NL8201621A - Instrument en werkwijze voor het focusseren van roentgenstralen, gammastralen en neutronen. - Google Patents

Instrument en werkwijze voor het focusseren van roentgenstralen, gammastralen en neutronen. Download PDF

Info

Publication number
NL8201621A
NL8201621A NL8201621A NL8201621A NL8201621A NL 8201621 A NL8201621 A NL 8201621A NL 8201621 A NL8201621 A NL 8201621A NL 8201621 A NL8201621 A NL 8201621A NL 8201621 A NL8201621 A NL 8201621A
Authority
NL
Netherlands
Prior art keywords
diffraction
plane
crystal
instrument
along
Prior art date
Application number
NL8201621A
Other languages
English (en)
Dutch (nl)
Original Assignee
Us Energy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Us Energy filed Critical Us Energy
Publication of NL8201621A publication Critical patent/NL8201621A/nl

Links

Classifications

    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/068Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements specially adapted for particle beams

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
NL8201621A 1981-04-20 1982-04-19 Instrument en werkwijze voor het focusseren van roentgenstralen, gammastralen en neutronen. NL8201621A (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US25597481A 1981-04-20 1981-04-20
US25597481 1981-04-20

Publications (1)

Publication Number Publication Date
NL8201621A true NL8201621A (nl) 1982-11-16

Family

ID=22970630

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8201621A NL8201621A (nl) 1981-04-20 1982-04-19 Instrument en werkwijze voor het focusseren van roentgenstralen, gammastralen en neutronen.

Country Status (6)

Country Link
JP (1) JPS57182152A (fr)
CA (1) CA1183285A (fr)
DE (1) DE3214611A1 (fr)
FR (1) FR2504308B1 (fr)
IT (1) IT1150848B (fr)
NL (1) NL8201621A (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4525853A (en) * 1983-10-17 1985-06-25 Energy Conversion Devices, Inc. Point source X-ray focusing device
JPS60111125A (ja) * 1983-11-21 1985-06-17 Hitachi Ltd モノクロメ−タ
US4699509A (en) * 1984-04-21 1987-10-13 Nippon Soken, Inc. Device for measuring contamination of lubricant
JPH0515120Y2 (fr) * 1985-05-29 1993-04-21
DE3820549A1 (de) * 1988-06-16 1989-12-21 Fraunhofer Ges Forschung Verfahren und vorrichtung zur untersuchung von membranoberflaechen
JPH02179500A (ja) * 1988-12-29 1990-07-12 Shimadzu Corp 軟x線用フレネルゾーンプレート
JPH0782117B2 (ja) * 1989-02-23 1995-09-06 オリンパス光学工業株式会社 反射型結像光学系
WO1995005725A1 (fr) * 1993-08-16 1995-02-23 Commonwealth Scientific And Industrial Research Organisation Optique amelioree pour rayons x destinee notamment a l'imagerie a contraste de phase
JP4521573B2 (ja) * 2007-01-10 2010-08-11 大学共同利用機関法人 高エネルギー加速器研究機構 中性子線の反射率曲線測定方法及び測定装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3777156A (en) * 1972-02-14 1973-12-04 Hewlett Packard Co Bent diffraction crystal with geometrical aberration compensation
US4012843A (en) * 1973-04-25 1977-03-22 Hitachi, Ltd. Concave diffraction grating and a manufacturing method thereof
US3980883A (en) * 1973-05-15 1976-09-14 National Research Development Corporation X-ray diffraction gratings
JPS5256856Y2 (fr) * 1974-05-15 1977-12-22
US3991309A (en) * 1975-07-09 1976-11-09 University Of Rochester Methods and apparatus for the control and analysis of X-rays
US4132654A (en) * 1976-07-02 1979-01-02 The Machlett Laboratories, Inc. X-ray focal spot test system
US4192994A (en) * 1978-09-18 1980-03-11 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Diffractoid grating configuration for X-ray and ultraviolet focusing

Also Published As

Publication number Publication date
FR2504308B1 (fr) 1988-09-02
IT8220815A0 (it) 1982-04-19
IT1150848B (it) 1986-12-17
CA1183285A (fr) 1985-02-26
JPH0421840B2 (fr) 1992-04-14
DE3214611A1 (de) 1982-11-04
FR2504308A1 (fr) 1982-10-22
JPS57182152A (en) 1982-11-09

Similar Documents

Publication Publication Date Title
US4429411A (en) Instrument and method for focusing X-rays, gamma rays and neutrons
EP0322408B1 (fr) Instruments de conditionnement de faisceaux a rayons x ou a neutrons
CN110530907B (zh) X射线吸收测量系统
CN1332399C (zh) 用于x射线应用的光学装置
Smither New method for focusing x rays and gamma rays
US4776696A (en) Optical system for high resolution spectrometer/monochromator
US5016265A (en) Variable magnification variable dispersion glancing incidence imaging x-ray spectroscopic telescope
JP2013210377A (ja) ビーム調整システム
CN121013975A (zh) 具有至少两个堆叠的平面布拉格衍射器的x射线探测器系统
US3772522A (en) Crystal monochromator and method of fabricating a diffraction crystal employed therein
NL8201621A (nl) Instrument en werkwijze voor het focusseren van roentgenstralen, gammastralen en neutronen.
US5164975A (en) Multiple wavelength X-ray monochromators
Vagovič et al. High-resolution high-efficiency X-ray imaging system based on the in-line Bragg magnifier and the Medipix detector
US4561721A (en) Attenuator for optical radiation
Hrdý X-ray inclined lens
Suortti et al. Focusing monochromators for high energy synchrotron radiation
Callcott et al. A simple variable line space grating monochromator for synchrotron light source beamlines
Underwood et al. Bent glass optics
Smither et al. Review of crystal diffraction and its application to focusing energetic gamma rays
Kushnir et al. X‐Ray Backscattering on Perfect Crystals (2θ≈ π)
WO1985002254A1 (fr) Monochromateur
Tondello et al. High‐resolution Czerny–Turner monochromator for application to undulators
Smither Instrument and method for focusing x-rays, gamma rays, and neutrons
Virgilli et al. Laue and Fresnel lenses
Idir et al. 2D focusing with an off-axis elliptical Bragg-Fresnel multilayer lens and application to X-ray imaging