CZ187498A3 - Přístroj pro elektrické testování tištěných obvodů s nastavitelnou polohou jehel sond - Google Patents

Přístroj pro elektrické testování tištěných obvodů s nastavitelnou polohou jehel sond

Info

Publication number
CZ187498A3
CZ187498A3 CZ981874A CZ187498A CZ187498A3 CZ 187498 A3 CZ187498 A3 CZ 187498A3 CZ 981874 A CZ981874 A CZ 981874A CZ 187498 A CZ187498 A CZ 187498A CZ 187498 A3 CZ187498 A3 CZ 187498A3
Authority
CZ
Czechia
Prior art keywords
pct
printed circuits
electrical testing
adjustable position
probe needles
Prior art date
Application number
CZ981874A
Other languages
English (en)
Other versions
CZ298035B6 (cs
Inventor
Jozef Vodopivec
Cesare Fumo
Original Assignee
New System S.R.L.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by New System S.R.L. filed Critical New System S.R.L.
Publication of CZ187498A3 publication Critical patent/CZ187498A3/cs
Publication of CZ298035B6 publication Critical patent/CZ298035B6/cs

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Supply And Installment Of Electrical Components (AREA)
CZ0187498A 1995-12-22 1996-08-09 Prístroj pro elektrické testování tištených obvodu na kartách CZ298035B6 (cs)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT95UD000251A IT1282829B1 (it) 1995-12-22 1995-12-22 Macchina di test elettrico per circuiti stampati con posizione registrabile degli aghi di sonda

Publications (2)

Publication Number Publication Date
CZ187498A3 true CZ187498A3 (cs) 1998-11-11
CZ298035B6 CZ298035B6 (cs) 2007-05-30

Family

ID=11421986

Family Applications (1)

Application Number Title Priority Date Filing Date
CZ0187498A CZ298035B6 (cs) 1995-12-22 1996-08-09 Prístroj pro elektrické testování tištených obvodu na kartách

Country Status (27)

Country Link
US (1) US6124722A (cs)
EP (1) EP0876619B1 (cs)
JP (1) JP2000502791A (cs)
KR (1) KR100526744B1 (cs)
CN (1) CN1175270C (cs)
AT (1) ATE202850T1 (cs)
AU (1) AU718507B2 (cs)
BR (1) BR9612251A (cs)
CA (1) CA2241326C (cs)
CZ (1) CZ298035B6 (cs)
DE (1) DE69613717T2 (cs)
DK (1) DK0876619T3 (cs)
ES (1) ES2160830T3 (cs)
GR (1) GR3036790T3 (cs)
HU (1) HUP9901931A3 (cs)
IT (1) IT1282829B1 (cs)
MX (1) MX9805100A (cs)
NO (1) NO315877B1 (cs)
NZ (1) NZ315085A (cs)
PL (1) PL327496A1 (cs)
PT (1) PT876619E (cs)
RO (1) RO119659B1 (cs)
RU (1) RU2212775C2 (cs)
SI (1) SI9620133B (cs)
TR (1) TR199801178T2 (cs)
UA (1) UA28121C2 (cs)
WO (1) WO1997023784A1 (cs)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1282827B1 (it) 1995-09-22 1998-03-31 New System Srl Macchina per il controllo contrapposto dei circuiti stampati
WO2002008773A2 (en) * 2000-07-19 2002-01-31 Orbotech Ltd. Apparatus and method for electrical testing of electrical circuits
RU2256306C1 (ru) * 2004-02-10 2005-07-10 ОАО Завод "Красное Знамя" Двухстороннее контактное устройство для контроля многослойных печатных плат
CN100357752C (zh) * 2004-03-26 2007-12-26 广辉电子股份有限公司 线路缺陷检测维修设备及方法
WO2005093441A1 (fr) * 2004-03-26 2005-10-06 Quanta Display Inc. Dispositif et procede de reparation et de mise a l'essai d'un defaut de ligne
CN100388001C (zh) * 2004-05-24 2008-05-14 名威科技实业有限公司 具有多个侦测单元的检测芯片
DE102009004555A1 (de) 2009-01-14 2010-09-30 Atg Luther & Maelzer Gmbh Verfahren zum Prüfen von Leiterplatten
RU2426283C1 (ru) * 2009-12-24 2011-08-10 Открытое акционерное общество "Научно-производственный комплекс "ЭЛАРА" имени Г.А. Ильенко (ОАО "ЭЛАРА") Устройство контактное
CN108761233B (zh) * 2018-05-23 2024-07-26 沈小晴 针对ied设备柔性化测试的模块可切换针盘设备及测试方法
CN110824331A (zh) * 2018-08-10 2020-02-21 苏州天目光学科技有限公司 一种背光板fpc自动点灯机构
PL3891516T3 (pl) * 2018-09-11 2024-11-18 Magicmotorsport Srl Narzędzie i zestaw do wykonywania testów obwodów elektrycznych i/lub elektronicznych
KR102501995B1 (ko) * 2019-12-18 2023-02-20 주식회사 아도반테스토 하나 이상의 피시험 장치를 테스트하기 위한 자동식 테스트 장비 및 자동식 테스트 장비의 작동 방법
DE112020000048T5 (de) * 2019-12-18 2022-06-02 Advantest Corporation Automatisierte prüfeinrichtung zum prüfen eines oder mehrerer prüfobjekte undverfahren zum betreiben einer automatisierten prüfeinrichtung
TWI797552B (zh) * 2020-02-06 2023-04-01 日商愛德萬測試股份有限公司 用於測試一或多個受測裝置之自動測試設備及用於操作自動測試設備的方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU563614A1 (ru) * 1974-04-17 1977-06-30 Московский Ордена Ленина Энергетический Институт Вихретоковый преобразователь
DE2628428C3 (de) * 1976-06-24 1979-02-15 Siemens Ag, 1000 Berlin Und 8000 Muenchen Adapter zum Verbinden von Anschluß- und/oder Prüfpunkten einer Baugruppe mit einer Mefischaltung
EP0256368B1 (de) * 1986-08-07 1992-09-30 Siemens Aktiengesellschaft Prüfeinrichtung für beidseitige, zweistufige Kontaktierung bestückter Leiterplatten
US4841241A (en) * 1986-08-07 1989-06-20 Siemens Aktiengesellschaft Testing device for both-sided contacting of component-equipped printed circuit boards
SU1531234A1 (ru) * 1987-07-10 1989-12-23 Научно-производственное объединение "Ротор" Устройство дл контрол печатных блоков
US4975637A (en) * 1989-12-29 1990-12-04 International Business Machines Corporation Method and apparatus for integrated circuit device testing
RU2019923C1 (ru) * 1991-05-15 1994-09-15 Научно-исследовательский центр электронной вычислительной техники Устройство для контроля печатных плат
US5436567A (en) * 1993-02-08 1995-07-25 Automated Test Engineering, Inc. Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts

Also Published As

Publication number Publication date
CZ298035B6 (cs) 2007-05-30
HUP9901931A3 (en) 1999-11-29
UA28121C2 (uk) 2000-10-16
NO315877B1 (no) 2003-11-03
ATE202850T1 (de) 2001-07-15
US6124722A (en) 2000-09-26
KR19990076663A (ko) 1999-10-15
CA2241326C (en) 2001-11-27
DK0876619T3 (da) 2001-10-22
IT1282829B1 (it) 1998-03-31
EP0876619B1 (en) 2001-07-04
NO982707D0 (no) 1998-06-12
SI9620133A (sl) 1998-12-31
SI9620133B (sl) 2005-10-31
MX9805100A (es) 1998-10-31
DE69613717T2 (de) 2002-05-16
PL327496A1 (en) 1998-12-21
HUP9901931A2 (hu) 1999-10-28
DE69613717D1 (de) 2001-08-09
JP2000502791A (ja) 2000-03-07
RU2212775C2 (ru) 2003-09-20
AU6668496A (en) 1997-07-17
RO119659B1 (ro) 2005-01-28
ITUD950251A0 (cs) 1995-12-22
GR3036790T3 (en) 2002-01-31
ITUD950251A1 (it) 1997-06-22
CA2241326A1 (en) 1997-07-03
BR9612251A (pt) 1999-07-13
AU718507B2 (en) 2000-04-13
KR100526744B1 (ko) 2005-12-21
WO1997023784A1 (en) 1997-07-03
ES2160830T3 (es) 2001-11-16
TR199801178T2 (xx) 1998-12-21
CN1175270C (zh) 2004-11-10
NO982707L (no) 1998-07-13
EP0876619A1 (en) 1998-11-11
CN1205774A (zh) 1999-01-20
NZ315085A (en) 2007-12-21
PT876619E (pt) 2001-12-28

Similar Documents

Publication Publication Date Title
CZ187498A3 (cs) Přístroj pro elektrické testování tištěných obvodů s nastavitelnou polohou jehel sond
DE69430656D1 (de) Elektrische Prüfmaschine mit Presse für Leiterplatten
DK0920714T3 (da) Elektrisk eller elektronisk apparat
MY115162A (en) Printed circuit board test fixture and method
GB2367191A (en) A method and apparatus for interconnecting multiple devices on a circuit board
EP0455369A3 (en) Spring contact twister probe for testing electrical printed circuit boards
MY104394A (en) Function inspecting system
CA2221404A1 (en) A method and device for correcting misalignment between test needles and test points during electrical testing of printed circuit boards, particularly during multiple tests
DE3479341D1 (en) Adapter for a printed-circuit board testing device
EP1186898A3 (de) Verfahren und Vorrichtung zum Prüfen von Leiterplatten
FR2660072B1 (fr) Appareil de test de circuit imprime.
CZ74598A3 (cs) Zařízení pro protilehlé testování plošných spojů
DE59709821D1 (de) Vorrichtung zum Prüfen von elektrischen Leiterplatten
EP0787992A3 (en) Housing for an electricity meter
DE69204587D1 (de) Elektrischer Kontaktstift für gedruckte Schaltungsplatten.
BR9307345A (pt) Placa de circuito impresso de parede traseira para uma armação de grupo de montagem
SE9900429L (sv) Anordningar avsedda för en elektrisk apparat
SE8704467D0 (sv) Apparat for provning av kretskort
ES292286U (es) Placa para montaje de circuitos electronicos en juegos didacticos
IT1248009B (it) Barba di collegamento per montaggio a secco su circuiti stampati

Legal Events

Date Code Title Description
PD00 Pending as of 2000-06-30 in czech republic
MM4A Patent lapsed due to non-payment of fee

Effective date: 20080809