JPH01123364U - - Google Patents

Info

Publication number
JPH01123364U
JPH01123364U JP2013688U JP2013688U JPH01123364U JP H01123364 U JPH01123364 U JP H01123364U JP 2013688 U JP2013688 U JP 2013688U JP 2013688 U JP2013688 U JP 2013688U JP H01123364 U JPH01123364 U JP H01123364U
Authority
JP
Japan
Prior art keywords
impurity semiconductor
semiconductor layer
insulator layer
layer formed
mos capacitor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2013688U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2013688U priority Critical patent/JPH01123364U/ja
Publication of JPH01123364U publication Critical patent/JPH01123364U/ja
Pending legal-status Critical Current

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  • Semiconductor Integrated Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例によるMOSキヤ
パシタの断面図、第2図は従来のMOSキヤパシ
タの断面図である。 図中、1は金属電極、2は第1の絶縁体層、3
は不純物半導体基板、4はトレンチ絶縁体層であ
る。なお、図中、同一符号は同一、または相当部
分を示す。
FIG. 1 is a sectional view of a MOS capacitor according to an embodiment of this invention, and FIG. 2 is a sectional view of a conventional MOS capacitor. In the figure, 1 is a metal electrode, 2 is a first insulator layer, and 3 is a metal electrode.
4 is an impurity semiconductor substrate, and 4 is a trench insulator layer. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 不純物半導体層の上部に形成される第1の絶縁
体層と、前記不純物半導体層を穿孔しこの穿孔を
充満するように形成される第2の絶縁体層と、上
記第1および第2の絶縁体層の上に、予め、位置
が変更できるように電極を形成することにより、
同一のマスクを用いて種々の容量を設定すること
が可能であることを特徴とするMOSキヤパシタ
a first insulator layer formed on top of the impurity semiconductor layer; a second insulator layer formed to drill through the impurity semiconductor layer and fill the hole; and the first and second insulators. By forming electrodes in advance on the body layer so that their positions can be changed,
A MOS capacitor characterized in that various capacitances can be set using the same mask.
JP2013688U 1988-02-17 1988-02-17 Pending JPH01123364U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013688U JPH01123364U (en) 1988-02-17 1988-02-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013688U JPH01123364U (en) 1988-02-17 1988-02-17

Publications (1)

Publication Number Publication Date
JPH01123364U true JPH01123364U (en) 1989-08-22

Family

ID=31236250

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013688U Pending JPH01123364U (en) 1988-02-17 1988-02-17

Country Status (1)

Country Link
JP (1) JPH01123364U (en)

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