) * | 2007-09-28 | 2011-02-22 | Sandisk Corporation | High voltage generation and control in source-side injection programming of non-volatile memory |
| KR100858293B1 (ko) | 2007-10-01 | 2008-09-11 | 최웅림 | Nand 메모리 셀 어레이, 상기 nand 메모리 셀어레이를 구비하는 nand 플래시 메모리 및 nand플래시 메모리의 데이터 처리방법 |
| KR20090035203A (ko) | 2007-10-05 | 2009-04-09 | 삼성전자주식회사 | 비휘발성 메모리 장치 및 그 동작 방법 |
| US7733705B2 (en) * | 2008-03-13 | 2010-06-08 | Micron Technology, Inc. | Reduction of punch-through disturb during programming of a memory device |
| US7949821B2 (en) | 2008-06-12 | 2011-05-24 | Micron Technology, Inc. | Method of storing data on a flash memory device |
| KR101569894B1 (ko) * | 2008-11-12 | 2015-11-17 | 삼성전자주식회사 | 불 휘발성 메모리 장치의 프로그램 방법 |
| US8692310B2 (en) | 2009-02-09 | 2014-04-08 | Spansion Llc | Gate fringing effect based channel formation for semiconductor device |
| KR101523677B1 (ko) * | 2009-02-26 | 2015-05-28 | 삼성전자주식회사 | 플래시 메모리 장치 및 그것의 프로그램 방법 그리고 그것을 포함하는 메모리 시스템 |
| US8009478B2 (en) | 2009-10-05 | 2011-08-30 | Micron Technology, Inc. | Non-volatile memory apparatus and methods |
| US8102712B2 (en) * | 2009-12-22 | 2012-01-24 | Intel Corporation | NAND programming technique |
| US8982631B2 (en) | 2010-02-09 | 2015-03-17 | Micron Technology, Inc. | Programming methods and memories |
| JP2011192349A (ja) * | 2010-03-15 | 2011-09-29 | Toshiba Corp | Nand型フラッシュメモリ |
| KR101682666B1 (ko) * | 2010-08-11 | 2016-12-07 | 삼성전자주식회사 | 비휘발성 메모리 장치, 그것의 채널 부스팅 방법, 그것의 프로그램 방법 및 그것을 포함하는 메모리 시스템 |
| KR20120129609A (ko) * | 2011-05-20 | 2012-11-28 | 에스케이하이닉스 주식회사 | 비휘발성 메모리 장치의 프로그램 방법 |
| US8638606B2 (en) | 2011-09-16 | 2014-01-28 | Sandisk Technologies Inc. | Substrate bias during program of non-volatile storage |
| KR101913331B1 (ko) | 2012-01-19 | 2018-10-30 | 삼성전자주식회사 | 비휘발성 메모리 장치, 그것을 포함하는 비휘발성 메모리 시스템, 그것의 프로그램 방법, 그리고 그것을 제어하는 컨트롤러 동작 방법 |
| US9136784B2 (en) * | 2012-03-20 | 2015-09-15 | GM Global Technology Operations LLC | Universal control unit for brushed or brushless DC motor |
| KR101979395B1 (ko) * | 2012-05-08 | 2019-08-28 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 및 그 동작 방법 |
| EP2892054B1 (de) * | 2012-08-29 | 2019-08-07 | Renesas Electronics Corporation | Halbleiterbauelement |
| KR102094336B1 (ko) * | 2013-02-13 | 2020-04-14 | 삼성전자주식회사 | 메모리 시스템 및 그것의 구동 방법 |
| KR102062314B1 (ko) | 2013-03-15 | 2020-01-03 | 삼성전자주식회사 | 불휘발성 메모리 장치 및 프로그램 방법 |
| US9449690B2 (en) * | 2013-04-03 | 2016-09-20 | Cypress Semiconductor Corporation | Modified local segmented self-boosting of memory cell channels |
| TWI514391B (zh) * | 2013-07-23 | 2015-12-21 | Winbond Electronics Corp | 半導體記憶裝置及其抹除方法 |
| US9595342B2 (en) | 2015-01-20 | 2017-03-14 | Sandisk Technologies Llc | Method and apparatus for refresh programming of memory cells based on amount of threshold voltage downshift |
| KR20170073980A (ko) * | 2015-12-21 | 2017-06-29 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 및 그것의 동작 방법 |
| US9953717B2 (en) * | 2016-03-31 | 2018-04-24 | Sandisk Technologies Llc | NAND structure with tier select gate transistors |
| JP2018116755A (ja) | 2017-01-19 | 2018-07-26 | 東芝メモリ株式会社 | 半導体記憶装置 |
| JP7074583B2 (ja) * | 2018-06-26 | 2022-05-24 | キオクシア株式会社 | 半導体記憶装置 |
| US10665306B1 (en) * | 2019-04-08 | 2020-05-26 | Sandisk Technologies Llc | Memory device with discharge voltage pulse to reduce injection type of program disturb |
| CN110619910B (zh) * | 2019-08-30 | 2021-08-03 | 长江存储科技有限责任公司 | 存储器的控制方法、装置、存储介质 |
| US12412609B2 (en) | 2019-12-09 | 2025-09-09 | Yangtze Memory Technologies Co., Ltd. | Method of reducing program disturbance in memory device and memory device utilizing same |
| WO2021114011A1 (en) | 2019-12-09 | 2021-06-17 | Yangtze Memory Technologies Co., Ltd. | Method of reducing program disturbance in memory device and memory device utilizing same |
| KR102897358B1 (ko) * | 2020-07-30 | 2025-12-05 | 삼성전자 주식회사 | 프로그래밍 동안 양방향 채널 프리차지를 수행하는 비휘발성 메모리 장치 |
| CN114121092B (zh) * | 2020-08-28 | 2025-10-31 | 桑迪士克科技股份有限公司 | 提高沟道升压的周期性减小的字线偏置 |
| CN114822615A (zh) * | 2021-01-20 | 2022-07-29 | 长江存储科技有限责任公司 | 存储器的编程操作方法及装置 |
| US11688469B2 (en) | 2021-08-11 | 2023-06-27 | Sandisk Technologies Llc | Non-volatile memory with sub-block based self-boosting scheme |
Family Cites Families (68)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5043940A (en) | 1988-06-08 | 1991-08-27 | Eliyahou Harari | Flash EEPROM memory systems having multistate storage cells |
| US5172338B1 (en) | 1989-04-13 | 1997-07-08 | Sandisk Corp | Multi-state eeprom read and write circuits and techniques |
| US5555204A (en) | 1993-06-29 | 1996-09-10 | Kabushiki Kaisha Toshiba | Non-volatile semiconductor memory device |
| US5887145A (en) | 1993-09-01 | 1999-03-23 | Sandisk Corporation | Removable mother/daughter peripheral card |
| KR0169267B1 (ko) | 1993-09-21 | 1999-02-01 | 사토 후미오 | 불휘발성 반도체 기억장치 |
| KR0142368B1 (ko) | 1994-09-09 | 1998-07-15 | 김광호 | 불휘발성 반도체 메모리장치의 자동프로그램 회로 |
| KR0145475B1 (ko) | 1995-03-31 | 1998-08-17 | 김광호 | 낸드구조를 가지는 불휘발성 반도체 메모리의 프로그램장치 및 방법 |
| KR100192430B1 (ko) | 1995-08-21 | 1999-06-15 | 구본준 | 비휘발성 메모리 및 이 비휘발성 메모리를 프로그램하는 방법 |
| JP3419969B2 (ja) | 1995-09-12 | 2003-06-23 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| KR0172441B1 (ko) | 1995-09-19 | 1999-03-30 | 김광호 | 불휘발성 반도체 메모리의 프로그램 방법 |
| US5903495A (en) | 1996-03-18 | 1999-05-11 | Kabushiki Kaisha Toshiba | Semiconductor device and memory system |
| KR100244864B1 (ko) | 1996-03-18 | 2000-03-02 | 니시무로 타이죠 | 불휘발성 반도체 기억 장치 |
| DE19615407C1 (de) * | 1996-04-18 | 1997-08-21 | Siemens Ag | Programmierbarer Festwertspeicher mit verbesserter Zugriffszeit |
| US5793677A (en) | 1996-06-18 | 1998-08-11 | Hu; Chung-You | Using floating gate devices as select gate devices for NAND flash memory and its bias scheme |
| US5715194A (en) | 1996-07-24 | 1998-02-03 | Advanced Micro Devices, Inc. | Bias scheme of program inhibit for random programming in a nand flash memory |
| KR100272037B1 (ko) | 1997-02-27 | 2000-12-01 | 니시무로 타이죠 | 불휘발성 반도체 기억 장치 |
| JP3481817B2 (ja) | 1997-04-07 | 2003-12-22 | 株式会社東芝 | 半導体記憶装置 |
| JP3583579B2 (ja) | 1997-06-06 | 2004-11-04 | 株式会社東芝 | 不揮発性半導体記憶装置およびその製造方法 |
| JP3805867B2 (ja) | 1997-09-18 | 2006-08-09 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| JP3540579B2 (ja) | 1997-11-07 | 2004-07-07 | 株式会社東芝 | 半導体記憶装置及びその製造方法 |
| KR100297602B1 (ko) | 1997-12-31 | 2001-08-07 | 윤종용 | 비휘발성메모리장치의프로그램방법 |
| JP2000048581A (ja) * | 1998-07-28 | 2000-02-18 | Sony Corp | 不揮発性半導体記憶装置 |
| US5991202A (en) | 1998-09-24 | 1999-11-23 | Advanced Micro Devices, Inc. | Method for reducing program disturb during self-boosting in a NAND flash memory |
| JP3866460B2 (ja) | 1998-11-26 | 2007-01-10 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| JP3540640B2 (ja) | 1998-12-22 | 2004-07-07 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| KR100388179B1 (ko) | 1999-02-08 | 2003-06-19 | 가부시끼가이샤 도시바 | 불휘발성 반도체 메모리 |
| KR100385229B1 (ko) | 2000-12-14 | 2003-05-27 | 삼성전자주식회사 | 스트링 선택 라인에 유도되는 노이즈 전압으로 인한프로그램 디스터브를 방지할 수 있는 불휘발성 반도체메모리 장치 및 그것의 프로그램 방법 |
| US7070973B2 (en) * | 2000-12-26 | 2006-07-04 | Board Of Regents Of The University Of Nebraska | Butyrylcholinesterase variants and methods of use |
| KR100385230B1 (ko) * | 2000-12-28 | 2003-05-27 | 삼성전자주식회사 | 불휘발성 반도체 메모리 장치의 프로그램 방법 |
| JP4713752B2 (ja) * | 2000-12-28 | 2011-06-29 | 財団法人国際科学振興財団 | 半導体装置およびその製造方法 |
| JP3631463B2 (ja) | 2001-12-27 | 2005-03-23 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| JP3957985B2 (ja) * | 2001-03-06 | 2007-08-15 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| US6522580B2 (en) | 2001-06-27 | 2003-02-18 | Sandisk Corporation | Operating techniques for reducing effects of coupling between storage elements of a non-volatile memory operated in multiple data states |
| US6535424B2 (en) | 2001-07-25 | 2003-03-18 | Advanced Micro Devices, Inc. | Voltage boost circuit using supply voltage detection to compensate for supply voltage variations in read mode voltage |
| JP2003045174A (ja) * | 2001-08-01 | 2003-02-14 | Sharp Corp | 半導体記憶装置 |
| TW520507B (en) | 2001-08-16 | 2003-02-11 | Integrated Circuit Solution In | Control unit and method for plannable and re-programmable non-volatile memory |
| KR100453854B1 (ko) | 2001-09-07 | 2004-10-20 | 삼성전자주식회사 | 향상된 프로그램 방지 특성을 갖는 불휘발성 반도체메모리 장치 및 그것의 프로그램 방법 |
| US6456528B1 (en) | 2001-09-17 | 2002-09-24 | Sandisk Corporation | Selective operation of a multi-state non-volatile memory system in a binary mode |
| US6700815B2 (en) | 2002-04-08 | 2004-03-02 | Advanced Micro Devices, Inc. | Refresh scheme for dynamic page programming |
| DE10220293A1 (de) | 2002-05-07 | 2003-11-27 | Philips Intellectual Property | Gerät und Verfahren zur Reduktion von Bildartefakten |
| TW569221B (en) | 2002-09-11 | 2004-01-01 | Elan Microelectronics Corp | Chip having on-system programmable nonvolatile memory and off-system programmable nonvolatile memory, and forming method and programming method of the same |
| KR100502412B1 (ko) | 2002-10-23 | 2005-07-19 | 삼성전자주식회사 | 불 휘발성 반도체 메모리 장치 및 그것의 프로그램 방법 |
| JP3863485B2 (ja) | 2002-11-29 | 2006-12-27 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| CN1297991C (zh) * | 2003-02-28 | 2007-01-31 | 彭泽忠 | 一种半导体存储器单元和存储器阵列的编程方法及其电路 |
| US6859397B2 (en) * | 2003-03-05 | 2005-02-22 | Sandisk Corporation | Source side self boosting technique for non-volatile memory |
| JP4537680B2 (ja) | 2003-08-04 | 2010-09-01 | 株式会社東芝 | 不揮発性半導体記憶装置及びその動作方法、製造方法、半導体集積回路及びシステム |
| US6977842B2 (en) * | 2003-09-16 | 2005-12-20 | Micron Technology, Inc. | Boosted substrate/tub programming for flash memories |
| JP4212444B2 (ja) | 2003-09-22 | 2009-01-21 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| KR100562506B1 (ko) * | 2003-12-01 | 2006-03-21 | 삼성전자주식회사 | 플래시 메모리 장치 및 그것의 프로그램 방법 |
| US6898126B1 (en) * | 2003-12-15 | 2005-05-24 | Powerchip Semiconductor Corp. | Method of programming a flash memory through boosting a voltage level of a source line |
| US7154779B2 (en) | 2004-01-21 | 2006-12-26 | Sandisk Corporation | Non-volatile memory cell using high-k material inter-gate programming |
| US7161833B2 (en) | 2004-02-06 | 2007-01-09 | Sandisk Corporation | Self-boosting system for flash memory cells |
| US7466590B2 (en) | 2004-02-06 | 2008-12-16 | Sandisk Corporation | Self-boosting method for flash memory cells |
| US7170793B2 (en) | 2004-04-13 | 2007-01-30 | Sandisk Corporation | Programming inhibit for non-volatile memory |
| US7020026B2 (en) | 2004-05-05 | 2006-03-28 | Sandisk Corporation | Bitline governed approach for program control of non-volatile memory |
| JP4758625B2 (ja) | 2004-08-09 | 2011-08-31 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| ES2596529T3 (es) * | 2004-08-16 | 2017-01-10 | Pacific World Corporation | Uñas artificiales estructuralmente flexibles |
| KR100645055B1 (ko) * | 2004-10-28 | 2006-11-10 | 삼성전자주식회사 | 플래시 메모리 장치 및 그것의 프로그램 방법 |
| KR100748553B1 (ko) * | 2004-12-20 | 2007-08-10 | 삼성전자주식회사 | 리플-프리 고전압 발생회로 및 방법, 그리고 이를 구비한반도체 메모리 장치 |
| KR100680462B1 (ko) | 2005-04-11 | 2007-02-08 | 주식회사 하이닉스반도체 | 비휘발성 메모리 장치 및 그것의 핫 일렉트론 프로그램디스터브 방지방법 |
| US7295478B2 (en) | 2005-05-12 | 2007-11-13 | Sandisk Corporation | Selective application of program inhibit schemes in non-volatile memory |
| KR100648289B1 (ko) | 2005-07-25 | 2006-11-23 | 삼성전자주식회사 | 프로그램 속도를 향상시킬 수 있는 플래시 메모리 장치 및그것의 프로그램 방법 |
| US7292476B2 (en) | 2005-08-31 | 2007-11-06 | Micron Technology, Inc. | Programming method for NAND EEPROM |
| US7355889B2 (en) | 2005-12-19 | 2008-04-08 | Sandisk Corporation | Method for programming non-volatile memory with reduced program disturb using modified pass voltages |
| EP1964127B1 (de) | 2005-12-19 | 2009-11-25 | SanDisk Corporation | Verfahren zur programmierung eines nicht flüchtigen speichers mit verminderter programmstörung über modizifierte durchgangsspannungen |
| WO2007117869A2 (en) | 2006-03-30 | 2007-10-18 | Sandisk Corporation | Self-boosting system with suppression of high lateral electric fields |
| US7511995B2 (en) | 2006-03-30 | 2009-03-31 | Sandisk Corporation | Self-boosting system with suppression of high lateral electric fields |
| US7428165B2 (en) | 2006-03-30 | 2008-09-23 | Sandisk Corporation | Self-boosting method with suppression of high lateral electric fields |
-
2004
- 2004-02-06 US US10/774,014 patent/US7161833B2/en not_active Expired - Lifetime
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2005
- 2005-01-20 JP JP2006552138A patent/JP4819702B2/ja not_active Expired - Fee Related
- 2005-01-20 AT AT05711788T patent/ATE508460T1/de not_active IP Right Cessation
- 2005-01-20 WO PCT/US2005/001962 patent/WO2005078733A2/en not_active Ceased
- 2005-01-20 CN CNB2005800088859A patent/CN100555453C/zh not_active Expired - Lifetime
- 2005-01-20 EP EP05711788A patent/EP1714291B1/de not_active Expired - Lifetime
- 2005-01-20 EP EP10011075A patent/EP2341506A3/de not_active Withdrawn
- 2005-01-20 KR KR1020067015940A patent/KR101161152B1/ko not_active Expired - Fee Related
- 2005-01-20 DE DE602005027810T patent/DE602005027810D1/de not_active Expired - Lifetime
- 2005-02-02 TW TW094103221A patent/TWI328228B/zh not_active IP Right Cessation
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- 2006-12-12 US US11/609,688 patent/US7471566B2/en not_active Expired - Lifetime
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- 2008-11-21 US US12/276,186 patent/US7773414B2/en not_active Expired - Lifetime
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Also Published As
| Publication number | Publication date |
|---|---|
| JP2007520850A (ja) | 2007-07-26 |
| EP1714291B1 (de) | 2011-05-04 |
| WO2005078733A2 (en) | 2005-08-25 |
| WO2005078733A3 (en) | 2005-10-13 |
| US20050174852A1 (en) | 2005-08-11 |
| US7161833B2 (en) | 2007-01-09 |
| CN1934653A (zh) | 2007-03-21 |
| JP4819702B2 (ja) | 2011-11-24 |
| US7773414B2 (en) | 2010-08-10 |
| CN100555453C (zh) | 2009-10-28 |
| TWI328228B (en) | 2010-08-01 |
| US7471566B2 (en) | 2008-12-30 |
| EP2341506A3 (de) | 2012-03-21 |
| EP2341506A2 (de) | 2011-07-06 |
| US20070081384A1 (en) | 2007-04-12 |
| KR20060133576A (ko) | 2006-12-26 |
| EP1714291A2 (de) | 2006-10-25 |
| JP5416161B2 (ja) | 2014-02-12 |
| TW200608398A (en) | 2006-03-01 |
| DE602005027810D1 (de) | 2011-06-16 |
| US20090073761A1 (en) | 2009-03-19 |
| JP2011154778A (ja) | 2011-08-11 |
| KR101161152B1 (ko) | 2012-07-03 |
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