ATE399330T1 - Dekrompressionsgerät/ prpg zur erzeugung von pseudo-zufälligen und deterministischen prüfmustern - Google Patents

Dekrompressionsgerät/ prpg zur erzeugung von pseudo-zufälligen und deterministischen prüfmustern

Info

Publication number
ATE399330T1
ATE399330T1 AT00979203T AT00979203T ATE399330T1 AT E399330 T1 ATE399330 T1 AT E399330T1 AT 00979203 T AT00979203 T AT 00979203T AT 00979203 T AT00979203 T AT 00979203T AT E399330 T1 ATE399330 T1 AT E399330T1
Authority
AT
Austria
Prior art keywords
prpg
decompressor
random
test patterns
deterministic
Prior art date
Application number
AT00979203T
Other languages
English (en)
Inventor
Janusz Rajski
Jerzy Tyszer
Mark Kassab
Nilanjan Mukherjee
Original Assignee
Mentor Graphics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mentor Graphics Corp filed Critical Mentor Graphics Corp
Application granted granted Critical
Publication of ATE399330T1 publication Critical patent/ATE399330T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318335—Test pattern compression or decompression
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318385—Random or pseudo-random test pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/318547—Data generators or compressors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
AT00979203T 1999-11-23 2000-11-16 Dekrompressionsgerät/ prpg zur erzeugung von pseudo-zufälligen und deterministischen prüfmustern ATE399330T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US16713799P 1999-11-23 1999-11-23
US09/713,664 US6684358B1 (en) 1999-11-23 2000-11-15 Decompressor/PRPG for applying pseudo-random and deterministic test patterns

Publications (1)

Publication Number Publication Date
ATE399330T1 true ATE399330T1 (de) 2008-07-15

Family

ID=26862893

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00979203T ATE399330T1 (de) 1999-11-23 2000-11-16 Dekrompressionsgerät/ prpg zur erzeugung von pseudo-zufälligen und deterministischen prüfmustern

Country Status (7)

Country Link
US (5) US6684358B1 (de)
EP (1) EP1256007B1 (de)
JP (1) JP2003518245A (de)
AT (1) ATE399330T1 (de)
DE (1) DE60039311D1 (de)
HK (1) HK1049207A1 (de)
WO (1) WO2001038890A1 (de)

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US7506232B2 (en) 2009-03-17
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US20090177933A1 (en) 2009-07-09
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US7865794B2 (en) 2011-01-04
US20040128599A1 (en) 2004-07-01
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