DK3526542T3 - Terahertz-måleanordning til bestemmelse af en lagtykkelse hos et testobjekt og tilsvarende målemetode - Google Patents

Terahertz-måleanordning til bestemmelse af en lagtykkelse hos et testobjekt og tilsvarende målemetode Download PDF

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Publication number
DK3526542T3
DK3526542T3 DK17791562.6T DK17791562T DK3526542T3 DK 3526542 T3 DK3526542 T3 DK 3526542T3 DK 17791562 T DK17791562 T DK 17791562T DK 3526542 T3 DK3526542 T3 DK 3526542T3
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DK
Denmark
Prior art keywords
determining
measuring device
layer thickness
measurement method
test object
Prior art date
Application number
DK17791562.6T
Other languages
English (en)
Inventor
Roland Böhm
Ralph Klose
Original Assignee
Inoex Gmbh Innovationen Und Ausruestungen Fuer Die Extrusionstechnik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inoex Gmbh Innovationen Und Ausruestungen Fuer Die Extrusionstechnik filed Critical Inoex Gmbh Innovationen Und Ausruestungen Fuer Die Extrusionstechnik
Application granted granted Critical
Publication of DK3526542T3 publication Critical patent/DK3526542T3/da

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S13/00Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
    • G01S13/88Radar or analogous systems specially adapted for specific applications

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Toxicology (AREA)
  • Textile Engineering (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DK17791562.6T 2016-10-17 2017-10-17 Terahertz-måleanordning til bestemmelse af en lagtykkelse hos et testobjekt og tilsvarende målemetode DK3526542T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102016119728.9A DE102016119728A1 (de) 2016-10-17 2016-10-17 Terahertz-Messgerät
PCT/DE2017/100891 WO2018072789A1 (de) 2016-10-17 2017-10-17 Terahertz-messgerät

Publications (1)

Publication Number Publication Date
DK3526542T3 true DK3526542T3 (da) 2021-12-06

Family

ID=60191065

Family Applications (1)

Application Number Title Priority Date Filing Date
DK17791562.6T DK3526542T3 (da) 2016-10-17 2017-10-17 Terahertz-måleanordning til bestemmelse af en lagtykkelse hos et testobjekt og tilsvarende målemetode

Country Status (7)

Country Link
US (1) US10753727B2 (da)
EP (1) EP3526542B1 (da)
CN (1) CN109964096B (da)
DE (1) DE102016119728A1 (da)
DK (1) DK3526542T3 (da)
ES (1) ES2901624T3 (da)
WO (1) WO2018072789A1 (da)

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EP3309508B1 (en) * 2016-05-23 2019-08-28 Nippon Steel Corporation Shape measurement device and shape measurement method
DE102018122965B4 (de) * 2018-09-19 2021-10-14 INOEX GmbH Innovationen und Ausrüstungen für die Extrusionstechnik THz-Messgerät und THz-Messverfahren zur Ermittlung von Fehlstellen in Messobjekten
WO2020072297A1 (en) 2018-10-03 2020-04-09 Arizona Board Of Regents On Behalf Of Arizona State University Direct rf signal processing for heart-rate monitoring using uwb impulse radar
CN109357598A (zh) * 2018-10-22 2019-02-19 江西北斗变电科技有限公司 一种新型便携式硅钢片毛刺形状检测识别装置及方法
US11783483B2 (en) 2019-03-19 2023-10-10 Arizona Board Of Regents On Behalf Of Arizona State University Detecting abnormalities in vital signs of subjects of videos
US11771380B2 (en) 2019-03-19 2023-10-03 Arizona Board Of Regents On Behalf Of Arizona State University Vital sign monitoring system using an optical sensor
US12274527B2 (en) 2019-03-20 2025-04-15 Arizona Board Of Regents On Behalf Of Arizona State University Radar cardiography: a precise cardiac data reconstruction method
DE102019109339B4 (de) * 2019-04-09 2021-04-08 CiTEX Holding GmbH Verfahren zur Kalibrierung einer THz-Messvorrichtung, THz-Messverfahren sowie entsprechende THz-Messvorrichtung
JP7498023B2 (ja) * 2020-05-18 2024-06-11 株式会社Subaru 孔検査装置の送り出し装置
CN111665212B (zh) * 2020-06-12 2023-12-15 常州海石智能装备有限公司 一种太赫兹波检测装置
US11709139B2 (en) * 2020-07-24 2023-07-25 New Jersey Institute Of Technology Systems and methods of detecting pipe defects
DE102021109748A1 (de) * 2021-04-19 2022-10-20 Isud Solutions Gmbh Optische Analysevorrichtung zur Bestimmung einer Kenngröße eines Mediums, Gehäuse und Gesamtsystem
CN113390370B (zh) * 2021-05-17 2023-01-13 珠海格力电器股份有限公司 一种对象检测方法、装置、电子设备及存储介质
CN113654471A (zh) * 2021-08-04 2021-11-16 河北光兴半导体技术有限公司 玻璃管厚度测量方法及装置
DE102021134228A1 (de) * 2021-12-22 2023-06-22 Universität Stuttgart, Körperschaft Des Öffentlichen Rechts Vorrichtung zum Bestimmen thermischer Energie sowie ein Verfahren zum Bestimmen der thermischen Energie mit der Vorrichtung
CN116337806A (zh) * 2021-12-23 2023-06-27 中国石油天然气集团有限公司 一种非金属管道本体缺陷的太赫兹无损检测方法
DE102022100650B3 (de) 2022-01-07 2022-12-15 CiTEX Holding GmbH Verfahren zur Kalibrierung einer THz-Messvorrichtung und Extrusions- und Messsystem
CN115077340B (zh) * 2022-06-24 2025-08-01 英纳法汽车天窗系统(上海)有限公司 汽车天窗框架蘑菇搭扣检测装置及其工作方法
DE102023108276A1 (de) * 2023-03-31 2024-10-02 CiTEX Holding GmbH THz- Messverfahren und THz- Messvorrichtung zur Vermessung eines Stranges
EP4462072B8 (de) 2023-05-11 2025-08-20 Sikora Ag Messvorrichtung und verfahren zum messen eines geometrieparameters eines gegenstands

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GB2405466B (en) * 2003-08-27 2006-01-25 Teraview Ltd Method and apparatus for investigating a non-planner sample
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Also Published As

Publication number Publication date
EP3526542A1 (de) 2019-08-21
DE102016119728A1 (de) 2018-04-19
CN109964096B (zh) 2022-07-08
US10753727B2 (en) 2020-08-25
ES2901624T3 (es) 2022-03-23
EP3526542B1 (de) 2021-09-22
CN109964096A (zh) 2019-07-02
US20190301853A1 (en) 2019-10-03
WO2018072789A9 (de) 2018-06-14
WO2018072789A1 (de) 2018-04-26

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