IL119850A - Optical method and apparatus for detecting low frequency defects - Google Patents

Optical method and apparatus for detecting low frequency defects

Info

Publication number
IL119850A
IL119850A IL11985096A IL11985096A IL119850A IL 119850 A IL119850 A IL 119850A IL 11985096 A IL11985096 A IL 11985096A IL 11985096 A IL11985096 A IL 11985096A IL 119850 A IL119850 A IL 119850A
Authority
IL
Israel
Prior art keywords
optical object
point
optical
shadow pattern
low frequency
Prior art date
Application number
IL11985096A
Other languages
English (en)
Other versions
IL119850A0 (en
Inventor
Vokhmin Peter
Original Assignee
Prolaser Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Prolaser Ltd filed Critical Prolaser Ltd
Priority to IL11985096A priority Critical patent/IL119850A/xx
Publication of IL119850A0 publication Critical patent/IL119850A0/xx
Priority to AT97308168T priority patent/ATE221650T1/de
Priority to ES97308168T priority patent/ES2180901T3/es
Priority to DE69714401T priority patent/DE69714401T2/de
Priority to EP97308168A priority patent/EP0856728B1/de
Priority to US08/967,305 priority patent/US6075591A/en
Publication of IL119850A publication Critical patent/IL119850A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
IL11985096A 1996-12-17 1996-12-17 Optical method and apparatus for detecting low frequency defects IL119850A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
IL11985096A IL119850A (en) 1996-12-17 1996-12-17 Optical method and apparatus for detecting low frequency defects
AT97308168T ATE221650T1 (de) 1996-12-17 1997-10-15 Optisches verfahren und vorrichtung zum erkennen von fehlstellen
ES97308168T ES2180901T3 (es) 1996-12-17 1997-10-15 Procedimiento para la inspeccion de un objeto optico y un aparato para la inspeccion de dicho objeto optico.
DE69714401T DE69714401T2 (de) 1996-12-17 1997-10-15 Optisches Verfahren und Vorrichtung zum Erkennen von Fehlstellen
EP97308168A EP0856728B1 (de) 1996-12-17 1997-10-15 Optisches Verfahren und Vorrichtung zum Erkennen von Fehlstellen
US08/967,305 US6075591A (en) 1996-12-17 1997-10-21 Optical method and apparatus for detecting low frequency defects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL11985096A IL119850A (en) 1996-12-17 1996-12-17 Optical method and apparatus for detecting low frequency defects

Publications (2)

Publication Number Publication Date
IL119850A0 IL119850A0 (en) 1997-03-18
IL119850A true IL119850A (en) 2000-11-21

Family

ID=11069591

Family Applications (1)

Application Number Title Priority Date Filing Date
IL11985096A IL119850A (en) 1996-12-17 1996-12-17 Optical method and apparatus for detecting low frequency defects

Country Status (6)

Country Link
US (1) US6075591A (de)
EP (1) EP0856728B1 (de)
AT (1) ATE221650T1 (de)
DE (1) DE69714401T2 (de)
ES (1) ES2180901T3 (de)
IL (1) IL119850A (de)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2807522B1 (fr) * 2000-04-07 2002-06-14 Aerospatiale Matra Airbus Dispositif pour determiner les valeurs d'au moins un parametre de particules, notamment de gouttelettes d'eau
US6671039B2 (en) * 2000-06-22 2003-12-30 Hoya Corporation Spectacle lens image sensing processing apparatus and spectacle lens positioning method
US6661506B2 (en) * 2000-08-24 2003-12-09 Og Technologies, Inc. Engine bearing inspection system
US7023542B2 (en) * 2002-04-03 2006-04-04 3M Innovative Properties Company Imaging method and apparatus
US7142295B2 (en) * 2003-03-05 2006-11-28 Corning Incorporated Inspection of transparent substrates for defects
GB0307345D0 (en) * 2003-03-29 2003-05-07 Pilkington Plc Glazing inspection
US7295330B2 (en) * 2003-07-11 2007-11-13 Chow Peter P Film mapping system
US7715023B2 (en) 2004-03-31 2010-05-11 Kabushiki Kaisha Topcon Jig mounting apparatus
EP1605241A1 (de) 2004-06-09 2005-12-14 Automation & Robotics Apparat zur optischen Kontrolle von transparenten oder reflektierenden Proben
US20090174554A1 (en) 2005-05-11 2009-07-09 Eric Bergeron Method and system for screening luggage items, cargo containers or persons
US7991242B2 (en) 2005-05-11 2011-08-02 Optosecurity Inc. Apparatus, method and system for screening receptacles and persons, having image distortion correction functionality
US7899232B2 (en) 2006-05-11 2011-03-01 Optosecurity Inc. Method and apparatus for providing threat image projection (TIP) in a luggage screening system, and luggage screening system implementing same
US8494210B2 (en) 2007-03-30 2013-07-23 Optosecurity Inc. User interface for use in security screening providing image enhancement capabilities and apparatus for implementing same
DE102006051538B4 (de) * 2006-10-27 2009-04-09 Schott Ag Verfahren und Vorrichtung zur Bestimmung der Waviness von Glasscheiben
JP4970149B2 (ja) * 2007-05-31 2012-07-04 株式会社ニデック カップ取付け装置
US20110193954A1 (en) * 2010-02-08 2011-08-11 Sunrise Optical Llc Apparatus for the measurement of the topography and photoelectric properties of transparent surfaces
JP2012243805A (ja) * 2011-05-16 2012-12-10 Toshiba Corp パターン形成方法
DE102011078833A1 (de) * 2011-07-07 2013-01-10 3D-Micromac Ag Verfahren und Vorrichtung zum Detektieren einer Markierung an einem Objekt
ES2675308T3 (es) 2011-09-07 2018-07-10 Rapiscan Systems, Inc. Sistema de inspección de rayos X que integra datos de manifiesto con procesamiento de obtención de imágenes/detección
DE102011119806B4 (de) * 2011-11-25 2020-10-15 Carl Zeiss Vision International Gmbh Verfahren und Vorrichtung zum Sichtbarmachen eines Signierzeichens auf einem Brillenglas
FR3017963B1 (fr) 2014-02-27 2016-03-25 Essilor Int Instrument optique pour identifier et localiser des microgravures presentes sur une lentille ophtalmique
FR3017964B1 (fr) 2014-02-27 2016-03-25 Essilor Int Instrument optique pour reperer au moins un point caracteristique d'une lentille ophtalmique
DE102015115735B3 (de) * 2015-09-17 2017-03-23 Carl Zeiss Vision International Gmbh Vorrichtung und Verfahren zum Sichtbarmachen eines Signierzeichens auf einem Brillenglas
MY194719A (en) * 2016-02-05 2022-12-15 Toray Industries Inspection device for sheet object, and inspection method for sheet object
EP3772702A3 (de) 2016-02-22 2021-05-19 Rapiscan Systems, Inc. Verfahren zur verarbeitung radiographischer bilder
DE102024129287A1 (de) 2024-10-10 2026-04-16 Carl Zeiss Jena Gmbh Inspektionsverfahren und inspektionssystem zum prüfen auf phasenverschiebende defekte und herstellungsverfahren
DE102024129286A1 (de) 2024-10-10 2026-04-16 Carl Zeiss Jena Gmbh Inspektionsverfahren, herstellungsverfahren und inspektionssystem

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3743431A (en) * 1972-05-09 1973-07-03 Philco Ford Corp Radiation sensitive means for detecting flaws in glass
GB1403911A (en) * 1972-07-26 1975-08-28 Sira Institute Method and apparatus for testing optical components
IL63264A (en) * 1980-11-04 1986-07-31 Israel Atomic Energy Comm Topographical mapping system and method
US4547073A (en) * 1981-02-17 1985-10-15 Matsushita Electric Industrial Co., Ltd. Surface examining apparatus and method
DE3237511A1 (de) * 1982-10-09 1984-04-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Verfahren zur pruefung von glaserzeugnissen
DE3406066A1 (de) * 1984-02-20 1985-08-22 Siemens AG, 1000 Berlin und 8000 München Anordnung zur optischen erfassung raeumlicher unebenheiten in der struktur eines zu untersuchenden objekts
US4810895A (en) * 1987-01-13 1989-03-07 Rotlex Optics Ltd. Method and apparatus for optical examination of an object particularly by moire ray deflection mapping
DE3816392A1 (de) * 1988-05-13 1989-11-23 Ver Glaswerke Gmbh Verfahren zur bestimmung der optischen qualitaet von flachglas oder flachglasprodukten
DE3838954A1 (de) * 1988-11-17 1990-05-23 Siemens Ag Optikanordnung zur dreidimensionalen formerfassung
DE3926349A1 (de) * 1989-08-09 1991-02-14 Sick Optik Elektronik Erwin Optische fehlerinspektionsvorrichtung
US5309222A (en) * 1991-07-16 1994-05-03 Mitsubishi Denki Kabushiki Kaisha Surface undulation inspection apparatus

Also Published As

Publication number Publication date
US6075591A (en) 2000-06-13
EP0856728A2 (de) 1998-08-05
IL119850A0 (en) 1997-03-18
DE69714401D1 (de) 2002-09-05
DE69714401T2 (de) 2003-09-18
ATE221650T1 (de) 2002-08-15
ES2180901T3 (es) 2003-02-16
EP0856728A3 (de) 1998-09-09
EP0856728B1 (de) 2002-07-31

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Legal Events

Date Code Title Description
FF Patent granted
KB Patent renewed
KB Patent renewed
MM9K Patent not in force due to non-payment of renewal fees