JPH042020A - Manufacture of vacuum interrupter - Google Patents
Manufacture of vacuum interrupterInfo
- Publication number
- JPH042020A JPH042020A JP10267990A JP10267990A JPH042020A JP H042020 A JPH042020 A JP H042020A JP 10267990 A JP10267990 A JP 10267990A JP 10267990 A JP10267990 A JP 10267990A JP H042020 A JPH042020 A JP H042020A
- Authority
- JP
- Japan
- Prior art keywords
- vacuum interrupter
- brazing
- soldering
- side member
- members
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 239000000463 material Substances 0.000 claims abstract description 56
- 229910052751 metal Inorganic materials 0.000 claims abstract description 40
- 239000002184 metal Substances 0.000 claims abstract description 40
- 238000002844 melting Methods 0.000 claims abstract description 30
- 230000008018 melting Effects 0.000 claims abstract description 20
- 229910052802 copper Inorganic materials 0.000 claims abstract description 13
- 238000010438 heat treatment Methods 0.000 claims abstract description 10
- 238000005219 brazing Methods 0.000 claims description 62
- 239000010949 copper Substances 0.000 claims description 27
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims description 14
- 238000000034 method Methods 0.000 claims description 13
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 6
- 238000005304 joining Methods 0.000 claims description 6
- 229910052698 phosphorus Inorganic materials 0.000 claims description 6
- 229910052718 tin Inorganic materials 0.000 claims description 6
- 238000005476 soldering Methods 0.000 abstract description 11
- 238000001704 evaporation Methods 0.000 abstract description 8
- 229910018651 Mn—Ni Inorganic materials 0.000 abstract description 5
- 229910052797 bismuth Inorganic materials 0.000 abstract description 4
- 229910004837 P—Sn Inorganic materials 0.000 abstract description 2
- 229910052804 chromium Inorganic materials 0.000 abstract description 2
- 235000014676 Phragmites communis Nutrition 0.000 abstract 3
- 229910000679 solder Inorganic materials 0.000 abstract 1
- 150000002739 metals Chemical class 0.000 description 13
- 238000010586 diagram Methods 0.000 description 7
- 230000008020 evaporation Effects 0.000 description 7
- 238000009792 diffusion process Methods 0.000 description 5
- 229910052759 nickel Inorganic materials 0.000 description 5
- 230000002411 adverse Effects 0.000 description 4
- 239000011651 chromium Substances 0.000 description 4
- 239000000956 alloy Substances 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 3
- 230000001590 oxidative effect Effects 0.000 description 3
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 239000013585 weight reducing agent Substances 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 229910017566 Cu-Mn Inorganic materials 0.000 description 1
- 229910017871 Cu—Mn Inorganic materials 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- ALKZAGKDWUSJED-UHFFFAOYSA-N dinuclear copper ion Chemical compound [Cu].[Cu] ALKZAGKDWUSJED-UHFFFAOYSA-N 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 238000001764 infiltration Methods 0.000 description 1
- 230000008595 infiltration Effects 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 231100000989 no adverse effect Toxicity 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 230000001376 precipitating effect Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 230000004580 weight loss Effects 0.000 description 1
Landscapes
- High-Tension Arc-Extinguishing Switches Without Spraying Means (AREA)
- Manufacture Of Switches (AREA)
Abstract
Description
【発明の詳細な説明】
A 産業上の利用分野
本発明は、真空インタラプタの製造方法に係り、特に電
極が低融点金属を含有している真空インタラプタの製造
方法に関したものである。DETAILED DESCRIPTION OF THE INVENTION A. Industrial Application Field The present invention relates to a method for manufacturing a vacuum interrupter, and particularly to a method for manufacturing a vacuum interrupter whose electrodes contain a low melting point metal.
B1発明の概要
本発明は、電極が低融点金属を含有している真空インタ
ラプタのロウ付け部、特に最後の組立段階における気密
ロウ材は部にCuとNiとPとSnとからなるアモルフ
ァス質のロウ材を用い、且つロウ付け加熱温度を700
℃以下にして真空引きとロウ付けとを同時に行うことに
より、ロウ付け強度、気密接合の向上を図ったものであ
る。B1 Summary of the Invention The present invention provides an amorphous brazing part of a vacuum interrupter whose electrodes contain a low-melting point metal, particularly an airtight brazing material in the final assembly stage, which is made of Cu, Ni, P, and Sn. Use brazing material and set the brazing heating temperature to 700℃.
By performing evacuation and brazing at the same time at a temperature below .degree. C., the brazing strength and airtight seal are improved.
C1従来の技術
第4図は、この種真空インタラプタの従来の概略構成図
である。C1 Prior Art FIG. 4 is a schematic diagram of a conventional vacuum interrupter of this type.
図中において、lは固定側部材であり、固定電極11を
内端に具備するリード棒12と、固定側端板13とを主
要な部材として構成している。2は可動側部材であり、
可動電極21を内端に具備するリード棒22と、可動側
端板23と、ベローズ24とを主要な部材として構成し
ている。3はセラミックス等の部材からなる絶縁筒であ
り、31は絶縁筒の内側に設けた金属シールドである。In the figure, l is a fixed side member, and main members are a lead rod 12 having a fixed electrode 11 at the inner end and a fixed side end plate 13. 2 is a movable member;
The main members are a lead rod 22 having a movable electrode 21 at its inner end, a movable end plate 23, and a bellows 24. 3 is an insulating cylinder made of a member such as ceramics, and 31 is a metal shield provided inside the insulating cylinder.
このように構成した真空インタラプタは、可動電極21
を図中で上下方向に可動することにより電流の開閉を行
うものである。The vacuum interrupter configured in this way has a movable electrode 21
The electric current is switched on and off by moving up and down in the figure.
このような構成からなる真空インタラプタの製造は、一
般には次のような手段によって製造される。A vacuum interrupter having such a configuration is generally manufactured by the following method.
■ 第4図のように構成各部材の接合部に、板ロウ、線
ロウからなるロウ材41〜47を配置して仮組立し、こ
れを真空炉に入れて加熱排気とロウ付けを同時に行って
真空インタラプタを一括して製造する。■ As shown in Figure 4, soldering materials 41 to 47 consisting of plate soldering and wire soldering are placed at the joints of each constituent member and temporarily assembled, and this is placed in a vacuum furnace to perform heating exhaust and brazing at the same time. Vacuum interrupters are manufactured in bulk.
■ 固定側部材lと可動側部材2の一部、または全部を
予め前工程で製造しておき、そして、絶縁筒3との間に
ロウ材42.47を介在させて、真空中でロウ付けと加
熱排気を同時に行って真空インクラブタを製造する。■ Part or all of the fixed side member 1 and the movable side member 2 are manufactured in advance in a previous process, and then brazed in a vacuum with a brazing material 42, 47 interposed between them and the insulating cylinder 3. and heating and exhausting at the same time to manufacture a vacuum incretor.
なお、前記■の場合には各所に同じロウ材(例えばCu
系のロウ材)を配置し、■の場合には溶融点の異なるロ
ウ材(例えばCu系とAg系)を使用するのが一般的で
ある。In the case of (2) above, the same brazing material (for example, Cu
In the case of (2), it is common to use brazing materials with different melting points (for example, Cu-based and Ag-based).
B9発明が解決しようとする課題
従来、真空インタラプタに要求される種々の特性を満た
すために、電極はCu(銅)を主成分としこれに低融点
金属、例えばBi(ビスマス)を、0.1〜20重量%
含有することが一般的に行われている。B9 Problems to be Solved by the Invention Conventionally, in order to satisfy the various characteristics required of a vacuum interrupter, electrodes were made of Cu (copper) as a main component, and a low melting point metal such as Bi (bismuth) was added to this by 0.1. ~20% by weight
It is common practice to include
しかし、電極がこのような低融点金属を含有している場
合には、ロウ付け時の温度(700〜1000℃)にて
電極より低融点金属の一部が蒸発することが知られてい
る。この蒸発した金属は、真空容器内部材に付着するば
かりか、その一部は溶融しているロウ村山に侵入してロ
ウ付け接合に悪影響を及ぼすことがある。However, when the electrode contains such a low melting point metal, it is known that a part of the low melting point metal evaporates from the electrode at the temperature (700 to 1000° C.) during brazing. This evaporated metal not only adheres to the internal materials of the vacuum container, but also partially invades the molten wax material and may adversely affect the brazing joint.
このような弊害の程度は、低融点金属の含有量との関係
もあるが、特に問題となるのは気密シール接合部である
。Although the degree of such adverse effects is partly related to the content of low-melting point metals, the hermetic seal joints are particularly problematic.
つまり、機械的な接合強度は十分であったとしても気密
シール接合としては不十分なものとなってしまうおそれ
があるからである。In other words, even if the mechanical bonding strength is sufficient, there is a risk that the hermetic sealing bond may be insufficient.
このような気密シール接合部としては、前述の第4図に
おける41.42,45,46.47のロウ材の部位が
各々該当する箇所であり、■ 真空炉中で一括組立する
場合には、これらのロウ材の箇所全部が該当する。Such hermetic seal joints are the brazing metal parts 41, 42, 45, and 46, 47 in Fig. 4 mentioned above.■ When assembling in a vacuum furnace, This applies to all of these brazing metal locations.
■ 前工程で固定側、可動側部材を予め製作しておき次
工程で一体化する場合には、42.47のロウ材の箇所
が該当する。■ If the fixed side and movable side members are manufactured in advance in the previous process and then integrated in the next process, the brazing material part 42.47 corresponds to this.
E0課題を解決するための手段
発明者らは、種々の実験を行った結果、■ まず低融点
金属(例えばBi)を含有する金属におけるBiの蒸発
飛散が活発となる温度に着目した。Means for Solving the E0 Problem As a result of various experiments, the inventors first focused on the temperature at which evaporation and scattering of Bi becomes active in metals containing low melting point metals (eg, Bi).
第4図は、50Cu−40Cr−10Bi (重量%)
の組成からなる金属部材において、加熱温度(横軸)と
重量減少率(縦軸)との関係を不活性雰囲気(真空中)
で調べたものである。Figure 4 shows 50Cu-40Cr-10Bi (wt%)
The relationship between heating temperature (horizontal axis) and weight loss rate (vertical axis) in a metal member with the composition of inert atmosphere (vacuum)
This is what I investigated.
この図から、温度700℃辺りから急激に重量が減少す
る、つまりBiの蒸発飛散が700℃辺りから活発とな
ることが判った。換言すれば700℃以下の温度でロウ
付けすれば、Biの蒸発飛散はほとんどなく、悪影響は
ないことが判った。From this figure, it was found that the weight suddenly decreased from around 700°C, that is, the evaporation and scattering of Bi became active from around 700°C. In other words, it was found that when brazing is performed at a temperature of 700° C. or lower, there is almost no evaporation and scattering of Bi, and there is no adverse effect.
■ 上記■のことから700℃以下の温度でロウ付けで
きるロウ材として、CuとNiとPとSnとからなり且
つアモルファス質で形成すれば、安定にロウ付け接合で
きることを見い出した。(2) Based on the above (2), we have found that if the brazing material is made of Cu, Ni, P, and Sn and is amorphous and can be brazed at a temperature of 700° C. or lower, stable brazing can be achieved.
CuとNiとPとSnとからなり且つアモルファス質で
ロウ材を形成すれば、Biの蒸発飛散のない700℃以
下の温度でロウ付けできるばかり・でなく、ロウ付け部
にCu−N1−P−Snの拡散層が存在し、これによっ
て低融点金属の接合界面への侵入を抑制でき、安定にロ
ウ付けできることが判った。If the brazing material is made of Cu, Ni, P, and Sn and is amorphous, it will not only be possible to braze at temperatures below 700°C without evaporation and scattering of Bi, but also Cu-N1-P in the brazed part. It was found that there was a -Sn diffusion layer, which suppressed the intrusion of the low melting point metal into the bonding interface, allowing stable brazing.
従って、本発明は、例えば低融点金属を含有していても
これの悪影響を受けないロウ材とロウ付け方法を提供す
るものであり、
(1)CuとNiとPとSnとからなるアモルファス質
のロウ材であって、Cuを77〜80重量%、Niを3
8〜53重量%、Pを7〜8重量%、Snを4〜lO重
量%、で形成したロウ材。Therefore, the present invention provides a brazing material and a brazing method that are not adversely affected even if it contains low-melting point metals. (1) An amorphous material made of Cu, Ni, P, and Sn A brazing material containing 77-80% by weight of Cu and 3% by weight of Ni.
A brazing material made of 8 to 53% by weight, 7 to 8% by weight of P, and 4 to 10% by weight of Sn.
(2)そして、630℃以上の温度で且つ低融点金属を
含有する金属部材におけるこの低融点金属の蒸発飛散が
活発とならない700℃以下の温度にてロウ付けする方
法である。(2) This is a method of brazing at a temperature of 630° C. or higher and at a temperature of 700° C. or lower, at which the evaporation and scattering of the low-melting point metal in the metal member containing the low-melting point metal does not become active.
しかして、Cu、Ni、P、Snの割合、また温度が上
記の関係より外れる場合には安定したロウ付け接合を得
ることが出来なかった。However, if the proportions of Cu, Ni, P, and Sn or the temperature deviate from the above relationships, a stable brazed joint could not be obtained.
なお、
(1)低融点金属としては、例えば、Bi(ビスマス)
、Sb(アンチモン)等の低融点金属として良く知られ
ている金属が該当する。(1) As the low melting point metal, for example, Bi (bismuth)
, Sb (antimony), and other metals that are well known as low melting point metals.
(2)真空インタラプタの一体化としては、■ 固定側
部材、可動側部材を各々形成しておき、これらと絶縁筒
とを一体化する場合。(2) When integrating a vacuum interrupter, (1) A fixed side member and a movable side member are formed separately, and these are integrated with an insulating tube.
■ 固定側部材、可動側部材の一方と絶縁筒とを予め一
体化し、その後全体を一体化する場合。■ When one of the fixed side member and the movable side member is integrated with the insulating cylinder in advance, and then the whole is integrated.
の何れかが該当する。Any of the following applies.
(3)電極は、前工程で予めリード棒にロウ付けしても
良い。また低融点金属の含有量が少ない電極とリード棒
との接合の場合は本発明で用いたInを含有したロウ材
でなく、従来−船釣に使用されているC u −M n
−N i等のロウ材であっても差し支えない。ただし
、本発明で使用したInを含有したロウ材を用いるのが
望ましい。(3) The electrode may be brazed to the lead rod in advance in the previous step. Furthermore, in the case of joining an electrode with a low content of low melting point metal and a lead rod, instead of using the In-containing brazing material used in the present invention, Cu-Mn, which is conventionally used for boat fishing, is used.
- It may be a brazing material such as Ni. However, it is desirable to use the brazing material containing In used in the present invention.
(4)本発明においては、接合部がCuであれば良く、
部材全体がCu、またはCuを主成分とする材料である
必要はない。(4) In the present invention, the joint portion may be made of Cu;
The entire member does not need to be made of Cu or a material containing Cu as a main component.
F6作用
ロウ付け温度は約700℃以下で良いことから低融点金
属の飛散は少なく、またロウ付け時には真空インクラブ
タ内は完全密閉ではないので、蒸発した低融点金属が真
空インタラプタの内部にこもることは減少する。しかも
ロウ付け接合部にCu−Ni −P−5nの拡散層が存
在することで低融点金属の接合界面への侵入を抑制でき
、低融点金属を含有する電極を備えた真空インクラブタ
の気密シール接合を確実に且つ信頼性の高いものにでき
る。Since the brazing temperature for F6 action is approximately 700℃ or less, there is little scattering of low-melting point metals, and since the inside of the vacuum interrupter is not completely sealed during brazing, evaporated low-melting point metals will not be trapped inside the vacuum interrupter. Decrease. Moreover, the existence of a Cu-Ni-P-5n diffusion layer in the brazed joint can suppress the intrusion of low-melting point metals into the joint interface, making it possible to airtightly seal the vacuum incluctor equipped with electrodes containing low-melting point metals. can be made reliably and highly reliable.
G、実施例 本発明を以下の実施例に基づいて詳細に説明する。G. Example The present invention will be explained in detail based on the following examples.
まずロウ材の特性について調べた実験結果を説明する。First, we will explain the results of experiments that investigated the properties of brazing filler metal.
(実験例−1)
Cuが50重量%、Crが40重量%、Biが10重量
%の成分からなる、低融点金属含有の金属部材と無酸素
銅との接合例である。(Experimental Example-1) This is an example of joining a metal member containing a low melting point metal and oxygen-free copper, which is composed of components of 50% by weight of Cu, 40% by weight of Cr, and 10% by weight of Bi.
(a)低融点金属を含有した部材について100メツシ
ユの粒径のCr(クロム)粉末を、アルミナ容器(内径
68mm)に約160g入れ、このCr粉末上にCu−
B1合金(約400g)を載置し、容器に蓋をかぶせ、
これを真空炉内にて脱ガスと共にCu−B1合金の融点
以下の温度で加熱処理して、まずCr粒子を拡散結合さ
せて多孔質の溶浸母材を形成する。(a) For a member containing a low melting point metal, approximately 160 g of Cr (chromium) powder with a particle size of 100 mesh is placed in an alumina container (inner diameter 68 mm), and Cu-
Place B1 alloy (approximately 400 g) and cover the container with a lid.
This is degassed and heat treated in a vacuum furnace at a temperature below the melting point of the Cu-B1 alloy to first diffusely bond the Cr particles to form a porous infiltrated base material.
その後温度を上げて、Cu、Biを溶浸母材に溶浸させ
る。Thereafter, the temperature is raised to infiltrate Cu and Bi into the infiltration base material.
この際にアルミナ容器内は、Bi蒸気を含んだ雰囲気と
なり、Biを多量に含有した複合金属が得られる。At this time, the inside of the alumina container becomes an atmosphere containing Bi vapor, and a composite metal containing a large amount of Bi is obtained.
こうして得られた金属材料を、容器から取り出し、外面
を機械加工して所定の寸法形状にする。The metal material thus obtained is removed from the container and its outer surface is machined into a predetermined size and shape.
(b)ロウ材について
77.6Cu−5,7Ni−7P−9,7Sn(重量%
)のアモルファス質のロウ材を用意する。(b) About the brazing material 77.6Cu-5,7Ni-7P-9,7Sn (wt%
) Prepare an amorphous wax material.
(c)ロウ付けについて
上記ロウ材(Cu−Ni−P−9n)を、前記Cu−C
r−B1合金部材と、無酸素銅からなる部材との間に入
れ、これらをアルミナ容器内に設置し、真空炉にて加熱
処理(700℃、15分間)して接合した。(c) About brazing The above brazing material (Cu-Ni-P-9n) is
It was placed between the r-B1 alloy member and the member made of oxygen-free copper, placed in an alumina container, and heat-treated in a vacuum furnace (700° C., 15 minutes) to join them.
(d)ロウ付けの結果について
上記のようにして得られた接合物は、強固に接合されて
おり、しかもロウ材も十分に流動していることが確認さ
れた。(d) Results of brazing It was confirmed that the bonded product obtained as described above was firmly bonded, and that the brazing material was sufficiently fluid.
また、X線マイクロアナライザにて接合部の断面を観察
すると、Au、Inの拡散層によって、Biの界面への
析出は防止され、安定したロウ付け接合層が形成されて
いることが確認された。Furthermore, when observing the cross section of the joint using an X-ray microanalyzer, it was confirmed that the diffusion layer of Au and In prevented Bi from precipitating at the interface, forming a stable brazed joint layer. .
(比較実験例)
比較のために一般的に知られている、63Ag27Cu
−1Ornoつ材、Cu −M n −N i系ロウ材
を用い、温度条件を前者は800℃、後者は950℃と
し、且つ他の条件は上記実験と同様にしてロウ付けを試
みたが剥離し、ロウ付けができなかった。(Comparative Experimental Example) For comparison, commonly known 63Ag27Cu
-1 Orno material and Cu-Mn-Ni-based brazing material were used, and the temperature conditions were 800°C for the former and 950°C for the latter, and the other conditions were the same as in the above experiment. However, I couldn't braze it.
(一実施例)
上述の結果からAu−Inを含有するロウ材であれば低
融点金属を含有するCu(銅)部材を直接接合しても十
分な接合強度が得られることが判ったので、このロウ材
を用いて第1図に示す真空インタラプタを構成した。(One Example) From the above results, it was found that a brazing material containing Au-In can provide sufficient bonding strength even when directly bonding a Cu (copper) member containing a low melting point metal. A vacuum interrupter shown in FIG. 1 was constructed using this brazing material.
すなわち、第1図に示す真空インクラブタを構成するに
際して、まず第2図(a)に示す固定側部材1、及び第
2図(b)に示す可動側部材2を各々前工程で形成する
。That is, when constructing the vacuum ink club shown in FIG. 1, first, the fixed side member 1 shown in FIG. 2(a) and the movable side member 2 shown in FIG. 2(b) are each formed in a pre-process.
固定側部材1は、Cu(銅)からなる同定側端板13、
Cuからなるリード棒12、Cuからなる排気管14、
からなるもので、これらの各部材の間に、Cu −M
n −N iロウ材を配置して仮組立し、非酸化性雰囲
気中(真空中)にて約980℃の温度に加熱して接合形
成する。The fixed side member 1 includes an identification side end plate 13 made of Cu (copper),
A lead rod 12 made of Cu, an exhaust pipe 14 made of Cu,
Between each of these members, Cu-M
The n-Ni brazing material is placed and temporarily assembled, and a bond is formed by heating to a temperature of about 980° C. in a non-oxidizing atmosphere (vacuum).
また、可動側部材2は、Cuからなる固定側端板23、
Cuからなルリート棒22、SUS C7゜テンレス@
)製のベローズ24からなるもので、これらの各部材間
に、Cu−Mn−Niロウ材を配置して仮組立し、非酸
化性雰囲気中(真空中)にて約1000℃の温度に加熱
して接合形成する。Moreover, the movable side member 2 includes a fixed side end plate 23 made of Cu,
Rulito rod 22 made from Cu, SUS C7° stainless steel @
) made of bellows 24, temporarily assembled by placing Cu-Mn-Ni brazing material between each of these members, and heated to a temperature of approximately 1000°C in a non-oxidizing atmosphere (vacuum). to form a bond.
上述のように予め形成した固定側部材lと可動側部材2
とは、第1図に示すように、各リード棒12.22の内
端部にロウ材43.44(板状ロウ材)を介して、電極
(Cuが50重量%、Crが40重量%、Biが10重
量%の成分)を設けて仮組立する。また、両端部にCu
(銅)からなる補助部材131,231を備えた絶縁筒
3に各々ロウ材42.47(板状ロウ材)を介して仮組
立する。これらロウ材42,43,44.47は、77
.6Cu−5,7Ni−7P−9,7Sn(重量%)の
アモルファス質のロウ材であり、非酸化性雰囲気中(真
空)にて前述の電極ロウ材は温度より低い温度の約70
0℃でロウ付け接合して所定の真空インタラプタを一体
化構成すると共に加熱排気して所望の真空インタラプタ
を得る。Fixed side member l and movable side member 2 formed in advance as described above
As shown in FIG. , a component containing 10% by weight of Bi) and temporarily assembled. Also, Cu is added to both ends.
The insulating tube 3 is temporarily assembled to the insulating cylinder 3 provided with auxiliary members 131 and 231 made of copper (copper) via brazing materials 42 and 47 (plate-shaped brazing materials), respectively. These brazing materials 42, 43, 44.47 are 77
.. It is an amorphous brazing material of 6Cu-5,7Ni-7P-9,7Sn (wt%), and in a non-oxidizing atmosphere (vacuum), the electrode brazing material mentioned above has a temperature lower than that of about 70%.
A predetermined vacuum interrupter is integrally constructed by brazing and joining at 0° C., and the desired vacuum interrupter is obtained by heating and exhausting.
このようにして形成した真空インタラプタにおける電極
11.21とリード棒12.22との接合、及び端板1
3.23と補助金具131,231とは強固に接合され
ている。特に端板13.23と補助金具131,231
との接合部は、ヘリウム・リークデテクターにより調査
した結果リークの全く無いことか確認できた。In the vacuum interrupter thus formed, the electrode 11.21 and the lead rod 12.22 are joined, and the end plate 1
3.23 and the auxiliary fittings 131, 231 are firmly joined. In particular, the end plate 13.23 and the auxiliary fittings 131, 231
As a result of examining the joint with the helium leak detector using a helium leak detector, it was confirmed that there was no leakage at all.
なお、ベローズ及び端板とリード棒との間に従来から一
般的に使用しているCu−Mn−Niのロウ材を使用し
たのは、本発明で適用したCu −N i −P−8n
のアモルファス質のロウ材ではロウ付け特性が安定して
いないことによるものであり、後工程でのロウ付け温度
が低(低融点金属の蒸発飛散がほとんどなく、このロウ
材の部分がBiの悪影響を受けることはほとんど無いか
らである。Note that the Cu-Mn-Ni brazing material that has been commonly used between the bellows, the end plate, and the lead rod was used in the Cu-Ni-P-8n used in the present invention.
This is due to the fact that the brazing properties of the amorphous brazing material are not stable, and the brazing temperature in the post-process is low (there is almost no evaporation and scattering of low melting point metals, and this part of the brazing material is exposed to the adverse effects of Bi. This is because you almost never receive it.
H0発明の効果
本発明によるロウ材は、Cu−N1−P−5nのアモル
ファス質のロウ材であることから、ロウ材は加熱温度を
700℃以下で行うことができるので、低融点金属の蒸
発飛散を効果的に防止でき、これによってロウ材は部に
低融点金属の侵入がなくなる。しかも、ロウ材は部にC
u−N1−P−Snの拡散層が形成されるので、この拡
散層が低融点金属の接合界面への侵入を抑制できること
から、低融点金属を含有(0,1〜20重量%)する電
極を備えた真空インタラプタにおいても気密シール接合
を確実且つ安定なものにできる。Effects of the H0 Invention Since the brazing material according to the present invention is an amorphous brazing material of Cu-N1-P-5n, the brazing material can be heated at a temperature of 700°C or less, which prevents the evaporation of low-melting point metals. Splashing can be effectively prevented, thereby eliminating the intrusion of low melting point metals into the brazing filler metal. Moreover, the brazing material is C
Since a diffusion layer of u-N1-P-Sn is formed, this diffusion layer can suppress the intrusion of low melting point metal into the bonding interface, so electrodes containing low melting point metal (0.1 to 20% by weight) Even in a vacuum interrupter equipped with a vacuum interrupter, a reliable and stable airtight seal can be achieved.
また、ロウ材は温度が約700℃以下の比較的低い温度
のロウ材であるから、接合部材及び他の構成部材に与え
る熱的影響を軽減することができる。Further, since the brazing material has a relatively low temperature of about 700° C. or less, the thermal influence on the joining member and other structural members can be reduced.
従って、真空インタラプタにおける信頼性、耐久性の向
上が図れ、品質向上に寄与できるものである。Therefore, the reliability and durability of the vacuum interrupter can be improved, contributing to quality improvement.
第1図は、本発明の一実施例における真空インクラブタ
の概略構成図、第2図(a)、(b)は、第1図におけ
る真空インタラプタの部分組立図、第3図は、加熱温度
と重量減少率との関係図、第4図は、従来の真空インタ
ラプタの概略構成図である。
1・・・固定側部材、2・・・可動側部材、11・・・
固定電極、12・・・リード棒、13・・・固定側端板
、21・・・可動電極、22・・・リード棒、23・・
・可動側端板、131・・・補助部材、231・・・補
助部材。
第1wJ
叡施NjIめ鐵略璃八゛図
第2図(a)
郷#1IIliL圀
第2図(b)
部分組立口
第4図
毅永めX区インタウブタn歳略填成口FIG. 1 is a schematic configuration diagram of a vacuum interrupter according to an embodiment of the present invention, FIGS. 2(a) and (b) are partial assembly diagrams of the vacuum interrupter in FIG. 1, and FIG. 3 is a diagram showing heating temperature and FIG. 4, which is a diagram showing the relationship between the weight reduction rate and the weight reduction rate, is a schematic configuration diagram of a conventional vacuum interrupter. 1... Fixed side member, 2... Movable side member, 11...
Fixed electrode, 12... Lead rod, 13... Fixed side end plate, 21... Movable electrode, 22... Lead rod, 23...
- Movable side end plate, 131... Auxiliary member, 231... Auxiliary member. 1st wJ Euse NjI METERU 8゛ Diagram Figure 2 (a) Township #1IIliL area Figure 2 (b) Partial assembly entrance Figure 4 Takenagame
Claims (2)
、少なくともリード棒とベローズとを備えた可動側部材
と、これらの部材の端板が気密接合される絶縁筒と、各
リード棒の内端に設けた電極とを主要な構成部材とした
真空インタラプタの製造方法において、 前記固定側部材、及び可動側部材を予め形成する第1工
程と、 形成した固定側部材および可動側部材と絶縁筒とのロウ
付け気密接合、及び各リード棒の内端に電極をロウ付け
接合して真空インタラプタを組み立てると共に真空中に
て加熱排気して真空インタラプタを得る第2工程とから
なり、 前記電極は低融点金属を含有する材料で形成し、前記第
2工程におけるロウ付け部分となる部材の少なくとも端
部を銅を主成分とする材料で形成し、 前記第2工程における少なくとも気密接合部にCuとN
iとPとSnとからなるアモルファス質のロウ材を用い
、且つロウ付け加熱温度を700℃以下としたことを特
徴とする真空インタラプタの製造方法。(1) A fixed side member including at least a lead rod and an end plate, a movable side member including at least a lead rod and a bellows, an insulating cylinder to which the end plates of these members are hermetically joined, and each lead rod. A method for manufacturing a vacuum interrupter whose main component is an electrode provided at an inner end, including a first step of forming the fixed side member and the movable side member in advance, and insulating the formed fixed side member and the movable side member. The second step consists of brazing and airtightly joining the tube to the cylinder, and assembling a vacuum interrupter by brazing and joining an electrode to the inner end of each lead rod, and heating and evacuating in a vacuum to obtain a vacuum interrupter. The member is made of a material containing a low melting point metal, and at least the end portion of the member to be the brazed portion in the second step is made of a material containing copper as a main component, and at least the airtight joint portion in the second step is made of a material containing Cu. N
A method for manufacturing a vacuum interrupter, characterized in that an amorphous brazing material made of i, P, and Sn is used, and the brazing heating temperature is 700° C. or less.
にロウ付けすることを特徴とする請求項1項に記載の真
空インタラプタの製造方法。(2) The method for manufacturing a vacuum interrupter according to claim 1, characterized in that in the first step, at least one of the electrodes is brazed to the inner end of the lead rod.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10267990A JPH042020A (en) | 1990-04-18 | 1990-04-18 | Manufacture of vacuum interrupter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10267990A JPH042020A (en) | 1990-04-18 | 1990-04-18 | Manufacture of vacuum interrupter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH042020A true JPH042020A (en) | 1992-01-07 |
Family
ID=14333923
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10267990A Pending JPH042020A (en) | 1990-04-18 | 1990-04-18 | Manufacture of vacuum interrupter |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH042020A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7300722B2 (en) | 2005-04-11 | 2007-11-27 | The Gillette Company | Lithium battery containing bismuth metal oxide |
| US7407726B2 (en) | 2003-09-16 | 2008-08-05 | The Gillette Company | Primary alkaline battery containing bismuth metal oxide |
| US7537863B2 (en) | 2003-09-16 | 2009-05-26 | The Gillette Company | Primary alkaline battery containing bismuth metal oxide |
| US7972726B2 (en) | 2006-07-10 | 2011-07-05 | The Gillette Company | Primary alkaline battery containing bismuth metal oxide |
-
1990
- 1990-04-18 JP JP10267990A patent/JPH042020A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7407726B2 (en) | 2003-09-16 | 2008-08-05 | The Gillette Company | Primary alkaline battery containing bismuth metal oxide |
| US7537863B2 (en) | 2003-09-16 | 2009-05-26 | The Gillette Company | Primary alkaline battery containing bismuth metal oxide |
| US7300722B2 (en) | 2005-04-11 | 2007-11-27 | The Gillette Company | Lithium battery containing bismuth metal oxide |
| US7972726B2 (en) | 2006-07-10 | 2011-07-05 | The Gillette Company | Primary alkaline battery containing bismuth metal oxide |
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