ATE506754T1 - Schaltungsvorrichtung und verfahren zur messung von taktschwankungen - Google Patents

Schaltungsvorrichtung und verfahren zur messung von taktschwankungen

Info

Publication number
ATE506754T1
ATE506754T1 AT08005117T AT08005117T ATE506754T1 AT E506754 T1 ATE506754 T1 AT E506754T1 AT 08005117 T AT08005117 T AT 08005117T AT 08005117 T AT08005117 T AT 08005117T AT E506754 T1 ATE506754 T1 AT E506754T1
Authority
AT
Austria
Prior art keywords
circuit device
measuring clock
clock fluctuations
clock signal
fluctuations
Prior art date
Application number
AT08005117T
Other languages
English (en)
Inventor
Martin Saint-Laurent
Boris Andreev
Paul Bassett
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Application granted granted Critical
Publication of ATE506754T1 publication Critical patent/ATE506754T1/de

Links

Classifications

    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/005—Time-to-digital converters [TDC]
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Pulse Circuits (AREA)
  • Manipulation Of Pulses (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Dc Digital Transmission (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Measuring Phase Differences (AREA)
AT08005117T 2007-08-09 2008-03-19 Schaltungsvorrichtung und verfahren zur messung von taktschwankungen ATE506754T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/836,220 US7816960B2 (en) 2007-08-09 2007-08-09 Circuit device and method of measuring clock jitter

Publications (1)

Publication Number Publication Date
ATE506754T1 true ATE506754T1 (de) 2011-05-15

Family

ID=39590275

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08005117T ATE506754T1 (de) 2007-08-09 2008-03-19 Schaltungsvorrichtung und verfahren zur messung von taktschwankungen

Country Status (14)

Country Link
US (1) US7816960B2 (de)
EP (1) EP2026469B1 (de)
JP (1) JP5318870B2 (de)
KR (1) KR101200233B1 (de)
CN (1) CN101779376B (de)
AT (1) ATE506754T1 (de)
BR (1) BRPI0815032A2 (de)
CA (1) CA2695373C (de)
DE (1) DE602008006312D1 (de)
ES (1) ES2365438T3 (de)
MX (1) MX2010001526A (de)
RU (1) RU2451391C2 (de)
TW (1) TWI366343B (de)
WO (1) WO2009021186A1 (de)

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CN106452693B (zh) * 2016-08-26 2019-04-30 西安空间无线电技术研究所 一种基于双频点噪底能量分析的时钟相位抖动测量方法
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CN108023576B (zh) * 2017-12-25 2021-02-02 北京无线电计量测试研究所 一种用于快沿脉冲发生器上升时间校准的方法
CN109062538B (zh) * 2018-07-10 2020-11-20 豪威科技(上海)有限公司 环形先进先出缓冲器及数据传输接口、系统、方法
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US11879936B1 (en) * 2022-07-01 2024-01-23 Ampere Computing Llc On-die clock period jitter and duty cycle analyzer
CN115204083B (zh) * 2022-09-13 2023-02-28 摩尔线程智能科技(北京)有限责任公司 芯片静态时序分析方法、装置、电子设备及存储介质
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Also Published As

Publication number Publication date
MX2010001526A (es) 2010-03-15
DE602008006312D1 (de) 2011-06-01
RU2010108218A (ru) 2011-10-27
KR20100053632A (ko) 2010-05-20
ES2365438T3 (es) 2011-10-05
CA2695373C (en) 2013-07-23
US20090039867A1 (en) 2009-02-12
JP2010536267A (ja) 2010-11-25
CN101779376A (zh) 2010-07-14
TW200919968A (en) 2009-05-01
TWI366343B (en) 2012-06-11
BRPI0815032A2 (pt) 2015-03-10
RU2451391C2 (ru) 2012-05-20
EP2026469A1 (de) 2009-02-18
KR101200233B1 (ko) 2012-11-09
CA2695373A1 (en) 2009-02-12
US7816960B2 (en) 2010-10-19
JP5318870B2 (ja) 2013-10-16
WO2009021186A1 (en) 2009-02-12
EP2026469B1 (de) 2011-04-20
CN101779376B (zh) 2013-11-06

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