ES2239404T3 - Aparato y procedimiento para la determinacion de la distorsion optica de un sustrato transparente. - Google Patents

Aparato y procedimiento para la determinacion de la distorsion optica de un sustrato transparente.

Info

Publication number
ES2239404T3
ES2239404T3 ES98945645T ES98945645T ES2239404T3 ES 2239404 T3 ES2239404 T3 ES 2239404T3 ES 98945645 T ES98945645 T ES 98945645T ES 98945645 T ES98945645 T ES 98945645T ES 2239404 T3 ES2239404 T3 ES 2239404T3
Authority
ES
Spain
Prior art keywords
light
reflected
substrate
beams
towards
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES98945645T
Other languages
English (en)
Spanish (es)
Inventor
Gerardo Hermosillo Valadez
Daniel Jimenez Farias
Alejandra Ramirez Ortiz
Nancy Gutierrez Garza
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IP Vitro Vidrio y Cristal Ltd
Original Assignee
IP Vitro Vidrio y Cristal Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by IP Vitro Vidrio y Cristal Ltd filed Critical IP Vitro Vidrio y Cristal Ltd
Application granted granted Critical
Publication of ES2239404T3 publication Critical patent/ES2239404T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
ES98945645T 1997-09-03 1998-09-03 Aparato y procedimiento para la determinacion de la distorsion optica de un sustrato transparente. Expired - Lifetime ES2239404T3 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/922,660 US5880843A (en) 1997-09-03 1997-09-03 Apparatus and method for determining the optical distortion of a transparent substrate
US922660 2001-08-06

Publications (1)

Publication Number Publication Date
ES2239404T3 true ES2239404T3 (es) 2005-09-16

Family

ID=25447401

Family Applications (1)

Application Number Title Priority Date Filing Date
ES98945645T Expired - Lifetime ES2239404T3 (es) 1997-09-03 1998-09-03 Aparato y procedimiento para la determinacion de la distorsion optica de un sustrato transparente.

Country Status (5)

Country Link
US (1) US5880843A (fr)
EP (1) EP1020719B1 (fr)
DE (1) DE69830323T2 (fr)
ES (1) ES2239404T3 (fr)
WO (1) WO1999012022A1 (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2001288641A1 (en) * 2000-09-01 2002-03-13 Mark M. Abbott Optical system for imaging distortions in moving reflective sheets
US6909502B2 (en) * 2001-12-27 2005-06-21 General Electric Method and apparatus for measuring ripple and distortion in a transparent material
JP4824541B2 (ja) * 2003-02-28 2011-11-30 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 面を検査するスキャタロメータ及び方法
US7142295B2 (en) * 2003-03-05 2006-11-28 Corning Incorporated Inspection of transparent substrates for defects
CN1326019C (zh) * 2003-12-05 2007-07-11 培新科技股份有限公司 光学信号影像撷取方法
US7345772B2 (en) * 2004-08-06 2008-03-18 Voith Paper Patent Gmbh Optical triangulation device and method of measuring a variable of a web using the device
US7339664B2 (en) 2004-09-29 2008-03-04 General Electric Company System and method for inspecting a light-management film and method of making the light-management film
US8553082B2 (en) * 2007-06-01 2013-10-08 University Of Miyazaki Distortion inspecting apparatus and distortion inspecting method
EP2578990B1 (fr) 2010-06-07 2022-07-20 AGC Inc. Dispositif et procédé de mesure de forme, et procédé de fabrication d'une plaque de verre
EP2584306B1 (fr) 2010-06-15 2019-01-16 AGC Inc. Dispositif de mesure de forme, procédé de mesure de forme, et procédé de fabrication de plaque de verre
KR102580487B1 (ko) * 2018-06-18 2023-09-21 주식회사 케이씨텍 패드 모니터링 장치 및 이를 포함하는 패드 모니터링 시스템, 패드 모니터링 방법
WO2020049971A1 (fr) * 2018-09-06 2020-03-12 日立オートモティブシステムズ株式会社 Procédé de mesure de surface, procédé de fabrication de composant, procédé d'inspection de composant et dispositif de mesure de composant

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3799679A (en) * 1972-06-27 1974-03-26 Ppg Industries Inc Glass distortion scanning system
US3788750A (en) * 1972-12-06 1974-01-29 Libbey Owens Ford Co Inspecting glass
US3857637A (en) * 1973-01-10 1974-12-31 Ppg Industries Inc Surface distortion analyzer
US3792930A (en) * 1973-05-31 1974-02-19 Ppg Industries Inc System for determining the nature of optical distortion in glass
US4272190A (en) * 1978-08-14 1981-06-09 Typalogics Optical measuring system
US4453827A (en) * 1981-08-28 1984-06-12 The United States Of America As Represented By The Secretary Of The Air Force Optical distortion analyzer system
US4585343A (en) * 1983-11-04 1986-04-29 Libbey-Owens-Ford Company Apparatus and method for inspecting glass
US4645337A (en) * 1984-10-31 1987-02-24 Ppg Industries, Inc. System for detecting variations in surface composition of an article
US5206700A (en) * 1985-03-14 1993-04-27 Diffracto, Ltd. Methods and apparatus for retroreflective surface inspection and distortion measurement
FR2591341B1 (fr) * 1985-12-10 1988-02-19 Saint Gobain Vitrage Technique de detection de defauts optiques sur ligne de production de verre
DE4035168A1 (de) * 1990-11-06 1992-05-07 Flachglas Ag Verfahren und vorrichtung zur bestimmung der optischen qualitaet einer transparenten platte
US5251010A (en) * 1991-06-07 1993-10-05 Glasstech, Inc. Optical roller wave gauge
FR2681429B1 (fr) * 1991-09-13 1995-05-24 Thomson Csf Procede et dispositif d'inspection du verre.
US5726749A (en) * 1996-09-20 1998-03-10 Libbey-Owens-Ford Co. Method and apparatus for inspection and evaluation of angular deviation and distortion defects for transparent sheets
US5724140A (en) * 1996-10-28 1998-03-03 Ford Motor Company Method and apparatus for determining the quality of flat glass sheet

Also Published As

Publication number Publication date
US5880843A (en) 1999-03-09
DE69830323D1 (de) 2005-06-30
WO1999012022A1 (fr) 1999-03-11
DE69830323T2 (de) 2005-11-17
EP1020719A1 (fr) 2000-07-19
EP1020719B1 (fr) 2005-05-25

Similar Documents

Publication Publication Date Title
ES2239404T3 (es) Aparato y procedimiento para la determinacion de la distorsion optica de un sustrato transparente.
CN1831519B (zh) 光泽测量装置以及光泽测量方法
JPH08184416A (ja) 容器仕上部形状パラメータの光学的検査
EP0766063B1 (fr) Mesure de paramètres de lentilles par la section optique
JPH0242307A (ja) 凸形物体の表面輪郭の表示装置及び表示方法
US6419387B1 (en) Method and device for the inspection of a material by thermal imaging
CN103415756A (zh) 玻璃瓶检查装置以及远心透镜单元
CN103189714A (zh) 用于测量镜子形状或镜表面形状的设备和方法
CN108291852A (zh) 用于确定手持式装置盖板玻璃中的应力的设备和方法
CN110260889A (zh) 一种手持式测距仪自动检定装置及其检定方法
US10161879B1 (en) Measurement of thickness, surface profile, and optical power of a transparent sheet
EP0338442B1 (fr) Procédé et dispositif pour le contrôle de surfaces à réflectance spéculaire
JP2681745B2 (ja) レーザ光を利用したスペックルパターンによる被計測物の上下および横移動量の測定方法。
JPH06281593A (ja) 表面検査方法及びその装置
JP2677351B2 (ja) 立体状被検体外面検査装置
RU2437058C2 (ru) Цифровой двухкоординатный динамический автоколлиматор
JP2870908B2 (ja) 透視歪の測定方法及びその装置
JPH01406A (ja) 試料形状測定装置
JP2001255230A (ja) レンズアレイの結像位置ずれ評価方法
CN119534455B (zh) 浮法玻璃的缺陷检测方法及装置
MXPA00001916A (es) Aparato y metodo para determinar la distorsion optica de un substrato transparente
JPS6264903A (ja) 形状計測方法およびその装置
RU2570835C2 (ru) Способ регистрации сечения профиля тоннеля и устройство для его осуществления
CN113689323B (zh) 外观检查方法及系统、检查方法及装置
JPH01212338A (ja) ガラス板の表面性状測定装置