DK0858096T3 - Ionisator til brug i et cykloidalt massespekrometer - Google Patents

Ionisator til brug i et cykloidalt massespekrometer

Info

Publication number
DK0858096T3
DK0858096T3 DK98106485T DK98106485T DK0858096T3 DK 0858096 T3 DK0858096 T3 DK 0858096T3 DK 98106485 T DK98106485 T DK 98106485T DK 98106485 T DK98106485 T DK 98106485T DK 0858096 T3 DK0858096 T3 DK 0858096T3
Authority
DK
Denmark
Prior art keywords
volume
ioniser
ion
mass spectrometer
cycloidal mass
Prior art date
Application number
DK98106485T
Other languages
Danish (da)
English (en)
Inventor
Lutz Kurzweg
Original Assignee
Monitor Instr Co Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Monitor Instr Co Llc filed Critical Monitor Instr Co Llc
Application granted granted Critical
Publication of DK0858096T3 publication Critical patent/DK0858096T3/da

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing
    • H01J49/328—Static spectrometers using double focusing with a cycloidal trajectory by using crossed electric and magnetic fields, e.g. trochoidal type

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DK98106485T 1993-02-19 1994-02-17 Ionisator til brug i et cykloidalt massespekrometer DK0858096T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/020,089 US5304799A (en) 1992-07-17 1993-02-19 Cycloidal mass spectrometer and ionizer for use therein

Publications (1)

Publication Number Publication Date
DK0858096T3 true DK0858096T3 (da) 2002-11-25

Family

ID=21796690

Family Applications (1)

Application Number Title Priority Date Filing Date
DK98106485T DK0858096T3 (da) 1993-02-19 1994-02-17 Ionisator til brug i et cykloidalt massespekrometer

Country Status (13)

Country Link
US (1) US5304799A (ja)
EP (2) EP0746872B1 (ja)
JP (2) JP2968338B2 (ja)
CN (1) CN1060287C (ja)
AT (2) ATE221697T1 (ja)
AU (1) AU692761B2 (ja)
CA (1) CA2156072C (ja)
DE (2) DE69418063T2 (ja)
DK (1) DK0858096T3 (ja)
ES (1) ES2181084T3 (ja)
LV (1) LV13030B (ja)
PT (1) PT858096E (ja)
WO (1) WO1994019820A1 (ja)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5536939A (en) * 1993-09-22 1996-07-16 Northrop Grumman Corporation Miniaturized mass filter
US5386115A (en) * 1993-09-22 1995-01-31 Westinghouse Electric Corporation Solid state micro-machined mass spectrograph universal gas detection sensor
AU687960B2 (en) * 1994-11-22 1998-03-05 Northrop Grumman Corporation Solid state micro-machined mass spectrograph universal gas detection sensor
US5572025A (en) * 1995-05-25 1996-11-05 The Johns Hopkins University, School Of Medicine Method and apparatus for scanning an ion trap mass spectrometer in the resonance ejection mode
US6037587A (en) * 1997-10-17 2000-03-14 Hewlett-Packard Company Chemical ionization source for mass spectrometry
FR2790596B3 (fr) * 1999-03-03 2001-05-18 Robert Evrard Source d'ions selective de tres grande intensite
US6220821B1 (en) * 1999-05-20 2001-04-24 Kernco, Incorporated Ion pump having protective mask components overlying the cathode elements
US6617576B1 (en) 2001-03-02 2003-09-09 Monitor Instruments Company, Llc Cycloidal mass spectrometer with time of flight characteristics and associated method
FR2831326B1 (fr) * 2001-10-19 2004-10-29 Robert Evrard Source selective de grande intensite de faisceaux ioniques focalises et collimates couplage avec des spectrometres de masse a haute resolution
US6624410B1 (en) 2002-02-25 2003-09-23 Monitor Instruments Company, Llc Cycloidal mass spectrometer
GB2399450A (en) * 2003-03-10 2004-09-15 Thermo Finnigan Llc Mass spectrometer
US6815674B1 (en) * 2003-06-03 2004-11-09 Monitor Instruments Company, Llc Mass spectrometer and related ionizer and methods
WO2006002027A2 (en) * 2004-06-15 2006-01-05 Griffin Analytical Technologies, Inc. Portable mass spectrometer configured to perform multidimensional mass analysis
CN101317246A (zh) 2005-04-25 2008-12-03 格里芬分析技术有限责任公司 分析仪器、装置和方法
US7992424B1 (en) 2006-09-14 2011-08-09 Griffin Analytical Technologies, L.L.C. Analytical instrumentation and sample analysis methods
CN102479664A (zh) * 2010-11-30 2012-05-30 中国科学院大连化学物理研究所 一种平板式离子迁移谱
EP2800960B1 (en) 2012-02-08 2018-10-31 MKS Instruments, Inc. Ionization gauge for high pressure operation
CN109256323B (zh) * 2018-10-19 2020-04-10 中国科学院化学研究所 用于飞行时间质谱仪的金属镀层氧化铝陶瓷电极片
CN109459784B (zh) * 2018-12-21 2023-09-12 中国工程物理研究院激光聚变研究中心 一种大动态汤姆逊离子谱仪
CN117012608A (zh) * 2022-04-29 2023-11-07 株式会社岛津制作所 摆线质谱仪及其分辨率调节方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2882410A (en) * 1946-06-14 1959-04-14 William M Brobeck Ion source
US3073951A (en) * 1960-07-28 1963-01-15 Combustion Eng Vacuum lock
US3590243A (en) * 1969-06-30 1971-06-29 Avco Corp Sample insertion vacuum lock and probe assembly for mass spectrometers
US3955084A (en) * 1974-09-09 1976-05-04 California Institute Of Technology Electro-optical detector for use in a wide mass range mass spectrometer
US4175234A (en) * 1977-08-05 1979-11-20 University Of Virginia Apparatus for producing ions of thermally labile or nonvolatile solids
JPS583592B2 (ja) * 1978-09-08 1983-01-21 日本分光工業株式会社 質量分析計への試料導入方法及び装置
US4206383A (en) * 1978-09-11 1980-06-03 California Institute Of Technology Miniature cyclotron resonance ion source using small permanent magnet
JPS5917500B2 (ja) * 1981-03-18 1984-04-21 株式会社東芝 中性粒子検出装置
US4882485A (en) * 1987-08-10 1989-11-21 Tracor, Inc. Ion detector and associated removable ionizer inlet assembly
US4926056A (en) * 1988-06-10 1990-05-15 Sri International Microelectronic field ionizer and method of fabricating the same
US4952802A (en) * 1988-07-29 1990-08-28 Leybold Inficon, Inc. Ion detection apparatus
US5155357A (en) * 1990-07-23 1992-10-13 Massachusetts Institute Of Technology Portable mass spectrometer
JP4732786B2 (ja) 2005-04-22 2011-07-27 京セラ株式会社 発光装置および画像形成装置

Also Published As

Publication number Publication date
EP0746872A1 (en) 1996-12-11
EP0858096A1 (en) 1998-08-12
ATE221697T1 (de) 2002-08-15
ES2181084T3 (es) 2003-02-16
PT858096E (pt) 2002-12-31
DE69431129T2 (de) 2002-11-21
DE69418063T2 (de) 1999-08-19
ATE179278T1 (de) 1999-05-15
CN1119477A (zh) 1996-03-27
CN1060287C (zh) 2001-01-03
CA2156072C (en) 2004-04-06
AU6176194A (en) 1994-09-14
US5304799A (en) 1994-04-19
EP0746872A4 (ja) 1996-12-18
EP0746872B1 (en) 1999-04-21
JP3500323B2 (ja) 2004-02-23
DE69418063D1 (de) 1999-05-27
WO1994019820A1 (en) 1994-09-01
AU692761B2 (en) 1998-06-18
CA2156072A1 (en) 1994-09-01
JPH11345591A (ja) 1999-12-14
JP2968338B2 (ja) 1999-10-25
JPH08510081A (ja) 1996-10-22
LV13030B (en) 2003-11-20
DE69431129D1 (de) 2002-09-05
EP0858096B1 (en) 2002-07-31

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