BRPI1009508A2 - método e dispositivo para medição óptica da superfície de um produto - Google Patents

método e dispositivo para medição óptica da superfície de um produto

Info

Publication number
BRPI1009508A2
BRPI1009508A2 BRPI1009508A BRPI1009508A BRPI1009508A2 BR PI1009508 A2 BRPI1009508 A2 BR PI1009508A2 BR PI1009508 A BRPI1009508 A BR PI1009508A BR PI1009508 A BRPI1009508 A BR PI1009508A BR PI1009508 A2 BRPI1009508 A2 BR PI1009508A2
Authority
BR
Brazil
Prior art keywords
tested product
white light
product
light
tested
Prior art date
Application number
BRPI1009508A
Other languages
English (en)
Inventor
Franz Wieser Roman
Original Assignee
Witrins S R O
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from EP09466016A external-priority patent/EP2196765A1/en
Application filed by Witrins S R O filed Critical Witrins S R O
Publication of BRPI1009508A2 publication Critical patent/BRPI1009508A2/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608Height gauges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509Color coding
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/081Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0817Monitoring of soldering processes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/50Using chromatic effects to achieve wavelength-dependent depth resolution

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

método e dispositivo para medição óptica da superfície de um produto a invenção se refere a um dispositivo (1 0), um método e uma aplicação destes para medir opticamente a superfície de um produto testado (5), especialmente um. produto de pci para inspeção do refluxo 'de solda. o disp0sitivo compreende pelo _menos uma fonte de luz branca (1) para emitir um feixe de luz branca, pelo menos uma unidade de colimação (4) para colimar o dito feixe de luz branca (30), pelo menos uma unidade espectrométrica, preferivelmente um prisma óptico (2) ou um nivelador de difração óptica (51), para fragmentar o dito feixe de luz branca (30) em um feixe de luz multicromático (31) sendo direcionado para o dito produto testado (5) sob um ângulo de incidência y predeterminado, e pelo menos uma câmera (3) para gravar um feixe de luz monocromático refletido (32) do dito produto testado (5). a informação da altura de superfície de eixo z do dito produto testado (5) pode ser extraída a partir de um valor de matiz do dito feixe de luz monocromático refletido (32), enquanto o dito produto de teste (5) se move relativamente em uma direção de escaneamento de eixo x (9).
BRPI1009508A 2009-03-03 2010-03-02 método e dispositivo para medição óptica da superfície de um produto BRPI1009508A2 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CZ20090133A CZ2009133A3 (cs) 2009-03-03 2009-03-03 Zarízení, zpusob merení vnejších rozmeru testovaného výrobku a použití tohoto zarízení
EP09466016A EP2196765A1 (en) 2008-12-09 2009-08-27 Measuring the outer dimensions of an object
PCT/IB2010/000944 WO2010100571A1 (en) 2009-03-03 2010-03-02 Method and device for optically measuring the surface of a product

Publications (1)

Publication Number Publication Date
BRPI1009508A2 true BRPI1009508A2 (pt) 2019-04-02

Family

ID=40823629

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI1009508A BRPI1009508A2 (pt) 2009-03-03 2010-03-02 método e dispositivo para medição óptica da superfície de um produto

Country Status (11)

Country Link
US (1) US20120033066A1 (pt)
EP (1) EP2307852B1 (pt)
CN (1) CN102282440B (pt)
AT (1) ATE557260T1 (pt)
BR (1) BRPI1009508A2 (pt)
CZ (1) CZ2009133A3 (pt)
ES (1) ES2390487T3 (pt)
MX (1) MX2011009114A (pt)
PT (1) PT2307852E (pt)
RU (1) RU2500984C2 (pt)
WO (1) WO2010100571A1 (pt)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101714050B1 (ko) 2010-11-01 2017-03-08 삼성전자주식회사 휴대단말기의 데이터 표시장치 및 방법
JP5765651B2 (ja) * 2011-02-01 2015-08-19 Jukiオートメーションシステムズ株式会社 3次元測定装置
JP5124705B1 (ja) * 2011-03-14 2013-01-23 パナソニック株式会社 はんだ高さ検出方法およびはんだ高さ検出装置
FR2975940A1 (fr) * 2011-05-31 2012-12-07 Forest Line Capdenac Procede de controle du jeu entre bandes deposees par une tete de drapage et sous-ensemble de tete de drapage a dispositif de controle embarque.
WO2013011586A1 (ja) 2011-07-21 2013-01-24 株式会社ニレコ 帯状体の端部位置検出装置及び帯状体の端部位置検出方法
JP5701837B2 (ja) * 2012-10-12 2015-04-15 横河電機株式会社 変位センサ、変位測定方法
US8939074B2 (en) 2013-03-12 2015-01-27 Illinois Tool Works Inc. Color-based linear three dimensional acquisition system and method
DE102013104679A1 (de) 2013-05-07 2014-11-13 Witrins S.R.O. Verfahren und Vorrichtung zur optischen Analyse eines PCBs
RU2559168C1 (ru) * 2014-03-17 2015-08-10 Государственное автономное образовательное учреждение Астраханской области высшего профессионального образования "Астраханский инженерно-строительный институт" (ГАОУ АО ВПО "АИСИ") Способ бесконтактного определения кривизны поверхности строительной конструкции
US9335157B2 (en) * 2014-10-14 2016-05-10 Electronics For Imaging, Inc. Differential lighting
DE102014115650B4 (de) 2014-10-28 2016-08-04 Witrins S.R.O. Inspektionssystem und Verfahren zur Fehleranalyse
US9826226B2 (en) 2015-02-04 2017-11-21 Dolby Laboratories Licensing Corporation Expedited display characterization using diffraction gratings
DE102015109431A1 (de) 2015-06-12 2016-12-15 Witrins S.R.O. Inspektionssystem und Verfahren zur Fehleranalyse von Drahtverbindungen
US9838612B2 (en) * 2015-07-13 2017-12-05 Test Research, Inc. Inspecting device and method for inspecting inspection target
EP3203264B1 (en) * 2016-02-04 2024-08-28 Mettler-Toledo GmbH Method of imaging an object for tracking and documentation during transportation and storage
CN106441120A (zh) * 2016-08-26 2017-02-22 江苏楚汉新能源科技有限公司 一种测量锂电池极片波浪边波峰的方法
US10473454B1 (en) * 2017-01-06 2019-11-12 Kla-Tencor Corporation Imaging-based height measurement based on known geometric information
CN107345789B (zh) * 2017-07-06 2023-06-30 深圳市强华科技发展有限公司 一种pcb板孔位检测装置及方法
TWI638132B (zh) * 2017-08-25 2018-10-11 三星科技股份有限公司 物件多面取像裝置
KR102236269B1 (ko) * 2018-05-09 2021-04-05 한화정밀기계 주식회사 부품 실장 장치
CN108801155B (zh) * 2018-07-18 2020-03-06 清华大学深圳研究生院 一种光谱编码距离传感器系统
US10866092B2 (en) * 2018-07-24 2020-12-15 Kla-Tencor Corporation Chromatic confocal area sensor
RU2767590C2 (ru) * 2018-09-19 2022-03-17 АРТЕК ЮРОП С.а.р.Л. Трехмерный сканер с обратной связью по сбору данных
CN110596136B (zh) * 2019-09-26 2024-06-07 江苏兴达钢帘线股份有限公司 一种检测钢丝表面镀层颜色变化装置
CN110940299B (zh) * 2019-11-04 2020-11-13 浙江大学 一种混凝土表面三维粗糙度的测量方法
CN112539697B (zh) * 2020-07-14 2022-12-09 深圳中科飞测科技股份有限公司 一种发光装置及其光斑调整方法、检测设备
CN111964595B (zh) * 2020-07-28 2022-05-27 天地科技股份有限公司 综采工作面液压支架支撑高度和顶梁倾角测量装置
CN111880575B (zh) * 2020-08-10 2023-03-24 重庆依塔大数据研究院有限公司 基于颜色追踪的控制方法、装置、存储介质及机器人
RU207462U1 (ru) * 2021-04-29 2021-10-28 Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" Устройство для лазерной модификации образца
CN113324498B (zh) * 2021-05-06 2024-09-20 西安理工大学 超薄玻璃基板平整度多参数高精度测量系统及方法
CN113364980B (zh) * 2021-05-31 2022-12-06 浙江大华技术股份有限公司 设备的控制方法、装置、存储介质以及电子装置
DE102021124505A1 (de) 2021-09-22 2023-03-23 WICKON HIGHTECH GmbH Inspektionssystem und Verfahren zur Fehleranalyse
DE102021124507B4 (de) 2021-09-22 2024-10-02 WICKON HIGHTECH GmbH Inspektionssystem und Verfahren zur Fehleranalyse
DE102021124504A1 (de) 2021-09-22 2023-03-23 WICKON HIGHTECH GmbH Inspektionssystem und Verfahren zur Fehleranalyse
EP4312020A1 (en) 2022-07-27 2024-01-31 WiTrins s.r.o. Inspection system and method for analyzing defects
DE102022132162A1 (de) 2022-12-05 2024-06-06 Witrins S.R.O. Verfahren zur Fehleranalyse und Inspektionssystem
EP4400805A1 (de) 2023-01-11 2024-07-17 WiTrins s.r.o. Inspektionssystem und verfahren zur fehleranalyse
CN116577638A (zh) * 2023-05-25 2023-08-11 赣州市超跃科技有限公司 一种电路板智能测试系统、方法、装置及介质
CN117564862B (zh) * 2024-01-02 2026-01-30 福建福晶科技股份有限公司 一种利用柱面棒镜的可调谐的角度校准方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6175210A (ja) * 1984-09-20 1986-04-17 Nec Corp レンジフアインダ
JPH07117399B2 (ja) * 1987-01-20 1995-12-18 株式会社竹中工務店 建築仕上げ下地の平面精度検査方法ならびに装置
RU2051399C1 (ru) * 1990-10-02 1995-12-27 Важенин Борис Павлович Способ получения цветостереомодели
KR100406843B1 (ko) * 2001-04-06 2003-11-21 (주) 인텍플러스 색정보를 이용한 실시간 3차원 표면형상 측정방법 및 장치
US7310139B2 (en) * 2002-03-28 2007-12-18 Takai Tofu & Soymilk Equipment Company Limited Evaluation method and device for gel state or sol-gel state change of object
US7349160B2 (en) * 2002-10-01 2008-03-25 Koninklijke Philips Electronics, N.V. Multi-layered collimator
US7529043B2 (en) * 2003-07-08 2009-05-05 Panasonic Corporation Beam shaping optical device, optical head, and optical information medium drive unit
EP2016580A2 (en) * 2006-05-04 2009-01-21 Philips Intellectual Property & Standards GmbH Lighting device with an array of controlled emitters with shared control and feedback
US7471381B2 (en) * 2006-05-23 2008-12-30 Agency For Science, Technology And Research Method and apparatus for bump inspection
CN100592214C (zh) * 2007-11-30 2010-02-24 北京理工大学 一种基于微透镜阵列调焦调平的装置与方法
US8348492B2 (en) * 2008-05-06 2013-01-08 Koninklijke Philips Electronics N.V. Movable LED track luminaire

Also Published As

Publication number Publication date
US20120033066A1 (en) 2012-02-09
CN102282440A (zh) 2011-12-14
CZ2009133A3 (cs) 2009-07-08
RU2500984C2 (ru) 2013-12-10
CN102282440B (zh) 2014-08-20
WO2010100571A4 (en) 2010-12-16
PT2307852E (pt) 2012-08-10
WO2010100571A1 (en) 2010-09-10
RU2011139987A (ru) 2013-04-10
ATE557260T1 (de) 2012-05-15
MX2011009114A (es) 2011-12-16
EP2307852A1 (en) 2011-04-13
ES2390487T3 (es) 2012-11-13
EP2307852B1 (en) 2012-05-09

Similar Documents

Publication Publication Date Title
BRPI1009508A2 (pt) método e dispositivo para medição óptica da superfície de um produto
US10976217B2 (en) System and method for inspecting optical power and thickness of ophthalmic lenses immersed in a solution
EA201291288A1 (ru) Способ и устройство измерения оптических характеристик оптически изменяемой маркировки, нанесенной на объект
TWI414817B (zh) 線型彩色共焦顯微系統
Luo et al. Fiber-based chromatic confocal microscope with Gaussian fitting method
CN112236666B (zh) 瞬时椭偏仪或散射仪及相关测量方法
WO2020086828A3 (en) Confocal optical protractor
EP2090918A3 (de) Kalibriervorrichtung und Laser-Scanning-Mikroskop mit einer derartigen Kalibriervorrichtung
WO2012141544A3 (ko) Tsv 측정용 간섭계 및 이를 이용한 측정방법
EP2228621A3 (en) Optical interference measuring apparatus
JP2008268387A (ja) 共焦点顕微鏡
US9261352B2 (en) Chromatic converter for altimetry
CN106461575A (zh) 制得浮法玻璃条中测量畸变缺陷装置及方法
JP2014503842A5 (ja) 共焦点レーザー走査顕微鏡
KR101794641B1 (ko) 파장 분리를 이용한 높이 및 형상측정이 가능한 경사 분광시스템
KR20150044291A (ko) 자동초점 조절장치 및 자동초점 조절방법
JP2008203232A (ja) 低コヒーレンス光干渉計及びそれを用いた低コヒーレンス光干渉方法
TW200712444A (en) Light wave interference device
TW200745602A (en) Optical measurement instrument and optical measurement method
ATE365933T1 (de) Mikroskop mit einem identifikationssystem für optische filter
MX2024003622A (es) Sistema de inspeccion y procedimiento para el analisis de defectos.
TW200734600A (en) Optical measurement unit for real-time measuring angular error of platform and the method thereof
CN1800803A (zh) 光学部件的检查方法以及检查装置
KR20120133603A (ko) 색수차를 이용한 표면 형상 측정장치
KR102786771B1 (ko) 변위측정 및 영상획득이 동시에 가능한 검사장치

Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE AS 6A, 7A, 8A E 9A ANUIDADES.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2518 DE 09-04-2019 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.

B350 Update of information on the portal [chapter 15.35 patent gazette]