EP0902101A1 - Metallisches Material oder Film mit fluorierter Oberfläche und Fluorierungsverfahren - Google Patents
Metallisches Material oder Film mit fluorierter Oberfläche und Fluorierungsverfahren Download PDFInfo
- Publication number
- EP0902101A1 EP0902101A1 EP98117280A EP98117280A EP0902101A1 EP 0902101 A1 EP0902101 A1 EP 0902101A1 EP 98117280 A EP98117280 A EP 98117280A EP 98117280 A EP98117280 A EP 98117280A EP 0902101 A1 EP0902101 A1 EP 0902101A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- metal
- film
- gas
- fluorinated
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 36
- 238000003682 fluorination reaction Methods 0.000 title claims description 34
- 239000002344 surface layer Substances 0.000 title claims description 7
- 239000007769 metal material Substances 0.000 title description 19
- 229910052751 metal Inorganic materials 0.000 claims abstract description 45
- 239000002184 metal Substances 0.000 claims abstract description 45
- 230000003647 oxidation Effects 0.000 claims abstract description 32
- 238000007254 oxidation reaction Methods 0.000 claims abstract description 32
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 64
- 239000007789 gas Substances 0.000 claims description 47
- 239000010410 layer Substances 0.000 claims description 44
- 229910052731 fluorine Inorganic materials 0.000 claims description 40
- 239000011737 fluorine Substances 0.000 claims description 36
- 229910052759 nickel Inorganic materials 0.000 claims description 25
- 239000000463 material Substances 0.000 claims description 21
- 229910052760 oxygen Inorganic materials 0.000 claims description 19
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 claims description 17
- 230000001590 oxidative effect Effects 0.000 claims description 15
- 229910052782 aluminium Inorganic materials 0.000 claims description 10
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 10
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 10
- 239000001301 oxygen Substances 0.000 claims description 10
- 239000010949 copper Substances 0.000 claims description 9
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 8
- 229910052802 copper Inorganic materials 0.000 claims description 8
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 claims description 5
- 239000011261 inert gas Substances 0.000 claims description 5
- 229910017604 nitric acid Inorganic materials 0.000 claims description 5
- 238000005240 physical vapour deposition Methods 0.000 claims description 5
- GQPLMRYTRLFLPF-UHFFFAOYSA-N Nitrous Oxide Chemical compound [O-][N+]#N GQPLMRYTRLFLPF-UHFFFAOYSA-N 0.000 claims description 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 4
- 238000007772 electroless plating Methods 0.000 claims description 4
- 238000009713 electroplating Methods 0.000 claims description 4
- 229910052709 silver Inorganic materials 0.000 claims description 4
- 239000004332 silver Substances 0.000 claims description 4
- 239000007864 aqueous solution Substances 0.000 claims description 3
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 claims description 2
- OMBRFUXPXNIUCZ-UHFFFAOYSA-N dioxidonitrogen(1+) Chemical compound O=[N+]=O OMBRFUXPXNIUCZ-UHFFFAOYSA-N 0.000 claims description 2
- 239000001272 nitrous oxide Substances 0.000 claims description 2
- JOHWNGGYGAVMGU-UHFFFAOYSA-N trifluorochlorine Chemical compound FCl(F)F JOHWNGGYGAVMGU-UHFFFAOYSA-N 0.000 claims description 2
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 claims 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 claims 2
- 239000004411 aluminium Substances 0.000 claims 2
- GVGCUCJTUSOZKP-UHFFFAOYSA-N nitrogen trifluoride Chemical compound FN(F)F GVGCUCJTUSOZKP-UHFFFAOYSA-N 0.000 claims 1
- 239000010408 film Substances 0.000 description 90
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 43
- 238000004519 manufacturing process Methods 0.000 description 42
- 229960005419 nitrogen Drugs 0.000 description 31
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 28
- 238000007747 plating Methods 0.000 description 26
- 238000006243 chemical reaction Methods 0.000 description 24
- 230000007797 corrosion Effects 0.000 description 24
- 238000005260 corrosion Methods 0.000 description 24
- 239000012071 phase Substances 0.000 description 19
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 18
- 229910001873 dinitrogen Inorganic materials 0.000 description 18
- 238000000682 scanning probe acoustic microscopy Methods 0.000 description 15
- 238000004544 sputter deposition Methods 0.000 description 15
- 239000000203 mixture Substances 0.000 description 13
- 229910052757 nitrogen Inorganic materials 0.000 description 13
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 12
- 239000003153 chemical reaction reagent Substances 0.000 description 12
- 229910001882 dioxygen Inorganic materials 0.000 description 12
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 11
- 239000000956 alloy Substances 0.000 description 11
- 238000012360 testing method Methods 0.000 description 11
- 229910045601 alloy Inorganic materials 0.000 description 10
- 229910052799 carbon Inorganic materials 0.000 description 10
- 238000002161 passivation Methods 0.000 description 10
- 239000010409 thin film Substances 0.000 description 10
- 229910052681 coesite Inorganic materials 0.000 description 9
- 229910052906 cristobalite Inorganic materials 0.000 description 9
- 239000000377 silicon dioxide Substances 0.000 description 9
- 229910001220 stainless steel Inorganic materials 0.000 description 9
- 239000010935 stainless steel Substances 0.000 description 9
- 229910052682 stishovite Inorganic materials 0.000 description 9
- 229910052905 tridymite Inorganic materials 0.000 description 9
- 229910000838 Al alloy Inorganic materials 0.000 description 8
- 238000005530 etching Methods 0.000 description 8
- 238000005259 measurement Methods 0.000 description 8
- 230000004580 weight loss Effects 0.000 description 8
- 230000000052 comparative effect Effects 0.000 description 7
- 238000012937 correction Methods 0.000 description 7
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 6
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 6
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 6
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 6
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 6
- LGQLOGILCSXPEA-UHFFFAOYSA-L nickel sulfate Chemical compound [Ni+2].[O-]S([O-])(=O)=O LGQLOGILCSXPEA-UHFFFAOYSA-L 0.000 description 6
- 229910000363 nickel(II) sulfate Inorganic materials 0.000 description 6
- 238000001514 detection method Methods 0.000 description 5
- 238000009792 diffusion process Methods 0.000 description 5
- 125000001153 fluoro group Chemical group F* 0.000 description 5
- 229960000443 hydrochloric acid Drugs 0.000 description 5
- 235000011167 hydrochloric acid Nutrition 0.000 description 5
- DBJLJFTWODWSOF-UHFFFAOYSA-L nickel(ii) fluoride Chemical compound F[Ni]F DBJLJFTWODWSOF-UHFFFAOYSA-L 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 239000000126 substance Substances 0.000 description 5
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 4
- 229910000881 Cu alloy Inorganic materials 0.000 description 4
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 4
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 4
- WAIPAZQMEIHHTJ-UHFFFAOYSA-N [Cr].[Co] Chemical compound [Cr].[Co] WAIPAZQMEIHHTJ-UHFFFAOYSA-N 0.000 description 4
- 239000002253 acid Substances 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 4
- 239000000356 contaminant Substances 0.000 description 4
- 230000003247 decreasing effect Effects 0.000 description 4
- 238000007654 immersion Methods 0.000 description 4
- 239000007791 liquid phase Substances 0.000 description 4
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 4
- 229940074355 nitric acid Drugs 0.000 description 4
- 238000005498 polishing Methods 0.000 description 4
- 238000002360 preparation method Methods 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- 229910018104 Ni-P Inorganic materials 0.000 description 3
- 229910018536 Ni—P Inorganic materials 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 3
- 239000012298 atmosphere Substances 0.000 description 3
- 239000003638 chemical reducing agent Substances 0.000 description 3
- 229910052736 halogen Inorganic materials 0.000 description 3
- 150000002367 halogens Chemical class 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- QKCGXXHCELUCKW-UHFFFAOYSA-N n-[4-[4-(dinaphthalen-2-ylamino)phenyl]phenyl]-n-naphthalen-2-ylnaphthalen-2-amine Chemical compound C1=CC=CC2=CC(N(C=3C=CC(=CC=3)C=3C=CC(=CC=3)N(C=3C=C4C=CC=CC4=CC=3)C=3C=C4C=CC=CC4=CC=3)C3=CC4=CC=CC=C4C=C3)=CC=C21 QKCGXXHCELUCKW-UHFFFAOYSA-N 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 description 2
- KWSLGOVYXMQPPX-UHFFFAOYSA-N 5-[3-(trifluoromethyl)phenyl]-2h-tetrazole Chemical compound FC(F)(F)C1=CC=CC(C2=NNN=N2)=C1 KWSLGOVYXMQPPX-UHFFFAOYSA-N 0.000 description 2
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 2
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 2
- KCXVZYZYPLLWCC-UHFFFAOYSA-N EDTA Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O KCXVZYZYPLLWCC-UHFFFAOYSA-N 0.000 description 2
- WTDHULULXKLSOZ-UHFFFAOYSA-N Hydroxylamine hydrochloride Chemical compound Cl.ON WTDHULULXKLSOZ-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 229910021209 NaHPO2 Inorganic materials 0.000 description 2
- 229910000990 Ni alloy Inorganic materials 0.000 description 2
- 229910021586 Nickel(II) chloride Inorganic materials 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 2
- 239000003513 alkali Substances 0.000 description 2
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 2
- 235000011114 ammonium hydroxide Nutrition 0.000 description 2
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 2
- 239000008139 complexing agent Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 150000002222 fluorine compounds Chemical group 0.000 description 2
- 235000019253 formic acid Nutrition 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- SHXXPRJOPFJRHA-UHFFFAOYSA-K iron(iii) fluoride Chemical compound F[Fe](F)F SHXXPRJOPFJRHA-UHFFFAOYSA-K 0.000 description 2
- 230000007935 neutral effect Effects 0.000 description 2
- QMMRZOWCJAIUJA-UHFFFAOYSA-L nickel dichloride Chemical compound Cl[Ni]Cl QMMRZOWCJAIUJA-UHFFFAOYSA-L 0.000 description 2
- 235000006408 oxalic acid Nutrition 0.000 description 2
- 238000005554 pickling Methods 0.000 description 2
- 230000035484 reaction time Effects 0.000 description 2
- 235000011121 sodium hydroxide Nutrition 0.000 description 2
- 229910001379 sodium hypophosphite Inorganic materials 0.000 description 2
- 239000003381 stabilizer Substances 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- AGGKEGLBGGJEBZ-UHFFFAOYSA-N tetramethylenedisulfotetramine Chemical compound C1N(S2(=O)=O)CN3S(=O)(=O)N1CN2C3 AGGKEGLBGGJEBZ-UHFFFAOYSA-N 0.000 description 2
- FAQYAMRNWDIXMY-UHFFFAOYSA-N trichloroborane Chemical compound ClB(Cl)Cl FAQYAMRNWDIXMY-UHFFFAOYSA-N 0.000 description 2
- BMYNFMYTOJXKLE-UHFFFAOYSA-N 3-azaniumyl-2-hydroxypropanoate Chemical compound NCC(O)C(O)=O BMYNFMYTOJXKLE-UHFFFAOYSA-N 0.000 description 1
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical compound [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- CPELXLSAUQHCOX-UHFFFAOYSA-N Hydrogen bromide Chemical compound Br CPELXLSAUQHCOX-UHFFFAOYSA-N 0.000 description 1
- 229910020347 Na2WO3 Inorganic materials 0.000 description 1
- 229910018054 Ni-Cu Inorganic materials 0.000 description 1
- 229910018490 Ni—Cr—Mo—W Inorganic materials 0.000 description 1
- 229910018481 Ni—Cu Inorganic materials 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000000026 X-ray photoelectron spectrum Methods 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 125000004429 atom Chemical group 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005422 blasting Methods 0.000 description 1
- 239000004327 boric acid Substances 0.000 description 1
- RJTANRZEWTUVMA-UHFFFAOYSA-N boron;n-methylmethanamine Chemical compound [B].CNC RJTANRZEWTUVMA-UHFFFAOYSA-N 0.000 description 1
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 1
- 229910052794 bromium Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 229910021563 chromium fluoride Inorganic materials 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000003750 conditioning effect Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005238 degreasing Methods 0.000 description 1
- 238000005108 dry cleaning Methods 0.000 description 1
- 239000003792 electrolyte Substances 0.000 description 1
- 229920006351 engineering plastic Polymers 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- QOSATHPSBFQAML-UHFFFAOYSA-N hydrogen peroxide;hydrate Chemical compound O.OO QOSATHPSBFQAML-UHFFFAOYSA-N 0.000 description 1
- 238000011090 industrial biotechnology method and process Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000011068 loading method Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 239000007800 oxidant agent Substances 0.000 description 1
- OFNHPGDEEMZPFG-UHFFFAOYSA-N phosphanylidynenickel Chemical compound [P].[Ni] OFNHPGDEEMZPFG-UHFFFAOYSA-N 0.000 description 1
- ACVYVLVWPXVTIT-UHFFFAOYSA-N phosphinic acid Chemical compound O[PH2]=O ACVYVLVWPXVTIT-UHFFFAOYSA-N 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- XMVONEAAOPAGAO-UHFFFAOYSA-N sodium tungstate Chemical compound [Na+].[Na+].[O-][W]([O-])(=O)=O XMVONEAAOPAGAO-UHFFFAOYSA-N 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- FTBATIJJKIIOTP-UHFFFAOYSA-K trifluorochromium Chemical compound F[Cr](F)F FTBATIJJKIIOTP-UHFFFAOYSA-K 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C8/00—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
- C23C8/06—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases
- C23C8/34—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases more than one element being applied in more than one step
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C8/00—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
- C23C8/06—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases
- C23C8/08—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases only one element being applied
Definitions
- the present invention relates to metallic material or film having a fluorinated surface layer, and a fluorination method of the metallic material or film. More particularly, the present invention provides fluorinated metal, on the top surface of which a thick fluoride layer greately enhances the corrosion resistance.
- the metal may be in any form capable of forming the fluoride layer thereon.
- the metal may be monolithic material or film formed on the substrate.
- the metallic material or film be used in a production apparatus of semiconductor devices and the like, so as to realize extremely advantageous corrosion performance against halogen-based corrosive gases, such as chlorine-, fluorine- or bromine-based gases.
- halogen-based corrosive gases such as chlorine-, fluorine- or bromine-based gases.
- halogen-based, reactive and strongly corrosive special gases such as hydrogen chloride (HCl), boron trichloride (BCl 3 ), fluorine (F 2 ), nitrogen trifluoride (NF 3 ), chlorine trifluroride (ClF 3 ) and hydrogen bromide (HBr) are used.
- gases are easily hydrolyzed by the presence of water in the environment, thus generating hydrochloric acid, hydrofluoric acid, hydrobromic acid and the like.
- the constructional metallic material or film of a valve, coupling, pipings, reaction chamber and the like for treating these gases is easily corroded and problems incurr.
- these corrosive gases are converted to plasma or are thermally decomposed. They are decomposed to active atom species and are used for etching the oxide film or metallic film and are used for dry-cleaning the reaction chamber as well.
- the amount of such gases used has abruptly increased. The highest quality of cleanliness and corrosion performance is required for the plant materials, such as the surface of a reaction chamber.
- fluorine gas is mixed with inert gas (krypton, neon, argon) and is oscillated in the field of an excimer laser, extremely strict corrosion performance is required for the material surface of a plant against the fluorine radicals.
- inert gas krypton, neon, argon
- Electrolytically polished stainless steel SUS 316L can allegedly solve the above described problems and is usually used. Such stainless steel is subjected to baking at 250°C prior to use. However, the corrosion resistance of stainless steel does not satisfactorily meet the requirements. Various nickel-based alloys have, therefore, been employed with halogen gas such as gaseous hydrechloric-acid at high temperature.
- Hastelloy-C Ni-Cr-Mo-W alloy
- Hastelloy-C exhibits extremely improved corrosion resistance against the oxidizing acid and also exhibits improved corrosion resistance against even the reducing acid, such as hydrochloric acid, when used at room temperature.
- Hastelloy-C exhibits remarkable resistance against pitting corrosion and crevice corrosion.
- the corrosion resistance of Hastelloy-C is poor against the fluorine gases and the fluorine radicals mentioned above, Hastelloy-C is not usable.
- Japanese Unexamined Patent Publication (kokai) No. 2-263972 is related to the invention entitled "Metallic Materials with Fluorinated Passivation Film Formed Thereon and Apparatus with the Use of Such Metallic Materials".
- the publication discloses the metallic material or film, on which the passivation film is formed, and an apparatus, in which the metallic material and coating are used.
- a passivation film is formed by means of fluorine gas on the metal which is at least one selected from nickel, nickel alloy, aluminum, aluminum alloy, copper, copper alloy and chromium, among the metals.
- the corrosion resistance disclosed is of improved quality.
- the film formed is of from 1000 to 3000 angstrom thick and hence ultra thin.
- the surface state of aluminum, stainless steel, copper and nickel plates to be fluorinated in this publication is a polished surface.
- Japanese Unexamined Patent Publication (kokai) No. 2-175855 is related metallic material or film, on which the fluorinated passivation film is formed, as well as an apparatus, in which the metallic material and film are used.
- the publication discloses a process for forming on the surface of stainless steel a mixed fluoride layer of iron fluoride and chromium fluoride.
- a fluorinated passivation film in the order of sub-micron thickness as well as the material with such film are disclosed. Improved corrosion resistance is disclosed. Thickness of the film formed is 4000 angstrom and is ultra thin.
- the polished SUS316L sheet is subjected to the fluorination.
- the fluorinated passivation films formed in the above publications are of approximately 4000 angstroms or less in thickness, they are easily removed by flaws, friction and the like. It is, therefore, difficult to say that the films are appropriate as the material of production apparatuses of semiconductor devices from the viewpoints of durability and longevity.
- the present invention aims to solve the problems involved in the prior art described above.
- the conventional passivation techniques are characterized in that the material surface is cleaned by polishing and the like and is then fluorinated to passivate it. It was discovered that, when the surface is oxidized to passivate it and is then fluorinated, surprisingly, not only the passivated and oxidized surface exhibits no hindrance to the fluorination, but also a rather thick fluorinated layer can be formed.
- a fluorinated metal having 1 ⁇ m or more thick fluorinated layer formed by forcibly oxidizing a surface of said metal and thereafter fluorinating the forcibly oxidized surface.
- the present invention is, therefore, characterized in that the surface of the metallic material or film is forcibly oxidized and, thereafter, the fluorinated layer having 1 ⁇ m or more of film thickness is formed on said surface.
- the fluorination process according to the present invention is, therefore, characterized in that the metallic material or film is forcibly oxidized by oxidizing material, and, thereafter the oxidized film is brought into contact with the fluorination gas.
- the metal which is fluorinated in the present invention, may be any one which is reactive with fluorine and forms a stable fluoride.
- nickel, copper, silver and aluminum are preferable metal, since their corrosion resistance is greatly enhanced by fluorination.
- Iron is excluded in the present invention, because the iron fluoride formed is decomposed and dissociated due to the moisture in air. Corrosion is, therefore, promoted in an environment containing moisture (exposure to air). There is, thus, a danger of incurring a practical problem.
- the metal may be an alloy containing nickel and the like.
- the metallic film to be fluorinated according to the present invention can be the film of electrolytic plating, electroless plating, physical vapor deposition (PVD) and the like of nickel, silver or aluminum, or an alloy containing at least one of them.
- PVD physical vapor deposition
- Ni plating Ni-Cu plating, Ni-W plating and the like are mentioned.
- electroless plating Ni-P plating, Ni-B plating, Ni-P-W plating, Ni-P-B plating and the like are mentioned.
- PVD the sputtering of Ni or its alloy is mentioned.
- the substrate for forming a film are various metallic materials, such as stainless steel, aluminum-alloy, steels and the like, sintered metal, ceramics, engineering plastics. These materials are subjected to known surface preparation such as degreasing, pickling, polishing, and shot-blasting, prior to formation of the metallic film.
- the metallic (alloy) material and the metallic (alloy) film is abbreviated as "metal".
- the metallic surface is first forcibly oxidized and subsequently the metallic oxide film is brought into reaction with fluorine.
- the thickness of the oxide film is from a few tens to a few hundreds angstroms at the highest.
- the metals, on which strong oxide can be formed in the case of natural oxidation are limited to the specified metals, such aluminum.
- natural oxidation is defined in GLOSSARY OF TECHNICAL TERMS IN JAPANESE INDUSTRIAL STANDARDS, Fourth Edition (page 729) to mean the oxidizing reaction which occurs in air without artificial acceleration.
- the natural oxidation film is well known in aluminum materials (c.f., Fundamentals and Industrial Techniques of Aluminum Materials (in Japanese) publlished on May 1, 1985, page 186).
- the forced oxidizing method is used in the present invention as described in detail hereinafter.
- the fluorination is carried out after the forced oxidation, the substitution reaction of oxygen and fluorine takes place to form the fluorinated layer.
- the thickness of the fluorinated layer increases, therefore, in proportion to the thickness of the forced oxidizing layer and amounts to a few tens of ⁇ m.
- the forced oxidizing layer becomes extremely thick, its adhesion to the substrate is lowered. Thickness of the layer seems to be limited to 10 ⁇ m.
- the thickness of fluoride formed on the metallic surface can be made thicker than that obtained by the so-called passivation.
- Aluminum alloys, copper, nickel or its alloy have affinity to oxygen, and, hence, a natural oxide film is readily formed on the surface in the atmosphere. This natural oxide film has an extremely dense structure and is chemically stable as well.
- Oxygen diffusion into the metal interior is, therefore, impeded at normal temperature, due to the presence of the oxide film.
- the natural oxide film retains ultra thin thickness amounting to only a few tens to hundreds angstroms. It is, therefore, necessary to thicken the oxide film by means of the so-called forced oxidation.
- a workpiece having a natural-oxide film is not directly fluorinated but is forcibly oxidized and then fluorinated.
- the thickness of the forcibly oxidized layer is greater than that of the natural oxide film and is preferably approximately 1000 angstroms or more.
- the wear resistance, corrosion resistance and durability of the so-formed fluoride layer are improved to such a level that it is satisfactorily usable in a practicable way.
- the fluoride layer is, broadly speaking, a layer which contains fluorine and preferably consists essentially of fluoride.
- the fluorination herein has a substantial meaning. That is, it is not necessary for 100% of the metallic to be replaced with fluoride.
- the oxygen is preferably replaced with fluorine to a level lower than the detection level of oxygen.
- the metal need not be necessarily uniformly fluorinated. Rarther, the fluorinated layer may be of non-uniform thickness, and the fluoride region and fluorine diffusion region may be mixed.
- the fluorinated layer consists of the first layer essentially consisting of metallic fluoride and a second layer, underlying the first layer, and into which fluorine has been diffused.
- gas-phase oxidation is a means to enable the forced oxidation.
- oxygen or its gas mixture with neutral or inert gas is preferable.
- nitrous oxide, nitrogen peroxide, ozone, or their mixture with neutral or inert gas are also preferable. In such cases, the gases are brought into contact with the metal at high temperature.
- Liquid-phase oxidation can be mentioned as another means for the forced oxidation. This can be carried out by means of immersion into a solution, such as nitric acid and hydrogen-peroxide water.
- the metallic material may be anodically oxidized using an electrolyte, such as alkali, to form an oxide film on the surface thereof.
- an electrolyte such as alkali
- oxygen formed on the anode is a means for the forced oxidation.
- aluminnum alloys It is broadly known in the case of aluminnum alloys that an oxide film amounting to a few microns to a few tens of microns can be formed on the surface of aluminum alloys by the so-called alumite treatment (anodic oxidation treatment). It has been put into practical application, and, therefore can be employed.
- the gases capable of use for the fluorination are 100% gases such fluorine, chlorine trifluoride and nitrogen trifluoride, their diluted gases by inert gases such as nitrogen, helium, argon and the like, or plasma gases of fluorine or the like.
- the fluorination is a production method of a fluorine diffusion layer and a film of fluoride by means of bringing the gases into reaction with the oxidized film formed on the top surface-layer of the metal.
- the metal as described above is loaded in a normal-pressure gas-phase flowing-type reaction furnace. While the oxidizing gas is flowing, the reaction furnace is heated to a predetermined temperature and is held for a predetermined time. The furnace is then filled with fluorination gas at a predetermined temperature. The reaction is carried out for a predetermined time to fluorinate the surface.
- the metal prior to loading the metal into a reaction furnace, the metal is degreased or demoisturized as usual, and the forced oxidation is subsequently formed. The purity of the subsequently formed, forcibly oxidized layer is therefore enhanced and defects are not formed in the layer. Since a thin natural oxide film of a few tens of angstroms, remaining on the metallic surface is forcibly oxidized together with the bulk, the thin natural oxide film need not be removed prior to the forced oxidation.
- the temperature of a reaction furnace for forcibly oxidizing nickel and copper is usually from 200°C to 600°C, in particular, preferably from 300°C to 500°C.
- Reaction time is usually from 1 hour to 48 hours, in particular, preferably from 3 to 24 hours.
- Aluminum is preferably anodically oxidized.
- the fluorination temperature is usually from 100°C to 700°C, in particular, preferably from 150°C to 500°C under the normal pressure.
- the reaction time is usually from 1 to 48 hours, particularly preferably from 3 hour to 24 hours.
- the oxygen of the forcibly oxidized layer is not satisfactorily replaced with fluorine, and, furthermore, diffusion of fluorine from the top surface is not satisfactory.
- the upper limits of temperature and time are exceeded, the reaction of fluorine is so abrupt that cracks generate in the film formed.
- the plating was carried out by using commercially available lustrous nickel plating reagents of the so-called Watt bath, mainly composed of NiSO 4 (nickel sulfate), NiCl 2 (nickel chloride), H 3 BO 3 (boric acid), and brightener.
- Stainless steel (SUS 316L) was preliminarily subjected to surface preparation by pickling. Film was then formed by conducting a current for a predetermined time at 1A/dm 2 of current density.
- the acidic chemical nickel plating which is referred to as the so-called chemical plating, has been put into practice.
- the reagents which are based on reduction with hypophosphorous acid are commercially available.
- the reagents used in the present production example were a commercially available reagent of chemical nickel plating, with the use of dimethylamine borane as the reducing agent, and a commercially available reagent of the chemical nickel plating, in which importance is attached to the corrosion resistance, that is, the nickel-phosphorus plating (Ni-P alloy plating).
- These reagents consist of 25 g/L of NiSO 4 (nickel sulfate) as the main component, 20g/L of NaHPO 2 (sodium hypophosphite) as the reducing agent, a complexing agent, stabilizing agent and brightener.
- NiSO 4 nickel sulfate
- NaHPO 2 sodium hypophosphite
- the stainless steel sheets were preliminarily subjected to surface preparation, then immersed in a plating liquor solution, which has been elevated to a temperature of 90°C, so as to cause a reaction for a predetermined time and hence to form a film.
- the reagent used was commercially available alkaline chemical plating, in which importance is attached to the wear resistance and the post-heat treatment corrosion resistance, and which is carried out in a nickel-phosphorous-tungsten (Ni-P-W) bath.
- This reagent consists of 15g/L of NiSO 4 (nickel sulfate) and Na 2 WO 3 (sodium tungstate), i.e., the metallic component, 20g/L of NaHPO 2 (sodium hypophosphite) as the reducing agent, complexing agent, a stabilizing agent, and brightener.
- the stainless steel sheets were preliminarily subjected to a predetermined surface conditioning, as in the above-described examples, and then immersed in a plating liquor tank, which has been elevated to a temperature of 85°C, so as to cause a reaction for a predetermined time and hence to form a film.
- A5083 was taken as an example of the so-called aluminum alloy, and its surface was mirror-polished. A5083 was then exposed for 30 days in air, so as to thoroughly form a natural oxide film on the surface. Thus, specimens were provided.
- C1100P copper material was taken as an example of a Cu-alloy, and its surface was mirror-polished. C1100P was then exposed for 30 days in air so as to form thoroughly a natural oxide film on the surface. Thus, specimens were provided.
- Specimens which were prepared by the procedure described in Production Example 1, were loaded in the interior of a normal-pressure, gas-phase flowing-type reaction furnace.
- the specimens were pretreated by baking for 1 hour at 200°C under reduced pressure to expel the adsorbed moisture and the like.
- the temperature was then elevated to 500°C while introducing the oxygen gas (99.999%).
- the temperature was then held at that temperature for 12 hours so as to forcibly oxidize the metallic surface.
- the temperature was lowered while replacing the oxygen gas with nitrogen gas.
- 20% F 2 gas diluted with nitrogen
- the surface fluorination was carried out by holding for 24 hours. After a predetermined time, the fluorine gas was replaced with nitrogen gas. After keeping the temperature at this level for 1 hour, the temperature was lowered.
- Specimens which were prepared by the procedure described in Production Example 1, were loaded in the interior of a normal-pressure, gas-phase flowing-type reaction furnace.
- the specimens were pretreated by baking for 1 hour at 200°C under reduced pressure.
- the temperature was then elevated to 500°C while introducing the oxygen gas (99.999%).
- the temperature was then held at that temperature for 12 hours so as to forcibly oxidize the metallic surface.
- the gas-replacement with nitrogen was carried out.
- the 20% F 2 gas diluted with nitrogen
- the surface fluorination was carried out by maintainig the conditions for 12 hours.
- the fluorine gas was replaced with nitrogen gas. After keeping the temperature at this level for 1 hour, the temperature was lowered.
- Specimens which were prepared by the procedure described in Production Example 2, were loaded in the interior of a normal-pressure, gas-phase flowing-type reaction furnace.
- the specimens were pretreated by baking for 1 hour at 200°C under reduced pressure.
- the temperature was then elevated to 500°C while introducing the oxygen gas (99.999%).
- the temperature was then maintained at 500°C for 12 hours so as to forcibly oxidize the metallic surface.
- the gas-replacement with nitrogen was carried out, while lowering the temperature.
- the 20% F 2 gas diluted with nitrogen
- the surface fluorination was carried out by holding the conditions for 12 hours. After a predetermined time, the fluorine gas was replaced with nitrogen gas. After keeping the temperature at this level for 1 hour, the temperature was lowered.
- Specimens which were prepared by the procedure described in Production Example 2, were loaded in the interior of a normal-pressure, gas-phase flowing-type reaction furnace.
- the specimens were pretreated by baking for 1 hour at 200°C under reduced pressure.
- the temperature was then elevated to 500°C while introducing the oxygen gas (99.999%).
- the temperature was then held at 500°C for 12 hours so as to forcibly oxidize the metallic surface.
- the gas-replacement with nitrogen was carried out.
- the 20% F 2 gas diluted with nitrogen
- the surface fluorination was carried out by holding for 12 hours.
- the fluorine gas was replaced with nitrogen gas. After keeping the temperature at this level for 1 hour, the temperature was lowered.
- the specimens were pretreated by baking for 1 hour at 200°C under reduced pressure.
- the temperature was then elevated to 500°C while introducing the oxygen gas (99.999%).
- the temperature was then held at that temperature for 12 hours so as to forcedly oxidize the metallic surface.
- the gas replacement with nitrogen gas was carried out.
- the 20% F 2 gas (diluted with nitrogen) was introduced for replacement of nitrogen.
- the surface fluorination was carried out by holding the same temperature for 12 hours. After a predetermined time, the fluorine gas was replaced with the nitrogen gas. After keeping the temperature at this level for 1 hour, the temperature was lowered.
- the specimen prepared by the procedure of Production Example 2 was immersed for 10 minutes in a 5% nitric-acid aqueous solution, the temperature of which had been elevated to 50°C. The specimen was further thoroughly washed with pure water and then left as it was, in the pure water for 8 hours to oxidize the surface. This specimen was loaded in a normal-pressure gas-phase flowing-type reaction furnace. The nitrogen gas was introduced into the furnace to replace the oxygen gas. After the replacement, the baking pretreatment was carried out at 200°C for 1 hour under reduced pressure. Immediately after baking, the temperature was lowered.
- the specimen which was prepared by the procedure of Production Example 3, was loaded into a normal-pressure gasphase flowing-type reaction-furnace. Baking pretreatment was carried out at 200°C for 1 hour. Temperature was then elevated. When the furnace temperature reached 400°C, 20% F 2 gas (diluted with nitrogen) was introduced, followed by maintaining that state for 6 hours, hence carring out the fluorination of the metallic material. This is broadly known as the passiavation method of nickel materials. After that, nitrogen gas was introduced to replace the fluorine gas. After keeping the temperature at this level for 1 hour, the temperature was lowered.
- Film thickness of the fluorinated layer was deemed as the thickness where the fluorine atoms could be detected by the above-mentioned argon sputtering.
- a similar measurement was preliminarily carried out with regard to the oxygen-detection thickness of SiO 2 thin film, the thickness of which was already known.
- the sputter rate measured was 115 angstroms per minute (hereinafter referred to as "SiO 2 correction"). As a result, it turned out that the thickness of the fluorinated layer amounted to 1.2 ⁇ m or more.
- diffraction peaks of Ni or Ni 3 P appear very slightly, and the predominant peaks and most of the other peaks are NiF 2 . These peaks are detected at high intensity.
- the measurement by a thin-film method was carried out at an incident angle ( ⁇ ) 1° of X-ray. Theoretically, the analyzed thickness corresponds to 2.1 ⁇ m from the surface. The fluoride film is, therefore, in the order of ⁇ m thickness on the surface of the electroless nickel plating.
- Fig. 8 is shown the analysis results of the specimen according to Example 3 by AES (Auger Electron Spectroscopy).
- the element composition on the top surface layer is shown in Table 1.
- the atomic proportion of Ni and F is approximately 1 : 2. It could be confirmed from this result with the above-described results of X-ray diffraction, that the nickel fluoride (NiF 2 ) was formed on the top surface layer.
- Fig. 9 are shown the AES analytical results of specimens of Example 4.
- the element composition on the top surface is shown in Table 2.
- the atomic proportion of Ni and F is approximately 1 : 2. It could be confirmed from this result together with the above-described results of X-ray diffraction, that nickel fluoride (NiF 2 ) was formed on the top surface layer.
- Fig. 10 are shown the AES analytical results of specimens of Comparative Example 1.
- the element composition on the top surface is shown in Table 3.
- the atomic proportion of Ni and F is approximately 1 : 2.
- the detection intensity of fluorine decreased after a few minutes from the beginning of sputtering, and the fluorine was not detected at approximately 20 minutes.
- Corrosion-resistance test of various materials was carried out. The results are shown in Table 4.
- the evaluation of the corrosion resistance test was expressed by the weight loss of the various materials which were immersed in the 35% hydrochloric-acid aqueous solution at room temperature (25°C) for 24 hours.
- the surface-treated specimens formed in Production Examples 2 and 3 as the comparative materials and the specimens of Examples 3, 4, 5 and 6 were used. The weight loss was measured upon withdrawal after 24 hours. As a result of comparison, it turned out that weight loss of Example 5 was the smallest.
- the corrosion-resistance test of the specimens of Example 3 was carried out. The results are shown in Fig. 11 (Table 5).
- a solution or reagents such as 20% nitric acid, 50% hydrofluoric acid, 20% sulfuric acid, 20% phosphoric acid, 28% ammonia water, 28% caustic soda, 50% formic acid, 20% acetic acid, oxalic acid, organic solvent (acetone), ethanol, EDTA, tetramine and hydrochloric acid hydroxylamine were prepared.
- Various materials were immersed in the solutions or reagents at room temperature (30°C) for 24 hours. The evaluation of corrosion resistance was expressed by the weight loss during the immersion.
- Example 3 In every testing liquid, the specimens of Example 3 exhibited improved corrosion resistance from the viewpoint of weight loss and observation of appearance as compared with the electroless nickel plated and un-fluorinated specimens according to Example 3.
- Example 3 01 Nitric acid (20%) 1795 646 02 Hydrofluoric acid (50%) 22.5 1.1 03 Sulfuric acid (20%) 133 106 04 Phosphoric acid (20%) 66.2 4.6 05 Ammonia water (28%) 222 32.8 06 Caustic soda (1N) 4.0 2.4 07 Formic acid (50%) 43.1 1.5 08 Acetic acid (20%) 104 1.2 09 Oxalic acid 2.4 0.6 10 Acetone 0.0 0.0 11 Ethanol 0.0 0.9 12 EDTA 18.9 7.3 13 Tetramine 0.0 1.8 14 Hydrochloric acid hydroxylamine 770 22.2
- Example 4 The wear-resistance test was carried out under a constant load. As a result of the test, the sliding friction performance and film durability in terms of the sliding time until the film breaks only one time in Production Example 2, while it is 30 times in Example 3 and 208 times in Example 4. Particularly, since in Example 4, in which the fluoride film which is thick in the order of ⁇ m exhibited wear-resistance and durability better than those of the electroless nickel-plating, it was clarified that the durability of Example 4 is of a level satisfactory for practical use.
- Example 3 were forcibly oxidized by the oxygen gas. At this stage, the specimens were withdrawn from the reaction furnace. It is clear that the oxidation film of such specimens amounts to approximately 0.6 ⁇ m contrary to Example 9, since the oxide film is removed by the argon-ion sputtering of approximately 55 minutes.
- the thick fluorinated layer attained by the present invention has improved resistance against acid and alkali, and is therefore extremely useful for the plant members of the semiconductor-related machinery and devices among others.
- the metallic material or film, on which the surfacial fluorinated layer is formed, is, therefore, extremely useful for the production apparatuses of semiconductor devices, and plant members of vacuum-related machineries and devices.
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP09248231A JP3094000B2 (ja) | 1997-09-12 | 1997-09-12 | フッ化表面層を有する金属材料もしくは金属皮膜ならびにフッ化方法 |
| JP24823197 | 1997-09-12 | ||
| JP248231/97 | 1997-09-12 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP0902101A1 true EP0902101A1 (de) | 1999-03-17 |
| EP0902101B1 EP0902101B1 (de) | 2003-02-19 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP98117280A Expired - Lifetime EP0902101B1 (de) | 1997-09-12 | 1998-09-11 | Metallisches Material oder Film mit fluorierter Oberfläche und Fluorierungsverfahren |
Country Status (5)
| Country | Link |
|---|---|
| EP (1) | EP0902101B1 (de) |
| JP (1) | JP3094000B2 (de) |
| KR (1) | KR100308688B1 (de) |
| DE (2) | DE69811446D1 (de) |
| TW (1) | TW402646B (de) |
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| JP5317321B2 (ja) * | 2008-02-21 | 2013-10-16 | 岩谷産業株式会社 | 金属材料及びこれを用いた保存容器、ガス配管、装置、並びに、その製造方法、ClF3の保存方法 |
| SG155111A1 (en) | 2008-02-26 | 2009-09-30 | Kobe Steel Ltd | Surface treatment material for semiconductor manufacturing system and method for producing same |
| JP2010077529A (ja) * | 2008-08-26 | 2010-04-08 | Showa Denko Kk | 摺動部品およびその製造方法 |
| EP4006201A4 (de) | 2019-07-31 | 2023-11-29 | Resonac Corporation | Laminat und verfahren zur herstellung davon |
| CN110508299B (zh) * | 2019-09-03 | 2022-04-19 | 北京邮电大学 | 一种迅速升温制备二维局域氧化的过渡族金属氟化物催化剂方法 |
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| KR20220089724A (ko) | 2020-12-21 | 2022-06-29 | 에스케이스페셜티 주식회사 | 고순도 불화수소를 저장하기 위한 용기 및 이의 제조방법 |
| US20230103643A1 (en) * | 2021-10-04 | 2023-04-06 | Applied Materials, Inc. | ADVANCED BARRIER NICKEL OXIDE (BNiO) COATING DEVELOPMENT FOR THE PROCESS CHAMBER COMPONENTS |
| US12522923B2 (en) | 2022-03-11 | 2026-01-13 | Applied Materials, Inc. | Advanced barrier nickel oxide (BNiO) coating development for process chamber components via ozone treatment |
| DE102022210513A1 (de) * | 2022-10-05 | 2024-04-11 | Carl Zeiss Smt Gmbh | Verfahren zum Bilden einer Fluorid- oder Oxyfluoridschicht |
| JPWO2024127901A1 (de) * | 2022-12-15 | 2024-06-20 |
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- 1997-09-12 JP JP09248231A patent/JP3094000B2/ja not_active Expired - Fee Related
-
1998
- 1998-09-10 TW TW087115090A patent/TW402646B/zh active
- 1998-09-10 KR KR1019980037294A patent/KR100308688B1/ko not_active Expired - Fee Related
- 1998-09-11 DE DE69811446A patent/DE69811446D1/de not_active Expired - Fee Related
- 1998-09-11 DE DE69811446T patent/DE69811446T4/de not_active Expired - Lifetime
- 1998-09-11 EP EP98117280A patent/EP0902101B1/de not_active Expired - Lifetime
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| US4111762A (en) * | 1975-01-31 | 1978-09-05 | Martin Marietta Corporation | Optically black coating and process for forming it |
| EP0352061A2 (de) * | 1988-07-20 | 1990-01-24 | Hashimoto Chemical Industries Co., Ltd. | Metallischer Werkstoff mit durch Fluorierung passiviertem Film und aus dem metallischen Werkstoff bestehende Anlage |
| EP0460701A1 (de) * | 1990-06-07 | 1991-12-11 | Applied Materials, Inc. | Verfahren zur Herstellung eines korrosionsbeständigen Schutzüberzugs auf Aluminiumsubstrat |
| EP0460700A1 (de) * | 1990-06-07 | 1991-12-11 | Applied Materials, Inc. | Korrosionsbeständiger Schutzüberzug auf Aluminiumsubstrat oder Oberfläche und Verfahren zur Herstellung derselben |
| JPH04202755A (ja) * | 1990-11-30 | 1992-07-23 | Daido Sanso Kk | 鋼材の酸化方法 |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2003002454A3 (en) * | 2001-06-29 | 2003-05-30 | Showa Denko Kk | High-purity fluorine gas, production and use thereof, and method for analyzing trace impurities in high-purity fluorine gas |
| US6955801B2 (en) | 2001-06-29 | 2005-10-18 | Showa Denka K.K. | High-purity fluorine gas, production and use thereof, and method for analyzing trace impurities in high-purity fluorine gas |
| WO2003036216A1 (en) * | 2001-10-25 | 2003-05-01 | Showa Denko K.K. | Heat exchanger, method for fluorination of the heat exchanger or component members thereof, and method of manufacturing the heat exchanger |
| CN101835991A (zh) * | 2007-10-24 | 2010-09-15 | 株式会社Ihi | 耐磨损增强方法以及滑动构造体 |
| EP2211061A4 (de) * | 2007-10-24 | 2012-05-30 | Ihi Corp | Abriebfestigkeitsverstärkungsverfahren und schiebestruktur |
| US12064937B2 (en) | 2019-09-13 | 2024-08-20 | Resonac Corporation | Laminate and method for producing same |
| US12116671B2 (en) | 2019-10-10 | 2024-10-15 | Resonac Corporation | Laminate and method for producing same |
| CN117305840A (zh) * | 2023-10-10 | 2023-12-29 | 浙江工业大学 | 一种无级变速器零件防腐耐磨的处理工艺及细观织构设计 |
Also Published As
| Publication number | Publication date |
|---|---|
| DE69811446D1 (de) | 2003-03-27 |
| TW402646B (en) | 2000-08-21 |
| JP3094000B2 (ja) | 2000-10-03 |
| DE69811446T2 (de) | 2003-10-23 |
| KR19990029675A (ko) | 1999-04-26 |
| EP0902101B1 (de) | 2003-02-19 |
| DE69811446T4 (de) | 2004-07-08 |
| JPH1192912A (ja) | 1999-04-06 |
| KR100308688B1 (ko) | 2001-11-30 |
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