JPH0312437U - - Google Patents

Info

Publication number
JPH0312437U
JPH0312437U JP7394489U JP7394489U JPH0312437U JP H0312437 U JPH0312437 U JP H0312437U JP 7394489 U JP7394489 U JP 7394489U JP 7394489 U JP7394489 U JP 7394489U JP H0312437 U JPH0312437 U JP H0312437U
Authority
JP
Japan
Prior art keywords
guard
stage structure
wafer
shield
suction tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7394489U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7394489U priority Critical patent/JPH0312437U/ja
Publication of JPH0312437U publication Critical patent/JPH0312437U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Jigs For Machine Tools (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例であるステージ構
造を示す正面図およびテスト回路接続図、第2図
は第1図のウエハチヤツク部分の拡大図、第3図
はこの考案のリーク電流の流れの説明図、第4図
は従来のステージ構造を示す正面図、第5図は従
来のリーク電流の流れの説明図である。 図において、1……最上段ステージ、2,4…
…絶縁板、3……ガード、5……シールド、6…
…ウエハ吸着用チユーブ、7……測定器、8……
電流計を示す。なお、図中、同一符号は同一、ま
たは相当部分を示す。
Fig. 1 is a front view and test circuit connection diagram showing the stage structure as an embodiment of this invention, Fig. 2 is an enlarged view of the wafer chuck part of Fig. 1, and Fig. 3 shows the flow of leakage current in this invention. FIG. 4 is a front view showing a conventional stage structure, and FIG. 5 is an explanatory diagram of a conventional flow of leakage current. In the figure, 1...the top stage, 2, 4...
...Insulating plate, 3... Guard, 5... Shield, 6...
...Wafer suction tube, 7...Measuring device, 8...
Ammeter is shown. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体ウエハをテストするために使用するウエ
ハチヤツクにおいて、ウエハ吸着用のチユーブを
ガード又はその下のシルド又はグランドに取付た
ことを特徴とするウエハチヤツクのステージ構造
。
A stage structure for a wafer chuck used for testing semiconductor wafers, characterized in that a wafer suction tube is attached to a guard or a shield or ground below the guard.
JP7394489U 1989-06-22 1989-06-22 Pending JPH0312437U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7394489U JPH0312437U (en) 1989-06-22 1989-06-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7394489U JPH0312437U (en) 1989-06-22 1989-06-22

Publications (1)

Publication Number Publication Date
JPH0312437U true JPH0312437U (en) 1991-02-07

Family

ID=31613201

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7394489U Pending JPH0312437U (en) 1989-06-22 1989-06-22

Country Status (1)

Country Link
JP (1) JPH0312437U (en)

Similar Documents

Publication Publication Date Title
JPH01165643U (en)
JPS6322739U (en)
JPH02128575U (en)
JPH0455584U (en)
JPS63106138U (en)
JPH0395645U (en)
JPH0371625U (en)
JPH0213732U (en)
JPS649421U (en)
JPS5942707Y2 (en) Handling device electrode
JPH0453571U (en)
JPH0323368U (en)
JPS58127369U (en) Measuring device for PNP transistor
JPS6397237U (en)
JPS6027435U (en) Semiconductor substrate measuring device
JPH0430734U (en)
JPH0459147U (en)
JPS61164039U (en)
JPS6236531U (en)
JPH042036U (en)
JPH0421972U (en)
JPS63148864U (en)
JPS584081U (en) Semiconductor device testing equipment
JPS62173063U (en)
JPS6336044U (en)