DK266490A - Massespektroskopi af tilbageslaaede ioner for isotop- og sporelementanalyse - Google Patents
Massespektroskopi af tilbageslaaede ioner for isotop- og sporelementanalyse Download PDFInfo
- Publication number
- DK266490A DK266490A DK266490A DK266490A DK266490A DK 266490 A DK266490 A DK 266490A DK 266490 A DK266490 A DK 266490A DK 266490 A DK266490 A DK 266490A DK 266490 A DK266490 A DK 266490A
- Authority
- DK
- Denmark
- Prior art keywords
- isotope
- trace element
- mass spectroscopy
- element analysis
- charged ions
- Prior art date
Links
- 238000004458 analytical method Methods 0.000 title 1
- 150000002500 ions Chemical class 0.000 title 1
- 238000004949 mass spectrometry Methods 0.000 title 1
- 235000013619 trace mineral Nutrition 0.000 title 1
- 239000011573 trace mineral Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US43348289A | 1989-11-08 | 1989-11-08 | |
| US07/559,731 US5087815A (en) | 1989-11-08 | 1990-07-30 | High resolution mass spectrometry of recoiled ions for isotopic and trace elemental analysis |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DK266490D0 DK266490D0 (da) | 1990-11-06 |
| DK266490A true DK266490A (da) | 1991-05-09 |
Family
ID=27029863
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DK266490A DK266490A (da) | 1989-11-08 | 1990-11-06 | Massespektroskopi af tilbageslaaede ioner for isotop- og sporelementanalyse |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5087815A (de) |
| EP (1) | EP0427532A3 (de) |
| JP (1) | JPH0465060A (de) |
| DK (1) | DK266490A (de) |
Families Citing this family (73)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5347126A (en) * | 1992-07-02 | 1994-09-13 | Arch Development Corporation | Time-of-flight direct recoil ion scattering spectrometer |
| US6008491A (en) * | 1997-10-15 | 1999-12-28 | The United States Of America As Represented By The United States Department Of Energy | Time-of-flight SIMS/MSRI reflectron mass analyzer and method |
| NL1008461C2 (nl) * | 1998-03-03 | 1999-09-06 | Calipso B V | Inrichting voor het bepalen van de energie van door een doeloppervlak verstrooide ionen. |
| US5920068A (en) | 1998-03-05 | 1999-07-06 | Micron Technology, Inc. | Analysis of semiconductor surfaces by secondary ion mass spectrometry |
| AU764635B2 (en) * | 1999-02-10 | 2003-08-28 | Schunk Kohlenstofftechnik Gmbh | Method of regulating a high temperature gaseous phase process and use of said method |
| US6414307B1 (en) * | 1999-07-09 | 2002-07-02 | Fei Company | Method and apparatus for enhancing yield of secondary ions |
| SE0002066D0 (sv) * | 2000-05-31 | 2000-05-31 | Amersham Pharm Biotech Ab | Method and device for preforming analyses in parallel |
| AU2002353876A1 (en) * | 2001-10-26 | 2003-05-12 | Physical Electronics, Inc. | System and method for depth profiling and characterization of thin films |
| KR100433684B1 (ko) * | 2001-11-21 | 2004-06-02 | 한국수력원자력 주식회사 | 레이저 동위원소 분리과정에서 생성물의 질량성분신호를이용한 파장가변 레이저 파장의 실시간 궤환제어 방법 |
| JP2004024203A (ja) * | 2002-06-28 | 2004-01-29 | Canon Inc | 飛行時間型二次イオン質量分析法によるrnaの分析方法 |
| US20040137491A1 (en) * | 2002-06-28 | 2004-07-15 | Tadashi Okamoto | Method of analyzing probe carrier using time-of-flight secondary ion mass spectrometry |
| US6867414B2 (en) * | 2002-09-24 | 2005-03-15 | Ciphergen Biosystems, Inc. | Electric sector time-of-flight mass spectrometer with adjustable ion optical elements |
| US20040219685A1 (en) * | 2003-01-30 | 2004-11-04 | Applera Corporation | Methods and mixtures pertaining to analyte determination using electrophilic labeling reagents |
| US6903334B1 (en) * | 2003-03-19 | 2005-06-07 | Thermo Finnigan Llc | High throughput ion source for MALDI mass spectrometry |
| JP4148864B2 (ja) * | 2003-09-26 | 2008-09-10 | 株式会社神戸製鋼所 | 試料分析装置 |
| US7786452B2 (en) | 2003-10-16 | 2010-08-31 | Alis Corporation | Ion sources, systems and methods |
| US9159527B2 (en) | 2003-10-16 | 2015-10-13 | Carl Zeiss Microscopy, Llc | Systems and methods for a gas field ionization source |
| US7557361B2 (en) | 2003-10-16 | 2009-07-07 | Alis Corporation | Ion sources, systems and methods |
| US8110814B2 (en) | 2003-10-16 | 2012-02-07 | Alis Corporation | Ion sources, systems and methods |
| US7511280B2 (en) | 2003-10-16 | 2009-03-31 | Alis Corporation | Ion sources, systems and methods |
| US7521693B2 (en) | 2003-10-16 | 2009-04-21 | Alis Corporation | Ion sources, systems and methods |
| US7485873B2 (en) | 2003-10-16 | 2009-02-03 | Alis Corporation | Ion sources, systems and methods |
| US7504639B2 (en) | 2003-10-16 | 2009-03-17 | Alis Corporation | Ion sources, systems and methods |
| US7601953B2 (en) | 2006-03-20 | 2009-10-13 | Alis Corporation | Systems and methods for a gas field ion microscope |
| US7511279B2 (en) | 2003-10-16 | 2009-03-31 | Alis Corporation | Ion sources, systems and methods |
| US7488952B2 (en) | 2003-10-16 | 2009-02-10 | Alis Corporation | Ion sources, systems and methods |
| US7495232B2 (en) | 2003-10-16 | 2009-02-24 | Alis Corporation | Ion sources, systems and methods |
| US7554096B2 (en) | 2003-10-16 | 2009-06-30 | Alis Corporation | Ion sources, systems and methods |
| US7786451B2 (en) | 2003-10-16 | 2010-08-31 | Alis Corporation | Ion sources, systems and methods |
| US7518122B2 (en) | 2003-10-16 | 2009-04-14 | Alis Corporation | Ion sources, systems and methods |
| US7557358B2 (en) | 2003-10-16 | 2009-07-07 | Alis Corporation | Ion sources, systems and methods |
| US7557360B2 (en) | 2003-10-16 | 2009-07-07 | Alis Corporation | Ion sources, systems and methods |
| US7554097B2 (en) | 2003-10-16 | 2009-06-30 | Alis Corporation | Ion sources, systems and methods |
| US7557359B2 (en) | 2003-10-16 | 2009-07-07 | Alis Corporation | Ion sources, systems and methods |
| US20050148087A1 (en) * | 2004-01-05 | 2005-07-07 | Applera Corporation | Isobarically labeled analytes and fragment ions derived therefrom |
| US7504621B2 (en) * | 2004-03-04 | 2009-03-17 | Mds Inc. | Method and system for mass analysis of samples |
| CA2555985A1 (en) * | 2004-03-04 | 2005-09-15 | Mds Inc., Doing Business Through Its Mds Sciex Division | Method and system for mass analysis of samples |
| GB0409676D0 (en) * | 2004-04-30 | 2004-06-02 | Micromass Ltd | Mass spectrometer |
| JP5009784B2 (ja) * | 2004-04-30 | 2012-08-22 | マイクロマス ユーケー リミテッド | 質量分析計 |
| JP4901094B2 (ja) * | 2004-11-30 | 2012-03-21 | 株式会社Sen | ビーム照射装置 |
| US7351958B2 (en) | 2005-01-24 | 2008-04-01 | Applera Corporation | Ion optics systems |
| US7439520B2 (en) * | 2005-01-24 | 2008-10-21 | Applied Biosystems Inc. | Ion optics systems |
| JP4523488B2 (ja) * | 2005-05-27 | 2010-08-11 | 株式会社日立ハイテクノロジーズ | 質量分析システムおよび質量分析方法 |
| WO2007067296A2 (en) * | 2005-12-02 | 2007-06-14 | Alis Corporation | Ion sources, systems and methods |
| US7491931B2 (en) | 2006-05-05 | 2009-02-17 | Applera Corporation | Power supply regulation using a feedback circuit comprising an AC and DC component |
| GB0611146D0 (en) * | 2006-06-07 | 2006-07-19 | Nu Instr Ltd | Mass spectrometers |
| US20070284541A1 (en) * | 2006-06-08 | 2007-12-13 | Vane Ronald A | Oxidative cleaning method and apparatus for electron microscopes using UV excitation in a oxygen radical source |
| US8507879B2 (en) * | 2006-06-08 | 2013-08-13 | Xei Scientific, Inc. | Oxidative cleaning method and apparatus for electron microscopes using UV excitation in an oxygen radical source |
| US7804068B2 (en) | 2006-11-15 | 2010-09-28 | Alis Corporation | Determining dopant information |
| EP2126957A4 (de) * | 2007-01-19 | 2012-05-30 | Mds Analytical Tech Bu Mds Inc | Vorrichtung und verfahren zum kühlen von ionen |
| EP1959476A1 (de) * | 2007-02-19 | 2008-08-20 | Technische Universität Hamburg-Harburg | Massenspektrometer |
| US7820963B2 (en) * | 2007-08-06 | 2010-10-26 | Metabolic Alayses, Inc. | Method for generation and use of isotopic patterns in mass spectral data of simple organisms |
| EP2245648A4 (de) * | 2008-01-25 | 2017-03-29 | Ionwerks, Inc. | Laufzeitmassenspektrometrie von oberflächen |
| US8399834B2 (en) * | 2008-06-20 | 2013-03-19 | Carl Zeiss Nts, Llc | Isotope ion microscope methods and systems |
| US8847155B2 (en) | 2009-08-27 | 2014-09-30 | Virgin Instruments Corporation | Tandem time-of-flight mass spectrometry with simultaneous space and velocity focusing |
| US20110049350A1 (en) * | 2009-08-27 | 2011-03-03 | Virgin Instruments Corporation | Tandem TOF Mass Spectrometer With Pulsed Accelerator To Reduce Velocity Spread |
| US8461521B2 (en) | 2010-12-14 | 2013-06-11 | Virgin Instruments Corporation | Linear time-of-flight mass spectrometry with simultaneous space and velocity focusing |
| US8674292B2 (en) | 2010-12-14 | 2014-03-18 | Virgin Instruments Corporation | Reflector time-of-flight mass spectrometry with simultaneous space and velocity focusing |
| US8399828B2 (en) * | 2009-12-31 | 2013-03-19 | Virgin Instruments Corporation | Merged ion beam tandem TOF-TOF mass spectrometer |
| US9128076B2 (en) | 2010-04-30 | 2015-09-08 | Exxonmobil Upstream Research Company | Measurement of isotope ratios in complex matrices |
| JP5885474B2 (ja) * | 2011-11-17 | 2016-03-15 | キヤノン株式会社 | 質量分布分析方法及び質量分布分析装置 |
| US8772712B2 (en) * | 2012-04-24 | 2014-07-08 | Semiconductor Energy Laboratory Co., Ltd. | Analysis apparatus and analysis method |
| WO2014022426A1 (en) * | 2012-07-30 | 2014-02-06 | State Of Oregon Acting By And Through The State Boad Of Higher Education On Behalf Of Oregon State University | Apparatus and method for determining molecular structure |
| US8735810B1 (en) | 2013-03-15 | 2014-05-27 | Virgin Instruments Corporation | Time-of-flight mass spectrometer with ion source and ion detector electrically connected |
| WO2015026727A1 (en) | 2013-08-19 | 2015-02-26 | Virgin Instruments Corporation | Ion optical system for maldi-tof mass spectrometer |
| US9869797B2 (en) | 2013-08-23 | 2018-01-16 | Exxonmobil Upstream Research Company | Method for predicting occurrence of microquartz in a basin |
| US20170018397A1 (en) * | 2014-03-28 | 2017-01-19 | Hitachi High-Technologies Corporation | Sample holder for charged particle beam device, and charged particle beam device |
| JP2017511571A (ja) * | 2014-04-02 | 2017-04-20 | ザ ボード オブ トラスティーズ オブ ザ レランド スタンフォード ジュニア ユニバーシティー | 質量分析法によるサブミクロン元素画像解析の装置及び方法 |
| CA2996854C (en) * | 2015-09-11 | 2022-11-29 | Ion-Tof Technologies Gmbh | Secondary ion mass spectrometer and secondary ion mass spectrometric method |
| US10996353B1 (en) | 2017-10-10 | 2021-05-04 | The United States Of America, As Represented By The Secretary Of The Navy | N-type gallium nitride scintillation for fast-neutron detection |
| US10840077B2 (en) | 2018-06-05 | 2020-11-17 | Trace Matters Scientific Llc | Reconfigureable sequentially-packed ion (SPION) transfer device |
| EP4004967B1 (de) * | 2019-07-23 | 2025-05-21 | DH Technologies Development Pte. Ltd. | Erhöhter dynamikbereich zur dämpfung eines ionenstrahls |
| CN114460114B (zh) * | 2022-04-13 | 2022-06-21 | 季华实验室 | 样品分析方法、装置、设备及存储介质 |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3480774A (en) * | 1967-05-26 | 1969-11-25 | Minnesota Mining & Mfg | Low-energy ion scattering apparatus and method for analyzing the surface of a solid |
| US3576992A (en) * | 1968-09-13 | 1971-05-04 | Bendix Corp | Time-of-flight mass spectrometer having both linear and curved drift regions whose energy dispersions with time are mutually compensatory |
| US3898115A (en) * | 1971-12-20 | 1975-08-05 | Berne A Watkins | Modular building unit and methods of forming same |
| US3863068A (en) * | 1972-07-27 | 1975-01-28 | Max Planck Gesellschaft | Time-of-flight mass spectrometer |
| JPS5937540B2 (ja) * | 1974-09-06 | 1984-09-10 | 株式会社日立製作所 | 電界放射形走査電子顕微鏡 |
| US4036167A (en) * | 1976-01-30 | 1977-07-19 | Inficon Leybold-Heraeus Inc. | Apparatus for monitoring vacuum deposition processes |
| US4037100A (en) * | 1976-03-01 | 1977-07-19 | General Ionex Corporation | Ultra-sensitive spectrometer for making mass and elemental analyses |
| US4166784A (en) * | 1978-04-28 | 1979-09-04 | Applied Films Lab, Inc. | Feedback control for vacuum deposition apparatus |
| US4172020A (en) * | 1978-05-24 | 1979-10-23 | Gould Inc. | Method and apparatus for monitoring and controlling sputter deposition processes |
| AU534811B2 (en) * | 1979-07-03 | 1984-02-16 | Unisearch Limited | Atmospheric scanning electron microscope |
| DE3004149A1 (de) * | 1980-02-05 | 1981-08-13 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zur reproduzierbaren herstellung metallischer schichten |
| JPS6058793B2 (ja) * | 1980-03-24 | 1985-12-21 | 日電アネルバ株式会社 | プラズマ分光監視装置 |
| US4393311A (en) * | 1980-06-13 | 1983-07-12 | Bell Telephone Laboratories, Incorporated | Method and apparatus for surface characterization and process control utilizing radiation from desorbed particles |
| US4381894A (en) * | 1980-11-06 | 1983-05-03 | Inficon Leybold-Heraeus, Inc. | Deposition monitor and control system |
| US4367044A (en) * | 1980-12-31 | 1983-01-04 | International Business Machines Corp. | Situ rate and depth monitor for silicon etching |
| US4394237A (en) * | 1981-07-17 | 1983-07-19 | Bell Telephone Laboratories, Incorporated | Spectroscopic monitoring of gas-solid processes |
| JPS58100740A (ja) * | 1981-12-11 | 1983-06-15 | Hitachi Ltd | プラズマ分布モニタ |
| US4489237A (en) * | 1982-02-11 | 1984-12-18 | The Innovations Foundation Of The University Of Toronto | Method of broad band mass spectrometry and apparatus therefor |
| JPS58218121A (ja) * | 1982-06-11 | 1983-12-19 | Anelva Corp | シリコンのドライエツチングモニタリング方法 |
| US4607167A (en) * | 1982-10-19 | 1986-08-19 | Varian Associates, Inc. | Charged particle beam lithography machine incorporating localized vacuum envelope |
| US4637938A (en) * | 1983-08-19 | 1987-01-20 | Energy Conversion Devices, Inc. | Methods of using selective optical excitation in deposition processes and the detection of new compositions |
| US4478993A (en) * | 1984-01-06 | 1984-10-23 | The Goodyear Tire & Rubber Company | Rubber containing decarboxylated rosins |
| US4493745A (en) * | 1984-01-31 | 1985-01-15 | International Business Machines Corporation | Optical emission spectroscopy end point detection in plasma etching |
| EP0175807B1 (de) * | 1984-09-27 | 1988-12-07 | Leybold Aktiengesellschaft | Einrichtung zur Durchführung des SNMS-Verfahrens |
| US4864130A (en) * | 1986-06-04 | 1989-09-05 | Arch Development Corporation | Photo ion spectrometer |
| US4713140A (en) * | 1987-03-02 | 1987-12-15 | International Business Machines Corporation | Laser luminescence monitor for material thickness |
| US4818838A (en) * | 1988-01-11 | 1989-04-04 | The Perkin-Elmer Corporation | Apparatus for preselecting and maintaining a fixed gap between a workpiece and a vacuum seal apparatus in particle beam lithography systems |
| US4857136A (en) * | 1988-06-23 | 1989-08-15 | John Zajac | Reactor monitoring system and method |
-
1990
- 1990-07-30 US US07/559,731 patent/US5087815A/en not_active Expired - Lifetime
- 1990-11-06 DK DK266490A patent/DK266490A/da not_active Application Discontinuation
- 1990-11-07 EP EP19900312179 patent/EP0427532A3/en not_active Withdrawn
- 1990-11-08 JP JP2303748A patent/JPH0465060A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP0427532A3 (en) | 1992-07-01 |
| US5087815A (en) | 1992-02-11 |
| EP0427532A2 (de) | 1991-05-15 |
| JPH0465060A (ja) | 1992-03-02 |
| DK266490D0 (da) | 1990-11-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AHB | Application shelved due to non-payment |