IL99303A - A laser from a wave router buried in a variable structure and a method for its production - Google Patents
A laser from a wave router buried in a variable structure and a method for its productionInfo
- Publication number
- IL99303A IL99303A IL9930391A IL9930391A IL99303A IL 99303 A IL99303 A IL 99303A IL 9930391 A IL9930391 A IL 9930391A IL 9930391 A IL9930391 A IL 9930391A IL 99303 A IL99303 A IL 99303A
- Authority
- IL
- Israel
- Prior art keywords
- ridge
- lateral
- active region
- laser structure
- confining
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title description 13
- 239000000463 material Substances 0.000 claims description 81
- 230000004888 barrier function Effects 0.000 claims description 37
- 238000002513 implantation Methods 0.000 claims description 29
- 238000005253 cladding Methods 0.000 claims description 27
- 239000002800 charge carrier Substances 0.000 claims description 21
- 238000000034 method Methods 0.000 claims description 20
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 17
- 150000002500 ions Chemical class 0.000 claims description 16
- 239000000758 substrate Substances 0.000 claims description 15
- 230000003287 optical effect Effects 0.000 claims description 13
- 238000000137 annealing Methods 0.000 claims description 8
- 239000004065 semiconductor Substances 0.000 claims description 8
- 230000007480 spreading Effects 0.000 claims description 8
- 238000003892 spreading Methods 0.000 claims description 8
- 230000015556 catabolic process Effects 0.000 claims description 4
- 238000006731 degradation reaction Methods 0.000 claims description 4
- 238000010438 heat treatment Methods 0.000 claims description 4
- 238000005468 ion implantation Methods 0.000 claims description 4
- 230000005684 electric field Effects 0.000 claims description 3
- 239000011149 active material Substances 0.000 claims 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 claims 1
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 claims 1
- 238000005530 etching Methods 0.000 claims 1
- 239000010410 layer Substances 0.000 description 67
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 12
- 238000009792 diffusion process Methods 0.000 description 12
- 239000002019 doping agent Substances 0.000 description 9
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 7
- 229910052782 aluminium Inorganic materials 0.000 description 7
- 239000007943 implant Substances 0.000 description 5
- 230000012010 growth Effects 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000002310 reflectometry Methods 0.000 description 4
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 239000000969 carrier Substances 0.000 description 3
- 238000004943 liquid phase epitaxy Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 239000011701 zinc Substances 0.000 description 3
- 229910052725 zinc Inorganic materials 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000005465 channeling Effects 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000001451 molecular beam epitaxy Methods 0.000 description 2
- 125000002524 organometallic group Chemical group 0.000 description 2
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003574 free electron Substances 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000010849 ion bombardment Methods 0.000 description 1
- 238000001741 metal-organic molecular beam epitaxy Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 239000002674 ointment Substances 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000000927 vapour-phase epitaxy Methods 0.000 description 1
- 238000003631 wet chemical etching Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/026—Monolithically integrated components, e.g. waveguides, monitoring photo-detectors, drivers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/026—Monolithically integrated components, e.g. waveguides, monitoring photo-detectors, drivers
- H01S5/0261—Non-optical elements, e.g. laser driver components, heaters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2301/00—Functional characteristics
- H01S2301/17—Semiconductor lasers comprising special layers
- H01S2301/176—Specific passivation layers on surfaces other than the emission facet
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04256—Electrodes, e.g. characterised by the structure characterised by the configuration
- H01S5/04257—Electrodes, e.g. characterised by the structure characterised by the configuration having positive and negative electrodes on the same side of the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2054—Methods of obtaining the confinement
- H01S5/2059—Methods of obtaining the confinement by means of particular conductivity zones, e.g. obtained by particle bombardment or diffusion
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
- H01S5/2213—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers based on polyimide or resin
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/227—Buried mesa structure ; Striped active layer
- H01S5/2275—Buried mesa structure ; Striped active layer mesa created by etching
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Geometry (AREA)
- Nanotechnology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/582,300 US5138626A (en) | 1990-09-12 | 1990-09-12 | Ridge-waveguide buried-heterostructure laser and method of fabrication |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| IL99303A0 IL99303A0 (en) | 1992-07-15 |
| IL99303A true IL99303A (en) | 1994-05-30 |
Family
ID=24328603
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IL9930391A IL99303A (en) | 1990-09-12 | 1991-08-26 | A laser from a wave router buried in a variable structure and a method for its production |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5138626A (ja) |
| EP (1) | EP0475330B1 (ja) |
| JP (1) | JPH04234189A (ja) |
| DE (1) | DE69105079T2 (ja) |
| IL (1) | IL99303A (ja) |
Families Citing this family (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2674684A1 (fr) * | 1991-03-28 | 1992-10-02 | Alcatel Nv | Procede de realisation d'un composant semiconducteur tel qu'un laser a ruban enterre. |
| US5307357A (en) * | 1992-11-05 | 1994-04-26 | International Business Machines Corporation | Protection means for ridge waveguide laser structures using thick organic films |
| JPH08107253A (ja) * | 1994-08-12 | 1996-04-23 | Mitsubishi Electric Corp | 光導波路,半導体レーザ・導波路集積装置,半導体レーザ・導波路・フォトダイオード集積装置,半導体レーザ・導波路・モード整合集積装置,モード整合素子,及びその製造方法 |
| DE69510529T2 (de) * | 1994-10-06 | 1999-11-25 | Uniphase Opto Holdings Inc., San Jose | Strahlungsemittierende halbleiter-diode und herstellungsverfahren |
| JPH10233556A (ja) * | 1997-02-20 | 1998-09-02 | Mitsubishi Electric Corp | リッジ型半導体レーザダイオードとその製造方法 |
| US5912607A (en) * | 1997-09-12 | 1999-06-15 | American Superconductor Corporation | Fault current limiting superconducting coil |
| US6365968B1 (en) | 1998-08-07 | 2002-04-02 | Corning Lasertron, Inc. | Polyimide/silicon oxide bi-layer for bond pad parasitic capacitance control in semiconductor electro-optical device |
| EP1218973A4 (en) * | 1999-09-03 | 2005-11-16 | Univ California | TUNABLE LASER SOURCE WITH INTEGRATED OPTICAL MODULATOR |
| US6757313B1 (en) * | 1999-11-12 | 2004-06-29 | Trumpf Photonics Inc. | Control of current spreading in semiconductor laser diodes |
| WO2001035506A1 (en) * | 1999-11-12 | 2001-05-17 | Princeton Lightwave, Inc. | Control of current spreading in semiconductor laser diodes |
| GB0018576D0 (en) | 2000-07-27 | 2000-09-13 | Univ Glasgow | Improved semiconductor laser |
| US6878562B2 (en) | 2000-10-20 | 2005-04-12 | Phosistor Technologies, Incorporated | Method for shifting the bandgap energy of a quantum well layer |
| GB2371406A (en) * | 2001-01-23 | 2002-07-24 | Univ Glasgow | An Optically Active Device |
| US6649940B2 (en) | 2001-06-29 | 2003-11-18 | The Board Of Trustees Of The University Of Illinois | Separate lateral confinement quantum well laser |
| KR100427581B1 (ko) * | 2002-02-21 | 2004-04-28 | 한국전자통신연구원 | 반도체 광소자의 제조방법 |
| KR100499128B1 (ko) * | 2002-07-19 | 2005-07-04 | 삼성전기주식회사 | 전류제한층이 형성된 반도체 레이저 다이오드 및 그제조방법 |
| US6845116B2 (en) * | 2002-10-24 | 2005-01-18 | Wisconsin Alumni Research Foundation | Narrow lateral waveguide laser |
| WO2005011072A1 (en) * | 2003-06-24 | 2005-02-03 | Emcore Corporation | Mechanical protection for semiconductor edge-emitting ridge waveguide lasers |
| CN1879266A (zh) * | 2003-11-06 | 2006-12-13 | 波科海姆技术公共有限公司 | 高温激光二极管 |
| JP5028640B2 (ja) * | 2004-03-26 | 2012-09-19 | 日亜化学工業株式会社 | 窒化物半導体レーザ素子 |
| US8768132B2 (en) * | 2008-01-14 | 2014-07-01 | Hewlett-Packard Development Company, L.P. | Ridge waveguide |
| KR100909974B1 (ko) * | 2008-10-13 | 2009-07-30 | (주)엘디스 | 파장분할 통신용 반도체 레이저 다이오드와 그 제작 방법 |
| US7983317B2 (en) | 2008-12-16 | 2011-07-19 | Corning Incorporated | MQW laser structure comprising plural MQW regions |
| JP5323553B2 (ja) * | 2009-03-26 | 2013-10-23 | 古河電気工業株式会社 | 半導体光増幅素子 |
| KR101003970B1 (ko) | 2010-05-19 | 2010-12-31 | 조호성 | 굴절률 가둠식 스트라이프형 반도체 레이저 다이오드 및 그 제조방법 |
| US20120114001A1 (en) * | 2010-11-10 | 2012-05-10 | Fang Alexander W | Hybrid ridge waveguide |
| JP2014170825A (ja) * | 2013-03-04 | 2014-09-18 | Sumitomo Electric Ind Ltd | 量子カスケード半導体レーザ |
| US9726818B1 (en) | 2013-05-30 | 2017-08-08 | Hrl Laboratories, Llc | Multi-wavelength band optical phase and amplitude controller |
| CN105226145B (zh) * | 2014-06-23 | 2019-05-31 | 中国科学院物理研究所 | 量子阱结构、发光二极管外延结构及发光二极管 |
| US12519288B2 (en) | 2020-05-26 | 2026-01-06 | Brolis Sensor Technology, Uab | Optoelectronic devices with tunable optical mode and carrier distribution in the waveguides |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5763882A (en) * | 1980-10-06 | 1982-04-17 | Nec Corp | Manufacture of semiconductor laser |
| JPS61251090A (ja) * | 1985-04-30 | 1986-11-08 | Nippon Telegr & Teleph Corp <Ntt> | 半導体レ−ザおよびその製造方法 |
| US4731789A (en) * | 1985-05-13 | 1988-03-15 | Xerox Corporation | Clad superlattice semiconductor laser |
| JPS61296783A (ja) * | 1985-06-26 | 1986-12-27 | Hitachi Ltd | 半導体レ−ザ装置 |
| US4827483A (en) * | 1985-08-12 | 1989-05-02 | Hitachi, Ltd. | Semiconductor laser device and method of fabricating the same |
| US4932033A (en) * | 1986-09-26 | 1990-06-05 | Canon Kabushiki Kaisha | Semiconductor laser having a lateral p-n junction utilizing inclined surface and method of manufacturing same |
| JPS63299186A (ja) * | 1987-05-29 | 1988-12-06 | Hitachi Ltd | 発光素子 |
| US4802182A (en) * | 1987-11-05 | 1989-01-31 | Xerox Corporation | Monolithic two dimensional waveguide coupled cavity laser/modulator |
| US4961197A (en) * | 1988-09-07 | 1990-10-02 | Hitachi, Ltd. | Semiconductor laser device |
| US4990466A (en) * | 1988-11-01 | 1991-02-05 | Siemens Corporate Research, Inc. | Method for fabricating index-guided semiconductor laser |
| US5022036A (en) * | 1988-12-29 | 1991-06-04 | Sharp Kabushiki Kaisha | Semiconductor laser device |
| JPH02194587A (ja) * | 1989-01-23 | 1990-08-01 | Nec Corp | 半導体レーザの製造方法 |
| JPH02203583A (ja) * | 1989-02-01 | 1990-08-13 | Furukawa Electric Co Ltd:The | リッジ導波路型半導体レーザ素子の製造方法 |
-
1990
- 1990-09-12 US US07/582,300 patent/US5138626A/en not_active Expired - Lifetime
-
1991
- 1991-08-26 IL IL9930391A patent/IL99303A/en not_active IP Right Cessation
- 1991-09-09 EP EP91115219A patent/EP0475330B1/en not_active Expired - Lifetime
- 1991-09-09 DE DE69105079T patent/DE69105079T2/de not_active Expired - Fee Related
- 1991-09-10 JP JP3257176A patent/JPH04234189A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP0475330A2 (en) | 1992-03-18 |
| JPH04234189A (ja) | 1992-08-21 |
| DE69105079D1 (de) | 1994-12-15 |
| IL99303A0 (en) | 1992-07-15 |
| EP0475330A3 (en) | 1992-04-29 |
| DE69105079T2 (de) | 1995-03-09 |
| US5138626A (en) | 1992-08-11 |
| EP0475330B1 (en) | 1994-11-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RH | Patent void |