CA1183285A - Appareil et methode pour focaliser les rayons x et gamma et les neutrons - Google Patents

Appareil et methode pour focaliser les rayons x et gamma et les neutrons

Info

Publication number
CA1183285A
CA1183285A CA000401037A CA401037A CA1183285A CA 1183285 A CA1183285 A CA 1183285A CA 000401037 A CA000401037 A CA 000401037A CA 401037 A CA401037 A CA 401037A CA 1183285 A CA1183285 A CA 1183285A
Authority
CA
Canada
Prior art keywords
face
instrument
spacing
diffraction
crystalline structure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000401037A
Other languages
English (en)
Inventor
Robert K. Smither
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
US Department of Energy
Original Assignee
US Department of Energy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by US Department of Energy filed Critical US Department of Energy
Application granted granted Critical
Publication of CA1183285A publication Critical patent/CA1183285A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/068—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements specially adapted for particle beams

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
CA000401037A 1981-04-20 1982-04-15 Appareil et methode pour focaliser les rayons x et gamma et les neutrons Expired CA1183285A (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US25597481A 1981-04-20 1981-04-20
US255,974 1981-04-20

Publications (1)

Publication Number Publication Date
CA1183285A true CA1183285A (fr) 1985-02-26

Family

ID=22970630

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000401037A Expired CA1183285A (fr) 1981-04-20 1982-04-15 Appareil et methode pour focaliser les rayons x et gamma et les neutrons

Country Status (6)

Country Link
JP (1) JPS57182152A (fr)
CA (1) CA1183285A (fr)
DE (1) DE3214611A1 (fr)
FR (1) FR2504308B1 (fr)
IT (1) IT1150848B (fr)
NL (1) NL8201621A (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1995005725A1 (fr) * 1993-08-16 1995-02-23 Commonwealth Scientific And Industrial Research Organisation Optique amelioree pour rayons x destinee notamment a l'imagerie a contraste de phase
US5619382A (en) * 1989-02-23 1997-04-08 Olympus Optical Co., Ltd. Reflection type imaging optical system

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4525853A (en) * 1983-10-17 1985-06-25 Energy Conversion Devices, Inc. Point source X-ray focusing device
JPS60111125A (ja) * 1983-11-21 1985-06-17 Hitachi Ltd モノクロメ−タ
US4699509A (en) * 1984-04-21 1987-10-13 Nippon Soken, Inc. Device for measuring contamination of lubricant
JPH0515120Y2 (fr) * 1985-05-29 1993-04-21
DE3820549A1 (de) * 1988-06-16 1989-12-21 Fraunhofer Ges Forschung Verfahren und vorrichtung zur untersuchung von membranoberflaechen
JPH02179500A (ja) * 1988-12-29 1990-07-12 Shimadzu Corp 軟ｘ線用フレネルゾーンプレート
JP4521573B2 (ja) * 2007-01-10 2010-08-11 大学共同利用機関法人 高エネルギー加速器研究機構 中性子線の反射率曲線測定方法及び測定装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3777156A (en) * 1972-02-14 1973-12-04 Hewlett Packard Co Bent diffraction crystal with geometrical aberration compensation
US4012843A (en) * 1973-04-25 1977-03-22 Hitachi, Ltd. Concave diffraction grating and a manufacturing method thereof
US3980883A (en) * 1973-05-15 1976-09-14 National Research Development Corporation X-ray diffraction gratings
JPS5256856Y2 (fr) * 1974-05-15 1977-12-22
US3991309A (en) * 1975-07-09 1976-11-09 University Of Rochester Methods and apparatus for the control and analysis of X-rays
US4132654A (en) * 1976-07-02 1979-01-02 The Machlett Laboratories, Inc. X-ray focal spot test system
US4192994A (en) * 1978-09-18 1980-03-11 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Diffractoid grating configuration for X-ray and ultraviolet focusing

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5619382A (en) * 1989-02-23 1997-04-08 Olympus Optical Co., Ltd. Reflection type imaging optical system
WO1995005725A1 (fr) * 1993-08-16 1995-02-23 Commonwealth Scientific And Industrial Research Organisation Optique amelioree pour rayons x destinee notamment a l'imagerie a contraste de phase

Also Published As

Publication number Publication date
FR2504308B1 (fr) 1988-09-02
IT8220815A0 (it) 1982-04-19
IT1150848B (it) 1986-12-17
JPH0421840B2 (fr) 1992-04-14
DE3214611A1 (de) 1982-11-04
FR2504308A1 (fr) 1982-10-22
NL8201621A (nl) 1982-11-16
JPS57182152A (en) 1982-11-09

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Legal Events

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