IT8019615A0 - Processo per la fabbricazione di circuiti integrati. - Google Patents

Processo per la fabbricazione di circuiti integrati.

Info

Publication number
IT8019615A0
IT8019615A0 IT8019615A IT1961580A IT8019615A0 IT 8019615 A0 IT8019615 A0 IT 8019615A0 IT 8019615 A IT8019615 A IT 8019615A IT 1961580 A IT1961580 A IT 1961580A IT 8019615 A0 IT8019615 A0 IT 8019615A0
Authority
IT
Italy
Prior art keywords
manufacture
integrated circuits
circuits
integrated
Prior art date
Application number
IT8019615A
Other languages
English (en)
Other versions
IT1151001B (it
Inventor
Ray Asit Kumar
Reisman Arnold
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of IT8019615A0 publication Critical patent/IT8019615A0/it
Application granted granted Critical
Publication of IT1151001B publication Critical patent/IT1151001B/it

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/69Inorganic materials
    • H10P14/692Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
    • H10P14/6921Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
    • H10P14/69215Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material being a silicon oxide, e.g. SiO2
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C8/00Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
    • C23C8/06Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases
    • C23C8/36Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases using ionised gases, e.g. ionitriding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/63Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
    • H10P14/6302Non-deposition formation processes
    • H10P14/6319Formation by plasma treatments, e.g. plasma oxidation of the substrate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/63Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
    • H10P14/6302Non-deposition formation processes
    • H10P14/6304Formation by oxidation, e.g. oxidation of the substrate
    • H10P14/6306Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials
    • H10P14/6308Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials of Group IV semiconductors
    • H10P14/6309Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials of Group IV semiconductors of silicon in uncombined form, i.e. pure silicon

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Formation Of Insulating Films (AREA)
  • Chemical Vapour Deposition (AREA)
IT19615/80A 1979-03-01 1980-02-01 Processo per la fabbricazione di circuiti integrati IT1151001B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/016,648 US4232057A (en) 1979-03-01 1979-03-01 Semiconductor plasma oxidation

Publications (2)

Publication Number Publication Date
IT8019615A0 true IT8019615A0 (it) 1980-02-01
IT1151001B IT1151001B (it) 1986-12-17

Family

ID=21778221

Family Applications (1)

Application Number Title Priority Date Filing Date
IT19615/80A IT1151001B (it) 1979-03-01 1980-02-01 Processo per la fabbricazione di circuiti integrati

Country Status (6)

Country Link
US (1) US4232057A (it)
EP (1) EP0016909B1 (it)
JP (1) JPS55118639A (it)
CA (1) CA1124409A (it)
DE (1) DE3060785D1 (it)
IT (1) IT1151001B (it)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4409260A (en) * 1979-08-15 1983-10-11 Hughes Aircraft Company Process for low-temperature surface layer oxidation of a semiconductor substrate
JPS6029295B2 (ja) * 1979-08-16 1985-07-10 舜平 山崎 非単結晶被膜形成法
JPS5662328A (en) * 1979-10-26 1981-05-28 Agency Of Ind Science & Technol Manufacturing of insulation membrane and insulation membrane-semiconductor interface
US4371587A (en) * 1979-12-17 1983-02-01 Hughes Aircraft Company Low temperature process for depositing oxide layers by photochemical vapor deposition
US4323589A (en) * 1980-05-07 1982-04-06 International Business Machines Corporation Plasma oxidation
US4421592A (en) * 1981-05-22 1983-12-20 United Technologies Corporation Plasma enhanced deposition of semiconductors
US4474829A (en) * 1981-11-23 1984-10-02 Hughes Aircraft Company Low-temperature charge-free process for forming native oxide layers
JPS59111333A (ja) * 1982-12-09 1984-06-27 インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション SiO領域をSiO↓2領域に変換してSiO↓2領を形成する方法
NL8300422A (nl) * 1983-02-04 1984-09-03 Philips Nv Methode voor de vervaardiging van een optisch uitleesbare informatieschijf.
US4474828A (en) * 1983-03-30 1984-10-02 Sperry Corporation Method of controlling the supercurrent of a Josephson junction device
US4510172A (en) * 1984-05-29 1985-04-09 International Business Machines Corporation Technique for thin insulator growth
US4599247A (en) * 1985-01-04 1986-07-08 Texas Instruments Incorporated Semiconductor processing facility for providing enhanced oxidation rate
FR2587729B1 (fr) * 1985-09-24 1988-12-23 Centre Nat Rech Scient Procede et dispositif de traitement chimique, notamment de traitement thermochimique et de depot chimique dans un plasma homogene de grand volume
JPS62227089A (ja) * 1986-03-27 1987-10-06 Anelva Corp 表面処理方法および装置
FR2618796B1 (fr) * 1987-07-27 1993-02-05 Centre Nat Rech Scient Procede de traitement de surfaces, utilisant une post-decharge electrique dans un gaz en ecoulement et dispositif pour la mise en oeuvre de ce procede
FR2652591B1 (fr) * 1989-10-03 1993-10-08 Framatome Procede d'oxydation superficielle d'une piece en metal passivable, et elements d'assemblage combustible en alliage metallique revetus d'une couche d'oxyde protectrice.
US5039625A (en) * 1990-04-27 1991-08-13 Mcnc Maximum areal density recessed oxide isolation (MADROX) process
JP2519364B2 (ja) * 1990-12-03 1996-07-31 アプライド マテリアルズ インコーポレイテッド Uhf/vhf共振アンテナ供給源を用いたプラズマリアクタ
WO2002075801A2 (en) * 2000-11-07 2002-09-26 Tokyo Electron Limited Method of fabricating oxides with low defect densities
US7273638B2 (en) * 2003-01-07 2007-09-25 International Business Machines Corp. High density plasma oxidation
CN101451237B (zh) 2007-11-30 2012-02-08 中微半导体设备(上海)有限公司 具有多个等离子体反应区域的包括多个处理平台的等离子体反应室
US7974119B2 (en) 2008-07-10 2011-07-05 Seagate Technology Llc Transmission gate-based spin-transfer torque memory unit
US7936580B2 (en) 2008-10-20 2011-05-03 Seagate Technology Llc MRAM diode array and access method
US9030867B2 (en) 2008-10-20 2015-05-12 Seagate Technology Llc Bipolar CMOS select device for resistive sense memory
US7936583B2 (en) 2008-10-30 2011-05-03 Seagate Technology Llc Variable resistive memory punchthrough access method
US7825478B2 (en) 2008-11-07 2010-11-02 Seagate Technology Llc Polarity dependent switch for resistive sense memory
US8178864B2 (en) 2008-11-18 2012-05-15 Seagate Technology Llc Asymmetric barrier diode
US8203869B2 (en) 2008-12-02 2012-06-19 Seagate Technology Llc Bit line charge accumulation sensing for resistive changing memory
US8159856B2 (en) 2009-07-07 2012-04-17 Seagate Technology Llc Bipolar select device for resistive sense memory
US8158964B2 (en) 2009-07-13 2012-04-17 Seagate Technology Llc Schottky diode switch and memory units containing the same
US8183126B2 (en) 2009-07-13 2012-05-22 Seagate Technology Llc Patterning embedded control lines for vertically stacked semiconductor elements
US8617952B2 (en) 2010-09-28 2013-12-31 Seagate Technology Llc Vertical transistor with hardening implatation
US8648426B2 (en) 2010-12-17 2014-02-11 Seagate Technology Llc Tunneling transistors

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3108900A (en) * 1959-04-13 1963-10-29 Cornelius A Papp Apparatus and process for producing coatings on metals
DE1289382B (de) * 1963-08-16 1969-02-13 Licentia Gmbh Verfahren zur Oxydation eines Silizium-Halbleiterkoerpers
FR1403466A (fr) * 1963-08-16 1965-06-18 Licentia Gmbh Procédé d'oxydation de silicium ou d'une disposition de semi-conducteurs comportant une ou plusieurs transitions pn
GB1104935A (en) * 1964-05-08 1968-03-06 Standard Telephones Cables Ltd Improvements in or relating to a method of forming a layer of an inorganic compound
US3424661A (en) * 1966-09-01 1969-01-28 Bell Telephone Labor Inc Method of conducting chemical reactions in a glow discharge
US3615956A (en) * 1969-03-27 1971-10-26 Signetics Corp Gas plasma vapor etching process
JPS4960484A (it) * 1972-10-12 1974-06-12
US3920483A (en) * 1974-11-25 1975-11-18 Ibm Method of ion implantation through a photoresist mask
US4123663A (en) * 1975-01-22 1978-10-31 Tokyo Shibaura Electric Co., Ltd. Gas-etching device
GB1550853A (en) * 1975-10-06 1979-08-22 Hitachi Ltd Apparatus and process for plasma treatment
US4138306A (en) * 1976-08-31 1979-02-06 Tokyo Shibaura Electric Co., Ltd. Apparatus for the treatment of semiconductors

Also Published As

Publication number Publication date
DE3060785D1 (en) 1982-10-28
JPS55118639A (en) 1980-09-11
US4232057A (en) 1980-11-04
IT1151001B (it) 1986-12-17
CA1124409A (en) 1982-05-25
EP0016909A1 (fr) 1980-10-15
EP0016909B1 (fr) 1982-09-01

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