ATE529894T1 - Nanodraht-tunneltransistor - Google Patents
Nanodraht-tunneltransistorInfo
- Publication number
- ATE529894T1 ATE529894T1 AT07700680T AT07700680T ATE529894T1 AT E529894 T1 ATE529894 T1 AT E529894T1 AT 07700680 T AT07700680 T AT 07700680T AT 07700680 T AT07700680 T AT 07700680T AT E529894 T1 ATE529894 T1 AT E529894T1
- Authority
- AT
- Austria
- Prior art keywords
- tunnel transistor
- potential barrier
- nanowire
- nanowire tunnel
- intrinsic
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/751—Insulated-gate field-effect transistors [IGFET] having composition variations in the channel regions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/025—Manufacture or treatment of FETs having insulated gates [IGFET] of vertical IGFETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/63—Vertical IGFETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
- H10D62/119—Nanowire, nanosheet or nanotube semiconductor bodies
- H10D62/121—Nanowire, nanosheet or nanotube semiconductor bodies oriented parallel to substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
- H10D62/119—Nanowire, nanosheet or nanotube semiconductor bodies
- H10D62/122—Nanowire, nanosheet or nanotube semiconductor bodies oriented at angles to substrates, e.g. perpendicular to substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
- H10D62/119—Nanowire, nanosheet or nanotube semiconductor bodies
- H10D62/123—Nanowire, nanosheet or nanotube semiconductor bodies comprising junctions
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/734—Fullerenes, i.e. graphene-based structures, such as nanohorns, nanococoons, nanoscrolls or fullerene-like structures, e.g. WS2 or MoS2 chalcogenide nanotubes, planar C3N4, etc.
- Y10S977/742—Carbon nanotubes, CNTs
- Y10S977/75—Single-walled
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/813—Of specified inorganic semiconductor composition, e.g. periodic table group IV-VI compositions
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/936—Specified use of nanostructure for electronic or optoelectronic application in a transistor or 3-terminal device
- Y10S977/938—Field effect transistors, FETS, with nanowire- or nanotube-channel region
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Thin Film Transistor (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP06100816 | 2006-01-25 | ||
| PCT/IB2007/050241 WO2007086009A1 (en) | 2006-01-25 | 2007-01-24 | Nanowire tunneling transistor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE529894T1 true ATE529894T1 (de) | 2011-11-15 |
Family
ID=38007344
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT07700680T ATE529894T1 (de) | 2006-01-25 | 2007-01-24 | Nanodraht-tunneltransistor |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US7791108B2 (de) |
| EP (1) | EP1979946B1 (de) |
| JP (1) | JP2009524924A (de) |
| KR (1) | KR20080096789A (de) |
| CN (1) | CN101375398B (de) |
| AT (1) | ATE529894T1 (de) |
| TW (1) | TW200739905A (de) |
| WO (1) | WO2007086009A1 (de) |
Families Citing this family (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1979935A1 (de) * | 2006-01-25 | 2008-10-15 | Nxp B.V. | Tunneltransistor mit barriere |
| US20080093693A1 (en) * | 2006-10-20 | 2008-04-24 | Kamins Theodore I | Nanowire sensor with variant selectively interactive segments |
| WO2009072984A1 (en) * | 2007-12-07 | 2009-06-11 | Agency For Science, Technology And Research | A silicon-germanium nanowire structure and a method of forming the same |
| RU2367059C1 (ru) * | 2007-12-13 | 2009-09-10 | Институт радиотехники и электроники Российской Академии Наук | Туннельное устройство |
| EP2148374A1 (de) | 2008-07-23 | 2010-01-27 | University College Cork-National University of Ireland, Cork | Nanodraht-Tunneltransistor |
| US8114787B2 (en) * | 2009-02-19 | 2012-02-14 | Empire Technology Development Llc | Integrated circuit nanowires |
| KR20120003463A (ko) * | 2009-03-25 | 2012-01-10 | 글로 에이비 | 쇼트키 장치 |
| WO2011010988A1 (en) * | 2009-07-20 | 2011-01-27 | Hewlett-Packard Development Company, L.P | Nanowire sensor with angled segments that are differently functionalized |
| US9159565B2 (en) * | 2009-08-20 | 2015-10-13 | Globalfoundries Singapore Pte. Ltd. | Integrated circuit system with band to band tunneling and method of manufacture thereof |
| US20110087430A1 (en) | 2009-10-14 | 2011-04-14 | International Business Machines Corporation | Determining travel routes by using auction-based location preferences |
| TW201236154A (en) * | 2010-12-22 | 2012-09-01 | Ibm | Semiconductor device |
| JP2013038336A (ja) * | 2011-08-10 | 2013-02-21 | Toshiba Corp | 半導体装置 |
| US9368502B2 (en) * | 2011-10-17 | 2016-06-14 | GlogalFoundries, Inc. | Replacement gate multigate transistor for embedded DRAM |
| WO2013095342A1 (en) | 2011-12-19 | 2013-06-27 | Intel Corporation | High voltage field effect transistors |
| US9142400B1 (en) | 2012-07-17 | 2015-09-22 | Stc.Unm | Method of making a heteroepitaxial layer on a seed area |
| US9054215B2 (en) * | 2012-12-18 | 2015-06-09 | Intel Corporation | Patterning of vertical nanowire transistor channel and gate with directed self assembly |
| US8890119B2 (en) * | 2012-12-18 | 2014-11-18 | Intel Corporation | Vertical nanowire transistor with axially engineered semiconductor and gate metallization |
| US8896101B2 (en) * | 2012-12-21 | 2014-11-25 | Intel Corporation | Nonplanar III-N transistors with compositionally graded semiconductor channels |
| US8975123B2 (en) | 2013-07-09 | 2015-03-10 | International Business Machines Corporation | Tunnel field-effect transistors with a gate-swing broken-gap heterostructure |
| US9306063B2 (en) * | 2013-09-27 | 2016-04-05 | Intel Corporation | Vertical transistor devices for embedded memory and logic technologies |
| JP6146265B2 (ja) * | 2013-11-07 | 2017-06-14 | ソニー株式会社 | 顕微鏡システムおよびオートフォーカス方法 |
| US9318447B2 (en) | 2014-07-18 | 2016-04-19 | Taiwan Semiconductor Manufacturing Company Limited | Semiconductor device and method of forming vertical structure |
| TR201809995T4 (tr) * | 2014-09-24 | 2018-08-27 | Evonik Roehm Gmbh | Darbe mukavemeti olan iyileştirilmiş özellik profiline sahip kalıplama bileşiği. |
| US10121858B2 (en) * | 2015-10-30 | 2018-11-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Elongated semiconductor structure planarization |
| US11018254B2 (en) * | 2016-03-31 | 2021-05-25 | International Business Machines Corporation | Fabrication of vertical fin transistor with multiple threshold voltages |
| WO2017181404A1 (zh) | 2016-04-22 | 2017-10-26 | 华为技术有限公司 | 隧穿场效应晶体管及其制造方法 |
| KR102519665B1 (ko) | 2016-08-05 | 2023-04-07 | 삼성전자주식회사 | 집적회로 장치 및 그 제조 방법 |
| KR101857873B1 (ko) * | 2016-09-26 | 2018-06-19 | 고려대학교 산학협력단 | 로직 반도체 소자 |
| CN108695382B (zh) * | 2017-04-07 | 2021-07-06 | 中芯国际集成电路制造(上海)有限公司 | 半导体装置及其制造方法 |
| WO2019046629A1 (en) | 2017-08-31 | 2019-03-07 | Micron Technology, Inc. | SEMICONDUCTOR DEVICES, HYBRID TRANSISTORS, AND ASSOCIATED METHODS |
| EP3676877A4 (de) * | 2017-08-31 | 2021-09-01 | Micron Technology, Inc. | Halbleiterbauelemente, transistoren und zugehörige verfahren zur kontaktierung von metalloxid-halbleiterbauelementen |
| CN109326650B (zh) * | 2018-10-10 | 2022-04-19 | 中国科学院微电子研究所 | 半导体器件及其制造方法及包括该器件的电子设备 |
| KR20220101861A (ko) * | 2021-01-12 | 2022-07-19 | 에스케이하이닉스 주식회사 | 수직형 트랜지스터 및 그 제조 방법 |
| CN112968053B (zh) * | 2021-02-01 | 2022-09-09 | 深圳大学 | 场效应晶体管及其制备方法 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7192533B2 (en) * | 2002-03-28 | 2007-03-20 | Koninklijke Philips Electronics N.V. | Method of manufacturing nanowires and electronic device |
| US7335908B2 (en) * | 2002-07-08 | 2008-02-26 | Qunano Ab | Nanostructures and methods for manufacturing the same |
| US7180107B2 (en) * | 2004-05-25 | 2007-02-20 | International Business Machines Corporation | Method of fabricating a tunneling nanotube field effect transistor |
| GB0413310D0 (en) | 2004-06-15 | 2004-07-14 | Koninkl Philips Electronics Nv | Nanowire semiconductor device |
| US7714386B2 (en) * | 2006-06-09 | 2010-05-11 | Northrop Grumman Systems Corporation | Carbon nanotube field effect transistor |
-
2007
- 2007-01-24 CN CN2007800034256A patent/CN101375398B/zh not_active Expired - Fee Related
- 2007-01-24 WO PCT/IB2007/050241 patent/WO2007086009A1/en not_active Ceased
- 2007-01-24 EP EP07700680A patent/EP1979946B1/de active Active
- 2007-01-24 KR KR1020087020568A patent/KR20080096789A/ko not_active Ceased
- 2007-01-24 JP JP2008551929A patent/JP2009524924A/ja not_active Withdrawn
- 2007-01-24 AT AT07700680T patent/ATE529894T1/de not_active IP Right Cessation
- 2007-01-24 US US12/161,574 patent/US7791108B2/en not_active Expired - Fee Related
- 2007-01-25 TW TW096102854A patent/TW200739905A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| EP1979946A1 (de) | 2008-10-15 |
| WO2007086009A1 (en) | 2007-08-02 |
| CN101375398A (zh) | 2009-02-25 |
| EP1979946B1 (de) | 2011-10-19 |
| CN101375398B (zh) | 2011-12-28 |
| US7791108B2 (en) | 2010-09-07 |
| KR20080096789A (ko) | 2008-11-03 |
| TW200739905A (en) | 2007-10-16 |
| US20090008631A1 (en) | 2009-01-08 |
| JP2009524924A (ja) | 2009-07-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |