ATE384957T1 - Integerierte schaltung mit prüfschaltung - Google Patents

Integerierte schaltung mit prüfschaltung

Info

Publication number: ATE384957T1
Authority: AT; Austria
Prior art keywords: circuit; test patterns; control inputs; application circuit; test
Prior art date: 2002-03-01

Application number

AT03702959T

Other languages

English (en)

Inventor

Friedrich Hapke

Original Assignee

Nxp Bv

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2002-03-01

Filing date

2003-02-26

Publication date

2008-02-15

2003-02-26 Application filed by Nxp Bv filed Critical Nxp Bv

2008-02-15 Application granted granted Critical

2008-02-15 Publication of ATE384957T1 publication Critical patent/ATE384957T1/de

Links

238000012360 testing method Methods 0.000 title abstract 11
238000012986 modification Methods 0.000 abstract 2
230000004048 modification Effects 0.000 abstract 2

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/31813—Test pattern generators
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318385—Random or pseudo-random test pattern
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318544—Scanning methods, algorithms and patterns
- G01R31/318547—Data generators or compressors
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318572—Input/Output interfaces

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Tests Of Electronic Circuits (AREA)
Semiconductor Integrated Circuits (AREA)
Testing Or Measuring Of Semiconductors Or The Like (AREA)

AT03702959T 2002-03-01 2003-02-26 Integerierte schaltung mit prüfschaltung ATE384957T1 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
DE10209078A DE10209078A1 (de)	2002-03-01	2002-03-01	Integrierter Schaltkreis mit Testschaltung

Publications (1)

Publication Number	Publication Date
ATE384957T1 true ATE384957T1 (de)	2008-02-15

Family

ID=27762582

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
AT03702959T ATE384957T1 (de)	2002-03-01	2003-02-26	Integerierte schaltung mit prüfschaltung

Country Status (8)

Country	Link
US (1)	US7139953B2 (de)
EP (1)	EP1483596B1 (de)
JP (1)	JP2005519286A (de)
CN (1)	CN100357754C (de)
AT (1)	ATE384957T1 (de)
AU (1)	AU2003206075A1 (de)
DE (2)	DE10209078A1 (de)
WO (1)	WO2003075028A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US7234092B2 (en)	2002-06-11	2007-06-19	On-Chip Technologies, Inc.	Variable clocked scan test circuitry and method
TWI242121B (en) *	2004-08-20	2005-10-21	Via Tech Inc	Testing method for reconstructing unit
US8286040B2 (en)	2007-02-09	2012-10-09	Freescale Semiconductor, Inc.	Device and method for testing a circuit
US7996749B2 (en) *	2007-07-03	2011-08-09	Altera Corporation	Signal loss detector for high-speed serial interface of a programmable logic device
US8566656B2 (en) *	2009-12-22	2013-10-22	Nxp B.V.	Testing circuit and method

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4503537A (en) *	1982-11-08	1985-03-05	International Business Machines Corporation	Parallel path self-testing system
JPS6329276A (ja) *	1986-07-23	1988-02-06	Hitachi Ltd	論理ｌｓｉ
CA1298668C (en) *	1988-05-05	1992-04-07	Lanae Avra	Maximum length pseudo-random test pattern generator via feedback network modification
US4974184A (en) *	1988-05-05	1990-11-27	Honeywell Inc.	Maximum length pseudo-random test pattern generator via feedback network modification
JP3308099B2 (ja) *	1993-06-16	2002-07-29	花王株式会社	キャップ
WO1997025717A1 (fr) *	1996-01-12	1997-07-17	Advantest Corporation	Generateur de motif de contrôle
KR100245795B1 (ko) *	1997-06-30	2000-03-02	윤종용	테스트의 동작 오류 검사 방법
DE19917884C1 (de) *	1999-04-20	2000-11-16	Siemens Ag	Schaltung mit eingebautem Selbsttest
DE10038327A1 (de) *	2000-08-05	2002-02-14	Philips Corp Intellectual Pty	Integrierter Schaltkreis mit Selbsttest-Schaltung

2002
- 2002-03-01 DE DE10209078A patent/DE10209078A1/de not_active Withdrawn
2003
- 2003-02-26 CN CNB038048787A patent/CN100357754C/zh not_active Expired - Fee Related
- 2003-02-26 WO PCT/IB2003/000760 patent/WO2003075028A1/en not_active Ceased
- 2003-02-26 DE DE60318820T patent/DE60318820T2/de not_active Expired - Lifetime
- 2003-02-26 EP EP03702959A patent/EP1483596B1/de not_active Expired - Lifetime
- 2003-02-26 JP JP2003573435A patent/JP2005519286A/ja not_active Ceased
- 2003-02-26 AU AU2003206075A patent/AU2003206075A1/en not_active Abandoned
- 2003-02-26 US US10/506,234 patent/US7139953B2/en not_active Expired - Fee Related
- 2003-02-26 AT AT03702959T patent/ATE384957T1/de not_active IP Right Cessation

Also Published As

Publication number	Publication date
DE60318820T2 (de)	2009-01-22
CN1639581A (zh)	2005-07-13
US20050160338A1 (en)	2005-07-21
EP1483596A1 (de)	2004-12-08
US7139953B2 (en)	2006-11-21
JP2005519286A (ja)	2005-06-30
DE10209078A1 (de)	2003-09-18
CN100357754C (zh)	2007-12-26
AU2003206075A1 (en)	2003-09-16
DE60318820D1 (de)	2008-03-13
WO2003075028A1 (en)	2003-09-12
EP1483596B1 (de)	2008-01-23

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Legal Events

Date	Code	Title	Description
2008-07-15	RER	Ceased as to paragraph 5 lit. 3 law introducing patent treaties