ES2106194T3 - Metodo de fabricacion de perlas de soldadura y perlas de soldadura formadas mediante el mismo. - Google Patents
Metodo de fabricacion de perlas de soldadura y perlas de soldadura formadas mediante el mismo.Info
- Publication number
- ES2106194T3 ES2106194T3 ES92919808T ES92919808T ES2106194T3 ES 2106194 T3 ES2106194 T3 ES 2106194T3 ES 92919808 T ES92919808 T ES 92919808T ES 92919808 T ES92919808 T ES 92919808T ES 2106194 T3 ES2106194 T3 ES 2106194T3
- Authority
- ES
- Spain
- Prior art keywords
- welding
- contact terminal
- combination
- pearls
- intermetallic material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/019—Manufacture or treatment of bond pads
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3452—Solder masks
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3465—Application of solder
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01251—Changing the shapes of bumps
- H10W72/01255—Changing the shapes of bumps by using masks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01251—Changing the shapes of bumps
- H10W72/01257—Changing the shapes of bumps by reflowing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01261—Chemical or physical modification, e.g. by sintering or anodisation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/019—Manufacture or treatment of bond pads
- H10W72/01951—Changing the shapes of bond pads
- H10W72/01953—Changing the shapes of bond pads by etching
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/231—Shapes
- H10W72/234—Cross-sectional shape, i.e. in side view
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/241—Dispositions, e.g. layouts
- H10W72/242—Dispositions, e.g. layouts relative to the surface, e.g. recessed, protruding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/29—Bond pads specially adapted therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
Landscapes
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Wire Bonding (AREA)
- Ceramic Products (AREA)
- Arc Welding In General (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
LA BASE DE LAS COMBAS DE SOLDADURA SE PRESERVA CONVIERTIENDO EL METAL DE DEBAJO DE LA COMBADURA ENTRE LA COMBADURA DE SOLDADURA Y EL TERMINAL DE CONTACTO EN UN MATERIAL INTERMETALICO ENTRE LA SOLDADURA Y EL COMPONENTE SOLDABLE DEL METAL DE DEBAJO DE LA COMBADURA ANTES DE EFECTUAR EL ATAQUE QUIMICO A LA PARTE METALICO DE DEBAJO DE LA SOLDADURA. EL MATERIAL INTERMETALICO ES RESISTENTE A LOS AGENTES DE ATAQUE QUIMICO QUE SE UTILIZAN PARA ATACAR QUIMICAMENTE EL METAL DE DEBAJO DE LA SOLDADURA ENTRE LOS TERMINALES DE CONTACTO. DE ESTA FORMA, SE PRODUCE UN RECORTE MINIMO DE LAS COMBADURAS DE LA SOLDADURA, Y SE PRESERVA SU TAMAÑO. LA SOLDADURA PUEDE ELECTRODEPOSITARSE SOBRE EL MATERIAL METALICO DE DEBAJO DE LA COMBADURA POR ENCIMA DEL TERMINAL DE CONTACTO A TRAVES DE UNA CAPA DE DAMA DE SOLDADURA CONFORMADA QUE TENGA UNA REGION DE ACUMULACION DE SOLDADURA SOBRE LA MISMA. LA DAMA DE SOLDADURA ES PREFERIBLEMENTE UNA CAPA DE PELICULA FINA QUE PUEDE ALINEARSE EXACTAMENTE CON EL TERMINAL DE CONTACTO INFERIOR PARA CONFINAR LA MOJADURA DE LA SOLDADURA FUNDIDA DURANTE EL REFLUJO. DE ESTA FORMA PUEDE REDUCIRSE EL DESALINEAMIENTO ENTRE LA COMBADURA DE SOLDADURA Y EL TERMINAL DE CONTACTO. LAS COMBADURAS DE SOLDADURA ASI FORMADAS INCLUYEN UNA CAPA DE MATERIAL INTERMETALICO QUE SE EXTIENDE MAS ALLA DE LA COMBADURA PARA FORMAR UN LABIO ALREDEDOR DE LA BASE DE LA COMBADURA. EL LABIO SUMINISTRA UNA PROTECCION EXTRA PARA LA COMBADURA DE SOLDADURA.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/759,450 US5162257A (en) | 1991-09-13 | 1991-09-13 | Solder bump fabrication method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ES2106194T3 true ES2106194T3 (es) | 1997-11-01 |
Family
ID=25055684
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES92919808T Expired - Lifetime ES2106194T3 (es) | 1991-09-13 | 1992-09-11 | Metodo de fabricacion de perlas de soldadura y perlas de soldadura formadas mediante el mismo. |
Country Status (10)
| Country | Link |
|---|---|
| US (2) | US5162257A (es) |
| EP (1) | EP0603296B1 (es) |
| JP (1) | JP2842692B2 (es) |
| KR (1) | KR0186061B1 (es) |
| AT (1) | ATE156935T1 (es) |
| CA (1) | CA2116766C (es) |
| DE (1) | DE69221627T2 (es) |
| ES (1) | ES2106194T3 (es) |
| TW (1) | TW200417B (es) |
| WO (1) | WO1993006620A1 (es) |
Families Citing this family (96)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR950001962A (ko) * | 1993-06-30 | 1995-01-04 | 김광호 | 반도체 칩 범프 |
| US5366140A (en) * | 1993-09-30 | 1994-11-22 | Minnesota Mining And Manufacturing Company | Patterned array of uniform metal microbeads |
| US5442852A (en) * | 1993-10-26 | 1995-08-22 | Pacific Microelectronics Corporation | Method of fabricating solder ball array |
| US5396702A (en) * | 1993-12-15 | 1995-03-14 | At&T Corp. | Method for forming solder bumps on a substrate using an electrodeposition technique |
| US5532550A (en) * | 1993-12-30 | 1996-07-02 | Adler; Robert | Organic based led display matrix |
| US5665639A (en) * | 1994-02-23 | 1997-09-09 | Cypress Semiconductor Corp. | Process for manufacturing a semiconductor device bump electrode using a rapid thermal anneal |
| US5470787A (en) * | 1994-05-02 | 1995-11-28 | Motorola, Inc. | Semiconductor device solder bump having intrinsic potential for forming an extended eutectic region and method for making and using the same |
| US5503286A (en) * | 1994-06-28 | 1996-04-02 | International Business Machines Corporation | Electroplated solder terminal |
| US5539153A (en) * | 1994-08-08 | 1996-07-23 | Hewlett-Packard Company | Method of bumping substrates by contained paste deposition |
| TW253856B (en) * | 1994-12-13 | 1995-08-11 | At & T Corp | Method of solder bonding, and article produced by the method |
| ATE210895T1 (de) * | 1995-03-20 | 2001-12-15 | Unitive Int Ltd | Löthöcker-herstellungsverfahren und strukturen mit einer titan-sperrschicht |
| US6388203B1 (en) | 1995-04-04 | 2002-05-14 | Unitive International Limited | Controlled-shaped solder reservoirs for increasing the volume of solder bumps, and structures formed thereby |
| EP0819318B1 (en) * | 1995-04-05 | 2003-05-14 | Unitive International Limited | A solder bump structure for a microelectronic substrate |
| US5620131A (en) * | 1995-06-15 | 1997-04-15 | Lucent Technologies Inc. | Method of solder bonding |
| US5874782A (en) * | 1995-08-24 | 1999-02-23 | International Business Machines Corporation | Wafer with elevated contact structures |
| KR100438256B1 (ko) * | 1995-12-18 | 2004-08-25 | 마츠시타 덴끼 산교 가부시키가이샤 | 반도체장치 및 그 제조방법 |
| US5851911A (en) | 1996-03-07 | 1998-12-22 | Micron Technology, Inc. | Mask repattern process |
| US5736456A (en) * | 1996-03-07 | 1998-04-07 | Micron Technology, Inc. | Method of forming conductive bumps on die for flip chip applications |
| US5793116A (en) * | 1996-05-29 | 1998-08-11 | Mcnc | Microelectronic packaging using arched solder columns |
| US5903058A (en) * | 1996-07-17 | 1999-05-11 | Micron Technology, Inc. | Conductive bumps on die for flip chip application |
| JP3413020B2 (ja) * | 1996-07-17 | 2003-06-03 | 株式会社東芝 | 半導体装置の製造方法 |
| US5902686A (en) * | 1996-11-21 | 1999-05-11 | Mcnc | Methods for forming an intermetallic region between a solder bump and an under bump metallurgy layer and related structures |
| JP3553300B2 (ja) * | 1996-12-02 | 2004-08-11 | 富士通株式会社 | 半導体装置の製造方法及び半導体装置の実装方法 |
| US6045030A (en) * | 1997-03-13 | 2000-04-04 | Raytheon Company | Sealing electronic packages containing bumped hybrids |
| US6117299A (en) * | 1997-05-09 | 2000-09-12 | Mcnc | Methods of electroplating solder bumps of uniform height on integrated circuit substrates |
| US5926731A (en) * | 1997-07-02 | 1999-07-20 | Delco Electronics Corp. | Method for controlling solder bump shape and stand-off height |
| US5990472A (en) * | 1997-09-29 | 1999-11-23 | Mcnc | Microelectronic radiation detectors for detecting and emitting radiation signals |
| US5962151A (en) * | 1997-12-05 | 1999-10-05 | Delco Electronics Corp. | Method for controlling solderability of a conductor and conductor formed thereby |
| US5937320A (en) * | 1998-04-08 | 1999-08-10 | International Business Machines Corporation | Barrier layers for electroplated SnPb eutectic solder joints |
| US6595408B1 (en) | 1998-10-07 | 2003-07-22 | Micron Technology, Inc. | Method of attaching solder balls to BGA package utilizing a tool to pick and dip the solder ball in flux prior to placement |
| US6268275B1 (en) * | 1998-10-08 | 2001-07-31 | Micron Technology, Inc. | Method of locating conductive spheres utilizing screen and hopper of solder balls |
| US6139972A (en) * | 1998-10-26 | 2000-10-31 | Agilent Technologies Inc. | Solder paste containment device |
| JP3667184B2 (ja) * | 1999-02-26 | 2005-07-06 | 住友ベークライト株式会社 | 半導体装置 |
| JP3287328B2 (ja) * | 1999-03-09 | 2002-06-04 | 日本電気株式会社 | 半導体装置及び半導体装置の製造方法 |
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| US6332988B1 (en) | 1999-06-02 | 2001-12-25 | International Business Machines Corporation | Rework process |
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| US6570251B1 (en) * | 1999-09-02 | 2003-05-27 | Micron Technology, Inc. | Under bump metalization pad and solder bump connections |
| KR100319813B1 (ko) | 2000-01-03 | 2002-01-09 | 윤종용 | 유비엠 언더컷을 개선한 솔더 범프의 형성 방법 |
| US6387793B1 (en) * | 2000-03-09 | 2002-05-14 | Hrl Laboratories, Llc | Method for manufacturing precision electroplated solder bumps |
| US6437669B1 (en) * | 2000-09-29 | 2002-08-20 | Applied Micro Circuits Corporation | Microwave to millimeter wave frequency substrate interface |
| DE60108413T2 (de) | 2000-11-10 | 2005-06-02 | Unitive Electronics, Inc. | Verfahren zum positionieren von komponenten mit hilfe flüssiger antriebsmittel und strukturen hierfür |
| US6863209B2 (en) | 2000-12-15 | 2005-03-08 | Unitivie International Limited | Low temperature methods of bonding components |
| US6884313B2 (en) * | 2001-01-08 | 2005-04-26 | Fujitsu Limited | Method and system for joining and an ultra-high density interconnect |
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| JP4656275B2 (ja) * | 2001-01-15 | 2011-03-23 | 日本電気株式会社 | 半導体装置の製造方法 |
| US6419148B1 (en) | 2001-01-23 | 2002-07-16 | Orbotech Ltd. | System for forming bumps on wafers |
| US6762122B2 (en) * | 2001-09-27 | 2004-07-13 | Unitivie International Limited | Methods of forming metallurgy structures for wire and solder bonding |
| TW536766B (en) * | 2002-02-19 | 2003-06-11 | Advanced Semiconductor Eng | Bump process |
| TW521359B (en) * | 2002-02-20 | 2003-02-21 | Advanced Semiconductor Eng | Bump fabrication process |
| TWI239578B (en) * | 2002-02-21 | 2005-09-11 | Advanced Semiconductor Eng | Manufacturing process of bump |
| US7547623B2 (en) | 2002-06-25 | 2009-06-16 | Unitive International Limited | Methods of forming lead free solder bumps |
| US7531898B2 (en) | 2002-06-25 | 2009-05-12 | Unitive International Limited | Non-Circular via holes for bumping pads and related structures |
| AU2003256360A1 (en) | 2002-06-25 | 2004-01-06 | Unitive International Limited | Methods of forming electronic structures including conductive shunt layers and related structures |
| US6987307B2 (en) * | 2002-06-26 | 2006-01-17 | Georgia Tech Research Corporation | Stand-alone organic-based passive devices |
| US6900708B2 (en) * | 2002-06-26 | 2005-05-31 | Georgia Tech Research Corporation | Integrated passive devices fabricated utilizing multi-layer, organic laminates |
| US7260890B2 (en) * | 2002-06-26 | 2007-08-28 | Georgia Tech Research Corporation | Methods for fabricating three-dimensional all organic interconnect structures |
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| AU2003301632A1 (en) | 2002-10-22 | 2004-05-13 | Unitive International Limited | Stacked electronic structures including offset substrates |
| US6897141B2 (en) * | 2002-10-23 | 2005-05-24 | Ocube Digital Co., Ltd. | Solder terminal and fabricating method thereof |
| US6796482B2 (en) * | 2002-10-31 | 2004-09-28 | Freescale Semiconductor, Inc. | Phase separated system for fluxing |
| DE10301934A1 (de) * | 2003-01-20 | 2004-07-29 | Epcos Ag | Elektrisches Bauelement mit verringerter Substratfläche |
| TWI225899B (en) | 2003-02-18 | 2005-01-01 | Unitive Semiconductor Taiwan C | Etching solution and method for manufacturing conductive bump using the etching solution to selectively remove barrier layer |
| US7489914B2 (en) * | 2003-03-28 | 2009-02-10 | Georgia Tech Research Corporation | Multi-band RF transceiver with passive reuse in organic substrates |
| TWI221334B (en) * | 2003-06-30 | 2004-09-21 | Advanced Semiconductor Eng | Bumping process |
| TWI223882B (en) * | 2003-06-30 | 2004-11-11 | Advanced Semiconductor Eng | Bumping process |
| US7244671B2 (en) * | 2003-07-25 | 2007-07-17 | Unitive International Limited | Methods of forming conductive structures including titanium-tungsten base layers and related structures |
| US7049216B2 (en) | 2003-10-14 | 2006-05-23 | Unitive International Limited | Methods of providing solder structures for out plane connections |
| US7427557B2 (en) * | 2004-03-10 | 2008-09-23 | Unitive International Limited | Methods of forming bumps using barrier layers as etch masks |
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| US7713860B2 (en) * | 2007-10-13 | 2010-05-11 | Wan-Ling Yu | Method of forming metallic bump on I/O pad |
| TWI446843B (zh) * | 2007-12-11 | 2014-07-21 | Unimicron Technology Corp | 線路板及其製程 |
| US7888259B2 (en) * | 2008-08-19 | 2011-02-15 | Ati Technologies Ulc | Integrated circuit package employing predetermined three-dimensional solder pad surface and method for making same |
| KR101022942B1 (ko) | 2008-11-12 | 2011-03-16 | 삼성전기주식회사 | 흐름 방지용 댐을 구비한 인쇄회로기판 및 그 제조방법 |
| US9142520B2 (en) * | 2011-08-30 | 2015-09-22 | Ati Technologies Ulc | Methods of fabricating semiconductor chip solder structures |
| KR101774938B1 (ko) | 2011-08-31 | 2017-09-06 | 삼성전자 주식회사 | 지지대를 갖는 반도체 패키지 및 그 형성 방법 |
| US8946891B1 (en) * | 2012-09-04 | 2015-02-03 | Amkor Technology, Inc. | Mushroom shaped bump on repassivation |
| US20150195912A1 (en) | 2014-01-08 | 2015-07-09 | Zhuhai Advanced Chip Carriers & Electronic Substrate Solutions Technologies Co. Ltd. | Substrates With Ultra Fine Pitch Flip Chip Bumps |
| US9949378B2 (en) | 2014-04-14 | 2018-04-17 | Presidio Components, Inc. | Electrical devices with solder dam |
| FR3050865B1 (fr) * | 2016-05-02 | 2018-10-12 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede de realisation d'interconnexions conductrices sur un substrat et interconnexions ainsi obtenues |
| US11676932B2 (en) * | 2019-12-31 | 2023-06-13 | Micron Technology, Inc. | Semiconductor interconnect structures with narrowed portions, and associated systems and methods |
| KR20250061993A (ko) | 2023-10-30 | 2025-05-08 | 가톨릭대학교 산학협력단 | 재난 대응 하·폐수 처리시설의 자산관리방법 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3986255A (en) * | 1974-11-29 | 1976-10-19 | Itek Corporation | Process for electrically interconnecting chips with substrates employing gold alloy bumps and magnetic materials therein |
| JPS54128669A (en) * | 1978-03-29 | 1979-10-05 | Nippon Denso Co Ltd | Flip chip element |
| US4273859A (en) * | 1979-12-31 | 1981-06-16 | Honeywell Information Systems Inc. | Method of forming solder bump terminals on semiconductor elements |
| DE3685647T2 (de) * | 1985-07-16 | 1993-01-07 | Nippon Telegraph & Telephone | Verbindungskontakte zwischen substraten und verfahren zur herstellung derselben. |
| FR2588121B1 (fr) * | 1985-10-02 | 1990-02-23 | Bull Sa | Procede et dispositif de soudage d'elements sur les plots correspondants d'une plaquette telle que notamment une plaquette de circuits integres de haute densite |
| US4878611A (en) * | 1986-05-30 | 1989-11-07 | American Telephone And Telegraph Company, At&T Bell Laboratories | Process for controlling solder joint geometry when surface mounting a leadless integrated circuit package on a substrate |
| US4763829A (en) * | 1986-06-04 | 1988-08-16 | American Telephone And Telegraph Company, At&T Bell Laboratories | Soldering of electronic components |
| EP0263222B1 (en) * | 1986-10-08 | 1992-03-25 | International Business Machines Corporation | Method of forming solder terminals for a pinless ceramic module |
| US4752027A (en) * | 1987-02-20 | 1988-06-21 | Hewlett-Packard Company | Method and apparatus for solder bumping of printed circuit boards |
| JP2544396B2 (ja) * | 1987-08-25 | 1996-10-16 | 株式会社日立製作所 | 半導体集積回路装置の製造方法 |
| JP2633586B2 (ja) * | 1987-10-21 | 1997-07-23 | 株式会社東芝 | バンプ構造を有する半導体装置 |
| US4817850A (en) * | 1988-03-28 | 1989-04-04 | Hughes Aircraft Company | Repairable flip-chip bumping |
| US4893403A (en) * | 1988-04-15 | 1990-01-16 | Hewlett-Packard Company | Chip alignment method |
| US4840302A (en) * | 1988-04-15 | 1989-06-20 | International Business Machines Corporation | Chromium-titanium alloy |
| US4950623A (en) * | 1988-08-02 | 1990-08-21 | Microelectronics Center Of North Carolina | Method of building solder bumps |
| US5024372A (en) * | 1989-01-03 | 1991-06-18 | Motorola, Inc. | Method of making high density solder bumps and a substrate socket for high density solder bumps |
| US4940181A (en) * | 1989-04-06 | 1990-07-10 | Motorola, Inc. | Pad grid array for receiving a solder bumped chip carrier |
| US5154341A (en) * | 1990-12-06 | 1992-10-13 | Motorola Inc. | Noncollapsing multisolder interconnection |
| US5152451A (en) * | 1991-04-01 | 1992-10-06 | Motorola, Inc. | Controlled solder oxidation process |
-
1991
- 1991-09-13 US US07/759,450 patent/US5162257A/en not_active Expired - Lifetime
-
1992
- 1992-08-07 US US07/927,069 patent/US5293006A/en not_active Expired - Lifetime
- 1992-09-11 CA CA002116766A patent/CA2116766C/en not_active Expired - Fee Related
- 1992-09-11 JP JP5506136A patent/JP2842692B2/ja not_active Expired - Fee Related
- 1992-09-11 WO PCT/US1992/007722 patent/WO1993006620A1/en not_active Ceased
- 1992-09-11 EP EP92919808A patent/EP0603296B1/en not_active Expired - Lifetime
- 1992-09-11 DE DE69221627T patent/DE69221627T2/de not_active Expired - Fee Related
- 1992-09-11 KR KR1019940700820A patent/KR0186061B1/ko not_active Expired - Fee Related
- 1992-09-11 AT AT92919808T patent/ATE156935T1/de not_active IP Right Cessation
- 1992-09-11 ES ES92919808T patent/ES2106194T3/es not_active Expired - Lifetime
- 1992-10-01 TW TW081107808A patent/TW200417B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| EP0603296B1 (en) | 1997-08-13 |
| TW200417B (es) | 1993-02-21 |
| DE69221627T2 (de) | 1998-01-08 |
| WO1993006620A1 (en) | 1993-04-01 |
| JP2842692B2 (ja) | 1999-01-06 |
| EP0603296A1 (en) | 1994-06-29 |
| JPH07502147A (ja) | 1995-03-02 |
| US5162257A (en) | 1992-11-10 |
| DE69221627D1 (de) | 1997-09-18 |
| CA2116766A1 (en) | 1993-04-01 |
| ATE156935T1 (de) | 1997-08-15 |
| KR0186061B1 (ko) | 1999-04-15 |
| KR940702644A (ko) | 1994-08-20 |
| US5293006A (en) | 1994-03-08 |
| CA2116766C (en) | 1999-02-16 |
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