ATE405846T1 - Fehlererkennung in komprimierten daten - Google Patents

Fehlererkennung in komprimierten daten

Info

Publication number
ATE405846T1
ATE405846T1 AT05101918T AT05101918T ATE405846T1 AT E405846 T1 ATE405846 T1 AT E405846T1 AT 05101918 T AT05101918 T AT 05101918T AT 05101918 T AT05101918 T AT 05101918T AT E405846 T1 ATE405846 T1 AT E405846T1
Authority
AT
Austria
Prior art keywords
data
dut
data sequence
error detection
compressed data
Prior art date
Application number
AT05101918T
Other languages
English (en)
Inventor
Martin Fischer
Domenico Chindamo
Original Assignee
Verigy Pte Ltd Singapore
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Verigy Pte Ltd Singapore filed Critical Verigy Pte Ltd Singapore
Application granted granted Critical
Publication of ATE405846T1 publication Critical patent/ATE405846T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/318547—Data generators or compressors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318335—Test pattern compression or decompression
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318371—Methodologies therefor, e.g. algorithms, procedures

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Signal Processing For Digital Recording And Reproducing (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
  • Television Signal Processing For Recording (AREA)
AT05101918T 2005-03-11 2005-03-11 Fehlererkennung in komprimierten daten ATE405846T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP05101918A EP1701173B1 (de) 2005-03-11 2005-03-11 Fehlererkennung in komprimierten Daten

Publications (1)

Publication Number Publication Date
ATE405846T1 true ATE405846T1 (de) 2008-09-15

Family

ID=34938955

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05101918T ATE405846T1 (de) 2005-03-11 2005-03-11 Fehlererkennung in komprimierten daten

Country Status (5)

Country Link
US (1) US8473796B2 (de)
EP (1) EP1701173B1 (de)
JP (1) JP2006250940A (de)
AT (1) ATE405846T1 (de)
DE (1) DE602005009133D1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100761851B1 (ko) * 2006-06-30 2007-09-28 삼성전자주식회사 실시간으로 최적화되는 반도체 소자의 전기적 검사를 위한 컴퓨터로 실행 가능한 저장매체 및 그 적용방법
JP5300373B2 (ja) * 2008-08-25 2013-09-25 株式会社東芝 代数的トーラスを用いたデータ圧縮処理を行う装置およびプログラム
FR2952735B1 (fr) * 2009-11-18 2011-12-09 St Microelectronics Rousset Procede et dispositif de detection d'attaques par injection de fautes
US8582768B2 (en) 2011-02-16 2013-11-12 Marvell World Trade Ltd. Recovery from decryption errors in a sequence of communication packets
FR2984553B1 (fr) 2011-12-15 2015-11-06 Proton World Int Nv Procede et dispositif de detection de fautes
US9385865B2 (en) * 2013-07-18 2016-07-05 Marvell World Trade Ltd. Correcting deciphering mis-synchronization in a mobile communication terminal

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5173906A (en) * 1990-08-31 1992-12-22 Dreibelbis Jeffrey H Built-in self test for integrated circuits
DE69100204T2 (de) 1991-11-11 1994-01-13 Hewlett Packard Gmbh Einrichtung zur Erzeugung von Testsignalen.
DE4305442C2 (de) 1993-02-23 1999-08-05 Hewlett Packard Gmbh Verfahren und Vorrichtung zum Erzeugen eines Testvektors
EP0882991B1 (de) 1997-05-22 1999-03-17 Hewlett-Packard Company Dekompressionsschaltkreis
DE69700660T2 (de) 1997-05-30 2000-02-10 Hewlett-Packard Co., Palo Alto Mehrkanalanordnung mit einem unabhängigen Taktsignal pro Kanal
US5930270A (en) * 1997-07-23 1999-07-27 International Business Machines Corporation Logic built in self-test diagnostic method
EP0864977B1 (de) 1997-09-13 1999-07-14 Hewlett-Packard Company Ausgleich von Latenzzeit in einem Speicher
EP0859318B1 (de) 1997-09-13 1999-07-14 Hewlett-Packard Company Optimierte Speicherorganisation in einer Mehrkanalcomputerarchitektur
US6067651A (en) * 1998-02-20 2000-05-23 Hewlett-Packard Company Test pattern generator having improved test sequence compaction
US6578169B1 (en) * 2000-04-08 2003-06-10 Advantest Corp. Data failure memory compaction for semiconductor test system
JP4863547B2 (ja) * 2000-12-27 2012-01-25 ルネサスエレクトロニクス株式会社 Ｂｉｓｔ回路内蔵半導体集積回路装置
DE10122619C1 (de) * 2001-05-10 2003-02-13 Infineon Technologies Ag Testschaltung zum Testen einer synchronen Schaltung
US6948096B2 (en) * 2001-07-31 2005-09-20 Intel Corporation Functional random instruction testing (FRIT) method for complex devices such as microprocessors
JP2003332443A (ja) * 2002-05-08 2003-11-21 Toshiba Corp 半導体集積回路とその設計支援装置およびテスト方法
JP4031954B2 (ja) * 2002-06-11 2008-01-09 富士通株式会社 集積回路の診断装置および診断方法

Also Published As

Publication number Publication date
EP1701173B1 (de) 2008-08-20
JP2006250940A (ja) 2006-09-21
EP1701173A1 (de) 2006-09-13
DE602005009133D1 (de) 2008-10-02
US8473796B2 (en) 2013-06-25
US20060212770A1 (en) 2006-09-21

Similar Documents

Publication Publication Date Title
US7737701B2 (en) Method and tester for verifying the electrical connection integrity of a component to a substrate
US20080086664A1 (en) Tester input/output sharing
WO2009039316A3 (en) Fault diagnosis in a memory bist environment using a linear feedback shift register
WO2007146581A3 (en) Method of expanding tester drive and measurement capability
TWI323348B (en) Apparatus and methods for measurement of analog voltages in an integrated circuit
ATE525661T1 (de) Halbleiterbauelement und verfahren zum testen eines solchen
US8217674B2 (en) Systems and methods to test integrated circuits
US8922233B2 (en) Apparatus for testing a semiconductor device and method of testing a semiconductor device
DE602005009133D1 (de) Fehlererkennung in komprimierten Daten
TW534986B (en) Inspecting apparatus and inspecting method for circuit board
CN101303391A (zh) 流水线测试设备及方法
US8130032B1 (en) Systems and methods for high-sensitivity detection of input bias current
ATE376191T1 (de) Prüfung eines testobjekts mit abtastung vom taktsignal und vom datensignal
WO2006073736A3 (en) Probe head arrays
WO2008120518A1 (ja) Ｔｃｐハンドリング装置
TW200716998A (en) Method and apparatus for eliminating automated testing equipment index time
JP2003018007A (ja) アナログ／ディジタル信号変換方法
TW200500618A (en) Ancillary equipment for testing semiconductor integrated circuit
WO2008114602A1 (ja) 試験装置および電子デバイス
TWI316139B (en) Method of testing non-componented large printed circuit boards using a finger tester
TW200712521A (en) Semiconductor test apparatus
WO2006002334A3 (en) Intelligent probe chips/heads
ATE456080T1 (de) Überwachungseinrichtung für eine antriebseinrichtung
TWI520244B (zh) 測試鍵的電路架構與測試鍵的測試方法
PL1877734T3 (pl) Urządzenie nastawcze i sposób oceny urządzenia nastawczego

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties